Scribd Logo
Upload

Welcome to Scribd!

  • 129 views

    Phenom Prox Specifications Lambda PDF

    Uploaded by

    Thia Bummies

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd

    Phenom Prox Specifications Lambda PDF

    Uploaded by

    Thia Bummies
    129 views4 pages

    Original Title

    Phenom_proX_Specifications_Lambda.pdf

    Copyright

    © © All Rights Reserved

    Available Formats

    PDF, TXT or read online from Scribd

    Did you find this document useful?

    Is this content inappropriate?

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    129 views4 pages

    Phenom Prox Specifications Lambda PDF

    Uploaded by

    Thia Bummies

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    of 4

    www.lambdaphoto.co.

    uk

    T: +44 (0)1582 764334

    Phenom ProX
    The Perfect All-in-One Desktop SEM

    PHENOM

    PROX

    All-in-one imaging & analysis system

    MAGNIFICATION

    Magnification range up to 100,000x


    NEVER LOST NAVIGATION

    Swift navigation to any region of interest

    MULTIPLE ACCELERATION VOLTAGES

    
    5 kV and 10 kV for high resolution images;
    15 kV for great analysis results

    ELEMENTAL MAPPING & LINE SCAN


    Revealing the distribution of elements within the
    
    sample

    FULLY INTEGRATED EDS


    
    Analysis is as easy as imaging with fully

    integrated EDS detector and software

    Phenom-World products are of high quality, fast, compact and easy to use. The Phenom ProX is the most
    extended solution for fast and user friendly imaging and analysis.

    Specification Sheet

    Phenom ProX

    All-in-One System

    The Phenom ProX desktop scanning electron microscope (SEM) is the ultimate all-in-one imaging and X-ray analysis system.
    With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined.
    Besides point analysis, the optional Elemental Mapping and Line Scan software allows further analysis of the distribution of elements.
    PHENOM PROX
    All Phenom-World products are intuitive to use, fast to create
    results and built to high quality standards. These core principles
    have been used to develop and create the Phenom ProX
    spectroscopy system for best-in-class imaging and analysis.
    As well as viewing three-dimensional images of microscopic
    structures, there is often a need to identify the different chemical
    elements in a specimen. This is accomplished in the Phenom

    ProX with the Element Identification (EID) software package


    and a specially designed and fully integrated Energy Dispensive
    Spectrometer (EDS).
    The Phenom ProX is the most extended solution for fast and
    user friendly imaging and analysis. This is enhanced by additional
    sample holders that allow for example sample tilting and
    cooling for imaging an even greater diversity of samples.

    Imaging Specifications

    Imaging

    Image

    formats

    Magnification range: 80 - 100,000x

    Image

    resolution

    Digital zoom max.12x

    options 456 x 456, 684 x 684, 1024 x 1024

    modes

    Light optical

    Magnification range: 20 - 120x

    Electron optical

    Illumination

    JPEG, TIFF, BMP

    and 2048 x 2048 pixels

    Light optical

    Bright field / dark field modes

    Electron optical

    Long-lifetime thermionic source (CeB6)

    Low, imaging, spot analysis and mapping


    mode, beam currents selection

    Data

    storage

    USB flash drive

    Network

    Pro Suite PC

    Sample Stage

    Computer-controlled motorized X and Y

    Sample

    size

    32 mm (); 100 mm (h)

    Sample

    loading time

    Acceleration Voltages 5 kV, 10 kV and 15 kV imaging and


    analysis mode
    Resolution

    Digital

    17 nm

    image detection

    Light optical

    Color navigation camera

    Electron optical High-sensitivity backscattered electron


    detector (compositional and topographical

    Light Optical

    <5s

    Electron Optical

    < 30 s

    Logo_Website_Tel_Stamp_Layout

    modes)

    Specification Sheet
    www.lambdaphoto.co.uk
    T: +44 (0)1582 764334

    Fully Integrated EDS Solution

    Acquisition mode

    Spot mode analysis

    STEP-BY-STEP DATA COLLECTION


    A dedicated software package is included and installed on the
    Pro Suite PC to control the fully integrated EDS detector.
    Analysis has become as easy as imaging, since there is no need
    to switch between external software packages or computers.
    The EDS-technique analyzes X-rays generated by the electrons
    from the electron beam interacting with the sample. The
    Phenom CeB6 electron source generates the highest number
    of X-rays in its market segment.

    The element identification software package allows the user to


    identify any hidden elements within the sample via the spot
    mode analysis. All results are verified using iterative peak
    stripping deconvolution. The step-by-step guided process
    within the software helps the user to collect all X-ray results in
    an organized and structured way. Optionally, this software can
    be expanded with the Elemental Mapping and Line Scan option.

    EDS Specifications
    Detector type
    Silicon Drift Detector (SDD)

    SYSTEM SPECIFICATIONS

    Dimensions & Weight

    Thermoelectrically cooled (LN2 free)

    Imaging module

    Detector active Area

    25 mm2

    Diaphragm vacuum pump 145(w) x 220(d) x 213(h) mm, 4.5 kg


    Power supply

    156(w) x 300(d) x 74(h) mm, 3 kg

    allowing detection of elements C to Am

    Monitor

    375(w) x 203(d) x 395(h) mm, 7.9 kg

    Mn K 140 eV

    Pro Suite Standard Pro Suite System including:

    X-ray window Ultra-thin Silicon Nitride (Si3N4) window


    Energy resolution

    Processing capabilities Multi-channel analyzer with 2048 channels

    19 monitor with PC and network router


    mounted

    at 10 eV/ch
    Max. input count rate

    286(w) x 566(d) x 495(h) mm, 50 kg

    300,000 cps

    375(w) x 250(d) x 395(h) mm, 9 kg

    Hardware integration

    Fully embedded

    Software

    Integrated in Phenom Pro Suite

    Ambient

    Integrated column and stage control

    Temperature

    15C ~ 30C (59F ~ 86F)

    Auto-peak ID

    Humidity

    < 80% RH

    Iterative strip peak deconvolution

    Power Single phase AC 110 - 240 Volt, 50/60 Hz,

    Confidence of analysis indicator

    REQUIREMENTS

    Export functions: CSV, JPG, TIFF, ELID, EMSA

    Report
    Docx format
    Logo_Website_Tel_Stamp_Layout
    1 25/06/2013
    14:46 Page 1

    conditions

    300 W (max.)

    Recommended
    table size

    150 x 75 cm, load rating of 100 kg

    Phenom ProX
    www.lambdaphoto.co.uk
    T: +44 (0)1582 764334

    www.lambdaphoto.co.uk

    T: +44 (0)1582 764334

    Upgrade Options

    Selected Area Mapping

    Line Scan analysis

    ELEMENTAL MAPPING AND LINE SCAN


    Elemental Mapping reveals the distribution of elements within
    the sample. The selected elements can be mapped at a user
    specified pixel resolution and acquisition time. The real time
    mapping algorithm shows live build-up of the selected element
    maps while storing spectra of each pixel. This allows elements
    to be added or removed at any time during or after the mapping
    process. Mixing any number of elements with the backscatter
    image gives users a clear insight into the distribution of
    elements within the sample.

    Mapping can be done on the image as a whole or to save


    time, on a Selected Area (SA). Any area can be selected in a
    rectangular shape on the image location.
    Line Scan allows analysis to be performed over a selected line.
    The number of points and dwell time per point can be selected
    individually.A line profile of every selected element is displayed
    on the screen. On top of that, the results can be easily exported
    and reported via an automated template. Multiple analyses can
    be performed in sequence without user intervention.

    ELEMENTAL MAPPING & LINE SCAN


    SPECIFICATIONS

    Elemental Mapping

    Line Scan

    Element selection 10 individual user-specified maps, plus


    Line Scan resolution range 16 512 pixels

    backscatter image and mix-image

    Points dwell time range

    50 250 ms

    Selected area Any size, rectangular shaped

    Total number of lines

    12

    Report

    Docx format

    Mapping resolution range

    16x16 - 512x512 pixels

    Pixel dwell time range

    10 - 250 ms

    Phenom-World B.V., Dillenburgstraat 9E, 5652 AM Eindhoven,The Netherlands, www.phenom-world.com

    2013. Specifications and prices are subject to change without notice.All rights reserved. Reproduction, copying, usage, modifying, hiring,
    renting, public performance, transmission and/or broadcasting in whole or in part is prohibited without the written consent of
    Phenom-World BV. Find your Phenom-World contact information at www.phenom-world.com

    You might also like