100% found this document useful (1 vote)
135 views47 pages

Mos Iv

This document discusses MOS transistor modeling. It begins with an overview of different modeling levels and then focuses on transistor-level modeling. The MOSFET device structure and important concepts like threshold voltage, velocity saturation, and channel length modulation are introduced. Equations for the drain current in different regions of operation are derived and parameters like mobility, saturation velocity, and channel length modulation factor are discussed. Both the linear region and saturation region, as well as velocity saturation, are covered. The document also discusses sub-threshold current modeling and parameters like subthreshold slope and DIBL. Modeling approaches are compared to SPICE simulations.

Uploaded by

Raga Lasya
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
100% found this document useful (1 vote)
135 views47 pages

Mos Iv

This document discusses MOS transistor modeling. It begins with an overview of different modeling levels and then focuses on transistor-level modeling. The MOSFET device structure and important concepts like threshold voltage, velocity saturation, and channel length modulation are introduced. Equations for the drain current in different regions of operation are derived and parameters like mobility, saturation velocity, and channel length modulation factor are discussed. Both the linear region and saturation region, as well as velocity saturation, are covered. The document also discusses sub-threshold current modeling and parameters like subthreshold slope and DIBL. Modeling approaches are compared to SPICE simulations.

Uploaded by

Raga Lasya
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 47

EE115C Spring 2013

Digital Electronic Circuits


Lecture 2:

MOS Transistor:
IV Model

Levels of Modeling

Analytical
CAD analytical
Switch-level sim
Transistor-level sim
complexity
Different complexity, accuracy, speed of convergence
EE115C Spring 2013

MOS Transistor Modeling

Our goal is to model


delay and energy
not current

But have to start


with current

EE115C Spring 2013

MOSFET, Notations
G

tox

xd

Leff

Ld

xd

Hand-analysis I-V formulas:


EE115C Spring 2013

L = Leff
4

Important Concepts to Understand

Threshold voltage (VT)

Velocity saturation
Channel length modulation (channel pinch-off)

EE115C Spring 2013

Threshold Voltage, VT
VSB = 0

VT0 is approx 0.2V for our process

= + ( | + | | |)

VT

VSB
B
EE115C Spring 2013

NMOS:
VSB > 0 (RBB)
VSB < 0 (FBB)
PMOS:
VSB > 0 (FBB)
VSB < 0 (RBB)
6

Outline

MOS Transistor
Basic Operation
Modes of Operation
Deep sub-micron MOS

EE115C Spring 2013

The Drain Current in Linear Regime


Combining velocity and charge:

Integrating over the channel:

Transconductance:
Gain factor:
EE115C Spring 2013

Small VDS ignore quadratic


term linear VDS dependence
L = effective L = Ld 2xd
8

Velocity Saturation
Carrier velocity saturates when critical field is reached
v
105 m/s

vsat

c
EE115C Spring 2013

Simple Model

EE115C Spring 2013

10

A More General Model


Approximate velocity:

A more general model:


for c
for c

we use n = 1

And integrate current again:

In deep submicron, there are four regions of operation:


(1) cutoff, (2) resistive, (3) saturation and (4) velocity saturation
EE115C Spring 2013

11

Including Velocity Saturation in the ID Formula

EE115C Spring 2013

12

Calculating Velocity Saturation, VDSAT

EE115C Spring 2013

13

Vsat Occurs at LOWER VDS than Sat


VDS = kVGT

VDS = VGT

ID

Vsat

Sat

k = k(VGT)

VDS
EE115C Spring 2013

14

Vsat: Less Current for Same VGS


ID

Sat (Long-L)
VGS = VDD

Vsat (Short-L)

VDSAT
EE115C Spring 2013

VGT

VDS

15

Channel Length Modulation (CLM)


Channel pinch-off

EE115C Spring 2013

16

Modeling Channel Length Modulation (CLM)


Many empirical models
Goal: get a simple model that is convenient for hand analysis
Here is a possible modeling approach:

EE115C Spring 2013

17

MOS in Saturation with CLM


Another model: DV instead of Lp

EE115C Spring 2013

18

CLM Holds in Vsat


VDS > VDSAT
S

VDS
Leff

Lp

VDSAT
VDS
EE115C Spring 2013

19

Saturation vs. Velocity Saturation


V-Sat occurs for lower VDS than Sat

EE115C Spring 2013

20

Simulation: Long vs. Short Channel (90nm)


IDSat(VGS) quadratic, IDVsat(VGS) linear
Stronger CLM in short-L than long-L
IDVsat < IDSat only for large VGS
2.4m/0.5m
0.48m/0.1m

EE115C Spring 2013

21

Simplification: VDSAT = Constant


Const
VDSAT

Simplifies hand
calculations

ID

BUT

VDS
EE115C Spring 2013

22

Regions of Operation
Const
VDSAT

Simplification
introduces Sat
region for low VGS

ID

VGT < VDSAT, the


Lin

VSat

device appears
to be in Sat

VGT = VDSAT
Sat
VDS
EE115C Spring 2013

23

Unified Model vs. SPICE Simulation

VDS = VDSAT

simulation
model

Transition

0.25

ID (mA)

0.2

Lin

lin/v-sat:
largest
modeling
error

VSat

0.15

0.1

VGT = VDSAT

0.05
0
0

Sat
0.2

VDS = VGT

0.4

0.6

0.8

VDS / VREF
EE115C Spring 2013

24

MOS Regions of Operation


Nano-scale MOS devices operate in velocity saturation
Saturation still possible for low VGS values (up to VDSAT)

EE115C Spring 2013

25

MOS I-V Model: Active Region


VGT = VGS VT
Active region (VGT 0) Lin, Sat, V-Sat

ID
B

2
V
W
ID = k (VGTVmin min )(1 + VDS)
2
L

Vmin = min(VDS, VGT, VDSAT)


Lin Sat V-Sat

Neglect CLM in linear region

EE115C Spring 2013

26

Model Parameters: Active Region


VT0 : Threshold voltage
: Body effect
VDSAT : Velocity saturation
k : Transconductance (k = Cox)
: Channel-length modulation (CLM)

CLM term (1 + VDS) also included for linear region


Empirical, no physical justification
EE115C Spring 2013

27

Typical Values for 90nm


ox 0 = 3.5 1011 F/m (ox = 3.9)
tox = 2.3 nm
Cox = ox / tox = 15.2 fF/um2
For W/L = 430nm/120nm
Cg = 0.65 fF
Leff = 70nm
c = 4V/um
Vdsat = cL = 0.3V

EE115C Spring 2013

28

Unified Model: Observations


CLM term (1 + lVDS) also included for linear region
Empirical, not grounded in physical considerations

Five parameters: VT0, g, VDSAT, k, l

Can determine from physics


Or choose values that best match simulation/measured data
(match the best in regions that matter the most)
Use different model for L >> Lmin
(in EE115C we assume L = Lmin unless otherwise specified)

Lets see how do we extract these parameters from the I-V curves
EE115C Spring 2013

29

140

ID (mA)

120
The Meaning
of Model Parameters: VT0
100

MOS in80saturation
ID (mA)

60

B
A

40
20

0.4
0.5
0.7
1
0.4BB
0.5BB
0.7BB
1BB

VGS=0.5V
VGS=0.4V

0
0.0

0.2

0.4

0.6

0.8

1.0

VDS (V)

EE115C Spring 2013

30

The Meaning of Model Parameters: g

EE115C Spring 2013

31

The Meaning of Model Parameters: l

EE115C Spring 2013

32

The Meaning of Model Parameters: k

EE115C Spring 2013

33

Sub-threshold Current

This is another topic of crucial importance in digital


design (and not considered in EE115A models)
We need to consider sub-threshold current, because digital
designs have many millions of transistors and when these are
inactive, we may get some surprise power consumption

EE115C Spring 2013

34

Sub-threshold ID versus VGS is Exponential


x 10-4
6

Long Channel
5

ID (A)

quadratic

Sub-threshold

linear

Short Channel

exp quadratic
0

0.5

1.5

2.5

VGS (V)
EE115C Spring 2013

35

Modeling the Sub-threshold Behavior


G

S
n+

D
Cox

C n+

=
EE115C Spring 2013

Cd

Parasitic BJT

=1+

36

Sub-threshold ID vs. VGS


Physical
model

0 =

DIBL

Empirical
model

= () [mV/dec]
EE115C Spring 2013

37

The Sub-threshold Slope Parameter


= () [mV/dec]
Change in VGS that gives 10x change in IDS
n=1
60 mV/dec
(ideal)
n = 1.5 90 mV/dec
(typical)

S: increases with temperature ( )


n: intrinsic to device topology / structure

EE115C Spring 2013

38

Drain Induced Barrier Lowering (DIBL)


Effective VT

Long-L
Short-L
decreasing L
VDS

Field lines from the drain affect charge in the channel


Typically derived for small VDS, holds for large VDS
Even if we neglect CLM, IDS will increase b/c of VT drop
Device turned off by VGS (below VT) may turn on by VDS

EE115C Spring 2013

39

MOS I-V Model: Subthreshold


Subthreshold region (VGT 0)

VGT = VGS VT

W VGS VT + DVDS
ID = I0 10
S
W0

ID
B

EE115C Spring 2013

Model parameters
I0 : Nominal leakage current
S : Subthreshold slope
D : DIBL factor

40

90nm Simulation: Sub-threshold ID vs. VGS

PMOS

NMOS

VDS : 0 to 0.4V

10x
90mV

EE115C Spring 2013

= ()

90mV/dec
41

90nm Simulation: Sub-threshold ID vs. VDS

PMOS

480nm/100nm

EE115C Spring 2013

NMOS

VGS : 0 to 0.3V

240nm/100nm

42

MOS I-V Model: Summary


Subthreshold region (VGT 0)

VGT = VGS VT

W VGS VT + DVDS
ID = I0 10
S
W0

ID
B

Active region (VGT 0) Lin, Sat, V-Sat


2
Vmin

W
ID = k (VGTVmin
)(1 + VDS)
2
L
Vmin = min(VDS, VGT, VDSAT)
Lin Sat V-Sat

EE115C Spring 2013

43

.MODEL Parameters MOS1 (Basic Parameters)


.MODEL Modname NMOS/PMOS <VT0=VT0>

EE115C Spring 2013

44

In Reality: GPDK090 Model (gpdk090_mos.scs)


section TT_s1v
parameters
+ s1v_rs_ne =
0.000000e+000 s1v_vsat_ne = 1.120000e+005
+ s1v_uc1_ne = 3.700000e-010 s1v_u0_ne =
2.000000e-002
+ s1v_rsc_ne = 4.082483e-014 s1v_cgbo_ne = 1.482000e-011
+ s1v_rdc_ne = 4.082483e-014 s1v_vth0_ne = 1.692662e-001
+ s1v_cgdo_ne = 2.667600e-010 s1v_ckappa_ne =4.605336e+000
+ s1v_k1_ne =
2.825346e-001 s1v_cgsl_ne = 1.111500e-010
+ s1v_js_ne =
3.366667e-006 s1v_hdif_ne = 1.400000e-007
+ s1v_jsw_ne = 3.366667e-010 s1v_tox_ne =
2.330000e-009
+ s1v_cjsw_ne = 4.790122e-011 s1v_ldif_ne =
1.000000e-008
+ s1v_rd_ne =
0.000000e+000 s1v_pb_ne =
9.918524e-001
+ s1v_lint_ne = 1.500000e-008 s1v_cjswg_ne = 1.995884e-011
+ s1v_u0_pe = 1.200000e-002 s1v_nch_pe =
4.000000e+017
+ s1v_cgbo_pe = 1.392363e-011 s1v_rdc_pe =
2.886751e-014
+ s1v_k2_pe =
0.000000e+000 s1v_cgdo_pe = 2.506253e-010
+ s1v_wint_pe = 5.000000e-009 s1v_k1_pe =
2.637520e-001
+ s1v_js_pe =
3.350000e-006 s1v_hdif_pe =
1.400000e-007
+ s1v_jsw_pe = 3.350000e-010 s1v_tox_pe =
2.480000e-009
+ s1v_cjsw_pe = 4.747351e-011 s1v_ldif_pe =
1.000000e-008
+ s1v_rd_pe =
0.000000e+000 s1v_pb_pe =
1.009805e+000
+ s1v_lint_pe = 1.500000e-008 s1v_cjswg_pe = 1.978063e-011
+ s1v_rs_pe =
0.000000e+000 s1v_vsat_pe =
1.000000e+005
include "gpdk090_mos.scs" section = s1v_mos
endsection TT_s1v

s1v_pldd_surf =
6.000000e+019
s1v_nch_ne =
5.200000e+017
s1v_prt_ne =
1.000000e+001
s1v_k2_ne =
0.000000e+000
s1v_wint_ne =
6.000000e-009
s1v_nldd_surf =
3.000000e+019
s1v_rdsw_ne =
3.900000e-006
s1v_cj_ne =
7.983537e-004
s1v_xj_ne =
2.500000e-008
s1v_cf_ne =
4.594612e-011
s1v_rsh_ne =
1.000000e+001
s1v_rsc_pe =
2.886751e-014
s1v_vth0_pe =
-1.359511e-001
s1v_ckappa_pe =
1.043477e+001
s1v_cgsl_pe =
1.044272e-010
s1v_rdsw_pe =
7.800000e-006
s1v_cj_pe =
7.912252e-004
s1v_xj_pe =
2.500000e-008
s1v_cf_pe =
4.527118e-011
s1v_rsh_pe =
2.000000e+001

This model continues on the next slide

EE115C Spring 2013

45

GPDK090 Model (section s1v_mos)


section s1v_mos
model gpdk090_nmos1v bsim3v3 type = n
+ lmin =
0.0
lmax =
1.0
+ wmax = 1.0
tnom =
25.0
+ tox =
s1v_tox_ne
toxm =
s1v_tox_ne
+ nch =
s1v_nch_ne
lln =
1.0000000
+ wln =
1.0000000
wwn =
-1.0000000
+ ll =
0.00
lw =
0.00
+ wint =
s1v_wint_ne
wl =
0.00
+ wwl =
0.00
mobmod = 1
+ xl =
0
xw =
0
+ dwb =
0.00
acm =
12
+ hdif =
s1v_hdif_ne
rsh =
s1v_rsh_ne
+ rs =
s1v_rs_ne
rsc =
s1v_rsc_ne
+ vth0 =
s1v_vth0_ne k1 =
s1v_k1_ne
+ k3 =
-2.3000000
dvt0 =
3.86366
+ dvt2 =
5.0299990E-02 dvt0w =
0.00
+ dvt2w = 0.00
nlx =
1.2517999E-07
+ k3b =
0.5576769
ngate =
4.0E20
+ ua =
-6.1879500E-10 ub =
1.8806652E-18
+ rdsw =
s1v_rdsw_ne prwb =
0.00
+ wr =
1.0000000
u0 =
s1v_u0_ne
+ keta =
-3.1429991E-02 a1 =
0.00
+ ags =
0.8900000
b0 =
0.00

wmin =
0.0
version =
3.2
xj =
s1v_xj_ne
lwn =
1.0000000
lint =
s1v_lint_ne
lwl =
0.00
ww =
0.00
binunit =
2
dwg =
0.00
ldif =
s1v_ldif_ne
rd =
s1v_rd_ne
rdc =
s1v_rdc_ne
k2 =
s1v_k2_ne
dvt1 =
1.2
dvt1w =
0.00
w0 =
-7.1353000E-09
vsat =
s1v_vsat_ne
uc =
1.3823546E-10
prwg =
0.00
a0 =
2.3750000
a2 =
0.9900000
b1 =
0.00

And many more parameters... (compare to our 5-parameter model)


EE115C Spring 2013

46

Spectre Netlist (NMOS, PMOS)


section s1v_mac
subckt s1v_ckt_nch (n11 n2 n33 n4)
parameters l=0.1u w=10u multi=1 factor=1 nrd=s1v_hdif_ne/factor/w nrs=s1v_hdif_ne/factor/w
+ Tox_ratio = 3.0e-9 / (s1v_tox_ne*s1v_tox_ne*s1v_tox_ne)
MAIN (n1 n2 n3 n4) gpdk090_nmos1v w=w l=l nrd=nrd nrs=nrs multi=multi
GDF1 (n2 n1) bsource i = w*0.6*s1v_xj_ne*4.97232*Tox_ratio*v(n2,n1)*v(n2,n3)*exp(-4.85669e11*s1v_tox_ne*
GDF2 (n2 n3) bsource i = w*0.6*s1v_xj_ne*4.97232*Tox_ratio*v(n2,n3)*sqrt( (v(n2,n3) - 0.026*log(4.0e20
20 / s1v_nldd_surf)) + 1.0e-4 )*exp(-4.85669e11*s1v_tox_ne*(0.43-0.054*sqrt( (v(n2,n3) - 0.026*log(4.0e20
.0e20 / s1v_nldd_surf)) + - 0.026*log(4.0e20 / s1v_nldd_surf))*(v(n2,n3) s1v_nldd_surf)) + 1.0e-4 )))
rdn (n1 n11) resistor r= 6.8 *nrd/multi
rsn (n3 n33) resistor r= 6.8 *nrs/multi
ends s1v_ckt_nch
subckt s1v_ckt_pch (p11 p2 p33 p4)
parameters l=0.1u w=10u multi=1 factor=1 nrd=s1v_hdif_pe/factor/w nrs=s1v_hdif_pe/factor/w
+ Tox_ratio = 3.0e-9/(s1v_tox_pe*s1v_tox_pe*s1v_tox_pe)
MAIN (p1 p2 p3 p4) gpdk090_pmos1v w=w l=l nrd=nrd nrs=nrs multi=multi
GDF1 (p2 p1) bsource i = w*0.6*s1v_xj_pe*3.42537*Tox_ratio*v(p2, p1)*sqrt( (v(p2, p1)0.026*log(9.32E19/s1v_pldd_surf))*(v(p2, p1)-0.026*log(9.32E1
9/s1v_pldd_surf)) + 1.0e-4 )*exp(-7.0645e11*s1v_tox_pe*(0.31-0.024*sqrt( (v(p2, p1)0.026*log(9.32E19/s1v_pldd_surf))*(v(p2, p1)-0.026*log(9.32E19 s1v_pldd_surf)) + 1.0e-4 ))*(1.0+0.03*sqrt( (v(p2, p1)0.026*log(9.32E19/s1v_pldd_surf))*(v(p2, p1)-0.026*log(9.32E19/s1v_pldd_surf)) + 1.0e-4 )))
GDF2 (p2 p3) bsource i = w*0.6*s1v_xj_pe*3.42537*Tox_ratio*sqrt( (v(p2, p3)-0.026*log(9.32E19/)) + 1.0e-4 )))
rdp (p1 p11) resistor r = 7.1 * nrd / multi
rsp (p3 p33) resistor r = 7.1 * nrs / multi
ends s1v_ckt_pch
endsection s1v_mac
EE115C Spring 2013

47

You might also like