Passives
Passives
Elad Alon
Dept. of EECS
Todays Lecture
EE240 CMOS Technology
Passive devices
Motivation
Resistors
Capacitors
(Inductors)
EECS240
Lecture 2
EE240 Process
90nm 1P7M CMOS
Lecture 2
Process Options
Available for many processes
Add features to baseline process
E.g.
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Lecture 2
p- substrate
p+ diffusion
Poly
n- well
n+ diffusion
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Lecture 2
Dimensions
EECS240
Lecture 2
EECS240
Lecture 2
Resistors
No provisions in standard CMOS
Resistors are bad for digital circuits
Minimized in standard CMOS
But, often want big, well-controlled R for
analog
Sheet resistance of available layers:
Layer
Sheet resistance
Aluminum
Polysilicon
N+/P+ diffusion
N-well
EECS240
60 m/
5 /
5 /
1 k/
Lecture 2
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Lecture 2
R/
[/ ]
100
180
50
100
1000
TC [ppm/oC]
@ T = 25 oC
VC [ppm/V]
-800
200
1500
1600
-1500
50
50
500
500
20,000
BC [ppm/V]
50
50
-500
-500
30,000
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10
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11
Voltage Dependence
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12
Voltage Coefficient
-
p substrate
p diffusion
n- well
n+ diffusion
V1
Example:
Diffusion resistor
V2
Applied voltage
modulates depletion
width
(cross-section of
conductive channel)
VB
V + V2
Ro 1 + TC (T 25o ) + VC (V1 V2 ) + BC 1
VB
2
R=
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Compensation
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Resistor Matching
Types of mismatch:
Run-to-run variations
Global differences in thickness, doping, etc.
Systematic (e.g. contacts)
Random variations between devices
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Lecture 2
15
2R?
R
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16
R1 : R2 = 1 : 2
gradient
Dummy
0.5 * R2 + R
R1
0.5 * R2 - R
Dummy
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MOSFETs as Resistors
Triode region (square law):
I D = Cox
W
V
VGS VTH DS VDS
L
2
1
W
Cox (VGS VTH )
L
Voltage coefficient:
VC =
1 R
1
=
R VDS VGS VTH VDS
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Lecture 2
19
MOS Resistors
Example: R = 1 M
1
W
Cox (VGS VTH )
L
1
W
=
L Cox R (VGS VTH )
=
100
VC V
DS
= 0V
=
=
EECS240
VGS
1
1
=
A
200
1
M
2
V
V2
1
VTH
1
= 0.5V 1
2V
Applications:
MOSFET-C filters: (linearization)
Ref: Tsividis et al, ContinuousTime MOSFET-C Filters in VLSI,
JSSC, pp. 15-30, Feb. 1986.
Biasing: (>1G)
Ref: Geen et al, Single-Chip
Surface-Micromachined Integrated
Gyroscope with 50o/hour Root Allen
Variance, ISSCC, pp. 426-7, Feb.
2002.
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20
Resistor Summary
No or limited support in standard CMOS
Large area (compared to FETs)
Nonidealities:
Large run-to-run variations
Temperature coefficient
Voltage coefficients (nonlinear)
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21
Capacitors
Simplest capacitor:
substrate
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Lecture 2
22
Capacitors
Improved capacitor:
substrate
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Lecture 2
23
Capacitor Options
Type
C [aF/m2]
VC [ppm/V]
TC
[ppm/oC]
Gate
10,000
Huge
Big
1000
10
25
Metal-metal
50
20
30
Metal-substrate
30
Metal-poly
50
Big
Big
Poly-poly
(option)
Poly-substrate
120
Junction caps
~ 1000
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Lecture 2
24
MOS Capacitor
High non-linearity,
temperature coefficient
But, still useful in many
applications, e.g.:
(Miller) compensation
capacitor
Bypass capacitor
(supply, bias)
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Lecture 2
25
Capacitor Layout
Unit elements
Shields:
Etching
Fringing fields
Common-centroid
Wiring and interconnect
parasitics
Ref.: Y. Tsividis, Mixed Analog-Digital VLSI Design
and Technology, McGraw-Hill, 1996.
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MIM Capacitors
Some processes have MIM cap as add-on option
Separation between metals is much thinner
Higher density
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Capacitor Geometries
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MOM Capacitors
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29
Reasonably good
matching and accuracy
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30
Distributed Effects
Can model IC resistors as
distributed RC circuits.
Could use transmission line
analysis to find equivalent
2-port parameters.
Inductance negligible for
small IC structures up to
~10GHz.
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Lecture 2
31
Effective Resistance
Lecture 2
32
Capacitor Q
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Lecture 2
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35
Spiral Inductors
Lecture 2
36