Calculation of Frequency-Dependent Impedance For Conductors of Rectangular Cross Section
Calculation of Frequency-Dependent Impedance For Conductors of Rectangular Cross Section
Frequency-Dependent
Impedance for
Conductors of
Rectangular
Cross Section
Alexander W. Barr
AMP Incorporated
ABSTRACT
Knowledge of the resistance and self-inductance of a
contact as well as the mutual inductance between
contacts is often necessary in determining the highspeed performance of connectors. Many of these connectors contain pins with rectangular cross sections.
Such geometries cannot be easily handled through
analytical techniques. This paper presents a numerical technique where the conductor cross sections are
broken into subconductors and the frequency-dependent current amplitude in each subconductor is found
by solving a system of equations relating the resistances, self-inductances, and mutual inductances of
all the subconductors. Once the currents in the sub
conductors are known, they are used to compute the
frequency-dependent resistance and self-inductance
of an individual conductor and the effective resistance and inductance of a conductor pair. Also the
currents of the subconductors are graphed to give a
discretized representation of the current density in
the conductors.
INTRODUCTION
Spiraling advances in electronic technology are placing an
ever increasing burden on connector manufacturers. With
computer clock frequencies doubling every few years and
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Once calculations have been completed to find the resistance and self-inductance of the subconductors as well as
the mutual inductances between all the subconductors, a
system of equations can be constructed to determine the
subconductor currents.
The laws of electromagnetic dictate that the voltage drop
across the length of a conductor is the same regardless of
where, in the conductor cross section, the current travels.
where v = 2nf. A similar expression can be developed for each of the subconductors, creating a system of N equations in N
unknowns where the unknowns are the subconductor currents:
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where R1 and R2 are the resistances for the subconductors in posts 1 and 2, and L1 and L2 are the self-inductances of subconductors in post 1 and post 2.
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Since the voltage and current across each of the posts is now
known, the impedance for each member of the coupled pair
can be found:
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Both equations (18) and (19) are in terms of the Ber and Bei
Bessel functions where
ness (0.01415 inch) and twice the width (0.0566 inch) of the
square post. This rectangular post possesses the same crosssectional area as the wire and square post. The data for the
rectangular post are consistent with expectations. Both the
resistance and self-inductance should be slightly lower than
the square post. In the graphs the subscripts mean the following: w = wire, s = square post, and r = rectangular post.
Table 1
where all dimensions are in meters. At dc the internal inductance for a round wire is 50 nH/m or 1.27 nH/inch. Subtracting this value from equation (20) yields the external
inductance for the wire. Adding the external inductance
value to the result from equation (19) furnishes the selfinductance for the wire sample at the chosen frequency.
To compute the impedance of the post, a C program called
Post_L was written. Given T, W, ~, NT, Nw, and f, Post_L
computes the frequency-dependent impedance of a post
using the previously described method. As with any finite
approximation method, the greater the number of subconductors in the model, the better the approximation. For this
study, Post_L was written and executed on an MS-DOSbased machine. Memory limitations allowed the square post
to be divided into an array of subconductors no larger than
14 by 14. It will be seen that further subdivision is necessary
to maintain model accuracy at high frequencies.
Table 1 shows the impedance values for the 20 AWG wire
and 0.0283-inch-square post.
As expected the resistance and self-inductance values are
nearly identical below 50 kHz. This observation is anticipated because below 50 kHz, the skin effect has not yet developed significantly. Consequently, the resistances should be
the same while a-minor difference in self-inductance is
found due to the difference in cross-sectional geometry. In
the range from 50 kHz to 1 MHz the resistance of the post
rises above that for the wire. Across this same frequency
range, the self-inductance of the post decreases slightly
faster than the wire. Both results were predicted.
The graphs in Figures 3 and 4 illustrate the resistance and
self-inductance data for the wire and square post. Also
included are data for a rectangular post with half the thick-
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Table 2 displays the data collected using Ansoft and 2CondMut at each frequency, while Figures 6 and 7 display graphs
of the same values:
Table 2
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inside edges. This distribution is a result of the strong negative mutual inductance occurring between the posts. If the
currents had been in the same direction, the greatest density
would have been located at the outer edges. The figure also
illustrates the influence of the skin effectthe current concentrates at the post perimeter, particularly at the comers.
Clearly, the observed current density is dictated by the combined influence of the mutual inductance between the posts
and the skin effect.
CONCLUSION
Two methods have been described for computing the
impedance of conducting posts with rectangular cross sections. The first method, intended for computing the resistance and self-inductance of an isolated post, divides the
post into subconductors and constructs a matrix equation
based on the voltage drop across the post. The second
method analyzes the combined impedance of two posts
experiencing mutual coupling. This later technique is not
only based on a uniform voltage drop across each post, but
must also satisfy the requirement of providing identical current magnitudes in each post.
Comparison of the results of these techniques with other
benchmarks revealed accurate correlation. The expectations
for marginally higher resistance and slightly lower selfinductance were realized for the single post when compared
to a round wire of identical cross-sectional area. Computational accuracy was found to be sensitive to the number of
subconductors spanning the skin depth. Because this condition affects the frequency range over which a given size
model can be accurately used, a reduced frequency range
was applied to the two-post problem. Comparison between
Ansofts finite element solution for this problem and the
previously described algorithm revealed agreement within a
few percent across the frequency range. It was postulated
that some of the observed discrepancy may be due to Ansoft
assuming infinite lengths for the conductors and not
accounting for end effects.
Because of the generality of these calculations, it is interesting to note that no constraint exists barring the application
of these techniques to conductors of arbitrary cross sections.
Furthermore, the technique applied to the coupled post prob-
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REFERENCES
1. B.E. Keiser, Principles of Electromagnetic Compatibili[y (Artech House Inc., Dedaham, Massachusetts,
1979), p. 102, equation (5.4).
2. F.W. Grover, Inductance Calculations, Working Formulas, and Tables (Dover Publications, New York,
1946).
3. W.N. Press, B.P. Flannery, S.A. Teukolsky, and W.T.
Vetterling, Numerical Recipes in C, The Art of Scientific Computing (Cambridge University Press, New York,
1989), pp. 39-45.
4. S. Ramo, J.R. Whinnery, and T. Van Duzer, Fields and
Waves in Communication Electronics (John Wiley &
Sons, New York, 1984), pp. 178-182.
5. P. Lorrain and D.R. Corson, Electromagnetic Fields
and Wave.s (W. H. Freeman and Company, San Francisco, I 970).
6. W.T. Weeks, L.L. Wu, M.F. McAllister, and A. Singh,
Resistive and Inductive Skin Effect in Rectangular
Conductors, IBM J. Res. Dev. 23(6), 652-660(1979).
Alexander W. Barr is a Development Engineer in the
Technology Group at AMP Incorporated in Harrisburg,
Pennsylvania.
Mr. Barr received a B.A. in physics from Franklin & Marshall College in Lancaster, Pennsylvania, and is currently
pursuing an M.S. in electrical engineering from the Pennsylvania State University. Since joining AMP in 1984, he
has been responsible for analyzing the electrical performance of connectors, contacts, and related devices through
computer modeling, time-domain reflectometry, and
microwave measurements.