Introduction To In-Circuit Testing
Introduction To In-Circuit Testing
Introduction To In-Circuit Testing
to
In-Circuit Testing
Introduction
In-Circuit Testing
W d , Inc. 1984
Concord, Massachusetts, U.S.A. 01742
Jmuarg l9M
The following are wademarks of GenRad, lnc.
SCRATCHPROBING
GRnet
BUSBUST
DRC
Rsx
VT
Contents
Chapter 2
Tdmtques for In-Circuit Tesdng ........... . .. . .... .... ... 17
; chapter 3
, A Look at an In-Circuit Tatex ... ...... .........-.... .... ... 53
chapter 4
' U* the . ..
ester ................. . , ..
i.'. ;A:,, ;i .......... 89
C h a p 2~- TechniquesFor Mmit -~-a the
mitical concepts ofat- via the bed-of-& fhitwe a d id&on
of the components on the h d by g u d h g for analog wad W-
driving for digid cumponents.
WAVE
R S S E M B L Y l DRILL BOARD COMWNEHT SOLDER ASSEMBLE0
DAAWNGS MAHIIFACNAE INSERTION PAOCESS BOARD
ucnnuann
!: t: ;: !. 8: c: !I [;
SCHEMATlC
TEST
Unfortunately, these steps are not always performed
flawlessly.
Shown below are some of the more common failures found in
newly assembled pc boards.
OMPONEFIT
Note that., even if' the bare pc hoard had no failures and if vou
tested every component to make sure that each one was good, ?70u
could still introduce problems while assembling thc board.
Nnw, consider t h e cost of f i n d i n g a n d fixing Failures.
To find a defective component
at incoming inspection might cost about .................. $0.50
lntroductinn 5
So who needs a fancy machine to test pc hoards? A
few test instruments a n d s o m e c o m m o n sense should
do the job.
Maybe, b u t don't underestimate the job.
First, you have t o understand how all the circuits o n the board
work before you can figure o u t how t o test them. Once you've
gotten over this hurdle, you have t o write test procedures specifv-
ing exactly how the board will b e tested. Remember, you want to
test all t h e circuits; otherwise, you can't b e sure the board will
work properlv under all normal operatiny conditions.
6 Introduction
Manual testing
Introduction 7
1 guess t h a t could be quite a bit of n~orlc.
Don't g o away. There's more.
8 Introduction
Thought you'd never ask.
Component manufacturing
Quality assurance
* System testing
I
Field service
IN-CIRCUIT TF,STEKS
cccan@cr! 5*ucnocc::
;;.~'c-z!';f::
:, r r .*!>
.. :.
:> -> ,.:. ,:.*,:A ! : - ~ C C ~ C ~
:* z; x'z 2 !: ..--
<.,<*
rJ -7 -7.:-
;c- : $' <,
7. ; ; i: ;; ,:-;c; 2 :- ~9::
, ,..,,,,-,,,- ,,,,, NEXT ,7 , m m ~ , , , , ~ . , ~ , ~ ~ ~ ~ ~ , r ,
COMPONENT
If one or more tests fail, the board is declared bad, and the ccster
reports t h e cause of the failure.
lo Introduction
1Yrh3t type o f faultc can in-circuit teqters d e t e c t
GenRad in-circuit testers can detect all the manufacturing faults
described a few pages back. As shown in the chart below, these
account for a very large portion of all the faults that can be found
on a new board.
MANUFACTURING
(CONNECTIVITY
DESIGN.
FUNCTIONAL,
ETC
Introduction 11
GenRad's in-circuir testers
All of GenRad's 227x Board Test Workstations are in-circuit
testers.
The tester performs all the manual procedures that were described
a few pages back, namely:
Introduction 13
Techniques
for
In-Circuit
Testing
I t must have access t o all the circuit nodes o n the board.
Obviously, t o test each component individually, the rester
must he able t o connect test instruments t o each pin of each
component.
ACCESS
ISOLATION IN-CIRCUIT I
The tester now has direct contact with everv circuit node on the
n
PC t)oard.
PC BOARD
BEPOF-NAILS k&\
TEST FIXTURE
VACUUM PORT
4 dc.c~-ri/~o
;jrotr: C/~n/?ter r bni~ ~ b e r / - o ~ m ~ i / r j~i {v rttc(7rc rtim/r.
f/)r.re
To prevent possible confusion later on, let's digress a moment and
define (nail down?)some of the terms associated with the inter-
face between the tester and the test fixture.
PIN When the tester is being referred to, the term (test) pins
signifies the test points or test connections available for
testing a board. For example, a tester may be said to
have a total of 640 test pins.
COMPONENT PINS
NAILS
v TEST PINS
Since all testing i s either analog or digital, every test nail in most
of GenRad's in-circuit testers can be connected to either the
analog or digital test instruments, as directed by the test program.
Because of this dual capability, these nails are referred to as
hybrid nails. The obvious advantage of hybrid nails is that either
analog o r digital testing (or both) can be performed at any circuit
node on the board, as the test propram dictates.
HYBRID
TEST
lNSfRUMENfS INSTRUMENTS
DC Current Source
DC Voltage Source
DC Voltmeter
DC Ammeter (Current fileter)
AC Impedance hleasurement Alnciule
Now, the question is, how can the tcstcr connect a n y o n e of these
instruments t o any o n e of hundreds of' circuit node.; on the hoard?
T h e 4 i n s ~ r u m e n bus
t channels are identified by the letters A, B,
C, and 0.
TEST NAILS
RELAYS
CHANNELS
B INSTRUMENT
C BUS
ANALOG
TEST
INSTRUMENTS
RELAYS SCANNER
ItJSTsRWfENT
E
C
D
n
I I I I I
RELAYS INSTRUMENT
_I
ANALOG TEST INSTRUMENTS
So, by controlling both the MUX and the SCANNER relays, the
program can r o u t e any analog instrument through thc i n s t r u m e n t
bus tn any test nail.
closes the relays connecting that same MUX channel A to test nail
I R and channel R to test nail 43.
The f k l l o ~ i instruction
n~~ sequence wnuld get the job done. a n d
t h e diagram shows how.
SCANNER
,
I 1
3ETDCSV>O.2:,
+0.2V
OCI
INSTRUMENTS
Under test procram control. the hZUS u.tn connect external IEEE
devices to the same i n ~ t s u r n e n bus
t i l q the standard analog
instruments, and t h e uontroIEer c a n hilndlc t h e settjnc-up iinrl
operation of these instruments.
-1
INSTRUMENT BUS I
TEST PROGRAM
ENSTRUCTIONS
+SV HIGH
OV
LOW
(ZERO)
1 (ONE)
So, the tester has a set of digital drivers that it uses to drive the IC
inputs to desired states and a set of digital sensors to check the
logic levels at the IC outputs.
SENSOR
Keywords, such as
TC - (Input Connect)
ID - (Input Disconnect)
OS- (Output Sense)
0 1 - (Output Ignore)
After the burst i s complete t h e CPU transfers the results from the
D/S memories back to the main metnor!. for analvsis.
SYSTEM D/S
MEMORY MEMORY
STARTTHE @
TEST BURST
TRANSFER TEST
PAITERNS TO ORlVEAS
I
TEST
NAILS
One more t h i n g iahor~tt h e c l r i ~ * e r / s e n c o r <
Testing large pc boards that have mang digital ICs requires a test
fixture with many digital test nails.
Luckily, not all of these nails are used at the same time. (All of
them contact the board at the same time, of course, but the tester
uses only a few of them during each test.)
In fact, during each test (or burst), the system uses onIy those
nails in contact with the IC being tested.
So, for economical reasons, each test nail does not usually have its
own dedicated driver/sensor, but shares a few driverlsensors with
a group of other nails. This technique is called driver/sensor
mu1tiplexing.
16 NAILS
1 )1
You could apply a known voltage across that resistor, measure the
resulting current, and calculate resistance by using Ohm's Law:
R=V/I.
AMMETER
SOURCE
- -
(APPLY VOLTAGE) (MEASURE CURRENT)
SOURCE MEASURE
R2
+ V ',
- -\/
BECOMES
EQUIVALENT TO
OPERATIONAL
RF AMPLIFIER
"ow
AMMITEA
CIRCUIT
J-
This is called a 7-terminal measurement.
~OUT
AMMETER
T h e tester knows the value of the feedback resistor (RF) and can
measure the op a m p voltage V0v.1.. Therefore. deterrninln~:the
current flow into the ammeter circuit itnd calculating Rx is a snap.
?A
1NDlCATES MUX 1L SCANNER
CONTACT RESISTANCE
R r---------
BUS
INSTRUMENT
A L_ ------- d
8
------ -
C *- - - -Ulk
---
L - -1
L - 2
D
Consider,
Any current from thy sourct. node t o ground flows through this
contnct resistance.
Techniques f o r I n - C i r r u ~ Testing
t 39
O h , no!
Take heart. All is not lost.
Rx
INSTRUMENT
B
C
D
1 ANALOG INSTRUMENTS I
EQUIVALENT
TO
N0tr.r:
I . 8inr.f nm 1-11/,tarvt~//70ri:rh t o
t/lc up u??7/t,)/I/ Po//<yr it
~/tbrlc,/optd u6.rnr.r~anfarl
r. R
n,si~-tc~rn
2. E.li-rp&l/l/)fV? r n ( ~ k i ?/ tO~f l ~ -
rcriiionn, nrrnrrrremr~n!.c.I/#(.
t 9
ANALOG INSTRUMENTS
scanner.
Q &
+
I ANALOG INSTRUMENTS I
Techniques for In-Circuit Testinfi 41
1x1's star[ bv reviewing how y o u rv{~uldtest a dig~talcornprlncnt
not tr)nnectecl in a circuit.
First, ~ O Lwould
I apply power((.lud g r o u n d ) t*) the rC, rn m a k c
t l ~ ccirc~iitrywithin t h e chip operational.
-e-' I,OW
High
Hi~h
tow
Hi+
1,ow
Hi-ch
Hj~h
High
14ixh
Low
42 T ' t ~ h n ~ q u fur
e s In-C~rcuitTc~tinp
For o n e thing, since puwcr must be rlpplied to t l ~ cIC. circuit
Interconnecttons nn the board will cauTe that power (and ground)
to be applied to the rest of the 1Cs on thc board. as well.
Therefore, when the tester tries to :apply a lop,ic level I ( > thc IC
input, it may find t h a t the IC input p i n 1s be in^ held in thc
opposite s t a t c b y the o u t p u t c ~ af n o t h e r 1C.
HIGH
OUTPUT
("cd
QS [OFR
L r
A lour output occurs when transistor Ql is conducting (is on) and
4 2 is off. To override this condition temporarily and develop a
high output (say, ahout 3.5 V), the tester forces a current pulse nf
up to 30U mA hack through Q1. This current flow in^ t h r o u ~ hthe
emitter-to-collectc~aresistance of the transistor develops the high
ourput.
Since digital tests are conducted a t high speeds, normally, the test
cutrent pulse is much less than 100 ms wide (rypically 5-10rs)
and, therefore, causes no problem.
DRIVER
OUT PUT
CURRENT
ImA)
STAT1C
LEVEL
1 *
60 100 209 TIME (mS)
Before anv di,qit:il tesring begins, t h e program first:
-
F1
I I
1[.(82) c )I l ( w ) ; 1I I. ti
ll.( 3 1 ) 11ffS2)* 1. PI 1I
IL(S2): 1. I II
BACKDRIVE TO STATES:
HI
HI
IC-UNDER-TEST
FOR STATES:
HI
BACKORIVE TO STATES'
I 1 I
I ] DIGITAL lNSTRUMEHTS
I 1
Not quite.
CCK
If this happens, the tester will assume that the flip-flop did not
toggle and, therefore, failed the test.
H
(DISABLE)
LOW
L CLR
Si 3-
-> CLK
H~
- Q-
CLK
BUS
BUS
I
IC 1C IC
(DISABLED) {DISABLED) (DISABLED)
DISABLE DISABLE
SlGNAL SIGNAL
I$ PULL-UP
RESISTOR
PULL-DOWN
RESISTOR
-V
9c
BUS
(DISABLED) (STILL
ENABLED)
I IC
(DISABLED) 1
DISABLE
SIGNAL 1 DISABLE
I
SIGNAL
9
/
-L
AMMETER
-
DISPLAY
STARTICONTINUE
SWITCH
TEST FIXTURE
"-
111
111
WINCHESTER
DISK DRIVE
DRIVE
The operator who uses the system solely for testing boards would
typically use the following system components on a regular basis:
Video Display
Keypad Controls
* Message Printer
Disk Units
Fixtures
Probe
A I.ook : ~ 3n
t In-Circutt Tester 55
The keypad con trolq
The keypad controls are specifically designed for the test
operator. I t has all the control keys that an operator needs for
production testing, but few keys fox accessing the system.
I- ----
- .. .. - - , . - . -- - - - .- ... ...-
keypad is a small calculator-size
keyboard.
2271, 227 2
KEYPAD
2275 ?275
STARTSWITCHES CONTROL
PANEL
The n u m b e r keys (0-9) and the YES/NO keys can be used for
selecting programmed test options and are not typically used by
t h e operator un3ess the operator is prompted by the test program.
After a board has been tested. the tester prints appropriate test
results, fault messages, and repair instrt~ctionsfor that board on a
message printer. The user can then artach these messages t o the
hoard so that a record o f the test results will accornpan!r the board
t o the repair station.
STRIP PRINTER
COMEINATION P R I N T E R
All the system software is stored on magnetic disks. Magnetic
disks are ideally suited for bulk storage of information, since each
disk is capable of storing l a r ~ eamounts of data.
--
,
1
7-2275 /
,
,
7
(SINGLE FLOPPY)
- d
- -- . . -
58 A Look at an In-Circu~tTester
FIXED DlSK
(SYSTEM
The 2271 and 2272 systems use: , SOFrwARE)
FLOPPY DlSK
-/ / (SOFTWARE
UPDATES)
1
2271 - Two fixtures available:
I
M a x hoard size - I,
I ? 1n.Y 17 in.(Jcmx43cm)
17 i n . x 2 1 En.(43cnlX 5 3 c m )
M a x hnnrd size -
I 2 in. A 2 6 in. (30 cm X 66 cm)
2 6 i n . A 16 i n . ( 6 6 c m x 4 1 c m )
26 in. x 26 in. (66 cm X 6G cm)
Converters arc also nv;lilahle which allow fixturos from one tester
tn be used on another type of tester. For example, with the
proper converter. a 2271 fixture c a n be used o n a 2275 tester.
Dual test fisturec
Dual fixtures can be used t o speed-up testing in a high-volume
test environment.
ANALOG
INSTRUMENTS
OlGlTAL
DRIVERISEHSORS
I
(Front I When the swlteh is in tha DIGITAL posl-
Panel) I tion, the probe Is connected to a driver/
I sensor dedicated to that probe, that is.
PROBE one that is not shared by other nails.
&' PROBE
An outline of the IC
and its pins appears o n
the screen.
Therefore, the programmer would use not only those items used
by the test operator:
Video Display
Keypad Controls
Message Printer
* Disk Units
Fixtures
Keyboard
The typewriter-like keyboard has all the keys needed for pre-
paring test programs, creating and editing files, selecting monitor
options, etc.
You can move the keyboard around the work surface for your
convenience.
LINE PRINTER
To perform all the tasks expected of it, the board tester require%a
sophisticated softwarc system, made u p of many pro-crams, suh-
programs and data files.
SYSTEM
l R S X 1 fM1
OPERATIHE
UTILITIES
USER
$" FILES
CIRCUIT IDESCAIPTIONS
TEST PAOGRhMS
I
U S E R llF!RARIES
f
TEST PAOGAAM
EKECllTlON
A I.c>ok ; ~ an
t In-Circuit Tcxtcr 71
So. tell m e a b o u t t h e m o n i t o r .
The monitor controls all o f the Illany tasks or functions t h a t the
tester can perform. Thesc tasks :Ire organized into operating
modes and utility routines. For each mode :tnd utility rnutine. the
monitor clisplnys a menu-type page nf user-selectable o p t i ~ m s .
(We'll look at these monitor pages a little later.)
AUTOMATIC
TEST NAIL
GENERATION CIRCUIT ASSIGNMENT
(ATG) GENERATION
(CKTGEN)
MODIFY
NETWORK
1RANSLATE
GENRAD 227X
PRINT
MONITOR
lPERATlNG MODES
8 UTILITIES l/.upDA'~
COPY /
DE'
LOGGING
& COLLECT
Operating modes ;loci u t i l i t i ~ q
It's beyond the scope of this docunlent to describe in detail all the
operating modes and utilities in the system. But, as an intraduc-
tion, here's a brief description of most of them. They're grouped
roughlv according to the general function that each one performs.
FILE MANACEMEKT
UMLlMlTEQ ACCESS
I LIIMITED ACCESS
I
Once the operating system gets loaded into the tester and the sys-
tem initializes itself. a DIAGNOSE mode options page (or m e n u
page) automatically appears o n the screen.
~ A R rO u
PAGE N A M E BOAR0 NAME DEVICE TAROIT SYSTEM
INPUT FlLE
SPECS
-OUTPUT
FlLE SPECS
COMMAND,
PROMPT
Suppose you wanted t o create a brand new data file, using one of
the system editors.
In this example, suppose you want to use the TECO editor (the
system has 2 editors: TECO and ED2) to create a file, and you
want to name t h e new file SC:BOARDI.CKT.
Nt~w.proceed as foIlows
M o n i t o r example
Press, then type
BOARD 1
@@
(moves cursor to
first option)
(specifies
file name)
I
- -
d
SC:
RETURN
(moves cursor to
next option)
.device
(specifies
name)
d RETURN
& SPACEBAR
(selects T E c o
option)
d
(--
RETURN
,, (selects CREATE
NEW option)
CUT
(specifies file
extens~on)
The tester is now ready for you to start creating the file. Simply
use the keyboard to enter the desired data.
When you've finished with the file (and want to save it), simply
exit TECO by pressing the ESC key followed by t h e CTRI, and Z
kcvs.
MONITOR PAGE
TEST
PROGRAM
HZ A I . o o k at ,In In-(11rru1tTester
When ;an accept:tblc procedure is f o u n d . ATC; defines t l ~ cspccific
g u a r d points, dt.I,ly5. etc) fur customrz-
palameters (tcst \~r~ltxgr.s.
inq that general ptoceda~ret o t h e particular rn-circuit ccontrcilr:~-
lion of t h e component berng tc-stcrt.
.TGwill always search through the user library for a test pro-
cedure before it searches through the system library. If an accept-
able test is found in the user library, ATG will use that test. If no
acceptable test is found in the user librarv, then ATG will t r y tr,
find one in the system library.
I Usingthe Teat- 89
What do I need to get started?
SCHEMATIC DIAGRAM AND
PARTS LIST
These contain the component
names, types, values, tolerances,
and other information that
you'll need for the circuit
description.
ASSEMBLY DRAWINGS
Used for locating precisely
where to place the test nails.
TBSTPIXTUREKIT
Contains all the hardware for
assembling and wiring the
f~ture.
& ~ X ~ d m d a W m m d
idea to examine the schematic diagram d try to
any special testing requirements. For example
OPERATOR Y C W I
e c d functional
'd like to add for
e circuit segments?
SPECIAL FUNCTIONALTEST
What if there ate special testing requirements?
GenRad testem have several featurn designed to help you take
care sf those problems. For example
SPECIAL
OlRECnVES
TEST
OPERATOR
MANUFACTURING
0 NODE NAME
Select the CREATE option t o open a new datahase file called .CIR,
specify appropriate file names, and then run the task.
Fill in the test nail inf-ormation requested for the "target" system
([he svstem o n which the test will be run).
CKTGEN ( C i r c u i t Crentrg tor\
After you indicate that the target data has been entered, the tester
will prompt you to enter a cornpunent- type.
# ENTER TYPE: R
t ENTER NAME: R 5 1
.F
# ENTER VALUE: 7 O K
.k
# ENTER NODE NUMBERS. N 1 '
Generating the test program usinc ATG
After you've compiled the circuit description, you're scndy to let
ATG develop the test program.
To do this call up the ATG options page and run thc ta.ck.
# ATG
The accumulation of all these individual tests forms the test pro-
gram. This user-readable test program Fjle is called .TPG.
-(FAIL)
'The .ATG r e p o r t s
When ATC finishes a s s e m b l i n ~the test program. it reports anv
known program deficiencies. For example, it will inform y o u of
m y components for which it could not find an acceptable test.
You, the programmer, can then modify the program to account
for these deficiencies o r make other changes. as appropriate.
I -
:-:
(capacitors, transistors,
rv~isturs.etc). A sll!nm;~r!~ .................... .-.
.............I.................
rrport rating the quality of the ..............
.......................I.
.
........................ . , ..~
...I
A,-i :
R u t hefore that, the tempnrarv test nails yclu assigned back in the
circuit description, have to be converted to real nail numbers.
This is done by running the test progrilm t h r o u ~ ha NAIL
ASSIGNMENT process.
I]
- 4-I rEsr PROCRAM-
A ASSIGNMENT
TRANSLATE
-
TEST P ~ O G R ~ ~ M
4
(SOURCE CODE. (SOURCE CODE (MACHINE CODE,
TEMPORARY REAL NAILS) REAL NAILS)
NRlLSl
you cannot arbitrarily assign just any test nail to any circuit
node
z- D/s
-
2-TO-16
PIN
MUX
1
3
2
16
-
Nail assignment analyzes the zest program and other input files
and automatically assigns real nail numbers so that testing
conflicts will not occur.
TEMPORARY NAIL%
.CKT, .TPX,
~ n d i c a t epreferred
~ ltlcnr~unp .,&,
->A,
.,.I
L5.j
f o r nail pl.lcemenrs. -,., ..*,
.,.,
-3.. ",a,
.111
.'.,'..
I,.. *,I.
*am+ .+,b
",.I
*I..
T l ~ Nail
c Fixture Report
(.NFR)is n wring l i s t k)r the
w s t t~xt~ire. If S P C C I ~ Cd~l ) resf
"I",
.jar. ...
.*.:,kj!;i;'m a c,~,:Tm
... ,
.-.................
...::::!::ii!~: ...................
....... . "../,. :f:!!.r;: : ......................
b-
i::::;:~r:!;;*:::;a--*;+:-;:!,';:;:;,,o
. -.<-.*,, ..,.L.l.,
".
*.or?-"
7r.1.
38, *,,I.
ID-.l.l.t:
,. I=-
1 ..<or* ".?*CTt?
m ",.-.",T *.tee,.,
(SOURCE (OBJECT
The translator will let yc~uk n o w if it finds any syntax errors. Use
EDIT ~ncldefor corrections. (Normally, syntax errnrs only exist i f
user inodifications were made t o the tcst program.)
This . O K file is the [ > n ouscd by rho systein when runnine the
test program.
So much for t h e test program. now for t h e
t e s t fisture
SOCKET
L!s~nl:t h c Trster
OK! 7'11s test projiritrn a n d Fixture arc 1-t.;1dr~.
Nnnr w h ~ l t ?
Now, you're readv for trial runs with several known good boards
to see if your new rest set is working properly.
Start by mounting the new test fixture o n the system, thcn place a
known good board on the fixture and run the test program.
, ~ - .
e
--
.. n -7
~ - --,
RED -
\Q. :Y-,,*a,
4 - e
FAIL
Repeat this trial run with each of the several known good hoards
to cvnluatc the performance of t h e test proRram properlv.
The system will run the entire test program in a normal fashion up
to UG,then shift to debug mode for the U6: to U7: segment, dis-
playing detaiI~dresults for you to analyze. After this test segment is
complete, testing resumes in the normal fashion.
After analyzing the test, suppose you decide that the 30 ps delay
specified in statement 2 (DLY=.WU) should have been 10 ms
( D L Y = l OM) instead of 30 ps.
The system nrill rerun the test with the new delay paranieter and
displav the new results.
LI<ing t h c T c ~ t c r 109
Making changes to a digital t e s t
First, look at the program stzitcments associated with the timing
display shown on the previous page. To do this. issue an UNTRA
(Untranslate) command.
DEBUG]> RERUN
Also, you have to instruct the test nperatc.-rr on how to use the text
r;st For production testing. For example, you lxlve to tell him or
her what files and fixture t o use nnd whilt options ta specify a n
the DIAGNOSE page. Inclridc a n y o t h e r special instructinns t h a t
tht. operator m i ~ h need
t t o run t h e test.
Scr tins-up f o r production t ~ s lni K
A batch file defines a series of tasks fnr the system to perfnrm. For
each task, the batch file specifics the options t o be used, followed
by a RUN command,
You can use one of the system editors to write a batch file that
defines all the DlAGNOSE options needed for the board test.
#ATG
#NAME=l796
#DFV-SC:
I RUN ATG
#TFANSUTE
RUN f RANSLATE
IONLY 1F ATG IS SUCCESSFUL\
#N!lL ASSIGNMENT
Note: va 8 precrdt-r the R UN command tbr .ystcm rrrns thdt tnsk only
the l u ~ tt a ~ ktvas succes.$~l/y mwpleted. You wn~(lrln'tlvnnt the systwn t n
translate a p r o p m tbur had not made it s r ~ ~ c e s ~ i f ti l Ij(r~u ~ t ~AhTG,
rt~oaldyorr?
R u n n i n g t h e test prngraln
PROGRAM FAILURES
MAKE
MODIFICATIONS
I
Drioermk D e h e s t h e p w k ~ W
atwhlcbaninput tesrptttem isapplied
to the m.
D/SCw.troller. Themermdulethat
tonnola the test@ sequence durittg m
digleal t&t burst. FundGdwteL ~ ~
UZfi a complete, functional entiq,
~~Atosthtutewith2sep Wd9hy~hutsMd-s
=ate bed-uf-d unit5 to speed up h u g h t k WB
anly
~utputs edge
production twsting8Ont b d can be EMLnecw-
loaded on m e figture while another
b m d is being tested on the other.
Fait Lntcsthg,aterinipplledha
UUT or a device WM
has ~e or more
Gli* test step
Fmult. Any d t i w that cums a
device orchmittbfd ~o apcmte iur
proper manner.
a m 9 ~ ~ ~ ~ ~ w t t e t * e a n d
l7E-b ,tdthesy&em
drtyei&&am~r
a
b&% NaUa. m - b d d m e r a l p t ~ b w d
F inabcd-~te3thhuctoI.#ake
tme QTI). Tbc time bC- eleetFfd rolltact with the nodes on a
eeamDllucwdwdpi*er-. circuit b d .
Ndl mB&wmwt~ 'Sheq h m p c n t of b i v e r . 'Phat partofthtiaterfawb t
temparaqa$tlaumbemsWgnedIna meentheteste~adrhefktur~~tfs
dxmh dmcriptten witb the target nniI pcffhanen* attached ta the ieses~er.
numb- used for &e actual wising d
chtmmrrc. ha-Time Spsrcm. The wbtxtbn d
s~fiwareprqwmsrquired topedo~nl
N d e l The ctecttbl i n t e r c o m the actual tating d diapmk of a
between two or dcvIce I d . m.
Object coda &' ?I- code.
--
Operating !3ptem (0s). T h c m f ~
mod& rhat ml3erVlsea the meratinn
of all other m & h io the c k p u f e r
OutpueY&oL
a l h r ex- or
Tbeset~flogic*,
fadl
auwtpineofa m a r dwkeata par-
tmt step.
Lhematiw. The set of
technlqua A
feature thntdirecter
~ move (santch) l e
~ t~ 4Iightly
prabtdmg thtpinaof anIC to&&
fit
! ? @ m r ~ ~ b ~ - -
w i C h output respanaes from the
PdphNtlI b k & Any Iopdatrtpw fSUTm measured.
&ice, aurh para di& Wt or l(ne
er, that k connected ao a c o m ~ ~