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The International Arab Journal of Information Technology, Vol. 6, No. 2, April 2009

Discrete Time NHPP Models for Software

Reliability Growth Phenomenon
Omar Shatnawi
Prince Hussein bin Abdullah Information Technology College, al-Bayt University, Jordan
Abstract: Nonhomogeneous poisson process based software reliability growth models are generally classified into two
groups. The first group contains models, which use the machine execution time or calendar time as a unit of fault
detection/removal period. Such models are called continuous time models. The second group contains models, which use the
number of test occasions/cases as a unit of fault detection period. Such models are called discrete time models, since the unit
of software fault detection period is countable. A large number of models have been developed in the first group while there
are fewer in the second group. Discrete time models in software reliability are important and a little effort has been made in
this direction. In this paper, we develop two discrete time SRGMs using probability generating function for the software
failure occurrence / fault detection phenomenon based on a NHPP namely, basic and extended models. The basic model
exploits the fault detection/removal rate during the initial and final test cases. Whereas, the extended model incorporates fault
generation and imperfect debugging with learning. Actual software reliability data have been used to demonstrate the
proposed models. The results are fairly encouraging in terms of goodness-of-fit and predictive validity criteria due to
applicability and flexibility of the proposed models as they can capture a wide class of reliability growth curves ranging from
purely exponential to highly S-shaped.
Keywords: Software engineering, software testing, software reliability, software reliability growth model, nonhomogeneous
poisson process, test occasions.
Received August 19, 2007; accepted December 9, 2007

1. Introduction
Software reliability assessment is important to evaluate
and predict the reliability and performance of software
system. The models applicable to the assessment of
software reliability are called Software Reliability
Growth Models (SRGMs). An SRGM provides a
mathematical relationship between time span of testing
or using the software and the cumulative number of
faults detected. It is used to assess the reliability of the
software during testing and operational phases.
An important class of SRGM that has been widely
studied is NonHomogeneous Poisson Process (NHPP).
It forms one of the main classes of the existing SRGM;
due to it is mathematical tractability and wide
applicability. NHPP models are useful in describing
failure processes, providing trends such as reliability
growth and fault-content. SRGM consider the
debugging process as a counting process characterized
by the mean value function of a NHPP. Software
reliability can be estimated once the mean value
function is determined. Model parameters are usually
determined using either Maximum Likelihood
Estimate (MLE) or least-square estimation methods [6,
13, 18].
NHPP based SRGM are generally classified into
two groups [2, 6, 17]. The first group contains models,
which use the execution time (i.e., CPU time) or

calendar time. Such models are called continuous time

models. The second group contains models, which use
the number of test cases as a unit of fault detection
period. Such models are called discrete time models,
since the unit of software fault detection period is
countable. A test case can be a single computer test run
executed in an hour, day, week or even month.
Therefore, it includes the computer test run and length
of time spent to visually inspect the software source
code [2, 6]. A large number of models have been
developed in the first group while fewer are there in
the second group due to the difficulties in terms of
mathematical complexity involved.
The utility of discrete time models cannot be
underestimated since the number of test cases (i.e.,
executed test run) is more appropriate measure of the
fault detection/removal period than the CPU/calendar
time used by continuous time model. These models
generally provide a better fit than their continuous time
counterparts because they are more realistic. Therefore,
in spite of difficulties in terms of mathematical
complexity involved, discrete time models are
proposed regularly.
Yamada and Osaki [17] discussed two classes of
models. One class describes the fault detection process
in which the expected number of faults per test case is
geometrically decreasing whereas, in the second is
proportional to the current fault-content and this class

Discrete Time NHPP Models for Software Reliability Growth Phenomenon

125

is known as exponential model. Kapur et al. [6]

proposed a model in which the testing phase is
assumed to have two different processes namely, fault
isolation and fault detection processes, this model is
known as delayed S-shaped model. Further they
proposed another model based on the assumption that
software may contain several types of faults. In these
models the fault removal process (i.e., debugging
process) is assumed to be perfect. But due to the
complexity of the software system and the incomplete
understanding of software requirements, specifications
and structure, the testing team may not be able to
remove the fault perfectly and the original fault may
remain or replaced by another fault. While the first
phenomenon is known as imperfect debugging. The
second is called error/fault generation.
The concept of imperfect debugging was first
introduced by Goel [3]. He introduced the probability
of imperfect debugging in Jelinski and Moranda model
[5]. Kapur et al. [6] introduced the imperfect
debugging in Goel and Okumoto model [4]. They
assumed that the fault removal rate per remaining
faults is reduced due to imperfect debugging. Thus the
number of failures observed by time infinity is more
than the initial fault content. Although these two
models describe the imperfect debugging phenomenon
yet the software reliability growth curve of these
models is always exponential. Moreover, they assume
that the probability of imperfect debugging is
independent of the testing time. Thus, they ignore the
role of the learning process during the testing phase by
not accounting for the experience gained with the
progress of software testing. Actually, the probability
of imperfect debugging is supposed to be a maximum
in the early stage of the testing phase and is supposed
to reduce with the progress of testing [1, 6, 7, 8, 10, 12,
13, 14, 15, 16].
In this paper, we propose two discrete time NHPP
based SRGMs for the situation given above. The
assumptions in this case are with respect to number of
test cases instead of time. The rest of this paper is
organized as follows. Section 2 derives the proposed
two flexible discrete time models. Sections 3 and 4
discuss the methods used for parameter estimation and
the criteria used for validation and evaluation of the
proposed models. The applications of the proposed
discrete to actual software reliability data through data
analyses and model comparisons are shown in section
5. We conclude this paper in section 6.

number of remaining faults [4]. This assumption

implies that all faults are equally likely to be detected.
In practical situation it has been observed that large
number of simple faults is easily detected at the early
stages of the testing, while the fault detection may
become extremely difficult in the later stages of the
testing phase. In this case, the fault detection rate has a
high value at the beginning of the testing as compared
to the value at the end of the testing. On the contrary, it
may happen that the detection of faults increases the
skill of the testing team and thus leading to increase in
efficiency. In other words, the testing team detects
more faults in less time. This implies that the value of
the fault detection rate at the end of the testing phase is
higher than it is value at the beginning of the testing.
Bittanti et al. [1] exploited this change in fault
detection rate, which they termed as the Fault
Exposure Coefficient (FEC) for their SRGM.
Through real data experiments and analysis on
several software development projects, the fault
detection rate has three possible trends as time
progresses; increasing, decreasing or constant [1, 10].
It decreases when the software has been used and
tested repeatedly, showing reliability growth. It can
also increase if the testing techniques/requirements are
changed, or new faults are introduced due to new
software features or imperfect debugging. Thus, we
treat the fault detection rate as a function of the number
of test cases to interpret these trends.

2. Software Reliability Modelling

Under the given model assumptions, the expected

cumulative number of faults detected between the nth
and (n+1)th test cases is proportional to the number of
faults remaining after the execution of the nth test run,
satisfies the following difference equation:

2.1. Basic Discrete Time Model

2.1.1. Model Development
The main assumption of SRGM is that the failure
observation / fault detection depends linearly upon the

2.1.2. Model Assumptions, Notations, and

Formulation
Failure observation/fault detection phenomenon is
modelled by NHPP.
Software is subject to failures during execution
caused by faults remaining in the software.
Each time a failure occurs, the fault that caused it is
immediately and perfectly detected, and no new
faults are introduced, i.e., the debugging process is
perfect.
a
Initial fault content of the software.
b(n+1) Fault detection rate function is dependent on
the number of test cases and behaves linearly
on the number of faults remaining.
bi
Initial fault detection rate.
bf
Final fault detection rate.
m(n) The expected mean number of faults detected
by the nth test case.

m ( n + 1) m ( n ) = b ( n + 1)(a m ( n ) )

(1)

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The International Arab Journal of Information Technology, Vol. 6, No. 2, April 2009

The fault detection rate is given as a function of the

number faults detected, as in the following equation,

m(n + 1)
b(n + 1) = bi + (b f bi )
a

(2)

According to the values of bi and bf, we can

distinguish between the following cases [1]:

Constant fault detection rate; bi=bf =b

Increasing fault detection rate; bf >bi
Decreasing fault detection rate; bi>bf
Vanishing fault detection rate; bf =0, bi>0

By substituting equation 2 in the difference equation 1

and then solving it using Probability Generating
Function (PGF) with initial condition m(n=0)=0, one
can get the closed form solution as given below.

a 1 (1 b f ) n
(3)
m (n) =
b f bi
n
1+
(1 b f )
bi
The structure of the model is flexible. The shape of
the growth curve is determined by the parameters bi
and bf and can be both exponential and S-shaped for
the four cases discussed above. In case of constant
fault detection rate, equation 3 can be written as

m(n) = a 1 (1 b)n

(4)

If bf<bi, it is apparent from equation 1 that b(n+1)

decreases to zero more rapidly than linearly. The
smaller ratio bf/bi, the larger rate convergence of
equation 1. If bf=0, then equation 1 becomes:

m(n +1) m(n) =

bi
(a m(n +1))(a m(n))
a

(5)

The solution of which is given by:

m (n ) =

ab i n
1 + bi n

(6)

If bf>bi, then equation 3 has an inflection point and

the growth curve is S-shaped. Such behaviour of the
SRGM can be attributed to the increased skill of the
test team or a modification of the testing strategy.
The proposed discrete time model defined in
equation 3 is very interesting from various points of
view. Besides the above-mentioned interpretation as a
flexible S-shaped fault detection model, this model has
the exponential model [17] as special cases as given in
equation 4.
Note that this proposed basic discrete time model is
able to model both cases of strictly decreasing failure
intensity and the case of increasing-and-decreasing
failure intensity. None of the exponential model [17]
and the ordinary delayed S-shaped model [6] can do
both.

2.2. Extended Discrete Time Model

2.2.1. Model Development
During debugging process faults are identified and
removed upon failures. In reality this may not be
always true. The corrections may themselves introduce
new faults or they may inadvertently create conditions,
not previously experienced, that enable other faults to
cause failures. This results in situations where the
actual fault removals are less than the removal
attempts. Therefore, the fault detection rate is reduced
by the probability of imperfect debugging [6, 8, 13,
14]. Besides there is a good chance that some new
faults might be introduced during the course of
debugging.
The learning-process of the software developers has
also been studied [1, 6, 12, 16]. Leaning occurs if
testing appears to improve dynamically in efficiency as
one progress through the testing phase. Learning
usually manifests itself as a changing fault detection
rate. By assuming the fault detection rate is dependent
on the number of test cases, the role of the learning
process during the testing phase can be established.
The extended model proposed below incorporates
these three factors.
To avoid mathematical complexity many
simplifying assumptions have been taken while
developing the basic model. One of which is that the
number of initial fault-content is constant.
Modifications to the basic model have been proposed
for increasing over-all fault content, where a of
equation 1 is substituted by a(n) as given in equation 8.
The nature of a(n) depends upon various factors like
the skill of test team or testing strategy, number of test
cases, software size, and complexity. Hence no single
functional form can describe the growth in number of
faults during testing phase and debugging process. This
necessitates a modelling approach that can be modified
without unnecessarily increasing the complexity of the
resultant model [8].
Here, we show how this can be achieved for the
proposed basic discrete time model by changing the
fault detection rate. Before the spread of flexible
models, a number of models were proposed that linked
the fault detection rate to the initial fault content. But
basic model due to it is inherent flexibility could
describe many of them.
Hence it is imperative to capture this flexibility and
in this paper we do so by proposing a logistic number
of test cases dependent for fault detection rate as
proposed in equation 9.
2.2.2. Model Assumptions
In addition to basic discrete time model assumptions
except for assumption 3, we have:
Over-all fault content is linearly dependent on the
number of test cases.

Discrete Time NHPP Models for Software Reliability Growth Phenomenon

Fault detection rate is number of test cases

dependent function with an inflection S-shaped
model.
Fault introduction rate is a linear function of the
number of test cases.
Faults can be introduced during the testing phase
and the debugging process may not lead to the
complete removal of the faults, i.e., the debugging
process is imperfect.
2.2.3. Model Notations
In addition to the basic discrete time model notations
we include the following:
a(n)
Over-all fault-content dependent on the
number of test cases, which includes initial
fault-content and the number of faults
introduced.
b(n+1) Fault detection rate dependent on the number of
test cases.

Fault introduction rate per detected faults per

test case.
p
The probability of fault removal on a failure,
i.e., the probability of perfect debugging
Fault detection rate function is dependent on
the number of test cases and behaves linearly
on the number of faults remaining.
2.2.4. Model Formulation
Under the above extended model assumptions, the
expected cumulative number of faults detected
between the nth and (n+1)th test cases is proportional to
the number of faults remaining after the execution nth
test run, satisfies the following difference equation:

m(n + 1) m(n) = b(n + 1)(a(n) m(n) )

(8)

and
b( n + 1) =

bf p
b f bi
1+
(1 b f p ) n +1
bi

m (n) =

b f bi
n
1 +
(1 b f p )
bi

[(1 (1 b

(9)

By substituting equations 9 and 8 in 7 and then

solving it using PGF with initial condition m(n=0)=0,
after tedious algebraic manipulations, one can get the
closed form solution as given below.

p) n

(10)

) b bp p + n

Fault generation and imperfect debugging with leaning

are integrated to form the extended discrete time model
as given in equation 10.
According to the values of parameters, we can
distinguish between the following cases:
Constant fault detection rate (bi=bf=b), no faults
introduced (=0), and prefect debugging (p=1)
No faults introduced (=0), and prefect debugging
(p=1).
In case 1, equation 10 can reduce to equation 4.
Whereas in case 2, it reduces to equation 3.

3. Parameter Estimation
MLE method is used to estimate the unknown
parameters of the developed framework. Since all data
sets used are given in the form of pairs
(ni,xi)(i=1,2,,f), where xi is the cumulative number of
faults detected by ni test cases (0<n1<n2<<nf) and ni
is the accumulated number of test run executed to
detect xi faults.
The likelihood function L for the unknown
parameters with the superposed mean value function is
given as
f

L( parmaters| (ni , xi )) =

[m(ni ) m(ni 1 )]x x

i

( xi xi 1 )!

i =1

(7)

Both a(n) and b(n+1) are number of test cases

dependent functions. An increasing a(n) implies an
increasing total number of faults, and thus reflects fault
generation. Whereas, b(n+1) is an S-shaped curve that
can capture the learning process of the software testers,
and this function is affected by the probability of fault
removal on a failure and they are giving as:
a ( n ) = a (1 + n )

127

i 1

(11)

exp( (m(ni ) m(ni 1 )))

Taking natural logarithm of equation 11 we get

f

ln L = ( xi xi 1 ) ln[m(ni ) m(ni 1 )]
i =1

(12)

{m(ni ) m(ni 1 )} ln[( xi xi 1 )!]

i =1

The MLE of the SRGM parameters can be obtained

to by maximizing L in equation 11 or 12 with respect
to the following constraints: (a,bi,bf>0, 0<p1, 0).

4. Model Validation and Comparison

Criteria
4.1. Model Validation
To check the validity of the proposed discrete time
models to describe the software reliability growth, they
have been tested on four Data Sets (DS) cited from real
software development projects.

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The International Arab Journal of Information Technology, Vol. 6, No. 2, April 2009

The first DS-I was collected from test of a networkmanagement system at AT&T Bell Laboratories, after
it was tested for 20 weeks in which 100 faults were
detected [13]. The second DS-II was collected during
21 days of testing, 46 faults were detected [12]. The
third DS-III was for a radar system of size 124 KLOC
after it was tested for 35 months in which 1301 faults
were detected [2]. The fourth DS-IV had been
collected during 25 days of testing in which 136 faults
were detected [13].

4.2. Comparison Criteria

The performance of an SRGM judged by its ability to
fit the past software reliability data (goodness-of-fit)
and to predict satisfactorily the future behavior from
present and past data (predictive validity) [6, 11].
4.2.1. Goodness of Fit

RPF =

(m ( n

) xi )

(13)

i =1

where f is the number of observations. The lower value

of SSE indicates less fitting error, thus better
goodness-of-fit.
The Akaike Information Criterion (AIC). This
criterion was first proposed as SRGM model
selection tool by [9]. It is defined as:
AIC= -2(value of max. log likelihood function) +
2(number of parameters used in the model)

(16)
xf
where xf is the cumulative number of faults removed
after the execution of the last test run nf and m^(nf), is
the estimated value of the SRGM m(nf), which
determined using the actually observed data up to an
arbitrary test case ne(nf).
If the RPF value is negative/positive the model is
said to underestimate/ overestimate the fault removal
process. A value close to zero indicates more accurate
prediction, thus more confidence in the model. The
value is said to be acceptable if it is within (10%) [6].

5. Data Analysis and Model Comparison

(14)

5.1.1. Goodness of Fit Analysis

Using MLE method, the estimated values of the
proposed basic discrete time model parameters for DSI and DS-II are given in Table 1. According to the
estimated values of the initial and final fault detection
rates (bi and bf), the skill of the test-team does improve
with time in both DS-I and DS-II. That is why the fault
detection/removal process resembles an S-shaped
growth curve in both DS-I and DS-II.
Table 1. Parameters estimations for DS-I and DS-II.
Model

Data
Set

Proposed
Basic

DS-I
DSII

Lower value of AIC indicates more confidence in the

Coefficient of multiple determination (R ). This
measure can be used to investigate whether a
significant trend exists in the observed failure
intensity. This coefficient is defined as the ratio of
the Sum of Squares (SS) resulting from the trend
model to that from a constant model subtracted from
1, that is:
2

residual SS
corrected SS

(15)

R2 measures the percentage of the total variation about

the mean accounted for by the fitted curve. It ranges in
value from 0 to 1. Small values indicate that the model
does not fit the data well [11].

Parameter Estimation
a

bi

bf

111

.0717

.1581

59

.0167

.1550

The fitting of the proposed model to both DS-I and

DS-II are graphically illustrated in Figures 1 and 2
respectively. It is clearly seen from both the figures
that the proposed model fits both DS-I and DS-II
excellently. This highlights it is flexibility.
112

C u m u la tiv e F a u lts

model thus a better fit and predictive validity.

R2 = 1

m ( n f ) x f

5.1. For Basic Discrete Time Model

The Sum of Squared Error (SSE). The difference

between the simulated data m^(ni) and the observed
(reported data) xi is measured by the SSE as,

SSE =

and past failure behaviour [11]. The relative prediction

fault (RPF) is defined as,

84
56
28
0
0

10

15

20

Test Cases (w eeks)

4.2.2. Predictive Validity
Predictive validity is defined as the ability of the model
to determine the future failure behaviour from present

Actual Data

Estimated Values

Figure 1. Goodness of fit (DS-I).

Discrete Time NHPP Models for Software Reliability Growth Phenomenon

about 55% and 50% it underestimates the process in

DS-II.

48
36

0.2

24
0.1

12

RPE

Cumulative Faults

129

0
50%

0
0

14

21

60%

70%

80%

90%

100%

-0.1

Test Cases (months)

A ctual Data

Estimated Values

Testing Progress Ratio

-0.2

Figure 2. Goodness of fit (DS-II).

P redictive Validity Curve

Table 2. Goodness of fit for DS-I.

Parameter
Estimation

Models under
Comparison

Comparison
Criteria

Figure 3. Predictive validity (DS-I).

0.2

0.1

RPE

Comparison of the proposed model and welldocumented discrete time NHPP based SRGMs in
terms of goodness of fit is given in Tables 2 and 3 for
DS-I and DS-II respectively. Note that during the
estimation process of models under comparison it is
observed that the exponential model [17] fails to give
any plausible result as it over estimates the faultcontent and no estimates were obtained for DS-II. It is
clearly seen from both the Tables 2 and 3 that the
proposed model is the best among the models under
comparison in terms of SSE, AIC, and R2 metrics
values, which is very encouraging.

0
50%

60%

70%

80%

90%

-0.1

Testing Progress Ratio

-0.2

P redictive Validity Curve

Figure 4. Predictive validity (DS-II).

It is clearly seen from both Figures 3 and 4 that 55%

of the total test time is sufficient to predict the future
behaviour of the fault removal process reasonably for
DS-I and DS-II.

SSE

AIC

R2

Exponential [17]

130

.0798

232

92

.9857

5.2. For Extended Discrete Time Model

Delayed S-shaped [6]

106

.2165

357

99

.9781

5.2.1. Goodness of Fit Analysis

Proposed Basic

See Table 1.

180

90

.9890

Table 3. Goodness of fit for DS-II.

Parameter
Estimation

Models under
Comparison

a
Exponential [17]
Delayed S-shaped [6]
Proposed Basic

SSE

b
*

84

Comparison
Criteria

.0831

See Table 1.

R2

AIC
*

28

79

.9938

25

77

.9944

Hence, the proposed basic discrete time model fits

better than existing models on both DS-I and DS-II.

100%

Using MLE method, the estimated values of the

proposed extended discrete time model parameters for
DS-III and DS-IV are given in Table 4. According to
the estimated values of the initial and final fault
detection rates (bi and bf), the skill of the test-team
does improve with time in DS-III and in DS-IV does
not. That is why the fault detection process resembles
an S-shaped growth curve in DS-III and an exponential
curve in DS-IV. According to the estimated values of
the fault introduction rate parameter () the fault
detection process (i.e., the debugging process) in DSIII is perfect and no fault introduced during debugging,
whereas in DS-IV was not.
Table 4. Parameters estimations for DS-III & -IV.

5.1.2. Predictive Validity Analysis

DS-I and DS-II are truncated into different proportions
and used to estimate the parameters of the proposed
basic discrete time model. For each truncation, one
value of RPE ratio is obtained.
Figures 3 and 4 graphically illustrate the results of
the predictive validity. It is observed that the predictive
validity of the proposed model varies from one
truncation to another. The RPE ratio of the proposed
model overestimates the fault removal process in DS-I
and DS-II except when the testing progress ratio is

Model
Proposed
Extended

Parameter Estimation

Data
Set

bi

bf

DS-III

1352

.0087

.1832

.9922

DS-IV

156

.1525

.0005

.9965

.0036

The fitting of the proposed model to both DS-III and

DS-IV are graphically illustrated in Figures 5 and 6. It
may be noticed that the relationship between the
cumulative number of faults and the number of test
cases vary from purely exponential to highly S-shaped.
It is clearly seen from both the figures that the

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The International Arab Journal of Information Technology, Vol. 6, No. 2, April 2009

proposed model fits both the DS-III and DS-IV

excellently. This highlights it is flexibility.
Cumulative Faults

1312
984
656
328
0
0

14

21

28

35

Test Cases (months)

A ctual Data

Estimated Values

Figure 5. Goodness of fit for DS-III.

Cumulative Faults

136

5.2.2. Predictive Validity Analysis

DS-III and DS-IV are truncated into different
proportions and used to estimate the parameters of the
proposed extended discrete time model. For each
truncation, one value of RPE ratio is obtained.
Figures 7 and 8 graphically illustrate the results of
the predictive validity. It is observed that the predictive
validity of the proposed model varies from one
truncation to another. The RPE ratio of the proposed
model overestimates the fault removal process in DSIII and DS-IV except when the testing progress ratio is
about 65% and 60% it underestimates the process in
DS-IV.
0.2

102
0.1

RPE

68
34

0
50%

60%

70%

8 0%

90%

100%

-0.1

0
0

10

15

20

25

A ctual Data

Testing Progress Ratio

-0.2

Test Cases (days)

P redictive Validity Curve

Estimated Values

Figure 7. Predictive validity (DS-III).

Figure 6. Goodness of fit (DS-IV).

0.2

Table 5. Goodness of fit for DS-III.

Parameter
Estimation

Models under
Comparison

a
Exponential [17]

Comparison
Criteria
SSE

b
*

Delayed S-shaped [6]

1735

.0814

Proposed Extended

See Table 5.

AIC R2
*
*

107324

518

.9856

7133

342

.9990

Table 6. Goodness of fit for DS-III.

Models under
Comparison

Parameter
Estimation

Comparison
Criteria
R2

SSE

AIC

Exponential [17]

136

.1291

766

119 .9664

Delayed S-shaped [6]

126

.2763

2426

176 .8936

Proposed Extended

See Table 5.

306

116 .9866

0.1

RPE

Comparison of the proposed model and welldocumented discrete time SRGM based on NHPP in
terms of goodness of fit is given in Tables 5 and 6 for
DS-III and DS-IV respectively. Note that during the
estimation process of models under comparison it is
observed that the exponential model [17] fails to give
any plausible result as it over estimates the faultcontent (a) and no estimates were obtained for DS-III.
It is clearly seen from both the Tables 5 and 6 that the
proposed model is the best among the models under
comparison in terms of SSE, AIC, and R2 metrics
values, which is very encouraging. Hence, the
proposed extended discrete time model fits better than
existing models on both DS-III and DS-IV.

0
50%

60%

70%

80%

90%

100%

-0.1

Testing Progress Ratio

-0.2

P redictive Validity Curve

Figure 8. Predictive validity (DS-IV).

It is clearly seen from both Figures 7 and 8 that 50%

of the total test time is sufficient to predict the future
behaviour of the fault removal process reasonably for
DS-III and DS-IV.

6. Conclusion
In this paper, newly developed discrete time SRGM
based on NHPP to describe a variety of reliability
growth and the increased skill (efficiency) of the
testing team or a modification of the testing strategy
during testing phase, are proposed.
The proposed discrete time models have been
validated and evaluated on actual software reliability
data cited from real software development projects and
compared with existing discrete time NHPP based
models. The results are encouraging in terms of
goodness of fit and predictive validity due to their
applicability and flexibility. Hence, we conclude that

Discrete Time NHPP Models for Software Reliability Growth Phenomenon

the two proposed discrete time models not only fit the
past well but also predict the future reasonably well.

Acknowledgements
I take this opportunity to thank Prof. P. K. Kapur, Dr.
A. K Bardhan, and Dr. P. C. Jha of Delhi University
for their support every moment I sought. The
suggestion, comments, and criticisms of these people
have greatly improved this manuscript.

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Omar Shatnawi received his PhD,

in computer science and his MSc in
operational
research
from
University of delhi in 2004 and
1999, respectively. Currently, he is
head of Department of Information
Systems at al-Bayt University. His
research interests are in software engineering, with an
emphasis on improving software reliability and
dependability.