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B.E./B.Tech. Degree Examination, April/May 2008. (Regulation 2004) Electronics and Communication Engineering

This document contains questions for an electronics and communication engineering exam covering microwave engineering topics. It includes multiple choice and long answer questions on topics like scattering matrices, directional couplers, microwave transistors, parametric amplifiers, magnetrons, microwave integrated circuits, and measurement techniques. The questions test understanding of microwave engineering principles, derivations, device operation, fabrication methods, and measurement methods.

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0% found this document useful (0 votes)
39 views2 pages

B.E./B.Tech. Degree Examination, April/May 2008. (Regulation 2004) Electronics and Communication Engineering

This document contains questions for an electronics and communication engineering exam covering microwave engineering topics. It includes multiple choice and long answer questions on topics like scattering matrices, directional couplers, microwave transistors, parametric amplifiers, magnetrons, microwave integrated circuits, and measurement techniques. The questions test understanding of microwave engineering principles, derivations, device operation, fabrication methods, and measurement methods.

Uploaded by

jubair
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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B.E./B.Tech. DEGREE EXAMINATION, APRIL/MAY 2008.

Seventh Semester
(Regulation 2004)
Electronics and Communication Engineering
EC1403-MICROWAVE ENGINEERING
(Common to B.E. (Part-time) Sixth Semester Regulation 2005)
Time: Three hours
Maximum: 100 marks
Answers ALL questions.
PART A-(10x2=20 marks)
1.What do you mean by symmetry of scattering matrix?
2. Define directivity of a Directional coupler.
3. State Gunn Effect.
4. What are M-Type tubes?
5. Distinguish between ATD's and TED's.
6. What is Velocity modulation?
7. List the advantages of Microwave IC's.
8. Name the different types of lithography.
9. What is the principle by which high power measurements could be done by
calorimetric method?
10. Name two methods to measure the dielectric constant of a solid.
PART-B(5x16=80 marks)

11.(a) (i)What is scattering matrix? Derive scattering matrix formulation for n-port
network (8)
(ii) derive scattering matrix for E-plane Tee using 'S' parameter theory. (8)
Or
(b) (i)What is the function of an isolator? Write down its 'S' parameters. (4)
(ii)Explain the working of a circulator and hence obtain the scattering matrix of the
circulator from the first principle. (12)

12.(a)Enumerate with appropriate equations the power frequency limitations of BJT's at


high frequencies. (16)
Or
(b)Write short notes on:
(i)Microwave FET's (8)
(ii)HEMT (8)

13.(a) (i)Give the principle of parametric amplifier. (4)


(ii)Derive Manley-Rowe power relations and hence explain the parametric up
convener.(12)
Or
(b) (i)Draw a neat sketch showing the constructional features of a cavity magnetron and
explain why Magnetron is called as crossed field device. (4)
(ii)Derive an expression for cut off magnetic field for a cylindrical magnetron. (8)
(iii)Explain how 'strapping' enables the separation of II mode from other modes. (4)

14.(a)Explain in detail with suitable diagrams the fabrication techniques of a monolithic


microwave integrated circuit. (16)
Or
(b) (i)List the basic characteristics required for an ideal substrate material. (4)
(ii)With suitable diagrams explain the various types of microwave strip lines. (12)

15.(a) (i)With neat diagram explain the Insertion loss and Attenuation measurements. (8)
(ii)Explain the measurement of load impedance by slotted line method. (8)
Or
(b) (i)Describe with neat diagram and mathematical formulation the measurement of
dielectric constant of a solid using rectangular waveguide. (8)
(ii)Explain the measurement of cavity 'Q' by slotted line method. (8)

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