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Testing 11

This document summarizes a lecture on testability analysis of VLSI circuits. It discusses the purpose of testability analysis, which is to provide approximate measures of how difficult it is to control and observe internal circuit lines. These measures can be used to guide test pattern generation algorithms and estimate fault coverage. The document outlines the origins of testability analysis in control theory. It describes the SCOAP measures used, including controllability and observability values. Examples are provided to illustrate how these measures are calculated for different gate types using a levelization algorithm.

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34 views18 pages

Testing 11

This document summarizes a lecture on testability analysis of VLSI circuits. It discusses the purpose of testability analysis, which is to provide approximate measures of how difficult it is to control and observe internal circuit lines. These measures can be used to guide test pattern generation algorithms and estimate fault coverage. The document outlines the origins of testability analysis in control theory. It describes the SCOAP measures used, including controllability and observability values. Examples are provided to illustrate how these measures are calculated for different gate types using a levelization algorithm.

Uploaded by

doomachaley
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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VLSI Testing

Testability
Testability Analysis
Analysis
Virendra Singh
Indian Institute of Science (IISc)
Bangalore
[email protected]
E0-286: Testing and Verification of SoC Design
Lecture - 11
Feb 13, 2008

E0-286@SERC

Purpose
Purpose

Need approximate measure of:


Difficulty of setting internal circuit lines to
0 or 1 by setting primary circuit inputs
Difficulty of observing internal circuit lines
by observing primary outputs
Uses:
Analysis of difficulty of testing internal
circuit parts redesign or add special test
hardware
Guidance for algorithms computing test
patterns avoid using hard-to-control lines
Estimation of fault coverage
Estimation of test vector length

Feb 13, 2008

E0-286@SERC

Origins
Origins

Control theory
Rutman 1972 -- First definition of controllability
Goldstein 1979 -- SCOAP
First definition of observability
First elegant formulation
First efficient algorithm to compute
controllability and observability
Parker & McCluskey 1975
Definition of Probabilistic Controllability
Brglez 1984 -- COP
1st probabilistic measures
Seth, Pan & Agrawal 1985 PREDICT
1st exact probabilistic measures
Feb 13, 2008

E0-286@SERC

Testability
Testability Analysis
Analysis
Involves Circuit Topological analysis, but
test vectors and no search algorithm
Static analysis

no

Linear computational complexity


Otherwise, is pointless might as well use
automatic test-pattern generation and
calculate:
Exact fault coverage
Exact test vectors

Feb 13, 2008

E0-286@SERC

Types
Types of
of Measures
Measures

SCOAP Sandia Controllability and Observability


Analysis Program
Combinational measures:
CC0 Difficulty of setting circuit line to logic 0
CC1 Difficulty of setting circuit line to logic 1
CO Difficulty of observing a circuit line
Sequential measures analogous:

SC0
SC1
SO

Feb 13, 2008

E0-286@SERC

Range
Range of
of SCOAP
SCOAP Measures
Measures
Controllabilities 1 (easiest) to infinity (hardest)
Observabilities 0 (easiest) to infinity (hardest)
Combinational measures:
Roughly proportional to # circuit lines that
must be set to control or observe given line
Sequential measures:
Roughly proportional to # times a flip-flop
must be clocked to control or observe given
line

Feb 13, 2008

E0-286@SERC

Goldsteins
Goldsteins SCOAP
SCOAP Measures
Measures
AND gate O/P 0 controllability:
output_controllability = min (input_controllabilities)
+1
AND gate O/P 1 controllability:
output_controllability = (input_controllabilities)
+1
XOR gate O/P controllability
output_controllability = min (controllabilities of
each input set) + 1
Fanout Stem observability:
or min (some or all fanout branch observabilities)
Feb 13, 2008

E0-286@SERC

Controllability
Controllability Examples
Examples

Feb 13, 2008

E0-286@SERC

Controllability
Controllability Examples
Examples

Feb 13, 2008

E0-286@SERC

Observability
Observability Examples
Examples
To observe a gate input:
Observe output and make other input values non-controlling

Feb 13, 2008

E0-286@SERC

10

Observability
Observability Examples
Examples
To observe a fanout stem:
Observe it through branch with best observability

Feb 13, 2008

E0-286@SERC

11

Levelization
Levelization Algorithm
Algorithm
Label each gate with max # of logic levels from

primary inputs or with max # of logic levels from


primary output
Assign level # 0 to all primary inputs (PIs)
For each PI fanout:
Label that line with the PI level number, &
Queue logic gate driven by that fanout
While queue is not empty:
Dequeue next logic gate
If all gate inputs have level #s, label the gate
with the maximum of them + 1;
Else, requeue the gate
Feb 13, 2008

E0-286@SERC

12

Controllability
Controllability -- Level
Level 0
0
Circled numbers give level number. (CC0, CC1)

Feb 13, 2008

E0-286@SERC

13

Controllability
Controllability -- Level
Level 2
2

Feb 13, 2008

E0-286@SERC

14

Combinational
Combinational Controllability
Controllability

Feb 13, 2008

E0-286@SERC

15

Observability
Observability for
for Level
Level 1
1
Number in square box is level from primary outputs (POs).
(CC0, CC1) CO

Feb 13, 2008

E0-286@SERC

16

Observabilities
Observabilities -- Level
Level 2
2

Feb 13, 2008

E0-286@SERC

17

Thank You
Feb 13, 2008

E0-286@SERC

18

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