Computational Materials Science
Computational Materials Science
Computational Materials
Science
Simulating plasticity at the
mesoscale
Richard LeSar
ICMR Summer School, UCSB
August 2013
Materials Science and Engineering
ICMR Summer School on Materials in 3 D: Modeling and Imaging at Multiple Length Scales
Location: ESB 1001
9:00 am 10:30am
Marc De Graef
Emmanuelle Marquis
Matt Miller
Stuart Wright
Mike Jackson
Mike Mills
Satoshi Hata
Richard LeSar
Samantha Daly
Dan Gianola
Yunzhi Wang
Marc DeGraef
9:00 am 10:30am
Simon Philpot
2:00pm 3:30 pm
Peter Voorhees
Date
Mon Aug 26th
Week 1 Aug 19 23
11:00am 12:30pm
Simon Philpot
Week 2 Aug 26 30
11:00am 12:30pm
Dave Rowenhorst
3:30 pm 5:00pm
Poster Session
(1001 ESB Patio)
McLean Echlin
Poster Session
(1001 ESB Patio)
Joann Kuchera-Morin
Matt Wright
Matt Begley
Michelle Johannes
Mike Uchic
Frederic Gibou
Michelle Johannes
Baron Peters
James Rondinelli
James Rondinelli
Free Time
3:30 pm 5:00pm
Poster Session
(1001 ESB Patio)
TBA
TBA
TBA
DFT/atomistics
multiscale
mesoscale
2
scales of deformation
Table 1 Length scales and timescales used to describe the mechanics of materials, as adapted from
Reference 9a
Unit
Length scale
Timescale
Mechanics
Complex structure
103 m
106 s
Structural mechanics
Simple structure
101 m
103 s
Fracture mechanics
Component
101 m
100 s
Continuum mechanics
Grain microstructure
103 m
103 s
Crystal plasticity
Dislocation microstructure
105 m
106 s
Micromechanics
Single dislocation
107 m
109 s
Dislocation dynamics
Atomic
109 m
1012 s
Molecular dynamics
Electron orbitals
1011 m
1015 s
Quantum mechanics
aIn
the first column, we indicate an important unit structure at each scale; in the second and third columns, the approximate
length scales and timescales; and in the fourth column, the approach used to understand and represent the materials
mechanical behavior at those scales.
Chernatynskiy
Phillpot
LeSar
based on Ashby, Physical modelling of materials problems. Mater. Sci. Tech. 8, 102111 (1992).
6
experiments
1 m
Szekely, Groma, Lendvai, Mat. Sci.
Engin. A 324, 179 (2002)
1 m
despite 80 years
of dislocations,
we have no good
theories for this
fundamental
structureproperty relation
(slope ~ )
1 m
single crystal under single slip
is the shear modulus
Taylor law:
1/2
\
Mughrabi, Phil. Mag. 23, 869 (1971)
8
1000
100
KD 0.62
10
0.1
Bulk NI
10
100
J. Kwon (OSU)
EFRC Center for Defect
Physics (DOE-BES)
Plasticity
11
edge dislocations
the Burgers vector b is a
measure of the displacement of
the lattice
distortion of lattice leads to
strain field and, thus, a stress
slip
plane
1934
(Taylor, Polanyi,
Orowan)
movement of an
edge dislocation
note the deformation that
arises from the movement
of the dislocation
annihilation
12
screw dislocations
b ||
1939
(Burgers)
b
mixed dislocations
E
F
E
F
B
C
D
F
E
E
F
b ||
13
stress
d
plastic strain
xi
stress
b
macroscopic displacement: D = x
i
d i=1
plastic strain:
N
D
b
N
p = =
xi = b
x
h dh i=1
dh
p = b x
= dislocation density = m/m3 = 1/m2
D
h
p =
D D
= tan
h h
1
14
plasticity
total strain: kl = +
e
kl
stress/strain:
p
kl
ij = c = cijkl kl
e
ijkl kl
app
p
kl
not to scale
p e
e
ijkl kl
dh
i=1
goal of simulations:
calculate plastic strain
15
Frank-Read source
serves to generate
new dislocations
(111) plane
(1 11) plane
b
S
cross slip:
screw dislocation can move off
slip plane
stress and temperature
activated
climb:
a diffusive process
17
Simulations
18
scales of deformation
Table 1 Length scales and timescales used to describe the mechanics of materials, as adapted from
Reference 9a
Unit
Length scale
Timescale
Mechanics
Complex structure
103 m
106 s
Structural mechanics
Simple structure
101 m
103 s
Fracture mechanics
Component
101 m
100 s
Continuum mechanics
Grain microstructure
103 m
103 s
Crystal plasticity
Dislocation microstructure
105 m
106 s
Micromechanics
Single dislocation
107 m
109 s
Dislocation dynamics
Atomic
109 m
1012 s
Molecular dynamics
Electron orbitals
1011 m
1015 s
Quantum mechanics
the first column, we indicate an important unit structure at each scale; in the second and third columns, the approximate
What
computational methods we use depends on what our
length scales and timescales; and in the fourth column, the approach used to understand and represent the materials
mechanical
behavior are
at thoseand
scales. the limitations of the methods.
questions
aIn
We start
by identifying
the entities in the model.
Phillpot
LeSar
Chernatynskiy
based on Ashby, Physical modelling of materials problems. Mater. Sci. Tech. 8, 102111 (1992).
19
20
molecular dynamics
entities
atoms
d ri
( )
reasonably good potentials are available for many systems, but great
potentials are not available for almost anything
21
limitations of atomistics
Modeling deformation on the scale of dislocation microstructures
cannot be done at an atomistic scale:
1 m3 of copper includes approximately 1011 atoms
time steps in MD: ~10-15 sec
- MD limited to a few hundred million atoms for a nanoseconds
atomistic simulations can describe processes that include only
small numbers of dislocations at fast rates
23
entities
In DFT and MD, the entities were clear: electrons
and atoms.
At the mesoscale, entities could be defects, such as
dislocations or grain boundaries, or some other
variables that define the physics of interest.
These entities are collective variables, in which the
actions of many smaller-scale entities are treated as
one.
We will often have flexibility in the choice of the entity,
e.g., the many ways to model grain boundaries
Most successful modeling is for cases in which there
is a clear separation into collective variables
24
damped dynamics
Most applications of dynamical simulations at the
mesoscale involve systems with damping, i.e., there
are forces that dissipate the energy.
2
d ri
Standard equation of motion: mi 2 = Fi
dt
diss
d ri
25
solution in 1D
2
d x
m 2 = F v
dt
For constant F (i.e., no variation with x), the solution is:
F
t /m
v ( t ) = 1 e
tterm 3m /
v* = v / F
t* = t / m
27
phase-field dislocations
- free-energy-based
- Ginzburg-Landau dynamics
- advantages: links naturally to other phase-field methods,
easy to include energy-based phenomena (e.g.,
partials)
dislocation dynamics
- force-based
- dynamics from equations of motion
- advantages: accurate dynamics (inertial effects), stressdriven processes (cross slip)
outline
simple 2D model
basics of 3D simulations
examples:
1. small scale plasticity
2. bulk plasticity
3. strain hardening
connection to experiments
All simulations discussed today are based on isotropic elasticity including anisotropy is not difficult, just very time consuming
29
30
Assume: b = bx and = z
y
b j
12 ( j ) =
2
2
2
2 (1 ) x + y
-1
F (i )
-2
bi b j xij x y
Fx ( i )
= bi 12 ( j ) =
L
2 (1 ) xij2 + y
xij = x j xi
-1
2
ij
2
ij
2 2
ij
ext
x
(i ) = b
i
bi b j xij x y
Fx ( i )
= bi +
2
L
ji=1 2 (1 )
xij + y
N
2
ij
2
ij
2 2
ij
33
34
Step 4. Dynamics
Fx ( t )
Assume overdamped dynamics: v ( t ) = M
L
Assume a simple Euler equation solution:
xi ( t + t ) = xi ( t ) + vi ( t ) t
For no external stress, run the system until converged.
Then apply an external stress, calculate change in
dislocation position, and calculate
N
b
N
p = 2 x i = b 2 x = b x
D i=1
D
35
T T
/
T
/..+ .L/
j.j.J.
IT
ITT
At converged solution:
straight lines alternating
+ and - dislocations with
spacing 1/2 the cutoff
distance
J"
I~-'~.
I~
~1-
T
~
-"
T T l~ ~
T
m'
T..,~-..LL
,~.
l~-
~"
T~.
tl
(b)
h- 3T"
J-,J'~b.,
T
'~L
. L ~ ".:t..8
"rz -L'~I ~:.
T
.1,
. , .~ '.~
T T J ~ ~" I
~
T
iL -~
~'~@T
.i ,,
: r~
ITII
z,.~ht-
J-
"
'r
.~.
.L
h,~
a::~-"-'-
J"
FIG. 1 Simulated dislocation microstructurcs with a dislocation density of 1015 m -2 corresponding to 10 3 edge
dislocations in a 1 gm x 1 grn simulation cell using (a) the infinitely repeated simulation cell (i.e. no cut-off) and
(b) the truncated interaction distance (Pc = 0.5 cell size) methods.
36
DISTRIBUTIONS
Vol.
23, No.
(a)
IT
/..+ .L/
j.j.J.
~"
Dislocation
distributions in two dimensions, A. N. Gulluoglu, D. J. Srolovitz,
ITT
I~-'~.
I~
~1T T l~ ~
,~.
J"
T
l
~
T
~.
R. LeSar, P. S. Lomdahl, Scripta
Metallurgica 23, 1347-1352 (1989).
Z
m'
-"
tl
T..,~-..LL
37
38
curvilinear dislocations
2.2. (a) Edge-screw
discretization of dislocation lines;
- parametricFigure
dislocations
of Ghoniem
(b) internal stresses induced by edge and screw segments
- nodal points plus interpolation
- numerical integration along curves
Each dislocation segment generates a long range elastic stress field within the
entire simulated sample. In the case of isotropic elasticity, analytical expressions for
Ghoniem, Tong, and Sun, Phys. Rev. B 61, 913 (2000);
the internal stress generated by a finite segment have been established by J.C.M. Li
Wang, Ghoniem, Swaminarayan, and LeSar, J. Comp. Phys. 219, 608 (2006)
[LI 64] and R. DeWit [DeWIT 67]. Taking into account the anisotropy of the elastic
41
2
3
2
3
ri = 1 3u + 2u Pi + 3u 2u Pi+1
2
3
2
3
+ u 2u + u Ti + u + u Ti+1
) (
) (
Pi
Pi+1
Pi+2
F = b
force on dislocation
calculated from stress:
Peach-Koehler Force
bA
rA
A
( a)
( ab)
bB
dlB rB
ba
2
ij =
kmn R,ijm ij R,ppm d k
R,mpp jmnd i + imnd j +
8
1
3
R
1
R,ijk =
2
xi x j xk R
evaluated numerically:
f (r ) d
Nsegment N
int
w f (r
=1
q=1
basic method: Wang, Ghoniem, Swaminarayan, and LeSar, J. Comp. Phys. 219, 608 (2006)
43
[1]
[3]
[2]
2
[4]
[5]
B
i
A
[6]
= T = b2
45
ma = F v
over-damped limit (ignore inertial effects): v = F /
for force velocity: determine forces on the nodes and
solve the equations of motion
r (t + t) = r (t) + v(t) t
47
Step 5: models
A Monte Carlo method is used to
determine whether cross-slip is activated.
cross slip:
[ 101]
(111) plane
(1 11) plane
b
S
L t
P=
e
Lo to
P =1
V
o CS
k BT
for CS < o
for CS > o
junction
48
48
49
steps in a simulation
choose initial conditions and stress
- place dislocations randomly on possible slip planes
calculate total stresses on each node by integrating
An example:
a simple Frank-Read Source
51
52
the model
y
x
= b
L
F
= b yz y , x = b y , x
L
53
[1]
1
[3]
[2]
2
[4]
4
[5]
5
[6]
7
s s
for constant force on segments Fi = Fi + Fi+1 / 2
i1
i
velocity
[1]
1
[3]
[2]
2
[4]
4
[5]
5
[6]
7
56
57
Applications
58
1. Some successes:
small-scale
plasticity
59
1 Zhou,
and
are the displacement and stress fields in an infinite medium from all dislocations.
El-Awady, Biner, and Ghoniem (2008)
61
61
After relaxation
Density =1.81013 m-2
stress-strain behavior of Ni
!
1 micron samples
calculated
onset of flow:
~ 0.003
1 micron samples
experimental
onset of flow:
~ 0.008
differences
arise from:
strain rate,
equation of
motion, ...
63
loading
loading regime:
intermittent flow, but
are they avalanches?
loading
flow
64
65
Bulk measurements based on X-ray diffraction and convergent beam electron diffraction support this view (e.g. [47
49]). The direct observation of frozen-in radii of bowedout dislocations in Al5 wt.% Zn right at LAGBs indicates
str
on
g
rea
cti
/ GPa
on
we
ak
r
0.1 1
10
Y
X
Burgers vector [1 1 1] [1 1 1] [1 1 1] [1 1 1] 1 0 0
eac
t
102
Y
X
ion
this LAGB
10
We investigated t
tion processes associ
as a hexagonal netwo
vectors using DDD s
The LAGB poses
tration with a wide
depend on the slip sy
location as well as on
ments in the network
to the strength of ju
network dislocation
sequence of increasin
the weakest, to terna
gest interaction. The
boundary impenetrab
103
s/b [1 1 1] [1 1 1] [1 1 1] [1 1 1] 1 0 0
Burgers vector
.
Fig.
8.
Estimated dependence
of disintegration
LAGB penetration
resistance
(b) final network
precedes penetration.
(b) after successful penetration from situation
(a) #1
r / s=b lns=b on network mesh size s based on penetration strength
7. Network penetration sequence of negative 1=2 1 1 1"1 !
1 0 incident
Network penetration sequence of positive 1=2 1levels
1 1"1 !
1 0
incident at Fig.
observed
s=b
200 in this study.
dislocation (on semitransparent glide plane). Vertical gray bar indicates
Fig. 6.
dislocation (on semitransparent glide plane). Vertical gray bar indicates
tress (full height = 1.5 GPa).
5. Concluding remark
Grain
2
GB
Grain
1
Residual dislocation, b
Incoming dislocation, b1
67
GB = 5 FR
68
D = 250 nm
D = 500 nm
D = 1000 nm
D = 1500 nm
Cu freestanding (Gruber et.al.)
Cu freestanding (Xiang et.al.)
600
Excellent agreement
with experimental
stress-strain behavior,
but ...
500
400
300
H/D = 1.0
200
100
5
-1
69
dislocation structures
D = 500 nm
H = 250 nm
H = 500 nm
H = 2 m
70
dependence
on D and H
dependence of yield
stress on D as a
function of film
thickness
approaches Hall-Petch
relation for thick films
(H = 1.5 m)
71
outlook
for small-scale samples, DD simulations have led the
72
A challenge: bulk
plasticity
73
1 m
Szekely, Groma, Lendvai, Mat. Sci. Engin. A 324, 179 (2002)
74
computational challenges
the dislocation density increases with stress
1/2
nnode L
tcomp n
2
node
75
boundary conditions
must have transport of dislocations into and out of the
simulation cell
periodic boundary conditions can be a problem.
- Madec, Devincre and Kubin, On the use of periodic boundary
conditions in dislocation dynamics simulations, Solid Mechanics
and Its Applications 115, 35-44 (2004)
seem to be bulk-like
76
1.0
0.8
0.6
0.4
0.2
0.0
0.0
1
Frank-Read
source
0.2
0.4
0.6
0.8
1.0
77
5 m cube
78
5 m cubes
79
= 10 s
5 1
= 10 s
p = 0.15%
B
slip bands are
approximately 0.2 m
wide
band spacing varies
between 0.1-1 m
spacing between fine
bands within bands is
0.01 m
10 s
10 s
81
81
hardening
= e + P
.6
Application
0.6 B to various metals at
14
s
room temperature:
they obtain qualitative, but not
0.4
12
quantitative pagreement with
experiment.
0.2
10
in many ways a 2D model
s
(mean free path on different slip
0
8
systems)
0.8
0
0.2
0.4
0.6
0.8
t
10016
14
80
(MPa)
log[ (m-2)]
[123]
2]
Ni
12
60 10
/0
40
20
Cu
Ag
Al
4
2
00
5
0.1
10
0.215
20
0.3
/0
25
0.4 30
35
0.5
0.6
40
al., resolved
PRL 93,
265503
(2004)
Densities (r) and
strains
(g) on the
primary (p) and secondary (s)
systems as a function of the total resolved strain, showing the transition betw
83
84
Outlook and
needs
86
substructure development.
Thus, prediction of hardening has not been possible.
The present dislocation-based models for strain
88
Needs
Better connection to experiment: The feedback loop
0
i(g
g )
1
1
e
+i
qg
g
g0
Extinction distance
g0 (r)
g0
g (r) 2g
Sg0 (z)
Nd
X
i=1
Displacement field
Ri (r) = 2g Rt (r)
Absorption length
Scattering matrix
S() = e
iA
S(0) = S()S(0)
From:
Marc De Graef
Example
parallel illumination
From:
Marc De Graef
g020
bright field
dark field
91
bi 1
ui R =
+
4 8
2
R
R,ij =
X i X j
( )
1
ikl bl R,pp + 1 kmn bn R,mi d k
Nsegment N
int
f (r ) d w f (r
=1
q=1
acknowledgements
who did the work:
Caizhi Zhou, MUST
Zhiqiang Wang, U. North Texas
Irene Beyerlein, Los Alamos
Sriram Swaminarayan, Los Alamos
Marisol Koslowski, Purdue University
collaborators:
Nasr Ghoniem, UCLA
Dennis Dimiduk and coworkers, Air Force Research
Laboratory
93
Questions?
94