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I. Mosfet Circuit Models A. Large Signal Model - Nmos: Vgs VTN Id Vgs VTN Vds Vgs VTN

The document summarizes MOSFET circuit models including: 1. Large signal and small signal models are introduced, with the small signal model derived from a Taylor expansion of the large signal model around the operating point. 2. Key aspects of the small signal model are described, including transconductance (gm), output conductance (go), and backgate transconductance (gmb). 3. At high frequencies, terminal capacitances including gate-source (Cgs), gate-drain (Cgd), gate-bulk (Cgb), drain-bulk (Cdb), and source-bulk (Csb) are included.

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0% found this document useful (0 votes)
89 views10 pages

I. Mosfet Circuit Models A. Large Signal Model - Nmos: Vgs VTN Id Vgs VTN Vds Vgs VTN

The document summarizes MOSFET circuit models including: 1. Large signal and small signal models are introduced, with the small signal model derived from a Taylor expansion of the large signal model around the operating point. 2. Key aspects of the small signal model are described, including transconductance (gm), output conductance (go), and backgate transconductance (gmb). 3. At high frequencies, terminal capacitances including gate-source (Cgs), gate-drain (Cgd), gate-bulk (Cgb), drain-bulk (Cdb), and source-bulk (Csb) are included.

Uploaded by

manohar487
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© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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I.

MOSFET Circuit Models


A. Large Signal Model - NMOS
Cutoff: (VGS VTn)-----> ID = 0
Triode: (VGS VTn and VDS VGS - VTn)

= C ( W L) V
V V
2 V 1 + V
n ox
GS
Tn DS DS
n DS

CLM term added to ensure continuous curve for ID vs. VDS


Saturation: (VGS VTn and VDS VGS - VTn)

2
V 1+ V
= ( 1 2) C ( W L) V
D
n ox
Tn
n DS
GS

B. Backgate Effect
The threshold voltage is a function of the bulk-to-source voltage
V Tn = V TOn + n V BS 2 p 2 p
where VTOn is the threshold voltage with VBS = 0
n is the backgate effect parameter
n = 2q s N a C ox

EECS 6.012 Spring 1998


Lecture 10

II. MOSFET Small-Signal Model


A. Small Signal Modelling Concepts
Find an equivalent circuit which relates the incremental changes in
iD, vGS, vDS, etc.
Since the changes are small, the small-signal equivalent circuit has
linear elements only (e.g., capacitors, resistors, controlled sources)
Mathamatically we perform a Taylor expansion around the DC
operating point (also called the quiescent point or Q point) defined
by the DC voltages Q(VGS, VDS, VBS):
The total drain current in saturation:
iD = (1/2) n Cox (W/L) (vGS - VTn )2 (1 + nvDS) = iD(vGS, vDS, vBS)
where vGS = VGS + vgs , iD = ID + id
We want to find id = (?) vgs
2

i D

1 iD
( v gs ) + --iD = I D +
v GS
2 2
v GS
Q

( v gs ) +
Q

If the small-signal voltage is really small, then we can neglect everything past the
linear term -i D
iD = I D +
( v gs ) = I D + g m v gs
v GS
Q

where the partial derivative is defined as the transconductance, gm.

EECS 6.012 Spring 1998


Lecture 10

B. Transconductance
The small-signal drain current due to vgs is therefore given by
id = gm vgs.

iD = ID + id

D
G

vgs

_
+

VDS = 3 V

VGS = 3 V_

iD
(A)
400
ID + id

300

ID

200

id = gmvgs

VGS + vgs

id
Q

100

VGS

VDS
1

vDS (V)

EECS 6.012 Spring 1998


Lecture 10

C. Quantifying Transconductance
Evaluating the partial derivative:
W
g m = n C ox ----- ( V GS V Tn ) ( 1 + n V DS )
L
We neglect the effect of CLM when calculating the transconductance
so that gm in terms of VGS becomes
W
g m = n C ox ----- ( V GS V Tn )
L
In many circuits we want an expression for gm in terms of the DC
drain current

gm =

W
2 n C ox ----- I D
L

For typical values (W/L) = 10, ID = 100 A, and nCox = 50 AV-2


we find that gm = 320 AV-1 = 0.32 mS
The circuit which expresses id = gm vgs
id

gate
+
vgs

drain
gmvgs

_ source

EECS 6.012 Spring 1998


Lecture 10

D. Output Conductance
iD
(A)
400
ID + id
ID

id = govds

id

300

VGS , VBS

200

vds

100

VDS VDS + vds


1

VDS (V)

The change in drain current due to an incremental change in the


drain-source voltage is:
i D
2
1
W
g o = ------------ = --- n C ox ----- ( V GS V T ) n n I D
2
L
v
DS

The output resistance is the inverse of the output conductance


1
1
r o = ----- = -----------go
n I D
The small-signal circuit model with ro added looks like:
id = gm vgs + (1/ro)vds
gate

drain

+
vgs
_ source

gmvgs

id
ro

+
vds
_

EECS 6.012 Spring 1998


Lecture 10

E. Backgate Transconductance
iD
(A)
400
ID + id

300

ID

200

VGS , VBS + vbs

id = gmbvbs

id

100

VGS , VBS

VDS
1

VDS (V)

The change in drain current due to an incremental change in the


backgate bias is found using the by the chain rule:
i D V Tn
i D
g mb = ------------ = ------------ -----------V Tn v BS
v BS
Q

i D
-----------V Tn

W
= n C ox ----- ( V GS V Tn ) ( 1 + n V DS ) g m
L
Q

V Tn
g mb = ( g m ) -----------v BS

n
n gm

= ( g m ) ------------------------------------ = -----------------------------------2 2 p V BS
2 2 p V BS

EECS 6.012 Spring 1998


Lecture 10

E. Backgate Transconductance (cont)


The ratio of the backgate transconductance gmb to the front-gate
transconductance gm to is:
2q s N
C b(y=0)
q s N a
g mb
1
a
--------- = ---------------------------------------------- = --------- --------------------------------------- = -------------------C ox 2 ( 2 p V BS )
gm
C ox
2C ox 2 p V BS
where Cb (y=0) is the depletion capacitance -gate
source

channel
Cb(0)

depletion
region

bulk

F. MOSFET Small Signal Model at Low Frequency


id
gate

drain
+
vgs

_
source _

+
gmvgs

gmbvbs

ro

vds
_
source

vbs
+
bulk

EECS 6.012 Spring 1998


Lecture 10




,,

III. MOSFET Small Signal Model at High Frequency


A. Terminal Capacitances
fringe electric
field lines

gate

drain

,,,
,

,,
,,,

source

n+

n+
Csb

qN (vGS)

depletion
region

Cdb

overlap LD

overlap LD

Cgs - Overlap capacitanceCov + Channel charge


Cgd - Overlap capacitanceCov only
Cgb - Only parasitic since bulk charge does not change
Cdb - Drain depletion charge
Csb - Source depletion charge

Cgd

gate

id

drain

vgs

Cgs

Cgb

gmvgs

gmbvbs

ro

_ source
_
Csb

vbs

Cdb

+
bulk

EECS 6.012 Spring 1998


Lecture 10

B. Channel Charge
L

q (v ) = W C v
V v (y) dy
N GS
ox GS
Tn C
0

Recalling that current is related to the electric field


W C ox n
dy = ---------------------- v
V v dv
Tn C C
GS
i

D
W 2 C 2 v GS V Tn
2

n ox

q (v ) = --------------------------
v

v
dv

N GS
GS
Tn C C
i

D
0

2
q (v ) = --- WLC v
V
N GS
ox GS
Tn
3

Note bulk Charge is constant with vGS so the channel charge


component of Cgs is given by
q (v ) = q (v ) q
G GS
N GS
B, max

In saturation the drain has no control over the channel charge so only
Cgs has a channel charge component given by

dq
G
-------------dv
GS

2
= --- WLC
ox
3
V

GS

EECS 6.012 Spring 1998


Lecture 10

C. Parasitic Capacitance from Source & Drain Depletion


Regions
The drain n and p regions have depletion regions whose stored
charge changes during the transient.
Depletion qJ(vD) is non-linear --> take the worst case and use the
zero-bias capacitance Cjo as a linear charge-storage element during
the transient.
Perimeter of the drain diffusion is also important and must be
included in the calculation as a capacitance/length x perimeter of
diffusion:
Area of drain diffusion:
gate contact

Adiff = W Ldiff

gate
interconnect

Perimeter of drain diffusion:


P = W + 2 Ldiff
(side next to gate
isnt counted)

n+ polysilicon gate

source contacts

source
interconnect

drain
interconnect
Ldiff

EECS 6.012 Spring 1998


Lecture 10

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