Diagnostics Guide

The sections in this guide provide the following information: Overview of the Diagnostics Guide gives a high-level overview of what diagnostics are available for your NetApp storage systems and gives some examples of when to run them. Running Diagnostics describes the Diagnostic Monitor and how to run diagnostics on your system. Diagnostics Menus lists and defines the menu options of the Diagnostic Monitor's individual diagnostic tests. Error Messages defines the coding conventions used, lists and defines the error messages generated by the diagnostic tests, and recommends the corrective action to address errors you encounter. Environmental Error Messages lists and defines the environmental error messages generated when you run the environmental status test in the miscellaneous motherboard test menu. The error messages are listed according to the platform in which the motherboard and any related daughterboard resides and are described according to the type of sensor that is reporting the error condition. This section also recommends the corrective action to address errors you encounter.
Part Number: 215-06426_A0 ur002 Last updated: December 10, 2012

Legal Information
This section describes the following topics: Copyright Trademarks Support note Communications regulations

[Up] [Trademarks] [Copyright] [Supportnote] [Communicationsregulations]

Copyright
Copyright 1994-2012 NetApp, Inc. All rights reserved. Printed in the U.S.A. No part of this document covered by copyright may be reproduced in any form or by any means graphic, electronic, or mechanical, including photocopying, recording, taping, or storage in an electronic retrieval systemwithout prior written permission of the copyright owner. Software derived from copyrighted NetApp material is subject to the following license and disclaimer: THIS SOFTWARE IS PROVIDED BY NETAPP AS IS AND WITHOUT ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE, WHICH ARE HEREBY DISCLAIMED. IN NO EVENT SHALL NETAPP BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE. NetApp reserves the right to change any products described herein at any time, and without notice. NetApp assumes no responsibility or liability arising from the use of products described herein, except as expressly agreed to in writing by NetApp. The use or purchase of this product does not convey a license under any patent rights, trademark rights, or any other intellectual property rights of NetApp. The product described in this manual may be protected by one or more U.S.A. patents, foreign patents, or pending applications. RESTRICTED RIGHTS LEGEND: Use, duplication, or disclosure by the government is subject to restrictions as set forth in subparagraph (c)(1)(ii) of the Rights in Technical Data and Computer Software clause at DFARS 252.2777103 (October 1988) and FAR 52-227-19 (June 1987).

[Up] [Trademarks] [Copyright] [Supportnote] [Communicationsregulations]

Trademarks
NetApp, the NetApp logo, Network Appliance, the Network Appliance logo, Akorri, ApplianceWatch, ASUP, AutoSupport, BalancePoint, BalancePoint Predictor, Bycast, Campaign Express, ComplianceClock, Cryptainer, CryptoShred, Data ONTAP, DataFabric, DataFort, Decru, Decru DataFort, DenseStak, Engenio, Engenio logo, EStack, FAServer, FastStak, FilerView, FlexCache, FlexClone, FlexPod, FlexScale, FlexShare, FlexSuite, FlexVol, FPolicy, GetSuccessful, gFiler, Go further, faster, Imagine Virtually Anything, Lifetime Key Management, LockVault, Manage ONTAP, MetroCluster, MultiStore, NearStore, NetCache, NOW (NetApp on the Web), Onaro, OnCommand, ONTAPI, OpenKey, PerformanceStak, RAID-DP, ReplicatorX, SANscreen, SANshare, SANtricity, SecureAdmin, SecureShare, Select, Service Builder, Shadow Tape, Simplicity, Simulate ONTAP, SnapCopy, SnapDirector, SnapDrive, SnapFilter, SnapLock, SnapManager, SnapMigrator, SnapMirror, SnapMover, SnapProtect, SnapRestore, Snapshot, SnapSuite, SnapValidator, SnapVault, StorageGRID, StoreVault, the StoreVault logo, SyncMirror, Tech OnTap, The evolution of storage, Topio, vFiler, VFM, Virtual File Manager, VPolicy, WAFL, Web Filer, and XBB are trademarks or registered trademarks of NetApp, Inc. in the United States, other countries, or both. IBM, the IBM logo, and ibm.com are trademarks or registered trademarks of International Business Machines Corporation in the United States, other countries, or both. A complete and current list of other IBM trademarks is available on the Web at www.ibm.com/legal/copytrade.shtml. Apple is a registered trademark and QuickTime is a trademark of Apple, Inc. in theUnited States and/or other countries. Microsoft is a registered trademark and Windows Media is a trademark of Microsoft Corporation in theUnited States and/or other countries. RealAudio, RealNetworks, RealPlayer, RealSystem, RealText, and RealVideo are registered trademarks and RealMedia, RealProxy, and SureStream are trademarks of RealNetworks, Inc. in theUnited States and/or other countries. All other brands or products are trademarks or registered trademarks of their respective holders and should be treated as such. NetApp, Inc. is a licensee of the CompactFlash and CF Logo trademarks. NetApp, Inc. NetCache is certified RealSystem compatible.

[Up] [Trademarks] [Copyright] [Supportnote] [Communicationsregulations]

Support note
Microsoft has not established a commitment to support SnapManager for Exchange and storage systems used in an Exchange configuration. There can be no assurance that Microsoft will provide support for this usage. NetApp supports SnapManager for Exchange and NetApp storage systems used in an Exchange environment and has invested resources in third-party programs to provide the highest quality support possible to our customers.

[Up] [Trademarks] [Copyright] [Supportnote] [Communicationsregulations]

Communications regulations
FCC notices (U.S. only)
NetApp devices are designed for a CFR 47 (Code Federal Regulations) Part 15 Class A environment. The FCC and NetApp guarantee the users rights to operate this equipment only if the user complies with the following rules and regulations: Install and operate this equipment in accordance with the specifications and instructions in this guide. Modify this equipment only in the ways specified by NetApp. Use shielded cables with metallic RFI/EMI connector hoods to maintain compliance with applicable emissions standards. If the system has nine or more Fibre Channel disk shelves, install the system in two or three NetApp System Cabinets to maintain performance within Part 15 of CFR 47 regulations.

Compliance with Part 15 of CFR 47

This equipment has been tested and found compliant with Part 15 of the CFR 47 rules for Class A digital devices. These rules are designed to provide reasonable protection from interference to electronics equipment operated in a commercial environment. Operation of this device is subject to the following two conditions: This device cannot cause harmful interference. This device must accept any interference received, including interference that may cause undesired operation.

Compliance with ICES-003

This Class A digital apparatus complies with Canadian ICES-003. Cet appareil numrique de la classe A conforme la norme NMB-003 du Canada.

Compliance with EN regulations

Marking by the symbol indicates compliance of this NetApp device to the EMC Directive and the Low Voltage Directive of the European Union. Such marking is indicative that this NetApp device meets technical standards. This is a Class A product. In a domestic environment this product may cause radio interference, in which case the user may be required to take adequate measures.

Bureau of Standards, Metrology, and Inspections notice (BSMI, Taiwan only)

Translation of the BSMI notice: Warning: This is a Class A product. In a domestic environment this product may cause radio interference, in which case the user may be required to take adequate measures.

Voluntary Control Council for Interference by Information Technology Equipment (VCCI, Japan)

Translation of the VCCI-A notice: This is a Class A product based on the standard of the Voluntary Control Council for Interference by Information Technology Equipment (VCCI). If this equipment is used in a domestic environment, radio disturbance may arise. If such trouble occurs, the user may be required to take corrective actions.

Contact Information
NetApp, Inc. 495 East Java Drive Sunnyvale, CA 94089 Telephone: +1 (408) 822-6000 Fax: +1 (408) 822-4501 Support telephone: +1 (888) 4-NETAPP Documentation comments: [email protected] Information Web: http://www.netapp.com

Preface
About this guide
This document describes how to boot and operate the diagnostics available for NetApp storage systems.

Audience
This guide is for qualified system administrators and service personnel who are familiar with NetApp storage systems. The procedures in this guide describe replacement, upgrade, and maintenance tasks for personnel with the following skills and experience: Working familiarity with small computer system hardware and operation Basic understanding of common networking concepts and practices Working familiarity with accepted tools and procedures for installing and operating sensitive electronic equipment

Command conventions
You can enter storage system commands on the system console or from any client that can obtain access to the storage system using Telnet. This guide uses the command syntax and output of SunOS 4.1x in examples of commands run on a UNIX workstation. If you use a different version of UNIX, the command syntax and output might be different.

Formatting conventions
The following table lists different character formats used in this guide to offset special information: Formatting convention Italic type Type of information Words or characters that require special attention. Placeholders for information you must supply. For example, if the guide requires you to enter the fctest adaptername command, you enter the characters "fctest" followed by the actual name of the adapter. Man page names. Book titles in cross-references. font Command and daemon names. Information displayed on the system console or other computer monitors. Contents of files. font Words or characters you type. What you type is always shown in lowercase letters, unless your program is case-sensitive and uppercase letters are necessary for it to work properly.

Monospaced

Bold monospaced

Keyboard conventions
This guide uses capitalization and some abbreviations to refer to the keys on the keyboard. The keys on your keyboard

might not be labeled exactly as they are in this guide: What is in this guide... hyphen (-) What it means... Used to separate individual keys. For example Ctrl-D means holding down the Ctrl key while pressing the D key. Enter type enter Used to refer to the key that generates a carriage return, although the key is named Return on some keyboards. Used to mean pressing one or more keys on the keyboard. Used to mean pressing one or more keys and then pressing the Enter key.

Special messages
This guide contains special messages that are described as follows: Note A note contains important information that helps you install or operate the system efficiently. Caution A caution contains instructions that you must follow to avoid damage to the equipment, a system crash, or loss of data. WARNING A warning contains instructions that you must follow to avoid personal injury.

Release history
For release information and history, see the NetApp Support site at http://support.netapp.com/.

Safety Information (Sicherheitshinweise)

Safety Rules
All products are Class 1 laser devices. You must follow these safety rules when working with this equipment: WARNING: Failure to follow these directions could result in bodily harm or loss of life. When installing disk shelves and a storage system into a movable cabinet or rack, install from the bottom up for best stability. DC-based systems must be installed in a restricted access location and the two input power terminals for the DC power supply must be connected to separate isolated branch circuits. To reduce the risk of personal injury or equipment damage, allow internal components time to cool before touching them and ensure that the equipment is properly supported or braced when installing options. This equipment is designed for connection to a grounded outlet. The grounding type plug is an important safety feature. To avoid the risk of electrical shock or damage to the equipment, do not disable this feature. This equipment has one or more replaceable batteries. There is danger of explosion if the battery is incorrectly replaced. Replace the battery only with the same or equivalent type recommended by the manufacturer. Dispose of used batteries according to the manufacturers instructions.

Warning for units with two power supplies

If your storage system or disk shelf has multiple power cords and you need to turn the unit off, heed the following warning: WARNING: This unit has more than one power supply cord. To reduce the risk of electrical shock, disconnect all power supply cords before servicing.

Sicherheitsvorgaben
Alle Produkte sind Lasergerte der Klasse 1. Die folgenden Sicherheitshinweise sind beim Betreiben des Gerts unbedingt zu beachten: VORSICHT: Nichtbeachtung dieser Anweisungen kann zu schweren Krperschden fhren oder tdlich sein. Bei der Montage der Diskettenregale und Archivierungsgerte, des NetCache -Gerts oder des NearStore Systems in bewegliche Schrnke oder Regale sind die Gerte von unten nach oben einzubauen, um optimale Stabilitt zu gewhrleisten. Gleichstrom-Systeme mssen an Betriebsstaette mit beschraenktem Zutritt installiert sein und die beiden Eingangsstromklemmen fr das Gleichstrom-Netzteil mssen an separate und isolierte Abzweigleitungen angeschlossen sein. Zum Schutz vor Krperverletzung oder Sachschden am Gert lassen Sie die inneren Bauteile stets vor dem Berhren abkhlen. Sorgen Sie dafr, dass das Gert richtig abgesttzt ist oder fest aufrecht steht, bevor Sie

neues Zubehr einbauen. Dieses Gert ist fr die Einspeisung aus einer geerdeten Netzverbindung ausgelegt. Der Netzstecker mit Erdungsvorrichtung ist ein wichtiger Sicherheitsschutz. Zum Schutz vor elektrischem Schlag oder Sachschden am Gert die Erdung nicht abschalten. Das Gert ist mit einer oder mehreren auswechselbaren Batterien ausgestattet. Bei unsachgemem Auswechseln der Batterie besteht Explosionsgefahr. Batterien nur mit dem vom Hersteller empfohlenen Typ oder entsprechenden Typen ersetzen. Gebrauchte Batterien sind gem den Anweisungen des Herstellers zu entsorgen.

Warnhinweis fr Gerte mit mehr-fachen Netzan-schlussleitungen

Sollte Ihr Archiviergert, NetCache-Gert, NearStore-Gert oder Diskettenregal mehrfache Netzanschlussleitungen aufweisen und Sie wollen das Gert abschalten, bitte folgenden Warnhinweis beachten. ACHTUNG: Gert besitzt zwei Netzanschlussleitungen. Vor Wartung alle Anschlsse vom Netz trennen.

Overview of the Diagnostics Guide

This section gives a high-level overview of what diagnostics are and gives some examples of when to run them. This section discusses the following topics: About diagnostics Optional materials Booting the diagnostics program

About diagnostics
The Diagnostic Monitor
The Diagnostic Monitor is a set of diagnostics tools and tests that is used to search for and determine hardware problems. It is used as part of system troubleshooting to help isolate and identify a faulty component or to confirm that a specific component is operating properly.

When to run diagnostics

Typically, you run diagnostics after one of the following events happens on your system: System panic is caused by an unidentified hardware failure Access to a specific device becomes intermittent or the device becomes unavailable System response time becomes sluggish The following scenarios are examples of when you might run diagnostics: After the initial hardware installation When you install your system for the first time, before you boot it, you can check the hardware components by running the all diagnostic. If any problems exist at the hardware level, you can learn about them before you boot the system and connect it to the network. When the system fails When the system fails, test the system by first running the all diagnostic and then running individual diagnostics to isolate the cause of the failure. When adding or replacing hardware Before you add new hardware to your system, verify that the version of the Diagnostic Monitor you have in your system supports the new hardware -- the notes in the download site applicable to your platform will provide some information on this. When you add new hardware, such as disk shelves, or change hardware components, before you boot the system, run individual diagnostics, such as fcal , to make sure that the disk shelf connections are sound. When you replace a suspect component, run an individual diagnostic on the new component to check it before you boot the system. If the problem persists, it is not caused by the suspect component, but lies somewhere else. If you suspect a problem in a specific hardware area For example, you observed a lot of error messages of a specific type that point to a problem with the FC-AL connection. This should lead you to run the fcal comprehensive diagnostic while the system is running. If the system passes all tests except for the two tests that require a loopback plug, you might disconnect the system at an appropriate time and run the Loop integrity and Read-only bus tests in extended mode. Another example is a CPU fan error causing Data ONTAP software to panic and shut down the system. When you examine the fan and see that it is spinning, a specific test of the fan might show that the fan is not spinning at the right

speed. Replacing the CPU fan should solve the problem.

Optional materials
Optional tools and equipment
You might need the following tools and equipment to run diagnostics, if you plan on correcting any system or component problems you might find: Tools and equipment #1 and #2 Phillips screwdriver Loopback plugs Antistatic wrist strap and grounding leash Where needed Opening the storage system, removing cabinet components, and replacing cards and adapters in the system. Needed by some diagnostic tests that run in extended mode. The plugs close data transmission loops of some system cards, such as Ethernet cards. Make sure that you have the appropriate loopback plugs for the specific card or adapter. Used for grounding yourself during equipment replacement.

Reference guides
You might need the following supporting guides to assist you in replacing system components: Manuals Appropriate hardware, hardware service guide, or field service guide for your storage system. Reasons These guides contain information for installing or replacing components in your storage system.

Booting the diagnostics program

To boot the diagnostics program, complete the following steps: Step Action 1 Turn off power to the system if it is on. The switch for each power supply is located on the back. You should be in one of the following situations: The system failed due to a hardware or software error. The system is down briefly for hardware maintenance, such as replacing a component or adding a disk shelf. You installed the system for the first time and are ready to turn on the power source and automatically boot the system. 2 Turn on power to the system. As the system boots, quickly interrupt the process during the memory test by pressing Ctrl-c. Result The OK prompt appears for most platforms after the memory test is completed. For the FAS200 series/GF270c and the FAS3020/V3020, the CFE prompt appears. For the FlexCache appliances, the FAS20xx, FAS3040/FAS3070/V3040/V3070, FAS31xx/V31xx, and FAS60xx/V60xx, the Loader prompt appears. Enter the following command at the prompt:
boot_diags

Result The diagnostics program starts to boot. When booting is complete, the top-level user interface and the Diagnostic Monitor appear, listing all available features.

Where to go next
After the Diagnostic Monitor loads, you can begin running either all diagnostic tests or specific tests. See Running Diagnostics for more information about the specific tests you can perform with the Diagnostic Monitor.

Running Diagnostics
About this section
This section describes the Diagnostic Monitor and how to run diagnostics on your system.

Topics in this section

This section discusses the following topics: Diagnostic Monitor user interface Running diagnostic tests

Diagnostic Monitor user interface

The Diagnostic Monitor is a menu-driven ASCII interface. It contains three sections: Diagnostics Commands Options

Diagnostic Monitor menu

Typically, you test all components at once by selecting the all option from this menu. You can also run individual diagnostic tests by selecting the test grouping, such as the mem test, from this menu. You can also select individual commands from the Commands section, to perform specific tasks, such as setting options. The Diagnostic Monitor also enables you to control the way certain diagnostics work, such as whether a test stops when encountering an error. The complete Diagnostic Monitor options are as follows: Diagnostics
all mb mem nvram scsi fcal gbe iscsi cna_nic cna_fc iomem fcache agent cf-card stress toe All system diagnostics Motherboard diagnostic Main memory diagnostic NVRAM diagnostic SCSI controller diagnostic FCAL controller diagnostic GbE controller diagnostic iSCSI target HBA diagnostic Converged Network Adapter - Ethernet diagnostic Converged Network Adapter - Fibre Channel diagnostic Performance Acceleration Module I Flash Cache Module Agent and rlm diagnostic CompactFlash card diagnostic System wide stress diagnostic TCP controller diagnostic

Commands
Config (print a list of configured PCI devices) (restore all options to default settings) Default (exit diagnostics and return to firmware OK prompt) Exit (print this commands list) Help (print current option settings) Options Run <diag...diag> (run selected diagnostics)

Options
Count <number> (loop selected diagnostic<s> <number> of passes> (loop selected diagnostic(s)> Loop <yes | no> (print status messages) Status <yes | no> (stop-on-error / keep running) Stop <yes | no> (extended tests / regular tests) Xtnd <yes | no> Mchk <auto | off | on | halt> (machine check control) CPU <0 | 1> (run diagnostic with CPU0 | run diagnostic with CPU1) (random seed (0:use machine generated number)) Seed <number> Enter Diag, Command or Option:

For detailed information

The following sections describe the individual sections of the Diagnostic Monitor:

Diagnostics menu options Commands menu options Options menu options

[Up] [Diagnosticsmenuoptions] [Commandsmenuoptions] [Optionsmenuoptions]

Diagnostic Monitor user interface

Diagnostics menu options

About the Diagnostics menu
The individual Diagnostics menu options are for the individual diagnostic tests, such as nvram , mb, and so on. Typically, these tests enable you to focus your testing on a specific process or component of a card. Note: Not all items listed in a menu will be available for the hardware in your system; the item will either not be apparent on the screen or it will be grayed out.

Sample Diagnostics menu

The following is an example of a second-level menu for the Onboard Ethernet diagnostic tests:
Select test or feature by number [0]: 4 GBE devices present: GBE dev e0a GBE dev e0b GBE dev e0c (Testing all GBE devices) 1: Comprehensive GBE test 2: Reset test 4: Link test 5: Internal Mac lp test 10B 6: Internal Mac lp test 100B 7: Internal Mac lp test 1G 8: Internal Tcvr lp test 10B 9: Internal Tcvr lp test 100B 10: Internal Tcvr lp test 1G 11: External lp test 10B (Xtnd) 12: External lp test 100B (Xtnd) 13: External lp test 1G (Xtnd) 14: Interrupt test Select feature by number [ ]

40: 41: 42: 43: 70: 71: 72: 73: 90: 91: 92: 93: 99:

Port-port 10B test (Xtnd) Port-port 100B test (Xtnd) Port-port 1 G test (Xtnd) Cluster diag-diag test Display MAC address Display all registers Display Counters Set MAC address [Factory] GBE card selection Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

[Up] [Diagnosticsmenuoptions] [Commandsmenuoptions] [Optionsmenuoptions]

Diagnostic Monitor user interface

Commands menu options

About the Commands menu
The following six commands are available in the Commands section of the Diagnostic Monitor: Commands
Config Default

(print a list of configured PCI devices) (restore all options to default settings) Exit (exit diagnostics and return to firmware OK prompt) Help (print this commands list) Options <(print current option settings) Run < diag...diag> (run selected diagnostic)

Config command
The config command enables you to learn what Peripheral Component Interconnect (PCI) devices you have on your system. Default and options commands The default and options commands are closely related. They are compared in the following table: Command Enables you to... default Return all test option settings to default values, which are
loop no status yes stop yes xtnd no mchk auto options

Display the current test option settings. When test options are set to default values, the system displays the following output after the default command:
--Tests will stop on error --Diagnostic looping disabled --Status messages enabled --Normal testing enabled --Automatically select action on machine checks (Halt on most machine checks)

For example, when you modify the option to the setting you want at the Enter Diag , Command, or Option prompt: loop yes The system response in this example shows all settings but one are set to default:

--Tests will stop on error **Diagnostic looping enabled --Status messages enabled --Normal testing enabled --Automatically select action on machine checks (Halt on most machine checks)

Note The asterisks before the option setting indicate a non-default value. The count option is not listed because it does not have a default setting.

Exit command
The exit command exits the Diagnostics program and returns you to the firmware prompt. Following this, you can reboot the system without power-cycling the machine. If you need to stop a diagnostic session while it is running, you can use the Ctrl-C command.

Help command
Online help is available for the Diagnostic Monitor through the help command. The help command lists what is available through the diagnostics, commands , and options menus. It also identifies the version of Diagnostics that is being run.

Run command
The run command enables you to run several diagnostic sessions in sequence, using the run command followed by the diagnostic names you want to run. Each session runs without interactive test selection menus. In the following example, you are running the mb (motherboard) diagnostic and the memory diagnostic:
run mb mem

[Up] [Diagnosticsmenuoptions] [Commandsmenuoptions] [Optionsmenuoptions]

Diagnostic Monitor user interface

Options menu options

About the Options menu
The six test options in the Diagnostic Monitor are as follows:
Options (loop selected diagnostic<s> <number> of passes) Count <number> (loop selected diagnostic(s)) Loop <yes | no> Status <yes | no> (print status messages) (stop-on-error / keep running) Stop <yes | no> (extended tests / regular tests) Xtnd <yes | no> Mchk <auto | off | on | halt> (machine check control) Seed <number> <random seed <0:use machine generated number>>

Count and loop options

The following table describes the count and loop options: Count and loop options
count <number>

Description You can control how many loop passes are executed. The count option works only when looping is enabled. Example: To limit an internal or external loopback test to six loop passes, you would enter:
count 6

loop no (default) loop yes

Looping is disabled. Terminates session at the end of a pass. Does not continue to loop continuously. Looping is enabled. The test run loops continuously or for the specified number of loop passes, if you set the count option. Enabled looping applies to the all and run commands. When you enable looping with loop yes , you can also specify the number of loop passes with count <number>. Example: To enable looping, you would enter the following command:
loop yes **Diagnostic looping enabled

The system response tells you looping is enabled.

Example count and loop options The following example enables looping and sets the number of loop passes to six:
loop yes **Diagnostic looping enabled count 6

Status option
The following table lists the status option settings: Status option
status yes (default) status no

Description Displays the diagnostic status in detail. Displays the diagnostic status in a brief sentence.

Stop option
The following table lists the stop option settings: Stop option
stop yes default)

stop no

Description When diagnostics discovers an error, it stops at the end of a complete loop pass. The error is logged to the console terminal. If the stop option is enabled, the diagnostic stops execution at the end of a complete test pass. When diagnostics discovers an error, it continues running. You can run additional tests and continue to encounter additional errors.

Xtnd option
Extended mode applies only to tests that are marked with the Xtnd label. There are two possible settings, described in the following table: Xtnd option
xtnd no (default) xtnd yes

Description In this test mode, called normal test mode, you are testing the system component within the inner boundaries of the unit. In this test mode, called extended test mode, you are testing the physical media outside the unit. With NICs, you are required to disconnect the unit and put special loopback connectors or plugs on the card. Note Loopback plugs are required to run some FC-AL diagnostic tests. They are not required when the Fibre Channel loop has its own terminator.

Example of xtnd yes This example shows xtnd yes and the system reminding you that you might need loopback plugs.
xtnd yes **Extended testing enabled NOTE: Some diagnostics require loopback plugs for complete test operation and will indicate

failures without these plugs.

Example of a test failure This example shows a test failure when you have done the following: Failed to prepare the FC-AL adapter with loopback plugs Failed to set the xtnd yes test option Selected 11--Loop integrity LRC test [Xtnd] in the FCAL test menu
ERROR DLH0020: FCAL loop is open. Check cables and associated hardware FCAL loop test...........................................FAILED

See Error Messages, for a description of individual error messages.

Preparing to run a test in extended mode

To prepare for a test in extended mode that requires loopback plugs, complete the following steps: Step Action 1 2 3 4 5 Disconnect the system from the network and if applicable from a cluster. Connect the loopback plugs to the card. Enable extended mode from the Diagnostic test menu by entering its number:
93

Run the comprehensive test or the specific loop test. Remove the loopback plugs after the test is completed.

Mchk option
The mchk (machine check) option enables you to control system behavior when the hardware detects a machine check error. The four mchk settings are as follows: Mchk option
mchk auto(default)

When a machine check is detected, the system... Automatically chooses the best machine check control for the diagnostic. Usually it halts the diagnostic session. You can use non-default machine check settings in certain memory testing circumstances to aid in diagnosing hardware problems. Halts the system immediately, going into a panic state. Reboot the system to continue running diagnostics. Silently ignores the error, unless it is fatal. Does not halt diagnostic execution if memory parity/ECC errors or similar errors are detected. The system reports the machine check and resumes the diagnostic execution. The diagnostic can continue testing and analyzing all errors in the test pass, possibly providing a more accurate callout of memory DIMM failures.

mchk halt mchk no mchk yes

Example:

In the following example, you enable machine check with the mchk yes option.
mchk yes **Machine checks enabled (Display memory machine checks and continue)

Options you can set at test menu level

You can set the loop , stop , and xtnd options not only at the Diagnostic Monitor menu level, but also at the individual test menu level. For example, when you enter gbe to run diagnostics on the GbE card, the GbE Diagnostic test menu appears, offering the following test options:
91: 92: 93: Enable/disable looping Stop/continue on error Extended/Normal test mode

You can also enable looping on the card by entering the number for the option:
91

Seed option
The following table lists the seed option settings: Seed option Description seed <number> Enables the user to feed the Memory, NVRAM, and Cache diagnostics tests with a user-defined seed. Even if the test is random, this option recreates a test scenario and the value of the seed is displayed at the beginning of the test. seed 0 (default) The diagnostics tests will use a machine generated seed number.

See Diagnostics Menus for more information about individual diagnostic test menus.

Running diagnostic tests

About the tests
The Diagnostic Monitor enables you to run tests of all components in the system or to select individual components for testing. Tests that are labeled [Xtnd] often require you to install a set of appropriate loopback plugs on the tested component before you start the test and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd ] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode. Items that are labeled [Factory] , [Mfg] , or the like, are accessible only to manufacturing personnel with special password privileges.

Running diagnostics on a Multipath High Availability nodes:

If you are running Stress diagnostics or tests 41, 42, 73 or option 4 of test 81 of the FC-AL diagnostics on a node in a Multi Path High Availability cabled pair of nodes, verify that one of the following is true: The partner node is at the CFE or Loader boot prompt. The partner node is powered off. The multipath high availability cabling for both nodes has been removed such that the appliance is only responsible for its own storage and not that of its partner.

Running diagnostics on a FAS270c, FAS20xxA, or FAS31xxA:

A FAS270c, FAS20xxA, or FAS31xxA have two system modules. If you are running diagnostics on system module B for example, you will see the following system message and question if you select specific tests or options that test the FC-AL interface or the disks:
Diagnostics is currently running on Module B. If Module A, the partner system, is running Data ONTAP or Diagnostics, then FCAL external loopback and disk tests may report nonexistent failures. To run all FCAL tests on this system, you must power cycle the shelf and leave Module A at the CFE prompt. NOTE: FCAL external loopback and disk tests will automatically be skipped if you answer "yes" to the following question. Is Module A currently running Data ONTAP or Diagnostics (yes/no)? This question is only asked once per diagnostic session and the system will recognize the response for all tests and options run during that session. If the answer is yes, then only a limited set of FC-AL tests or options are available for running. If the answer is no, then all tests and options are available for running.

For detailed information

The following sections describe how to run and interpret either type of test:

Running all diagnostic tests Running individual diagnostic tests Test results

[Up] [Runningalldiagnosticstests] [Runningindividualdiagnosticstests] [Testresults]

Running diagnostic tests

Running all diagnostic tests

When to run the all test
To identify a hardware problem as quickly as possible, you run diagnostics on all components using the all diagnostic. You should select this option only after a normal system shutdown, a new card is installed, or there is no chance to preserve customer data after a system crash. FAS270c, FAS20xxA, or FAS31xxA: If you are running diagnostics on system module B and you responded that system module A is running Data ONTAP or Diagnostics, then only a limited set of FC-AL tests or options are available for running. Do not use the all option for the following circumstances: Immediately after a system crash If log data is stored

Using the all option

To run diagnostics on all components, complete the following step: Step Action 1 In the Diagnostic Monitor, after the Enter Diag , Command, or Option prompt, enter the following command:
all

Note You can set the all option to run diagnostic testing without stopping when an error is detected. Use the stop no option from the Diagnostic Monitor. See Stop option for more information about setting this option.

Results
As each test starts, its name and the test result appears on the console. By default, diagnostic testing stops when an error is encountered. The error is displayed on the screen, so you can identify the problem. See Error Messages, for more information about error messages. C1300 only: Running the all option generates a System Event Log that must be cleared. Failure to clear this log will cause the Alarm LED to blink in amber. To clear the log, enter the following command:
environment chassis bmc sel-clear

[Up] [Runningalldiagnosticstests] [Runningindividualdiagnosticstests] [Testresults]

Running diagnostic tests

Running individual diagnostic tests

Individual test menu structure
The hardware component that you are testing determines what appears in its test menu. However, all individual test menus share some common features: 1 -- Use this option to run a comprehensive test or all tests in the menu. This is the quickest way to learn whether you have a problem on the component. 99 -- Use this option to exit the menu. See Diagnostics Menus, for a detailed description of the individual test menus. The following table describes the basic organization of test menus by numbers and shared functions: Menu number 1 2-39 40s 70s through 80s 90s Function Runs all the tests in the main test group (2-19) This is the main test group. Each test tests a specific part of the component. Runs additional tests, which are used to debug and narrow down the problem after you run the main test group. Displays specific information about the system component. Also lets you set specific conditions for testing. These tests are also used for initialization functions. Lets you set the loop , stop , and xtnd options at the test menu level and exit.

Running individual diagnostics

To run diagnostics on an individual component, complete the following steps: Step Action 1 In the Diagnostic Monitor, after the Enter Diag , Command, or Option prompt, enter the name of the diagnostic. Example:
gbe

Result The Gigabit diagnostic test menu appears. Enter the number of the test you want to run or enter 1 to run a comprehensive test.

[Up] [Runningalldiagnosticstests] [Runningindividualdiagnosticstests] [Testresults]

Running diagnostic tests

Test results
Example test output
When you run a test, its name, results, and error messages, if any, appear on the screen and you are returned to the test menu.

Error message output

A diagnostic can log up to 12 errors. If the test encounters too many errors, it stops execution. If the stop option is enabled, the diagnostic stops execution at the end of a complete test pass. After the test finishes, you can run additional tests and continue logging additional errors. Example: The following example shows an error message you might see during a test: DZH0112 Battery dead. RTC not functional!

Where to go next
After the Diagnostic Monitor is loaded, you can run diagnostics on all system components or individual components. See Diagnostics Menus, for a list and description of the tests you can run. See Error Messages, for a list and description of all diagnostic error messages, along with the suggested corrective action. See Environmental Error Messages, for a list and description of all environmental error messages, along with the suggested corrective action.

Diagnostics Menus
About this section
This section lists and defines the menu options of the Diagnostic Monitor's individual diagnostic tests. If you receive an error message during a particular test, go to Error Messages, to determine what the message means and to determine how to correct the problem encountered by the test.

Topics in this section

This section discusses the following topics. Motherboard diagnostics Main memory diagnostics Card diagnostics CompactFlash card diagnostics Stress diagnostics

Motherboard diagnostics
About motherboard diagnostics
The motherboard diagnostic test the integrity of a variety of components on the motherboard or system backplane. The data you retrieve from these tests helps you determine what component is causing an error. For example, if you want to check the PCI devices and slots on the motherboard, you select the Misc. board component menu option, then select the appropriate test from the Miscellaneous board component tests submenu.

For detailed information

For detailed information about the motherboard and backplane diagnostic menus, see the following sections: FAS200 series FAS20xx/SA200 FAS3020/V3020 FAS3040/FAS3070/V3040/V3070 FAS31xx/V31xx FAS60xx/V60xx/SA600

Diagnostics Menus - Motherboard

FAS200 motherboard tests

About the FAS200 motherboard tests
This section addresses the Motherboard menu and the Miscellaneous board test, the Cache test, the Onboard Ethernet test, and the Onboard FC-AL test submenus for the FAS200 platform. To go to the error messages associated with the motherboard diagnostic tests, see Motherboard error messages.

For detailed information

For detailed information about the menus, see the following sections: Motherboard menu Misc. board test menu Cache test menu Onboard Ethernet test menu Onboard FC-AL test menu The following table identifies the environmental error messages that you can generate by running the miscellaneous board diagnostic tests for the motherboards in the FAS200 series appliances: Miscellaneous Board Tests run on... FAS250 motherboard FAS270/GF270 motherboard See... FAS250 environmental error codes FAS270 environmental error codes

[Up] [Motherboard] [Miscellaneoustest] [Cachetest] [OnboardEthernet] [OnboardFC-AL]

Motherboard menu and submenus

Motherboard menu
This section describes the Motherboard menu. FAS270c only: If you are running diagnostics on system module B and you responded that system module A is running Data ONTAP or Diagnostics, then only a limited set of FC-AL tests or options are available for running: Test Test no 1 Comprehensive motherboard diag 2 Misc. board test menu 3 Cache test menu 4 Onboard Ethernet test menu 5 Onboard FCAL test menu 71 Show PCI configuration 72 Show detailed PCI info 73 Initialize real-time clock 74 Show system info 75 Serial info setup menu [Factory only] 76 Show all disks 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Accesses the miscellaneous motherboard test menu. Accesses the CPU cache tests. For more information, see the Cache test menu. Accesses the onboard Gigabit Ethernet test menu. Accesses the onboard FC-AL test menu. Lists the contents of all adapters in the PCI slots on the motherboard. Displays detailed information about the contents and settings of the cards in the PCI slots. Initializes the onboard real-time clock to user-defined settings. Displays information about the system. Option not available. Displays information about the disks. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneoustest] [Cachetest] [OnboardEthernet] [OnboardFC-AL]

Motherboard menu and submenus

Miscellaneous board test menu

This section describes the Miscellaneous board test submenu. Test Test no 1 Run all miscellaneous tests 2 Check PCI devices 3 Check memory interface Description Runs all tests in this menu in current mode. Verifies that the onboard PCI devices are alive and responding normally. Verifies the interface and data path integrity between the CPU and the memory DIMMs. This is a very small subset of the memory diagnostics and is not intended to be a comprehensive test. Performs a sliding 0 and 1 test to fixed locations of memory. Cache is disabled prior to running and then re-enabled at the end of the test.

4 5

7 8 9 71 72 73 91 92

Check boot flash This test verifies that the boot flash can be accessed reliably by software access Real-time clock This test will access the Real Time Clock and test its ability to count seconds. The RTC is test initialized and then the battery register is accessed to make sure that the correct status is read. Then the seconds register is accessed and the data is saved. The test will wait for about one second and then the seconds register is accessed again to make sure that it has changed. The second check will access the days register to make sure it is in the correct bounds (1-7). So, it basically verifies that the Real Time Clock is incrementing correctly and that its battery is in a good state. Check Checks the Environmental Status Register (ESR) for fault conditions, such as fan failure and Environmental high temperature. Status Front panel LED Exercises the front panel LEDs by changing patterns in the displays. You need to observe the exercise LEDs blinking to verify that they are working. Test PCI slots Tests the PCI devices. Check watchdog Checks that the watchdog interrupt is working. interrupt Show PCI Shows the configuration of the Peripheral Component Interconnect (PCI), a peripheral bus. configuration Show detailed Shows detailed information about the PCI devices on the various PCI buses. PCI info Initialize realInitializes the battery powered, real-time clock. time clock Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is looping pressed or when an error is encountered if option 92 is active. Stop/continue Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping on error looping continues after an error is encountered.

93 Extended/normal Enables or disables extended mode on tests where extended mode is an available option. test mode 99 Exit Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneoustest] [Cachetest] [OnboardEthernet] [OnboardFC-AL]

Motherboard menu and submenus

Cache test menu

The section describes the Cache test submenu. Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. cache test 2 Cache walking This test performs a walking 1 in a field of zeroes and a walking 0 in a field of ones. This test data bits test is repeated at each 8K "bank" boundary. This test is intended to verify data lines within L2 cache and to/from/within each DIMM bank. Expected to detect hard faults such as shorts and opens. Cache stuck-at Scans through all cache locations, checking for stuck bits (0 or 1). faults test Cache random This test is intended to access chunks of memory within an individual DIMM as rapidly as read/write test possible to stress the DIMM. Block size is chosen to be large enough to force cache collisions. Operation (read/write) is chosen randomly, along with the block, so this test causes some unique stressing of the memory system. Cache random This test is intended to verify all locations of SRAM cache and is expected to detect all data test common SRAM failures such as stuck cells or cell coupling. Intermittent errors may also be encountered, caused by noise or margin problems. Parity and ECC are stressed by the random patterns used. Cache random This test is intended to verify overall operation of L2 cache, with particular emphasis on noise, address test signal coupling and simultaneous switching problems. Detection of intermittent and margin problems is also expected. Cache spill test Tests the cache interface to main memory. Causes cache flush and reload. Provides excellent test of cache management logic. Cache tag test Tests the cache tags by reading random addresses. Cache MP test Tests the cache on an MP system. Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is looping pressed or when an error is encountered if option 92 is active. Stop/continue Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping on looping continues after an error is encountered. error Exit Exits this diagnostics menu.

3 4

7 8 9 91 92

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[Up] [Motherboard] [Miscellaneoustest] [Cachetest] [OnboardEthernet] [OnboardFC-AL]

Motherboard menu and submenus

Onboard Ethernet test menu

This section describes the onboard Ethernet test submenu. The Ethernet diagnostic tests can generate error messages associated with the hardware and software. FAS270c only test: To perform test 43, complete the following steps: 1. 2. 3. 4. Boot both system modules to Diagnostics. Select this test option on both system modules. Select tx (transmit) on system module A and rx (receive) on system module B. Then select tx (transmit) on system module B and rx (receive) on system module A.

Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. GBE test 2 Reset test Runs a test that verifies if the registers have the specified default values on reset on a reset of Intel GBE card. 4 Link test Verifies the external link condition. Requires loopback plug or Ethernet connection. 5 Internal Mac lp Tests movement of data through the MAC. test 10B 6 Internal Mac lp test 100B 7 Internal Mac lp test 1G 8 Internal Tcvr lp Tests movement of data through the transceiver. test 10B 9 Internal Tcvr lp test 100B 10 Internal Tcvr lp test 1G 11 External lp test Extended test mode: Tests card functionality and data movement between memory and the 10B (Xtnd) Ethernet cable. Requires a loopback plug. 12 External lp test 100B (Xtnd) 13 External lp test 1G (Xtnd) 14 Interrupt test Performs the internal loopback test in Interrupt mode to test and verify that the DMA/data

40 Port-port 10B test (Xtnd) 41 Port-port 100B test (Xtnd) 42 Port-port 1 G test (Xtnd) 43 Cluster diagdiag test 70 Display MAC address 71 Display all registers 72 Display Counters 73 Set MAC address [Factory] 90 GBE card selection 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

transfers work in Interrupt mode. Tests the data path from one channel to another for the dual-channel network interfaces. It requires a twisted-pair network cable to be connected between the two ports.

FAS270c only: Tests the third Ethernet interface which is on the backplane and functions as the interconnect interface between the two system modules. Verifies and displays the MAC address of the interface. Displays all the memory registers. Displays the date counters. Option not available. Enables the selection of a specific GbE interface in the system. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneoustest] [Cachetest] [OnboardEthernet] [OnboardFC-AL]

Motherboard menu and submenus

Onboard FC-AL diagnostics

This section describes the onboard FC-AL (Fibre Channel Arbitrated Loop) group of diagnostics tests. The tests range from EEPROM data verification through data transfer integrity testing. The FC-AL diagnostic tests can generate error messages associated with the interface and disk shelf. FAS270c only: If you are running diagnostics on system module B and you responded that system module A is running Data ONTAP or Diagnostics, then only tests 2, 3, and 4 are available for running. Note: To perform disk or shelf diagnostics, select test 90 and identify the channel. This returns you to the main FC-AL menu. Then select test 80 or 81. Caution: There are limitations to running Fibre Channel Diagnostics: This test does not support switches, media changeres, connections to the SAN environment, and Fibre Channel adapters functioning in target mode. The external loopback test does not detect the presence or absence of a loopback device before running, nor does it distinguish an open loop or broken cable. For example, the external loopback test fails if no loopback is attached. Users are responsible for correctly attaching the loopback device, and enabling external loopback tests. Running diagnostics on a Multipath High Availability nodes: If you are running tests 41, 42, 73 or option 4 of test 81 on a node in a Multi Path High Availability cabled pair of nodes, verify that one of the following is true: The partner node is at the CFE boot prompt. The partner node is powered off. The multipath high availability cabling for both nodes has been removed such that the appliance is only responsible for its own storage and not that of its partner.

FC-AL diagnostic test menu

Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices. The following table describes the available tests in the FC-AL diagnostic menu: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. FCAL test 2 Self test Verifies and tests the FC-AL chip configuration, firmware commands, mailboxes, status, error information, the serial EEPROM data, the ISP power-on self-test (POST), the on-chip SSRAM with fixed and random patterns, the SSRAM/DMA of fixed and random patterns between SSRAM and most locations of main memory, and ISP firmware in SSRAM. 3 ISP interrupt test Verifies the device's ability to generate interrupts, and the system's ability to handle interrupts correctly.

4 5 6 7 8 9

Int loop test Bus reset test [Xtnd] Ext loop test [Xtnd] Read-only bus test Read/write bus test [Mfg] Disk read test (FCTEST)

Tests data movement between main memory and the FC-AL chip, using on-chip loopback capability for 10 bit and 1 bit. Extended test mode: Tests the FC-AL loop integrity and LRC functionality by resetting the bus. Extended test mode: Tests the functionality and data movement between memory and FC-AL cable. Requires loopback plug. Tests the FC-AL loop integrity by reading from each disk attached to the FC-AL interface. Option not available. Tests the FC-AL adapter loop integrity by reading from each disk attached to the FC-AL onboard interface. This test has optional parameters. Requires disks attached to the FC host adapter. Option not available. Lists the status of all the disks on all FC-AL adapters on the storage system. Requires disks attached to the FC host adapter. Lists the status of all the disks on the specified FC-AL adapters. Requires disks attached to the FC host adapter. Tests the external LEDs on the FC-AL card. Displays information about the ISP Fibre Channel chip. Displays all devices attached to a specific FC-AL adapter. Lists disk information for all disks attached to the system. Resets the selected FC-AL adapter to its original state. Displays the serial EEPROM data. Option not available. Displays the link statistics maintained for all drives on a Fibre Channel loop. Accesses the disk bus pattern diagnostics submenu. Accesses the disk shelf diagnostics submenu. Enables you to select a specific FC-AL interface for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91,

10 Disk read/write test [Mfg] 41 Scan all disks on all FC-AL adapters 42 Scan and show disks on selected FC-AL adapters 43 FC-AL adapter LED test 71 Show ISP FC chip info 72 Show attached FC-AL devices 73 Show all disks (probe-scsi-all) 74 Reset FC-AL adapter 75 Show serial EEPROM data 76 Program serial EEPROM data [Factory] 77 Display fcstat link_status 80 Go to disk diagnostic menu 81 Go to shelf diagnostics menu 90 FC-AL channel selection 91 Enable/disable looping 92 Stop/continue

looping on error looping continues after an error is encountered. 93 Extended/normal Enables or disables extended mode on tests where extended mode is an available option. test mode 99 Exit Exits this diagnostics menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk diagnostics submenu

The following table describes the FC-AL disk diagnostics submenu: Test Test no 1 Perform drive self diagnostic test 2 Low frequency pattern [Mfg] 3 Low transition density pattern [Mfg] 4 Half-rate square pattern [Mfg] 5 Quarter-rate square pattern [Mfg] 6 Contiguous '3' pattern [Mfg] 7 Composite pattern [Mfg] 40 Read drive defect list 99 Exit this menu Description The drive seeks a reserved non user-accessible cylinder and writes, reads, and verifies data for each data surface. Option not available.

Displays primary and grown defect list. This test has optional parameters. Requires disks attached to the FC host adapter. Returns the user to the main FC-AL menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Disk shelf diagnostics submenu

The following table describes the disk shelf diagnostics submenu for the FC-AL interface. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapters with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Enter xtnd n to cancel Extended test mode: Test no 1 2 3 4 5 6 7 8 9 10 11 12 70 93 99 Test Turn shelf LED on Turn shelf LED off Get trunk information Get shelf drive map Get shelf environment information Check SES temperature sensors Check SES Fans Check SES power supply Check SES ESH (HUB) Check all SES elements Loop integrity/LRC test [Xtnd] Show HUB status Display sector size for FC-AL devices Extended/normal test mode Exit this menu Description Turns on the drive LEDs. Turns off the drive LEDs. Option not available. Displays the list of drives on target FC-AL interface. Displays the environmental parameters on the target FC-AL interface. Checks SES temperature sensors against threshold value. Checks SES fan status. Checks SES power supply status. Option not available. Check status of all SES elements in the shelf. Extended test mode: Tests the FC-AL loop integrity and LRC functionality. Option not available. Displays the sector size for the drives on the disk shelves. Enables or disables extended mode on tests where extended mode is an available option. Returns the user to the main FC-AL menu.

Diagnostics Menus - Motherboard

FAS20xx/SA200 motherboard tests

About the FAS20xx/SA200 motherboard tests
This section addresses the Motherboard menu and the Miscellaneous board test, the Cache test, the Onboard Ethernet test, and the Onboard FC-AL test submenus for the FAS20xx platform. To go to the error messages associated with the motherboard diagnostic tests, see Motherboard error messages.

For detailed information

For detailed information about the menus, see the following sections: Motherboard menu Misc. board test menu Cache test menu Onboard Gigabit Ethernet test menu Onboard FC-AL test menu Onboard SAS test menu Onboard IB test menu BMC test menu NVMEM menu You can generate the FAS20xx/SA200 environmental error codes by running the miscellaneous board diagnostic tests.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SAS] [Onboard IB] [BMC test] [NVMEM test]
Motherboard menu and submenus

Motherboard menu
This section describes the Motherboard menu: Test Test no 1 Comprehensive motherboard diag 2 Misc. board test menu 3 Cache test menu 4 Onboard Gigabit Ethernet test menu 5 Onboard FCAL test menu 6 SAS test menu 7 IB test menu 8 BMC test menu 9 NVMEM test menu 71 Show PCI configuration 72 Show detailed PCI info 73 Initialize real-time clock 75 Serial info setup menu [Mfg only] 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Accesses the miscellaneous motherboard test menu. Accesses the CPU cache tests. For more information, see the Cache test menu. Accesses the onboard Gigabit Ethernet test menu. Accesses the onboard FC-AL test menu. Accesses the SAS test menu. Accesses the Infiniband test menu. Accesses the baseboard management controller test menu. Accesses the NVMEM test menu. Lists the contents of all adapters in the PCI slots on the motherboard. Displays detailed information about the contents and settings of the cards in the PCI slots. Initializes the onboard real-time clock to user-defined settings. Option not available. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SAS] [Onboard IB] [BMC test] [NVMEM test]
Motherboard menu and submenus

Miscellaneous board test menu

This section describes the Miscellaneous board test submenu. Test Test Description no 1 Run all Runs all tests in this menu in current mode. miscellaneous tests 2 Check This test checks the ability to read the board type from the EEPROM structure. CPU/Northbridge Verifies the CPU speed and microcode revision. status Verifies the motherboard has the correct hostbridge installed. Verifies that the hostbridge is in a good state. Sets the correct number of CPUs on the motherboard. 3 Check Southbridge status This test checks the ability to read the Southbridge information about the bridges available in the system. Verifies that the motherboard has the correct southbridge installed (based on the system model information). Verifies that the southbridge is in a good state.

4 Check PCI This test verifies that all available PCI devices are valid and are located in valid slots. devices and slots 5 Check memory Verifies the interface and data path integrity between the CPU and the memory DIMMs. interface This is a very small subset of the memory diagnostics and is not intended to be a comprehensive test. Performs a sliding 0 and 1 test to fixed locations of memory. Cache is disabled prior to running and then re-enabled at the end of the test. 6 Check boot flash This test verifies that the boot flash can be accessed reliably by software access 7 Real-time clock This test will access the Real Time Clock and test its ability to count seconds. The RTC is test initialized and then the battery register is accessed to make sure that the correct status is read. Then the seconds register is accessed and the data is saved. The test will wait for about one second and then the seconds register is accessed again to make sure that it has changed. The second check will access the days register to make sure it is in the correct bounds (1-7). So, it basically verifies that the Real Time Clock is incrementing correctly and that its battery is in a good state. 8 Check Checks the Environmental Status Register (ESR) for fault conditions, such as fan failure and environmental high temperature. status 71 Show PCI Shows the configuration of the Peripheral Component Interconnect (PCI), a peripheral bus. configuration 72 Show detailed Shows detailed information about the PCI devices on the various PCI buses.

73 91 92 93 99

PCI info Initialize realtime clock Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

Initializes the battery powered, real-time clock. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SAS] [Onboard IB] [BMC test] [NVMEM test]
Motherboard menu and submenus

Cache test menu

The section describes the Cache test submenu. Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. cache test 2 Cache walking This test performs a walking 1 in a field of zeroes and a walking 0 in a field of ones. This test data bits test is repeated at each 8K "bank" boundary. This test is intended to verify data lines within L2 cache and to/from/within each DIMM bank. Expected to detect hard faults such as shorts and opens. Cache stuck-at Scans through all cache locations, checking for stuck bits (0 or 1). faults test Cache random This test is intended to access chunks of memory within an individual DIMM as rapidly as read/write test possible to stress the DIMM. Block size is chosen to be large enough to force cache collisions. Operation (read/write) is chosen randomly, along with the block, so this test causes some unique stressing of the memory system. Cache random This test is intended to verify all locations of SRAM cache and is expected to detect all data test common SRAM failures such as stuck cells or cell coupling. Intermittent errors may also be encountered, caused by noise or margin problems. Parity and ECC are stressed by the random patterns used. Cache random This test is intended to verify overall operation of L2 cache, with particular emphasis on noise, address test signal coupling and simultaneous switching problems. Detection of intermittent and margin problems is also expected. Cache spill test Tests the cache interface to main memory. Causes cache flush and reload. Provides excellent test of cache management logic. Cache tag test Tests the cache tags by reading random addresses. Cache MP test Available on multiprocessor systems only. Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is looping pressed or when an error is encountered if option 92 is active. Stop/continue Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping on looping continues after an error is encountered. error Exit Exits this diagnostics menu.

3 4

7 8 9 91 92

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[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SAS] [Onboard IB] [BMC test] [NVMEM test]
Motherboard menu and submenus

Gigabit diagnostics
About the Gigabit diagnostic tests
This section describes the onboard Gigabit Ethernet (GbE) test submenu. The GbE diagnostic tests can generate error messages associated with the hardware and software. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices.

GbE diagnostic test menu

The following table describes the GbE diagnostic tests: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. GBE test 2 Reset test Runs a test that verifies if the registers have the specified default values on reset on a reset of Intel GBE card. 3 EEPROM test Verifies that the checksum is valid as defined by the device specifications; an invalid checksum means that the device was programmed incorrectly. 4 Internal lp test Places the device into an internal loopback mode to validate the correct functionality of the 1G internal logic operations on the device. 5 External lp test Extended test mode: Requires loopback plug to verify data correctness by transmitting data 1G (Xtnd) from the device to itself across the attached loopback. 6 Internal lp test Places the device into an internal loopback mode to validate the correct functionality of the 10B internal logic operations on the device. 7 Internal lp test 100B 8 External lp test Extended test mode: Requires loopback plug to verify data correctness by transmitting data 10B (Xtnd) from the device to itself across the attached loopback. 9 External lp test 100B (Xtnd) 10 Interrupt test Tests the transmit and receive interrupts to verify the device's ability to generate interrupts, and the system's ability to handle interrupts correctly. 11 Quick Interrupt Tests and verifies that all the device interrupts are working. Data is not transfered during this test test. 40 MAC loop test This test will test data from the transmitter to the receiver before it goes to the MAC. 41 Big packets test Enables the sending and receiving of 16384-byte-sized data packets by reallocating memory use.

42 Port-port 10B test (Xtnd) 43 Port-port 100B test (Xtnd) 44 Port-port 1 G test (Xtnd) 70 Display MAC address 71 Display all registers 72 Display EEPROM 73 Set MAC address [Factory] 90 GBE card selection 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

Note The standard data packet size is 1522 bytes. Extended test mode: This test tests the data path from one channel to another for the dual channel NICS, requires a twisted pair network cable to be connected between the 2 ports.

Verifies and displays the MAC address of the card. Displays all the memory registers. Display the entire contents of the Ethernet device's EEPROM This is test is unavailable. Enables the selection of a specific GbE card in the system. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SAS] [Onboard IB] [BMC test] [NVMEM test]
Motherboard menu and submenus

Onboard FC-AL diagnostics

This section describes the onboard FC-AL (Fibre Channel Arbitrated Loop) group of diagnostics tests. The tests range from EEPROM data verification through data transfer integrity testing. The FC-AL diagnostic tests can generate error messages associated with the interface and disk shelf. FAS20xxA only: If you are running diagnostics on system module B and you responded that system module A is running Data ONTAP or Diagnostics, then only tests 2, 3, and 4 are available for running. Note: To perform disk or shelf diagnostics, select test 90 and identify the channel. This returns you to the main FC-AL menu. Then select test 80 or 81. Caution: There are limitations to running Fibre Channel Diagnostics: This test does not support switches, media changeres, connections to the SAN environment, and Fibre Channel adapters functioning in target mode. The external loopback test does not detect the presence or absence of a loopback device before running, nor does it distinguish an open loop or broken cable. For example, the external loopback test fails if no loopback is attached. Users are responsible for correctly attaching the loopback device, and enabling external loopback tests. Running diagnostics on a Multipath High Availability nodes: If you are running tests 41, 42, 73 or option 4 of test 81 on a node in a Multi Path High Availability cabled pair of nodes, verify that one of the following is true: The partner node is at the Loader boot prompt. The partner node is powered off. The multipath high availability cabling for both nodes has been removed such that the appliance is only responsible for its own storage and not that of its partner.

FC-AL diagnostic test menu

Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices. The following table describes the available tests in the FC-AL diagnostic menu: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. FCAL test 2 Self test Verifies and tests the FC-AL chip configuration, firmware commands, mailboxes, status, error information, the serial EEPROM data, the ISP power-on self-test (POST), the on-chip SSRAM with fixed and random patterns, the SSRAM/DMA of fixed and random patterns between SSRAM and most locations of main memory, and ISP firmware in SSRAM. 3 ISP interrupt test Verifies the device's ability to generate interrupts, and the system's ability to handle interrupts

4 5 6 7 8 9

Int loop test Bus reset test [Xtnd] Ext loop test [Xtnd] Read-only bus test Read/write bus test [Mfg] Disk read test (FCTEST)

correctly. Tests data movement between main memory and the FC-AL chip, using on-chip loopback capability for 10 bit and 1 bit. Extended test mode: Tests the FC-AL loop integrity and LRC functionality by resetting the bus. Extended test mode: Tests the functionality and data movement between memory and FC-AL cable. Requires loopback plug. Tests the FC-AL loop integrity by reading from each disk attached to the FC-AL interface. Option not available. Tests the FC-AL adapter loop integrity by reading from each disk attached to the FC-AL onboard interface. This test has optional parameters. Requires disks attached to the FC host adapter. Option not available. Lists the status of all the disks on all FC-AL interfaces on the storage system. Requires disks attached to the FC host interface. Lists the status of all the disks on the specified FC-AL interface. Requires disks attached to the FC host interface. Tests the external LEDs on the FC-AL card. The test is not supported. Displays information about the ISP Fibre Channel chip. Displays all devices attached to a specific FC-AL adapter. Lists disk information for all disks attached to the system. Resets the selected FC-AL adapter to its original state. Displays the serial EEPROM data. Option not available. Displays the link statistics maintained for all drives on a Fibre Channel loop. Accesses the disk bus pattern diagnostics submenu. Accesses the disk shelf diagnostics submenu. Enables you to select a specific FC-AL interface for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is

10 Disk read/write test [Mfg] 41 Scan all disks on all FC-AL 42 Scan and show disks on selected FC-AL 43 FC-AL adapter LED test 44 FC initiatortarget test 71 Show ISP FC chip info 72 Show attached FC-AL devices 73 Show all disks (probe-scsi-all) 74 Reset FC-AL adapter 75 Show serial EEPROM data 76 Program serial EEPROM data [Factory] 77 Display fcstat link_status 80 Go to disk diagnostic menu 81 Go to shelf diagnostics menu 90 FC-AL card selection 91 Enable/disable

looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk diagnostics submenu

The following table describes the FC-AL disk diagnostics submenu: Test Test no 1 Perform drive self diagnostic test 2 Low frequency pattern [Mfg] 3 Low transition density pattern [Mfg] 4 Half-rate square pattern [Mfg] 5 Quarter-rate square pattern [Mfg] 6 Marvell 8030 test pattern 1 [Mfg] 7 Marvell 8030 test pattern 2 [Mfg] 8 Marvell 8030 test pattern 3 [Mfg] 9 Pattern 0 [Mfg] 10 Contiguous '3' pattern [Mfg] 11 Composite pattern [Mfg] 40 Read drive defect list 99 Exit this menu Description The drive seeks a reserved non user-accessible cylinder and writes, reads, and verifies data for each data surface. Option not available.

Displays primary and grown defect list. This test has optional parameters. Requires disks attached to the FC host adapter. Returns the user to the main FC-AL menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Disk shelf diagnostics submenu

The following table describes the disk shelf diagnostics submenu for the FC-AL interface. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapters with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Enter xtnd n to cancel Extended test mode: Test Test no 1 Check LED 2 Get trunk information 3 4 5 6 7 8 9 10 11 12 70 93 99 Get shelf drive map Get shelf environment information Check SES temperature sensors Check SES FANs Check SES Power Supply Check SES ESH (HUB) Check all SES elements Loop integrity/LRC test [Xtnd] Show HUB status Show Expander Status Display disk sector size Extended/normal test mode Exit this menu Description Turns on the drive LEDs. Displays the list of disk shelves and their firmware revisions on the target FCAL card. Displays the list of drives on the disk shelves of the target FC-AL card. Displays the environmental parameters for the disk shelves on the target FCAL card. Check SES temperature sensors against threshold value. Check SES fan status. Check SES Power Supply status. Option not available. Check status of all SES elements in the shelf. Option not available.

Displays the expander status. Displays the sector size for the drives on the disk shelves. Enables or disables extended mode on tests where extended mode is an available option. Returns the user to the main FC-AL menu.

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Motherboard menu and submenus

SAS diagnostics
About the SAS diagnostic tests
The SAS (Serial Attached SCSI) group of diagnostics tests the functioning of the SAS interfaces that are in your system. The tests range from EEPROM data verification through data transfer integrity testing. The SAS diagnostic tests can generate error messages associated with the interface and disk shelf. To perform disk or shelf diagnostics, select test 90 and identify the channel. This returns you to the main SAS menu. Then select test 80 or 81. Note Altering disks or cabling in a loop adapter requires you to perform either Test 41 or Test 42 before running any SAS test.

SAS diagnostic test menu

The following table describes the available tests in the SAS diagnostic menu. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. SAS test 2 Self test Verifies and tests the SAS chip configuration, firmware commands, mailboxes, status, error information, the serial EEPROM data, the ISP power-on self-test (POST), the on-chip SSRAM with fixed and random patterns, the SSRAM/DMA of fixed and random patterns between SSRAM and most locations of main memory, and ISP firmware in SSRAM. 3 ISP interrupt test Verifies the device's ability to generate interrupts, and the system's ability to handle interrupts correctly. 4 Int loop test Tests data movement between main memory and the SAS chip, using on-chip loopback capability for 10 bit and 1 bit. 6 Ext loop test Tests the functionality and data movement between memory and SAS cable. Requires loopback plug. 7 Read-only bus Tests the SAS loop integrity by reading from each disk attached to the SAS interface. test Requires the presence of disks. 8 Read/write bus Option not available. test [Mfg] 9 Disk read test Tests the SAS loop integrity by reading from each disk attached to the SAS onboard interface. This test has optional parameters. Requires the presence of disks.

10 Disk read/write test [Mfg] 41 Scan all disks on all SAS 42 Scan and show disks on selected SAS 71 Show ISP SAS chip info 72 Show attached SAS devices 74 Reset SAS interface 76 Program onboard WWN [Factory] 78 Zeroing disk test [Mfg] 80 Go to disk diagnostic menu 81 Go to shelf diagnostics menu 90 SAS card selection 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

Option not available. Lists the status of all the disks on all SAS interfaces on the storage system. Requires the presence of disks. Lists the status of all the disks on the specified SAS interface. Requires the presence of disks. Displays information about the ISP SAS chip. Displays all devices attached to a specific SAS interface. Resets the selected SAS interface to its original state. Option not available. Option not available. Select a node, then go to the disk write test patterns submenu disk write test patterns menu. From this menu, a user can select a specific pattern test to run. Accesses the disk shelf diagnostics submenu. Enables you to select a specific SAS interface for testing. At present, the only possible interface is 0c. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk diagnostics submenu

The following table describes the SAS disk diagnostics submenu: Test Test no 1 Perform drive self diagnostic test 2 Low frequency pattern [Mfg] 3 Low transition density pattern [Mfg] 4 Half-rate square pattern [Mfg] 5 Quarter-rate square pattern [Mfg] 6 Marvell 8030 test pattern 1 [Mfg] 7 Marvell 8030 test pattern 2 [Mfg] 8 Marvell 8030 test pattern 3 [Mfg] 9 Pattern 0 [Mfg] 10 Contiguous '3' pattern [Mfg] 11 Composite pattern [Mfg] 40 Read drive defect list 99 Exit this menu Description The drive seeks a reserved non user-accessible cylinder and writes, reads, and verifies data for each data surface. Option not available.

Displays primary and grown defect list. This test has optional parameters. Requires disks attached to the SAS host adapter. Returns the user to the main SAS menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk shelf diagnostics submenu

The following table describes the disk shelf diagnostics submenu for the SAS interface: Test Test no 1 Check LED 2 Get trunk information 3 4 5 6 7 8 9 10 11 12 70 93 99 Get shelf drive map Get shelf environment information Check SES temperature sensors Check SES FANs Check SES Power Supply Check SES ESH (HUB) Check all SES elements Loop integrity/LRC test [Xtnd] Show HUB status Show Expander Status Display disk sector size Extended/normal test mode Exit this menu Description Turns on the drive LEDs. Displays the list of disk shelves and their firmware revisions on the target SAS card. Displays the list of drives on the disk shelves of the target SAS card. Displays the environmental parameters for the disk shelves on the target SAS card. Check SES temperature sensors against threshold value. Check SES fan status. Check SES Power Supply status. Option not available. Check status of all SES elements in the shelf. Option not available.

Displays the expander status. Displays the sector size for the drives on the disk shelves. Enables or disables extended mode on tests where extended mode is an available option. Returns the user to the main SAS menu.

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Motherboard menu and submenus

IB diagnostics
The following table describes the tests in the IB diagnostic test. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices: Test Test no 1 Comprehensive test 6 Internal loopback test 7 Link test [Xtnd] 70 Display card information 71 Reset chip [Xtnd] 72 Display firmware information 73 Download firmware 74 Read GUID 75 Write GUID 90 IB card selection 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Test data transfer between host memory and IB card, using onchip loopback. Extended test mode: Both heads must be in the IB test menu to perform the link test. Display card vendor ID, device ID, Revision ID, class code and GUID base. Extended test mode: Resets the controller chip. Displays the IB firmware information Downloads the IB firmware. Reads and displays the GUID information. Allows a user to enter a new GUID number. Option is logically not available. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SAS] [Onboard IB] [BMC test] [NVMEM test]
Motherboard menu and submenus

BMC menu
This section describes the BMC menu. The BMC diagnostic tests can generate error messages associated with the hardware and software. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. test 2 BMC self test This test issues a self test command to the BMC and waits a specified amount of time for a pass or fail response code. If the test times out without a response from the BMC, a timeout error will display. 3 Environment test Verifies the environmental hardware can successfully report extraordinary environmental events. 4 SDR read test Verifies that the sensor data repository (SDR) is readable. 5 SEL read test Verifies that the system event log (SEL) is readable. 6 LCD exercise Option not available. 7 BMC timer test Verifies that the SEL timer increments correctly. 10 Show BMC SSH Displays the BMC SSH Key. Keys 41 BMC NMI test This platform does not support this selection. 42 BMC Front Panel Button Test 43 SEL Write Test Extended test mode: Verifies that the SEL can be written to by software. Test is only available (Xtnd) in XTND mode. This test writes a dummy record into the SEL and checks if it was written correctly. 71 Show BMC SEL Displays the current time as measured by the BMC's SEL timer. time 72 Get reason for Identifies the reason for the previous reboot. restart 73 Show device Displays device information about the BMC. info 74 Show SDR info Displays information held in the BMC's SDR. 75 Show SEL info Displays information held in the BMC's SEL. 76 Clear SEL (Mfg) Option not available. 77 Emergency

78 79 80 91 92 93 99

shutdown (Mfg) BMC update menu (Xtnd) Dump SEL Records Dump Raw SEL Records Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

This platform is unable to perform this selection. Displays all the BMC SEL records in a user-readable format. Displays all the BMC SEL records in the raw format. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SAS] [Onboard IB] [BMC test] [NVMEM test]
Motherboard menu and submenus

NVMEM diagnostics
The following table describes the NVMEM test menu for the FAS20xx: Test Test no 1 Comprehensive NVMEM test 2 Battery test 71 Set battery armed 75 Fill for power cycle test, burst write 76 Fill for power cycle test, burst read 77 Fill for power cycle test 78 Verify data retention 82 Display memory by address 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Tests the battery. Toggles between arming and disarming the battery Fills NVRAM memory with data patterns for power cycle test, which does burst writes. Fills NVRAM memory with data patterns for power cycle test, which does burst reads. Fills NVRAM memory with data patterns for power cycle test. Checks the retention of data in NVRAM after a power cycle. Data comes from data patterns entered in Test 75. Displays the contents of a memory address location. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Diagnostics Menus - Motherboard

FAS3020/V3020 motherboard tests

About the FAS3020/V3020 motherboard tests
This section addresses the Motherboard menu and the Miscellaneous board test, the Cache test, the Onboard Ethernet test, and the Onboard FC-AL test submenus for the FAS3020/V3020 platform. To go to the error messages associated with the motherboard diagnostic tests, see Motherboard .

For detailed information

For detailed information about the menus, see the following sections: Motherboard menu Misc. board test menu Cache test menu Onboard Gigabit Ethernet test menu Onboard FC-AL test menu Onboard SCSI test menu You can generate the FAS3020/V3020 environmental error codes by running the miscellaneous board diagnostic tests.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SCSI]
Motherboard menu and submenus

Motherboard menu
This section describes the Motherboard menu: Test Test no 1 Comprehensive motherboard diag 2 Misc. board test menu 3 Cache test menu 4 Onboard Gigabit Ethernet test menu 5 Onboard FCAL test menu 6 Onboard SCSI test menu 71 Show PCI configuration 72 Show detailed PCI info 73 Initialize real-time clock 74 Show system info 75 Serial info setup menu [Factory only] 76 Show Adapter card info [Mfg only] 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Accesses the miscellaneous motherboard test menu. Accesses the CPU cache tests. For more information, see the Cache test menu. Accesses the onboard Gigabit Ethernet test menu. Accesses the onboard FC-AL test menu. Accesses the onboard SCSI test menu. Lists the contents of all adapters in the PCI slots on the motherboard. Displays detailed information about the contents and settings of the cards in the PCI slots. Initializes the onboard real-time clock to user-defined settings. Displays information about the system. Option not available. Option not available. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous board] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SCSI]
Motherboard menu and submenus

Miscellaneous board test menu

This section describes the Miscellaneous board test submenu. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode. Test Test Description no 1 Run all Runs all tests in this menu in current mode. miscellaneous tests 2 Check CPU/host This test checks the ability to read the board type from the EEPROM structure. bridge status Verifies the CPU speed and microcode revision. Verifies the motherboard has the correct hostbridge installed. Verifies that the hostbridge is in a good state. Sets the correct number of CPUs on the motherboard. 3 4 5 Check South Verifies that the South Bridge System I/O chipset is alive and responding normally. Bridge status Check PCI This test verifies that all available PCI devices are valid and are located in valid slots. devices and slots Check memory Verifies the interface and data path integrity between the CPU and the memory DIMMs. interface This is a very small subset of the memory diagnostics and is not intended to be a comprehensive test. Performs a sliding 0 and 1 test to fixed locations of memory. Cache is disabled prior to running and then re-enabled at the end of the test. Check boot flash This test verifies that the boot flash can be accessed reliably by software access Real-time clock This test will access the Real Time Clock and test its ability to count seconds. The RTC is test initialized and then the battery register is accessed to make sure that the correct status is read. Then the seconds register is accessed and the data is saved. The test will wait for about one second and then the seconds register is accessed again to make sure that it has changed. The second check will access the days register to make sure it is in the correct bounds (1-7). So, it basically verifies that the Real Time Clock is incrementing correctly and that its battery is in a good state. Check Checks the Environmental Status Register (ESR) for fault conditions, such as fan failure and environmental high temperature. status

6 7

9 11 12 13 14 41 71 72 73 74 91 92 93 99

Check Super I/O status Front panel LED exercise Front panel LCD exercise Test PCI devices [Factory only] Check on-board 8K nvsram Check watchdog interrupt Show PCI configuration Show detailed PCI info Initialize realtime clock Toggle front panel LEDs Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

Verifies that the Super I/O chip is alive and responding normally. Exercises the front panel LEDs by changing patterns in the displays. You need to observe the LEDs blinking to verify that they are working. Exercises the front panel LCD by changing patterns in the display. You need to observe the LCDs to verify that they are working. Option is unavailable. Verifies that the onboard 8K NVSRAM is working correctly. Checks that the watchdog interrupt is working. Shows the configuration of the Peripheral Component Interconnect (PCI), a peripheral bus. Shows detailed information about the PCI devices on the various PCI buses. Initializes the battery powered, real-time clock. Verifies that the front panel activity and status LEDs are working by turning them ON/OFF or changing colors. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous board] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SCSI]
Motherboard menu and submenus

Cache test menu

The section describes the Cache test submenu. Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. cache test 2 Cache walking This test performs a walking 1 in a field of zeroes and a walking 0 in a field of ones. This test data bits test is repeated at each 8K "bank" boundary. This test is intended to verify data lines within L2 cache and to/from/within each DIMM bank. Expected to detect hard faults such as shorts and opens. Cache stuck-at Scans through all cache locations, checking for stuck bits (0 or 1). faults test Cache random This test is intended to access chunks of memory within an individual DIMM as rapidly as read/write test possible to stress the DIMM. Block size is chosen to be large enough to force cache collisions. Operation (read/write) is chosen randomly, along with the block, so this test causes some unique stressing of the memory system. Cache random This test is intended to verify all locations of SRAM cache and is expected to detect all data test common SRAM failures such as stuck cells or cell coupling. Intermittent errors may also be encountered, caused by noise or margin problems. Parity and ECC are stressed by the random patterns used. Cache random This test is intended to verify overall operation of L2 cache, with particular emphasis on noise, address test signal coupling and simultaneous switching problems. Detection of intermittent and margin problems is also expected. Cache spill test Tests the cache interface to main memory. Causes cache flush and reload. Provides excellent test of cache management logic. Cache tag test Tests the cache tags by reading random addresses. Cache MP test Tests the cache on an MP system. Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is looping pressed or when an error is encountered if option 92 is active. Stop/continue Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping on looping continues after an error is encountered. error Exit Exits this diagnostics menu.

3 4

7 8 9 91 92

99

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SCSI]
Motherboard menu and submenus

Gigabit diagnostics
About the Gigabit diagnostic tests
This section describes the onboard Gigabit Ethernet (GbE) test submenu. The GbE diagnostic tests can generate error messages associated with the hardware and software. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices.

GbE diagnostic test menu

The following table describes the GbE diagnostic tests: Test Test no 1 Comprehensive GBE test 2 Reset test 3 EEPROM test 4 Internal lp test 1G 5 External lp test 1G (Xtnd) 6 Internal lp test 10B 7 Internal lp test 100B 8 External lp test 10B (Xtnd) 9 External lp test 100B (Xtnd) 10 Interrupt test 11 Quick Interrupt test 40 MAC loop test 41 Port-port 10B test (Xtnd) 42 Port-port 100B Description Runs all tests in this menu in current mode. Runs a test that verifies if the registers have the specified default values on reset on a reset of Intel GBE card. Runs a series of tests that reads and verifies EEPROM data on the GbE card. Places the device into an internal loopback mode to validate the correct functionality of the internal logic operations on the device. Extended test mode: Requires loopback plug to verify data correctness by transmitting data from the device to itself across the attached loopback. Tests data movement between main memory and the GbE card, using onboard loopback capability.

Extended test mode: Tests card functionality and data movement between memory and the Ethernet cable. Requires loopback plug.

Tests the transmit and receive interrupts to verify the device's ability to generate interrupts, and the system's ability to handle interrupts correctly. Tests and verifies that all the device interrupts are working. Data is not transfered during this test. This test will test data from the transmitter to the receiver before it goes to the MAC. This test tests the data path from one channel to another for the dual channel NICS, requires a twisted pair network cable to be connected between the 2 ports.

43 70 71 72 73 90 91 92 93 99

test (Xtnd) Port-port 1 G test (Xtnd) Display MAC address Display all registers Display EEPROM Set MAC address [Factory] GbE card selection Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

Verifies and displays the MAC address of the card. Displays all the card memory registers. Displays the EEPROM data on the GbE card. This is test is unavailable. Enables the selection of a specific GbE card in the system. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SCSI]
Motherboard menu and submenus

Onboard FC-AL diagnostics

This section describes the onboard FC-AL (Fibre Channel Arbitrated Loop) group of diagnostics tests. The tests range from EEPROM data verification through data transfer integrity testing. The FC-AL diagnostic tests can generate error messages associated with the interface and disk shelf. Note: To perform disk or shelf diagnostics, select test 90 and identify the channel. This returns you to the main FC-AL menu. Then select test 80 or 81. Caution: There are limitations to running Fibre Channel Diagnostics: This test does not support switches, media changeres, connections to the SAN environment, and Fibre Channel adapters functioning in target mode. The external loopback test does not detect the presence or absence of a loopback device before running, nor does it distinguish an open loop or broken cable. For example, the external loopback test fails if no loopback is attached. Users are responsible for correctly attaching the loopback device, and enabling external loopback tests. Running diagnostics on a Multipath High Availability nodes: If you are running tests 41, 42, 73 or option 4 of test 81 on a node in a Multi Path High Availability cabled pair of nodes, verify that one of the following is true: The partner node is at the CFE or Loader boot prompt. The partner node is powered off. The multipath high availability cabling for both nodes has been removed such that the appliance is only responsible for its own storage and not that of its partner.

FC-AL diagnostic test menu

Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices. The following table describes the available tests in the FC-AL diagnostic menu: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. FCAL test 2 Self test Verifies and tests the FC-AL chip configuration, firmware commands, mailboxes, status, error information, the serial EEPROM data, the ISP power-on self-test (POST), the on-chip SSRAM with fixed and random patterns, the SSRAM/DMA of fixed and random patterns between SSRAM and most locations of main memory, and ISP firmware in SSRAM. 3 ISP interrupt test Verifies the device's ability to generate interrupts, and the system's ability to handle interrupts correctly. 4 Int loop test Tests data movement between main memory and the FC-AL chip, using on-chip loopback capability for 10 bit and 1 bit.

5 6 7 8 9

Bus reset test [Xtnd] Ext loop test [Xtnd] Read-only bus test Read/write bus test [Mfg] Disk read test (FCTEST)

Extended test mode: Tests the FC-AL loop integrity and LRC functionality by resetting the bus. Extended test mode: Tests the functionality and data movement between memory and FC-AL cable. Requires loopback plug. Tests the FC-AL loop integrity by reading from each disk attached to the FC-AL interface. Option not available. Tests the FC-AL adapter loop integrity by reading from each disk attached to the FC-AL onboard interface. This test has optional parameters. Requires disks attached to the FC host adapter. Option not available. Lists the status of all the disks on all FC-AL adapters on the storage system. Requires disks attached to the FC host adapter. Lists the status of all the disks on the specified FC-AL adapters. Requires disks attached to the FC host adapter. Tests the external LEDs on the FC-AL card. Displays information about the ISP Fibre Channel chip. Displays all devices attached to a specific FC-AL adapter. Lists disk information for all disks attached to the system. Resets the selected FC-AL adapter to its original state. Displays the serial EEPROM data. Option not available. Displays the link statistics maintained for all drives on a Fibre Channel loop. Accesses the disk bus pattern diagnostics submenu. Accesses the disk shelf diagnostics submenu. Enables you to select a specific FC-AL interface for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option.

10 Disk read/write test [Mfg] 41 Scan all disks on all FC-AL adapters 42 Scan and show disks on selected FC-AL adapters 43 FC-AL adapter LED test 71 Show ISP FC chip info 72 Show attached FC-AL devices 73 Show all disks (probe-scsi-all) 74 Reset FC-AL adapter 75 Show serial EEPROM data 76 Program serial EEPROM data [Factory] 77 Display fcstat link_status 80 Go to disk diagnostic menu 81 Go to shelf diagnostics menu 90 FC-AL channel selection 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal

test mode 99 Exit

Exits this diagnostics menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk diagnostics submenu

The following table describes the FC-AL disk diagnostics submenu: Test Test no 1 Perform drive self diagnostic test 2 Low frequency pattern [Mfg] 3 Low transition density pattern [Mfg] 4 Half-rate square pattern [Mfg] 5 Quarter-rate square pattern [Mfg] 6 Contiguous '3' pattern [Mfg] 7 Composite pattern [Mfg] 40 Read drive defect list 99 Exit this menu Description The drive seeks a reserved non user-accessible cylinder and writes, reads, and verifies data for each data surface. Option not available.

Displays primary and grown defect list. This test has optional parameters. Requires disks attached to the FC host adapter. Returns the user to the main FC-AL menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Disk shelf diagnostics submenu

The following table describes the disk shelf diagnostics submenu for the FC-AL interface. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapters with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Enter xtnd n to cancel Extended test mode: Test no 1 2 3 4 5 6 7 8 9 10 11 12 70 93 99 Test Turn shelf LED on Turn shelf LED off Get trunk information Get shelf drive map Get shelf environment information Check SES temperature sensors Check SES Fans Check SES power supply Check SES ESH (HUB) Check all SES elements Loop integrity/LRC test [Xtnd] Show HUB status Display sector size for FC-AL devices Extended/normal test mode Exit this menu Description Turns on the drive LEDs. Turns off the drive LEDs. Option not available. Displays the list of drives on target FC-AL interface. Displays the environmental parameters on the target FC-AL interface. Checks SES temperature sensors against threshold value. Checks SES fan status. Checks SES power supply status. Option not available. Check status of all SES elements in the shelf. Extended test mode: Tests the FC-AL loop integrity and LRC functionality. Option not available. Displays the sector size for the drives on the disk shelves. Enables or disables extended mode on tests where extended mode is an available option. Returns the user to the main FC-AL menu.

[Up] [Motherboard] [Miscellaneous board] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard SCSI]
Motherboard menu and submenus

Onboard SCSI test menu

This section describes the Onboard SCSI test submenu. The SCSI diagnostic tests can generate error messages associated with the controller. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode: Test Test no 1 Comprehensive SCSI test 2 SCSI card self test Description Runs all tests in this menu in current mode. Verifies the PCI configuration registers, the SCSI chip configuration, firmware commands, mailboxes, and status and error information. Reads and verifies the serial EEPROM data. Tests the on-chip SSRAM with fixed and random data patterns. Tests the DMA of fixed and random data patterns between SSRAM and most locations of main memory. Runs built-in self-test Tests the ISP SCSI adapter interrupt. Extended test mode: Tests SCSI adapter loop integrity by reading from each disk attached to the SCSI adapter. Option not available. Tests the SCSI adapter connection by reading from each disk attached to the SCSI interface. Option not available. Lists the status of all the disks on the specified SCSI adapters. Requires disks attached to the SCSI host adapter on the R100. Displays information about the ISP chip. Displays the SCSI devices attached to the system. Displays all SCSI disks. Resets the SCSI adapter. Displays the serial EEPROM data. Option not available.

3 4 5 6 7 42 71 72 73 74 75 76

SCSI interrupt test Read-only bus test [Xtnd] Read/write bus test [Mfg] Disk read test (FCTEST) Disk read/write test Scan and show disks (R100) Show ISP chip info Show attached SCSI devices Show all disks (probe-scsi-all) Reset SCSI adapter Show serial EEPROM data Program serial EEPROM data

77

78

79 90 91 92 93 99

[Factory] Go to shelf Diagnostics menu Set serial # and revision [Factory] Zero disk test area [Factory] SCSI card selection Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

Option not available. Option not available. Option not available. Enables you to select a specific SCSI card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Diagnostics Menus - Motherboard

FAS3040/FAS3070/V3040/V3070 motherboard tests

About the FAS3040/FAS3070/V3040/V3070 motherboard tests
This section addresses the Motherboard menu and the Miscellaneous board test, the Cache test, the Onboard Ethernet test, and the Onboard FC-AL test submenus for the following platforms only: FAS3040 FAS3070 V3040 V3070 To go to the error messages associated with the motherboard diagnostic tests, see Motherboard error messages.

For detailed information

For detailed information about the menus, see the following sections: Motherboard menu Misc. board test menu Cache test menu Onboard Gigabit Ethernet test menu Onboard FC-AL test menu The following table identifies the environmental error messages that you can generate by running the miscellaneous board diagnostic tests for the motherboard: Miscellaneous Board Tests run on... FAS3040/V3040 motherboard FAS3070/V3070 motherboard See... FAS3040/FAS3070/V3040/V3070 environmental error codes

[Up] [Motherboard] [Miscellaneous board] [Cache test] [Onboard GbE] [Onboard FC-AL]
Motherboard menu and submenus

Motherboard menu
This section describes the Motherboard menu: Test Test no 1 Comprehensive motherboard diag 2 Misc. board test menu 3 Cache test menu 4 Onboard Gigabit Ethernet test menu 5 Onboard FCAL test menu 71 Show PCI configuration 72 Show detailed PCI info 74 Show system info 75 Serial info setup menu [Factory only] 76 Show Adapter card info [Mfg only] 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Accesses the miscellaneous motherboard test menu. Accesses the CPU cache tests. For more information, see the Cache test menu. Accesses the onboard Gigabit Ethernet test menu. Accesses the onboard FC-AL test menu. Lists the contents of all adapters in the PCI slots on the motherboard. Displays detailed information about the contents and settings of the cards in the PCI slots. Displays information about the system. Option not available. Option not available. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous board] [Cache test] [Onboard GbE] [Onboard FC-AL]
Motherboard menu and submenus

Miscellaneous board test menu

This section describes the Miscellaneous board test submenu. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode. Test Test no 1 Run all miscellaneous tests 3 Check South Bridge status 4 Check PCI devices and slots 5 Check memory interface Description Runs all tests in this menu in current mode. Verifies that the South Bridge System I/O chipset is alive and responding normally. This test verifies that all available PCI devices are valid and are located in valid slots. Verifies the interface and data path integrity between the CPU and the memory DIMMs. This is a very small subset of the memory diagnostics and is not intended to be a comprehensive test. Performs a sliding 0 and 1 test to fixed locations of memory. Cache is disabled prior to running and then re-enabled at the end of the test.

Real-time clock This test will access the Real Time Clock and test its ability to count seconds. The RTC is test initialized and then the battery register is accessed to make sure that the correct status is read. Then the seconds register is accessed and the data is saved. The test will wait for about one second and then the seconds register is accessed again to make sure that it has changed. The second check will access the days register to make sure it is in the correct bounds (1-7). So, it basically verifies that the Real Time Clock is incrementing correctly and that its battery is in a good state. 8 Check Checks the Environmental Status Register (ESR) for fault conditions, such as fan failure and environmental high temperature. status 9 Check Super I/O Verifies that the Super I/O chip is alive and responding normally. status 11 Front panel LED Exercises the front panel LEDs by changing patterns in the displays. You need to observe the exercise LEDs blinking to verify that they are working. 12 Front panel LCD Exercises the front panel LCD by changing patterns in the display. You need to observe the exercise LCDs to verify that they are working. 41 Check watchdog Checks that the watchdog interrupt is working. interrupt 7

42 NMI Dump Switch Test 43 Check HT link speed 71 Show PCI configuration 72 Show detailed PCI info 73 Initialize realtime clock 74 Toggle front panel LEDs 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

Within two minutes of selecting this test, you must press the NMI switch below the front panel. You will then get a confirmation message. Verifies if the HT link frequency and the width are the same as the factory settings. Shows the configuration of the Peripheral Component Interconnect (PCI), a peripheral bus. Shows detailed information about the PCI devices on the various PCI buses. Initializes the battery powered, real-time clock. Verifies that the front panel activity and status LEDs are working by turning them ON/OFF or changing colors. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous board] [Cache test] [Onboard GbE] [Onboard FC-AL]
Motherboard menu and submenus

Cache test menu

The section describes the Cache test submenu. Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. cache test 2 Cache walking This test performs a walking 1 in a field of zeroes and a walking 0 in a field of ones. This test data bits test is repeated at each 8K "bank" boundary. This test is intended to verify data lines within L2 cache and to/from/within each DIMM bank. Expected to detect hard faults such as shorts and opens. Cache stuck-at Scans through all cache locations, checking for stuck bits (0 or 1). faults test Cache random This test is intended to access chunks of memory within an individual DIMM as rapidly as read/write test possible to stress the DIMM. Block size is chosen to be large enough to force cache collisions. Operation (read/write) is chosen randomly, along with the block, so this test causes some unique stressing of the memory system. Cache random This test is intended to verify all locations of SRAM cache and is expected to detect all data test common SRAM failures such as stuck cells or cell coupling. Intermittent errors may also be encountered, caused by noise or margin problems. Parity and ECC are stressed by the random patterns used. Cache random This test is intended to verify overall operation of L2 cache, with particular emphasis on noise, address test signal coupling and simultaneous switching problems. Detection of intermittent and margin problems is also expected. Cache spill test Tests the cache interface to main memory. Causes cache flush and reload. Provides excellent test of cache management logic. Cache tag test Tests the cache tags by reading random addresses. Cache MP test Tests the cache on an MP system. Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is looping pressed or when an error is encountered if option 92 is active. Stop/continue Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping on looping continues after an error is encountered. error Exit Exits this diagnostics menu.

3 4

7 8 9 91 92

99

[Up] [Motherboard] [Miscellaneous board] [Cache test] [Onboard GbE] [Onboard FC-AL]
Motherboard menu and submenus

Gigabit diagnostics
About the Gigabit diagnostic tests
This section describes the onboard Gigabit Ethernet (GbE) test submenu. The GbE diagnostic tests can generate error messages associated with the hardware and software. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices.

GbE diagnostic test menu

The following table describes the GbE diagnostic tests: Test Test no 1 Comprehensive bge test 2 Reset test 3 Link test [Xtnd] 4 EEPROM test 5 Interrupt test [Xtnd] 6 Internal Mac lp test 10B 7 Internal Mac lp test 100B 8 Internal Mac lp test 1G 9 External lp test 10Bt [Xtnd] 10 External lp test 100Bt [Xtnd] 11 External lp test 1G [Xtnd] 40 Port-port 10B test (Xtnd) 41 Port-port 100B test (Xtnd) 42 Port-port 1 G test (Xtnd) Description Runs all tests in this menu in current mode. Verifies software reset function. Verifies the external link condition. Requires loopback plug or Ethernet connection. Displays the Electrically Erasable Programmable Read Only Memory (EEPROM) contents. Tests the interrupt mechanism. Checks transmit and receive interrupts, as well as timer interrupts. Requires loopback plug. These tests are unsupported by the controller.

Extended test mode: Tests data transfer between memory and the Ethernet chip on the 10BaseT/100Base-TX interface, involving loopback over connected wire. Also tests overall Ethernet functionality. Requires loopback plug.

This test tests the data path from one channel to another for the dual channel NICS, requires a twisted pair network cable to be connected between the 2 ports.

70 Display MAC address 71 Display all registers 72 Display all stats counters 73 Dump EEPROM 74 Set MAC address [Factory only] 75 EEPROM firmware update [Factory only] 90 BGE card selection 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Return to main menu

Verifies and displays the MAC address of the card. Displays all the card memory registers. Displays all the card statistics. Displays the EEPROM data. Option is unavailable. Option is unavailable. Enables you to select the onboard Ethernet port for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Returns you to the main Diagnostics menu.

[Up] [Motherboard] [Miscellaneous board] [Cache test] [Onboard GbE] [Onboard FC-AL]
Motherboard menu and submenus

Onboard FC-AL diagnostics

This section describes the onboard FC-AL (Fibre Channel Arbitrated Loop) group of diagnostics tests. The tests range from EEPROM data verification through data transfer integrity testing. The FC-AL diagnostic tests can generate error messages associated with the interface and disk shelf. Note: To perform disk or shelf diagnostics, select test 90 and identify the channel. This returns you to the main FC-AL menu. Then select test 80 or 81. Caution: There are limitations to running Fibre Channel Diagnostics: This test does not support switches, media changeres, connections to the SAN environment, and Fibre Channel adapters functioning in target mode. The external loopback test does not detect the presence or absence of a loopback device before running, nor does it distinguish an open loop or broken cable. For example, the external loopback test fails if no loopback is attached. Users are responsible for correctly attaching the loopback device, and enabling external loopback tests. Running diagnostics on a Multipath High Availability nodes: If you are running tests 41, 42, 73 or option 4 of test 81 on a node in a Multi Path High Availability cabled pair of nodes, verify that one of the following is true: The partner node is at the CFE or Loader boot prompt. The partner node is powered off. The multipath high availability cabling for both nodes has been removed such that the appliance is only responsible for its own storage and not that of its partner.

FC-AL diagnostic test menu

Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices. The following table describes the available tests in the FC-AL diagnostic menu: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. FCAL test 2 Self test Verifies and tests the FC-AL chip configuration, firmware commands, mailboxes, status, error information, the serial EEPROM data, the ISP power-on self-test (POST), the on-chip SSRAM with fixed and random patterns, the SSRAM/DMA of fixed and random patterns between SSRAM and most locations of main memory, and ISP firmware in SSRAM. 3 ISP interrupt test Verifies the device's ability to generate interrupts, and the system's ability to handle interrupts correctly. 4 Int loop test Tests data movement between main memory and the FC-AL chip, using on-chip loopback capability for 10 bit and 1 bit.

5 6 7 8 9

Bus reset test [Xtnd] Ext loop test [Xtnd] Read-only bus test Read/write bus test [Mfg] Disk read test (FCTEST)

Extended test mode: Tests the FC-AL loop integrity and LRC functionality by resetting the bus. Extended test mode: Tests the functionality and data movement between memory and FC-AL cable. Requires loopback plug. Tests the FC-AL loop integrity by reading from each disk attached to the FC-AL interface. Option not available. Tests the FC-AL adapter loop integrity by reading from each disk attached to the FC-AL onboard interface. This test has optional parameters. Requires disks attached to the FC host adapter. Option not available. Lists the status of all the disks on all FC-AL adapters on the storage system. Requires disks attached to the FC host adapter. Lists the status of all the disks on the specified FC-AL adapters. Requires disks attached to the FC host adapter. Tests the external LEDs on the FC-AL card. Test the mode (target or initiator) of the FC-AL. Displays information about the ISP Fibre Channel chip. Displays all devices attached to a specific FC-AL adapter. Lists disk information for all disks attached to the system. Resets the selected FC-AL adapter to its original state. Displays the serial EEPROM data. Option not available. Displays the link statistics maintained for all drives on a Fibre Channel loop. Accesses the disk bus pattern diagnostics submenu. Accesses the disk shelf diagnostics submenu. Display the onboard Fibre Channel port's World Wide Name. Enables you to select a specific FC-AL interface for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is

10 Disk read/write test [Mfg] 41 Scan all disks on all FC-AL adapters 42 Scan and show disks on selected FC-AL adapters 43 FC-AL adapter LED test 44 FC-AL initiatortarget test 71 Show ISP FC chip info 72 Show attached FC-AL devices 73 Show all disks (probe-scsi-all) 74 Reset FC-AL adapter 75 Show serial EEPROM data 76 Program serial EEPROM data [Factory] 77 Display fcstat link_status 80 Go to disk diagnostic menu 81 Go to shelf diagnostics menu 85 Show onboard Fcal WWN 90 FC-AL channel selection 91 Enable/disable

looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk diagnostics submenu

The following table describes the FC-AL disk diagnostics submenu: Test Test no 1 Perform drive self diagnostic test 2 Low frequency pattern [Mfg] 3 Low transition density pattern [Mfg] 4 Half-rate square pattern [Mfg] 5 Quarter-rate square pattern [Mfg] 6 Contiguous '3' pattern [Mfg] 7 Composite pattern [Mfg] 40 Read drive defect list 99 Exit this menu Description The drive seeks a reserved non user-accessible cylinder and writes, reads, and verifies data for each data surface. Option not available.

Displays primary and grown defect list. This test has optional parameters. Requires disks attached to the FC host adapter. Returns the user to the main FC-AL menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Disk shelf diagnostics submenu

The following table describes the disk shelf diagnostics submenu for the FC-AL interface. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapters with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Enter xtnd n to cancel Extended test mode: Test no 1 2 3 4 5 6 7 8 9 10 11 12 70 93 99 Test Turn shelf LED on Turn shelf LED off Get trunk information Get shelf drive map Get shelf environment information Check SES temperature sensors Check SES Fans Check SES power supply Check SES ESH (HUB) Check all SES elements Loop integrity/LRC test [Xtnd] Show HUB status Display sector size for FC-AL devices Extended/normal test mode Exit this menu Description Turns on the drive LEDs. Turns off the drive LEDs. Option not available. Displays the list of drives on target FC-AL interface. Displays the environmental parameters on the target FC-AL interface. Checks SES temperature sensors against threshold value. Checks SES fan status. Checks SES power supply status. Option not available. Check status of all SES elements in the shelf. Extended test mode: Tests the FC-AL loop integrity and LRC functionality. Option not available. Displays the sector size for the drives on the disk shelves. Enables or disables extended mode on tests where extended mode is an available option. Returns the user to the main FC-AL menu.

Diagnostics Menus - Motherboard

FAS31xx/V31xx motherboard tests

About the FAS31xx/V31xx motherboard tests
This section addresses the Motherboard menu and the Miscellaneous board test, the Cache test, the Onboard Ethernet test, and the Onboard FC-AL test submenus for the FAS31xx/V31xx platform. To go to the error messages associated with the motherboard diagnostic tests, see Motherboard error messages.

For detailed information

For detailed information about the menus, see the following sections: Motherboard menu Misc. board test menu Cache test menu Onboard Gigabit Ethernet test menu Onboard FC-AL test menu Onboard NVRAM menu Ethernet switch test menu You can generate the FAS31xx/V31xx environmental error codes by running the miscellaneous board diagnostic tests.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard NVRAM test] [Ethernet Switch test]
Motherboard menu and submenus

Motherboard menu
This section describes the Motherboard menu: Test Test no 1 Comprehensive motherboard diag 2 Misc. board test menu 3 Cache test menu 4 Onboard Gigabit Ethernet test menu 5 Onboard FCAL test menu 6 NVRAM test menu 7 Ethernet Switch test menu 71 Show PCI configuration 72 Show detailed PCI info 74 Show system info 75 Serial info setup menu [Factory only] 76 Show Adapter card info [Mfg only] 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Accesses the miscellaneous motherboard test menu. Accesses the CPU cache tests. For more information, see the Cache test menu. Accesses the onboard Gigabit Ethernet test menu. Accesses the onboard FC-AL test menu. Accesses the NVRAM test menu. Accesses the menu that tests the failover assistance switch. Lists the contents of all adapters in the PCI slots on the motherboard. Displays detailed information about the contents and settings of the cards in the PCI slots. Displays information about the system. Option not available. Option not available. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard NVRAM test] [Ethernet Switch test]
Motherboard menu and submenus

Miscellaneous board test menu

This section describes the Miscellaneous board test submenu. Test Test Description no 1 Run all Runs all tests in this menu in current mode. miscellaneous tests 2 Check This test checks the ability to read the board type from the EEPROM structure. CPU/Northbridge Verifies the CPU speed and microcode revision. status Verifies the motherboard has the correct hostbridge installed. Verifies that the hostbridge is in a good state. Sets the correct number of CPUs on the motherboard. 3 Check Southbridge status This test checks the ability to read the Southbridge information about the bridges available in the system. Verifies that the motherboard has the correct southbridge installed (based on the system model information). Verifies that the southbridge is in a good state.

4 Check PCI This test verifies that all available PCI devices are valid and are located in valid slots. devices and slots 5 Check memory Verifies the interface and data path integrity between the CPU and the memory DIMMs. interface This is a very small subset of the memory diagnostics and is not intended to be a comprehensive test. Performs a sliding 0 and 1 test to fixed locations of memory. Cache is disabled prior to running and then re-enabled at the end of the test. 6 Check boot flash This test verifies that the boot flash can be accessed reliably by software access 7 Real-time clock This test will access the Real Time Clock and test its ability to count seconds. The RTC is test initialized and then the battery register is accessed to make sure that the correct status is read. Then the seconds register is accessed and the data is saved. The test will wait for about one second and then the seconds register is accessed again to make sure that it has changed. The second check will access the days register to make sure it is in the correct bounds (1-7). So, it basically verifies that the Real Time Clock is incrementing correctly and that its battery is in a good state. 8 Check Checks the Environmental Status Register (ESR) for fault conditions, such as fan failure and environmental high temperature. status 71 Show PCI Shows the configuration of the Peripheral Component Interconnect (PCI), a peripheral bus. configuration 72 Show detailed Shows detailed information about the PCI devices on the various PCI buses.

73 91 92 93 99

PCI info Initialize realtime clock Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

Initializes the battery powered, real-time clock. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard NVRAM test] [Ethernet Switch test]
Motherboard menu and submenus

Cache test menu

The section describes the Cache test submenu. Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. cache test 2 Cache walking This test performs a walking 1 in a field of zeroes and a walking 0 in a field of ones. This test data bits test is repeated at each 8K "bank" boundary. This test is intended to verify data lines within L2 cache and to/from/within each DIMM bank. Expected to detect hard faults such as shorts and opens. Cache stuck-at Scans through all cache locations, checking for stuck bits (0 or 1). faults test Cache random This test is intended to access chunks of memory within an individual DIMM as rapidly as read/write test possible to stress the DIMM. Block size is chosen to be large enough to force cache collisions. Operation (read/write) is chosen randomly, along with the block, so this test causes some unique stressing of the memory system. Cache random This test is intended to verify all locations of SRAM cache and is expected to detect all data test common SRAM failures such as stuck cells or cell coupling. Intermittent errors may also be encountered, caused by noise or margin problems. Parity and ECC are stressed by the random patterns used. Cache random This test is intended to verify overall operation of L2 cache, with particular emphasis on noise, address test signal coupling and simultaneous switching problems. Detection of intermittent and margin problems is also expected. Cache spill test Tests the cache interface to main memory. Causes cache flush and reload. Provides excellent test of cache management logic. Cache tag test Tests the cache tags by reading random addresses. Cache MP test Tests the cache on an MP system. Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is looping pressed or when an error is encountered if option 92 is active. Stop/continue Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping on looping continues after an error is encountered. error Exit Exits this diagnostics menu.

3 4

7 8 9 91 92

99

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard NVRAM test] [Ethernet Switch test]
Motherboard menu and submenus

Gigabit diagnostics
About the Gigabit diagnostic tests
This section describes the onboard Gigabit Ethernet (GbE) test submenu. The GbE diagnostic tests can generate error messages associated with the hardware and software. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices.

GbE diagnostic test menu

The following table describes the GbE diagnostic tests: Test Test no 1 Comprehensive bge test 2 Reset test 3 Link test [Xtnd] 4 EEPROM test 5 Interrupt test [Xtnd] 6 Internal Mac lp test 10B 7 Internal Mac lp test 100B 8 Internal Mac lp test 1G 9 External lp test 10Bt [Xtnd] 10 External lp test 100Bt [Xtnd] 11 External lp test 1G [Xtnd] 40 Port-port 10B test (Xtnd) 41 Port-port 100B test (Xtnd) 42 Port-port 1 G test Description Runs all tests in this menu in current mode. Verifies software reset function. Verifies the external link condition. Requires loopback plug or Ethernet connection. Displays the Electrically Erasable Programmable Read Only Memory (EEPROM) contents. Tests the interrupt mechanism. Checks transmit and receive interrupts, as well as timer interrupts. Requires loopback plug. These tests are unsupported by the controller.

Extended test mode: Tests data transfer between memory and the Ethernet chip on the 10Base-T/100Base-TX interface, involving loopback over connected wire. Also tests overall Ethernet functionality. Requires loopback plug.

This test tests the data path from one channel to another for the dual channel NICS, requires a twisted pair network cable to be connected between the 2 ports.

70 71 72 73 74 75

76

77 90 91 92 93 99

(Xtnd) Display MAC address Display all registers Display all stats counters Dump EEPROM Set MAC address [Factory only] EEPROM firmware update [Factory only] Set IO board FRU information [Factory only] Show IO board FRU information BGE card selection Enable/disable looping Stop/continue looping on error Extended/normal test mode Return to main menu

Verifies and displays the MAC address of the card. Displays all the card memory registers. Displays all the card statistics. Displays the EEPROM data. Option is unavailable. Option is unavailable. Option is unavailable. Display the IO Board FRU information. Enables you to select the onboard Ethernet port for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Returns you to the main Diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard NVRAM test] [Ethernet Switch test]
Motherboard menu and submenus

Onboard FC-AL diagnostics

This section describes the onboard FC-AL (Fibre Channel Arbitrated Loop) group of diagnostics tests. The tests range from EEPROM data verification through data transfer integrity testing. The FC-AL diagnostic tests can generate error messages associated with the interface and disk shelf. FAS31xxA only: If you are running diagnostics on system module B and you responded that system module A is running Data ONTAP or Diagnostics, then only tests 2, 3, and 4 are available for running. Note: To perform disk or shelf diagnostics, select test 90 and identify the channel. This returns you to the main FC-AL menu. Then select test 80 or 81. Caution: There are limitations to running Fibre Channel Diagnostics: This test does not support switches, media changeres, connections to the SAN environment, and Fibre Channel adapters functioning in target mode. The external loopback test does not detect the presence or absence of a loopback device before running, nor does it distinguish an open loop or broken cable. For example, the external loopback test fails if no loopback is attached. Users are responsible for correctly attaching the loopback device, and enabling external loopback tests. Running diagnostics on a Multipath High Availability nodes: If you are running tests 41, 42, 73 or option 4 of test 81 on a node in a Multi Path High Availability cabled pair of nodes, verify that one of the following is true: The partner node is at the CFE or Loader boot prompt. The partner node is powered off. The multipath high availability cabling for both nodes has been removed such that the appliance is only responsible for its own storage and not that of its partner.

FC-AL diagnostic test menu

Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices. The following table describes the available tests in the FC-AL diagnostic menu: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. FCAL test 2 Self test Verifies and tests the FC-AL chip configuration, firmware commands, mailboxes, status, error information, the serial EEPROM data, the ISP power-on self-test (POST), the on-chip SSRAM with fixed and random patterns, the SSRAM/DMA of fixed and random patterns between SSRAM and most locations of main memory, and ISP firmware in SSRAM. 3 ISP interrupt test Verifies the device's ability to generate interrupts, and the system's ability to handle interrupts

4 5 6 7 8 9

Int loop test Bus reset test [Xtnd] Ext loop test [Xtnd] Read-only bus test Read/write bus test [Mfg] Disk read test (FCTEST)

correctly. Tests data movement between main memory and the FC-AL chip, using on-chip loopback capability for 10 bit and 1 bit. Extended test mode: Tests the FC-AL loop integrity and LRC functionality by resetting the bus. Extended test mode: Tests the functionality and data movement between memory and FC-AL cable. Requires loopback plug. Tests the FC-AL loop integrity by reading from each disk attached to the FC-AL interface. Option not available. Tests the FC-AL adapter loop integrity by reading from each disk attached to the FC-AL onboard interface. This test has optional parameters. Requires disks attached to the FC host adapter. Option not available. Lists the status of all the disks on all FC-AL interfaces on the storage system. Requires disks attached to the FC host interface. Lists the status of all the disks on the specified FC-AL interface. Requires disks attached to the FC host interface. Tests the external LEDs on the FC-AL card. The test is not supported. Displays information about the ISP Fibre Channel chip. Displays all devices attached to a specific FC-AL adapter. Lists disk information for all disks attached to the system. Resets the selected FC-AL adapter to its original state. Displays the serial EEPROM data. Option not available. Displays the link statistics maintained for all drives on a Fibre Channel loop. Accesses the disk bus pattern diagnostics submenu. Accesses the disk shelf diagnostics submenu. Enables you to select a specific FC-AL interface for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is

10 Disk read/write test [Mfg] 41 Scan all disks on all FC-AL 42 Scan and show disks on selected FC-AL 43 FC-AL adapter LED test 44 FC initiatortarget test 71 Show ISP FC chip info 72 Show attached FC-AL devices 73 Show all disks (probe-scsi-all) 74 Reset FC-AL adapter 75 Show serial EEPROM data 76 Program serial EEPROM data [Factory] 77 Display fcstat link_status 80 Go to disk diagnostic menu 81 Go to shelf diagnostics menu 90 FC-AL card selection 91 Enable/disable

looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk diagnostics submenu

The following table describes the FC-AL disk diagnostics submenu: Test Test no 1 Perform drive self diagnostic test 2 Low frequency pattern [Mfg] 3 Low transition density pattern [Mfg] 4 Half-rate square pattern [Mfg] 5 Quarter-rate square pattern [Mfg] 6 Marvell 8030 test pattern 1 [Mfg] 7 Marvell 8030 test pattern 2 [Mfg] 8 Marvell 8030 test pattern 3 [Mfg] 9 Pattern 0 [Mfg] 10 Contiguous '3' pattern [Mfg] 11 Composite pattern [Mfg] 40 Read drive defect list 99 Exit this menu Description The drive seeks a reserved non user-accessible cylinder and writes, reads, and verifies data for each data surface. Option not available.

Displays primary and grown defect list. This test has optional parameters. Requires disks attached to the FC host adapter. Returns the user to the main FC-AL menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Disk shelf diagnostics submenu

The following table describes the disk shelf diagnostics submenu for the FC-AL interface. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapters with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Enter xtnd n to cancel Extended test mode: Test Test no 1 Check LED 2 Get trunk information 3 4 5 6 7 8 9 10 11 12 70 93 99 Get shelf drive map Get shelf environment information Check SES temperature sensors Check SES FANs Check SES Power Supply Check SES ESH (HUB) Check all SES elements Loop integrity/LRC test [Xtnd] Show HUB status Show Expander Status Display disk sector size Extended/normal test mode Exit this menu Description Turns on the drive LEDs. Displays the list of disk shelves and their firmware revisions on the target FCAL card. Displays the list of drives on the disk shelves of the target FC-AL card. Displays the environmental parameters for the disk shelves on the target FCAL card. Check SES temperature sensors against threshold value. Check SES fan status. Check SES Power Supply status. Option not available. Check status of all SES elements in the shelf. Option not available.

Displays the expander status. Displays the sector size for the drives on the disk shelves. Enables or disables extended mode on tests where extended mode is an available option. Returns the user to the main FC-AL menu.

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Motherboard menu and submenus

NVRAM diagnostics
The following table describes the NVRAM test menu for the FAS31xx/V31xx : Test Test no 1 Comprehensive NVRAM test 2 NVRAM memory menu 3 NVRAM IB menu 5 NVRAM environmental test 6 NVRAM EEPROM test 7 NVRAM FLASH test 8 NVRAM i2c test 70 Set NVRAM properties [Mfg only] 71 Display NVRAM properties 72 Display NVRAM EEPROM 73 Display NVRAM status 74 Display NVRAM config space 76 Upgrade NVRAM firmware [Xtnd] 77 Clear NVRAM properties [Mfg only] 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Accesses the NVRAM memory menu. Accesses the IB menu which tests the part of the adapter associated with clustering. Accesses the environmental test menu. Tests the NVRAM EEPROM subcomponent. Tests the NVRAM FLASH subcomponent. Tests the NVRAM i2c bus. Option not available. Displays information about the NVRAM7 adapter. Displays information about the NVRAM7 Electrically Erasable Programmable Read Only Memory (EEPROM) contents. Displays information about the NVRAM7 status. Displays information about the NVRAM7 configuration space. Extended test mode: Updates the firmware on the NVRAM7. Option not available. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Memorydiagnostics] [IBdiagnostics] [Environmentaldiagnostics]

NVRAM7 diagnostics

Memory diagnostics
The following table describes the NVRAM7 memory test menu: Test Test no 1 Comprehensive NVRAM memory test 2 NVRAM memory walking data test 3 NVRAM memory walking address test 4 NVRAM memory partial word test 5 NVRAM memory random data test 6 NVRAM memory random address test 10 NVRAM DIMM SPD test 11 Display NVRAM DIMM SPD 12 Dump NVRAM DIMM SPD 20 Inject ECC errors [Xtnd only] 21 Inject/read ECC errors [Xtnd only] 50 NVRAM DMA Write-Read-Verify 51 NVRAM DMA Write-only 52 NVRAM DMA Read-only 70 NVRAM memory dump 71 NVRAM memory poke 72 NVRAM memory custom pattern 74 Memory fill power cycle test 75 Memory write power Description Runs all tests in current mode. Runs quick test of data lines. Runs quick test of all address lines to verify address paths in NVRAM memory. Tests intermixed data sizes. Runs longer test by writing and reading random data to all NVRAM locations. Runs longer test using random addresses. Compares NVRAM DIMM properties (SPD) against supported values. Displays NVRAM DIMM properties (SPD) as field-value pairs. Displays NVRAM DIMM properties (SPD) as a hexadecimal dump. Extended test mode: Injects ECC errors into the NVRAM DIMM, without triggering detection. Extended test mode: Injects ECC errors into the NVRAM DIMM, and then triggers detection. Fills system memory with a random data pattern, and then DMA transfers this pattern back-and-forth from NVRAM memory. Fills system memory with a random data pattern, and then DMA transfers this pattern to NVRAM memroy. Fills NVRAM memory with a random data pattern, and then DMA transfers this pattern to system memory. Allows the user to dump a region of memory. Allows the user to write to a region of memory. Fills NVRAM memory with a user-specified data pattern. Fills NVRAM memory with data patterns for power cycle test. Fills NVRAM memory with data patterns for power cycle test, which does burst writes.

cycle test 76 Memory read power Fills NVRAM memory with data patterns for power cycle test, which does burst reads. cycle test 77 Memory DMA write Fills NVRAM memory with data patterns for power cycle test, which does DMA writes. power cycle test 78 Verify data retention Checks the retention of data in NVRAM after a power cycle. Data comes from data patterns entered in Test 75. 80 Memory class change Option not available. [Mfg only] 90 NVRAM card Enables the selection of a specific NVRAM card for testing. selection 91 Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when looping Ctrl-C is pressed or when an error is encountered if option 92 is active. 92 Stop/continue on Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option error 91, looping continues after an error is encountered. 93 Extended/normal test Enables or disables extended mode on tests where extended mode is an available option. mode 99 Exit Exits this diagnostics menu.

[Up] [Memorydiagnostics] [IBdiagnostics] [Environmentaldiagnostics]

NVRAM7 diagnostics

NVRAM7 IB diagnostics
The following table describes the tests in the NVRAM7 IB diagnostic test: Test Test no 1 Comprehensive NVRAM cluster test 2 Internal loopback RDMAW test 3 Internal loopback send test 4 Link test [Xtnd] 5 External loopback RDMAW test [Xtnd] 6 External loopback send test [Xtnd] 70 Reset port performance counter 71 Display port performance counter 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Test remote direct memory access write (RDMAW) between host memory and NVRAM7 card, using onchip loopback. Test data transfer between host memory and NVRAM7 card, using onchip loopback. Extended test mode: Verify external link status. Point to point cable needed. Extended test mode: Test remote direct memory access write (RDMAW) between host memory and NVRAM7 card, using external loopback. Point to point cable needed. Extended test mode: Test data transfer between host memory and NVRAM7 card, using external loopback. Point to point cable needed. Resets the counter on the performance of the cluster ports. Displays information about the performance of the cluster ports. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Memorydiagnostics] [IBdiagnostics] [Environmentaldiagnostics]

NVRAM7 diagnostics

Environmental diagnostics
The following table describes the NVRAM7 environmental test menu. The NVRAM7 environmental test can generate environmental error messages associated with the battery or the temperature sensors. The corrective action for this error message grouping is below the error message description: Test Test no 1 Comprehensive NVRAM env test 2 NVRAM env subsytem test 3 NVRAM battery test 4 NVRAM charger test 70 GPIO bit control 71 GPIO dump 72 Turn battery on 73 Turn charger on 74 LM81 I2C dump 75 LM81 I2C write 76 Force GPIO interrupt 77 Charge Battery 78 Discharge Battery 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Tests the interrupt conditions for each sensor. Tests the battery. Tests the battery charger. Allows the user to toggle the general purpose IO lines. Dumps the settings of the general purpose IO lines. Turns on the battery. Turns on the battery charger. Allows the user to read the devices on the NVRAM board. Allows the user to write to the devices on the NVRAM board. Force an interrupt from the NVRAM board through the general purpose IO line. Charges the NVRAM battery to a user-specified voltage. Discharges the NVRAM battery to a user-specified voltage. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Environmental error message range and affected item

The following tablelists the error code range and part of the error strings identifying the affected item. The full error string depends on your system configuration: Error code range Partial error string

ENV01960x ENV01961x

NVRAM7-battery-0 NVRAM7-temperature-0

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error code range: Error code range ENV01960x ENV01961x Corrective action 1. Verify that the NVRAM7 battery is connected. 2. Call NetApp Technical Support if the error is not corrected. Call NetApp Technical Support if the error is not corrected.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL] [Onboard NVRAM test] [Ethernet Switch test]
Motherboard menu and submenus

Ethernet switch menu

This section describes the Ethernet switch menu which tests the failover assistance switch. The Ethernet switch diagnostic tests can generate error messages associated with the hardware and software. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode: Test Test no 1 Comprehensive test 2 Management port test suite (Mfg) 3 Remote management port test (Mfg) 4 Backplane test suite (Mfg) 70 Dump Switch config EEPROM 71 Dump Switch config Registers 72 Dump Switch Counters 73 Program Switch's EEPROM (Mfg) 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Option not available.

This option dumps the content of the switch config EEPROM. This option dumps the content of the switch config registers. This option dumps the content of the switch's receive and transmit counters for each port. Option not available. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Diagnostics Menus - Motherboard

FAS60xx/V60xx/SA600 motherboard tests

About the FAS60xx/V60xx/SA600 motherboard tests
This section addresses the Motherboard menu and the Miscellaneous board test, the Cache test, the Onboard Ethernet test, and the Onboard FC-AL test submenus for the FAS60xx/V60xx/SA600 platforms. To go to the error messages associated with the motherboard diagnostic tests, see Motherboard error messages.

For detailed information

For detailed information about the menus, see the following sections: Motherboard menu Misc. board test menu Cache test menu Onboard Gigabit Ethernet test menu Onboard FC-AL test menu You can generate the FAS60xx/V60xx/SA600 environmental error codes by running the miscellaneous board diagnostic tests.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL]
Motherboard menu and submenus

Motherboard menu
This section describes the Motherboard menu: Test Test no 1 Comprehensive motherboard diag 2 Misc. board test menu 3 Cache test menu 4 Onboard Gigabit Ethernet test menu 5 Onboard FCAL test menu 71 Show PCI configuration 72 Show detailed PCI info 73 Initialize real-time clock 74 Show system info 75 Serial info setup menu [Factory only] 76 Show Adapter card info [Mfg only] 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Accesses the miscellaneous motherboard test menu. Accesses the CPU cache tests. For more information, see the Cache test menu. Accesses the onboard Gigabit Ethernet test menu. Accesses the onboard FC-AL test menu. Lists the contents of all adapters in the PCI slots on the motherboard. Displays detailed information about the contents and settings of the cards in the PCI slots. Initializes the onboard real-time clock to user-defined settings. Displays information about the system. Option not available. Option not available. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboard] [Miscellaneous board] [Cache test] [Onboard GbE] [Onboard FC-AL]
Motherboard menu and submenus

Miscellaneous board test menu

This section describes the Miscellaneous board test submenu. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode. Test Test no 1 Run all miscellaneous tests 3 Check South Bridge status 4 Check PCI devices and slots 5 Check memory interface Description Runs all tests in this menu in current mode. Verifies that the South Bridge System I/O chipset is alive and responding normally. This test verifies that all available PCI devices are valid and are located in valid slots. Verifies the interface and data path integrity between the CPU and the memory DIMMs. This is a very small subset of the memory diagnostics and is not intended to be a comprehensive test. Performs a sliding 0 and 1 test to fixed locations of memory. Cache is disabled prior to running and then re-enabled at the end of the test.

Check boot flash This test verifies that the boot flash can be accessed reliably by software access 7 Real-time clock This test will access the Real Time Clock and test its ability to count seconds. The RTC is test initialized and then the battery register is accessed to make sure that the correct status is read. Then the seconds register is accessed and the data is saved. The test will wait for about one second and then the seconds register is accessed again to make sure that it has changed. The second check will access the days register to make sure it is in the correct bounds (1-7). So, it basically verifies that the Real Time Clock is incrementing correctly and that its battery is in a good state. 8 Check Checks the Environmental Status Register (ESR) for fault conditions, such as fan failure and environmental high temperature. status 9 Check Super I/O Verifies that the Super I/O chip is alive and responding normally. status 10 Change the Option is unavailable. SYSTEM fan speeds [Factory only] 11 Front panel LED Exercises the front panel LEDs by changing patterns in the displays. You need to observe the 6

12 13 14 41 42 71 72 73 74 75 91 92 93 99

exercise Front panel LCD exercise Test PCI devices [Factory only] FRU LED exercise Check watchdog interrupt NMI Dump Switch Test Show PCI configuration Show detailed PCI info Initialize realtime clock Toggle front panel LEDs Margins menu [Factory only] Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

LEDs blinking to verify that they are working. Exercises the front panel LCD by changing patterns in the display. You need to observe the LCDs to verify that they are working. Option is unavailable. Exercises the front panel LEDs by changing patterns in the displays. You need to observe the LEDs blinking to verify that they are working. Checks that the watchdog interrupt is working. Within two minutes of selecting this test, you must press the NMI switch below the front panel. You will then get a confirmation message. Shows the configuration of the Peripheral Component Interconnect (PCI), a peripheral bus. Shows detailed information about the PCI devices on the various PCI buses. Initializes the battery powered, real-time clock. Verifies that the front panel activity and status LEDs are working by turning them ON/OFF or changing colors. Option is unavailable. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Motherboardmenu] [Miscellaneousboard] [Cachetest] [OnboardEthernet] [Onboard FC-AL]

Motherboard menu and submenus

Cache test menu

The section describes the Cache test submenu. Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. cache test 2 Cache walking This test performs a walking 1 in a field of zeroes and a walking 0 in a field of ones. This test data bits test is repeated at each 8K "bank" boundary. This test is intended to verify data lines within L2 cache and to/from/within each DIMM bank. Expected to detect hard faults such as shorts and opens. Cache stuck-at Scans through all cache locations, checking for stuck bits (0 or 1). faults test Cache random This test is intended to access chunks of memory within an individual DIMM as rapidly as read/write test possible to stress the DIMM. Block size is chosen to be large enough to force cache collisions. Operation (read/write) is chosen randomly, along with the block, so this test causes some unique stressing of the memory system. Cache random This test is intended to verify all locations of SRAM cache and is expected to detect all data test common SRAM failures such as stuck cells or cell coupling. Intermittent errors may also be encountered, caused by noise or margin problems. Parity and ECC are stressed by the random patterns used. Cache random This test is intended to verify overall operation of L2 cache, with particular emphasis on noise, address test signal coupling and simultaneous switching problems. Detection of intermittent and margin problems is also expected. Cache spill test Tests the cache interface to main memory. Causes cache flush and reload. Provides excellent test of cache management logic. Cache tag test Tests the cache tags by reading random addresses. Cache MP test Tests the cache on an MP system. Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is looping pressed or when an error is encountered if option 92 is active. Stop/continue Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping on looping continues after an error is encountered. error Exit Exits this diagnostics menu.

3 4

7 8 9 91 92

99

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL]
Motherboard menu and submenus

Gigabit diagnostics
About the Gigabit diagnostic tests
This section describes the onboard Gigabit Ethernet (GbE) test submenu. The GbE diagnostic tests can generate error messages associated with the hardware and software. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices.

GbE diagnostic test menu

The following table describes the GbE diagnostic tests: Test Test no 1 Comprehensive bge test 2 Reset test 3 Link test [Xtnd] 4 EEPROM test 5 Interrupt test [Xtnd] 6 Internal Mac lp test 10B 7 Internal Mac lp test 100B 8 Internal Mac lp test 1G 9 External lp test 10Bt [Xtnd] 10 External lp test 100Bt [Xtnd] 11 External lp test 1G [Xtnd] 40 Port-port 10B test (Xtnd) 41 Port-port 100B test (Xtnd) 42 Port-port 1 G test (Xtnd) Description Runs all tests in this menu in current mode. Verifies software reset function. Verifies the external link condition. Requires loopback plug or Ethernet connection. Displays the Electrically Erasable Programmable Read Only Memory (EEPROM) contents. Tests the interrupt mechanism. Checks transmit and receive interrupts, as well as timer interrupts. Requires loopback plug. These tests are unsupported by the controller.

Extended test mode: Tests data transfer between memory and the Ethernet chip on the 10Base-T/100Base-TX interface, involving loopback over connected wire. Also tests overall Ethernet functionality. Requires loopback plug.

This test tests the data path from one channel to another for the dual channel NICS, requires a twisted pair network cable to be connected between the 2 ports.

70 Display MAC address 71 Display all registers 72 Display all stats counters 73 Dump EEPROM 74 Set MAC address [Factory only] 75 EEPROM firmware update [Factory only] 76 Set IO board FRU information [Factory only] 77 Show IO board FRU information 90 BGE card selection 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Return to main menu

Verifies and displays the MAC address of the card. Displays all the card memory registers. Displays all the card statistics. Displays the EEPROM data. Option is unavailable. Option is unavailable. Option is unavailable. Display the IO Board FRU information. Enables you to select the onboard Ethernet port for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Returns you to the main Diagnostics menu.

[Up] [Motherboard] [Miscellaneous test] [Cache test] [Onboard GbE] [Onboard FC-AL]
Motherboard menu and submenus

Onboard FC-AL diagnostics

This section describes the onboard FC-AL (Fibre Channel Arbitrated Loop) group of diagnostics tests. The tests range from EEPROM data verification through data transfer integrity testing. The FC-AL diagnostic tests can generate error messages associated with the interface and disk shelf. Note: To perform disk or shelf diagnostics, select test 90 and identify the channel. This returns you to the main FC-AL menu. Then select test 80 or 81. Caution: There are limitations to running Fibre Channel Diagnostics: This test does not support switches, media changeres, connections to the SAN environment, and Fibre Channel adapters functioning in target mode. The external loopback test does not detect the presence or absence of a loopback device before running, nor does it distinguish an open loop or broken cable. For example, the external loopback test fails if no loopback is attached. Users are responsible for correctly attaching the loopback device, and enabling external loopback tests. Running diagnostics on a Multipath High Availability nodes: If you are running tests 41, 42, 73 or option 4 of test 81 on a node in a Multi Path High Availability cabled pair of nodes, verify that one of the following is true: The partner node is at the CFE or Loader boot prompt. The partner node is powered off. The multipath high availability cabling for both nodes has been removed such that the appliance is only responsible for its own storage and not that of its partner.

FC-AL diagnostic test menu

Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices. The following table describes the available tests in the FC-AL diagnostic menu: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. FCAL test 2 Self test Verifies and tests the FC-AL chip configuration, firmware commands, mailboxes, status, error information, the serial EEPROM data, the ISP power-on self-test (POST), the on-chip SSRAM with fixed and random patterns, the SSRAM/DMA of fixed and random patterns between SSRAM and most locations of main memory, and ISP firmware in SSRAM. 3 ISP interrupt test Verifies the device's ability to generate interrupts, and the system's ability to handle interrupts correctly. 4 Int loop test Tests data movement between main memory and the FC-AL chip, using on-chip loopback capability for 10 bit and 1 bit.

5 6 7 8 9

Bus reset test [Xtnd] Ext loop test [Xtnd] Read-only bus test Read/write bus test [Mfg] Disk read test (FCTEST)

Extended test mode: Tests the FC-AL loop integrity and LRC functionality by resetting the bus. Extended test mode: Tests the functionality and data movement between memory and FC-AL cable. Requires loopback plug. Tests the FC-AL loop integrity by reading from each disk attached to the FC-AL interface. Option not available. Tests the FC-AL adapter loop integrity by reading from each disk attached to the FC-AL onboard interface. This test has optional parameters. Requires disks attached to the FC host adapter. Option not available. Lists the status of all the disks on all FC-AL adapters on the storage system. Requires disks attached to the FC host adapter. Lists the status of all the disks on the specified FC-AL adapters. Requires disks attached to the FC host adapter. Tests the external LEDs on the FC-AL card. Test the mode (target or initiator) of the FC-AL. Displays information about the ISP Fibre Channel chip. Displays all devices attached to a specific FC-AL adapter. Lists disk information for all disks attached to the system. Resets the selected FC-AL adapter to its original state. Displays the serial EEPROM data. Option not available. Displays the link statistics maintained for all drives on a Fibre Channel loop. Accesses the disk bus pattern diagnostics submenu. Accesses the disk shelf diagnostics submenu. Option is unavailable.

10 Disk read/write test [Mfg] 41 Scan all disks on all FC-AL adapters 42 Scan and show disks on selected FC-AL adapters 43 FC-AL adapter LED test 44 FC-AL initiatortarget test 71 Show ISP FC chip info 72 Show attached FC-AL devices 73 Show all disks (probe-scsi-all) 74 Reset FC-AL adapter 75 Show serial EEPROM data 76 Program serial EEPROM data [Factory] 77 Display fcstat link_status 80 Go to disk diagnostic menu 81 Go to shelf diagnostics menu 83 Set onboard Fcal FRU information [Factory only] 84 Show onboard

Display the Onboard Fiber Channel FRU information.

85 90 91 92 93 99

Fcal FRU information Show onboard Fcal WWN FC-AL channel selection Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

Display the onboard Fibre Channel port's World Wide Name. Enables you to select a specific FC-AL interface for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk diagnostics submenu

The following table describes the FC-AL disk diagnostics submenu: Test Test no 1 Perform drive self diagnostic test 2 Low frequency pattern [Mfg] 3 Low transition density pattern [Mfg] 4 Half-rate square pattern [Mfg] 5 Quarter-rate square pattern [Mfg] 6 Contiguous '3' pattern [Mfg] 7 Composite pattern [Mfg] 40 Read drive defect list 99 Exit this menu Description The drive seeks a reserved non user-accessible cylinder and writes, reads, and verifies data for each data surface. Option not available.

Displays primary and grown defect list. This test has optional parameters. Requires disks attached to the FC host adapter. Returns the user to the main FC-AL menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Disk shelf diagnostics submenu

The following table describes the disk shelf diagnostics submenu for the FC-AL interface. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapters with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Enter xtnd n to cancel Extended test mode: Test no 1 2 3 4 5 6 7 8 9 10 11 12 70 93 99 Test Turn shelf LED on Turn shelf LED off Get trunk information Get shelf drive map Get shelf environment information Check SES temperature sensors Check SES Fans Check SES power supply Check SES ESH (HUB) Check all SES elements Loop integrity/LRC test [Xtnd] Show HUB status Display sector size for FC-AL devices Extended/normal test mode Exit this menu Description Turns on the drive LEDs. Turns off the drive LEDs. Option not available. Displays the list of drives on target FC-AL interface. Displays the environmental parameters on the target FC-AL interface. Checks SES temperature sensors against threshold value. Checks SES fan status. Checks SES power supply status. Option not available. Check status of all SES elements in the shelf. Extended test mode: Tests the FC-AL loop integrity and LRC functionality. Option not available. Displays the sector size for the drives on the disk shelves. Enables or disables extended mode on tests where extended mode is an available option. Returns the user to the main FC-AL menu.

Motherboard diagnostics

Motherboard error messages

The following table identifies the error messages that can be generated when you run the motherboard group of diagnostics tests: Diagnostic tests run on... Hardware bridges Baseboard management controller Memory, onboard DIMMs, and SIMMs Motherboard and backplane adapters Error messages generated by... Hardware Software DBS0307 DBH0301 through DBH0501 DTH0001 through DTH0053 DTH0002, DTH0003, and DTS0010 DMH0001 through DMH0352 DMS0060 through DMS0061 DZH0101 through DZH3002 DZS0300 through DZS0435

Main memory diagnostics

About the main memory diagnostic menu
The tests in the main memory diagnostic menu test main memory DIMMs, analyze errors, and attempt to identify a failing DIMM component for all platforms. All but the first 12 MB of memory can be tested. The times listed for these tests are examples and might vary, depending on the platform type and amount of memory in the system. The main memory diagnostic tests can generate error messages associated with the hardware and software.

Types of main memory tested

Type of main memory Integrated with NVRAM memory Integrated with NVRAM memory Regular DIMMs Platforms using this type of memory FAS200 series/GF270c FAS20xx/SA200 FAS3040/FAS3070/V3040/V3070; FAS31xx/V31xx; FAS60xx/V60xx/SA600

[Up]
Main memory diagnostics

For FAS3040/FAS3070/V3040/V3070, FAS31xx/V31xx, and FAS60xx/V60xx/SA600

Main memory diagnostic menu
The following table describes the tests in the menu. The time specified in the parenthese is a variable of the platform on which you are running these tests: Test Test no 1 Comprehensive memory test ( 3328 sec ) 2 Walking data bits test ( 0 sec ) 3 Walking address test ( 0 sec ) 4 Stuck faults test ( 0 sec ) 5 Walking data words test ( 0 sec ) 6 Walking data bytes test ( 0 sec ) 7 Partial words test 8 9 10 11 12 13 14 15 42 Description Runs all tests in this menu in current mode. Verifies the data path between the CPU and memory. Runs a quick check of all data lines. Verifies address paths in memory. Runs a quick test of all address lines, up to size of memory. Scans memory to check for stuck bits, either 1 or 0.

Runs a short test, walking a byte of ones through a field of 64 words of zeros. Test is repeated with complemented data. Runs a short test, walking a byte of ones through a field of 64 words of zeros. Test is repeated with complemented data. Tests intermixed words, half-words, and bytes to verify ability of memory/CPU to merge data. Byte patterns test Spins through all 256 possible data patterns within each byte of a long word, one byte at a ( 0 sec ) time. RAS/CAS corners Runs a quick test between several locations that cause maximum change in the Row test ( 0 sec ) Address, Column Address, and RAS/CAS line. Random read/write Randomly reads or writes memory locations and tests memory controller sequencing. test ( 128 sec ) Alternating address Tests even and odd addresses, stressing PC byte marks. test ( 256 sec ) Random data test Runs a longer test, placing random data in every location. Tests DRAM cell verification. ( 0 sec ) Random address Runs a longer test, generating random addresses for reading and writing. Stresses DRAM test ( 768 sec ) addressing. Longer option also available for a test that quietly reads all memory locations. MP memory test Multiprocessor memory test. ( 2176 sec ) Large memory VM A fixed pattern test that is performed and verified on platforms with memory equal to or test ( 0 sec ) greater than 4 GB. Fill memory with Enables you to input data pattern and memory range. data pattern

43 Check memory with data pattern 44 Log2 patterns test ( 640 sec ) 45 Parity/ECC bits test ( 3200 sec ) 49 Qualification scope loop 71 Read all locations 72 Dump from specified address 73 Set test address range 74 91 92 93 95 99

Verifies the data pattern and memory range specified in Test 42. Runs a longer test of a set of log2-based (binary) data patterns. Runs a longer test to verify that each bit of a byte can propagate into the parity/ECC term. Initializes a memory region with a data pattern Reads through all memory locations, looking for errors. Gives a checksum at the end. You can run this test twice to compare the checksums. Enables you to set hexadecimal base addresses for the memory tests. You can repeat this test to confirm whether checksums for both tests are the same. Enables you to set the memory range for testing.

The default range is the entire testable address space. Show memory size Displays memory size and test range. and test range Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C looping is pressed or when an error is encountered if option 92 is active. Stop/continue on Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option error 91, looping continues after an error is encountered. Extended/normal Enables or disables extended mode on tests where extended mode is an available option. test mode Enable/disable Enables or disables caching on the system. cache Exit Exits this diagnostics menu.

[Up]
Main memory diagnostics

For FAS20xx/SA200
Main memory diagnostic menu
The following table describes the tests in the menu: Test Test no 1 Comprehensive memory test 2 Walking data bits test 3 Walking address test 4 Stuck faults test 5 Walking data words test 6 Walking data bytes test 7 Partial words test 8 9 10 11 12 13 42 43 44 45 49 71 Description Runs all tests in this menu in current mode. This test does take time -- approximately 750 seconds for the FAS2020 and approximately 2016 seconds for the FAS2050. Verifies the data path between the CPU and memory. Runs a quick check of all data lines. Verifies address paths in memory. Runs a quick test of all address lines, up to size of memory.

Scans memory to check for stuck bits, either 1 or 0. Runs a short test, walking a byte of ones through a field of 64 words of zeros. Test is repeated with complemented data. Runs a short test, walking a byte of ones through a field of 64 words of zeros. Test is repeated with complemented data. Tests intermixed words, half-words, and bytes to verify ability of memory/CPU to merge data. Byte patterns test Spins through all 256 possible data patterns within each byte of a long word, one byte at a time. RAS/CAS Runs a quick test between several locations that cause maximum change in the Row Address, corners test Column Address, and RAS/CAS line. Random Randomly reads or writes memory locations and tests memory controller sequencing. read/write test Alternating Tests even and odd addresses, stressing PC byte marks. address test Random data test Runs a longer test, placing random data in every location. Tests DRAM cell verification. Random address Runs a longer test, generating random addresses for reading and writing. Stresses DRAM test addressing. Longer option also available for a test that quietly reads all memory locations. Fill memory Enables you to input data pattern and memory range. with data pattern Check memory Verifies the data pattern and memory range specified in Test 42. with data pattern Log2 patterns Runs a longer test of a set of log2-based (binary) data patterns. test Parity/ECC bits Reads all of memory looking for ECC errors. test Qualification Initializes a memory region with a data pattern scope loop Read all Reads through all memory locations, looking for errors. Gives a checksum at the end. You

locations 72 Dump from specified address 73 Set test address range 74 Show memory size and test range 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 95 Enable/disable cache 99 Exit

can run this test twice to compare the checksums. Enables you to set hexadecimal base addresses for the memory tests. You can repeat this test to confirm whether checksums for both tests are the same. Enables you to set the memory range for testing. The default range is the entire testable address space. Displays memory size and test range. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Enables or disables caching on the system. Exits this diagnostics menu.

[Up]
Main memory diagnostics

FAS200 series
Rules for running main memory diagnostics with the FAS200 series
Observe the following rules when you run the mem diagnostic on the FAS200 series: Do not run this diagnostic immediately after a system crash. Be aware that mem diagnostics overwrite all contents of the main and NVRAM memory. Before you run mem diagnostics, reboot and shut down the system. You are alerted to be very careful by the following warning:
WARNING! Do not run the NVMEM diagnostic immediately after a system crash or if there is a possibility that log data is stored. Run only on new boards, or after a normal system shutdown, or if there is no chance of preserving customer data.

Main memory diagnostic menu

The following table describes the tests in the menu: Test Test no 1 Comprehensive memory test (177 sec) 2 Walking data bits test (1 sec) 3 Walking address test (1 sec) 4 Stuck faults test (50 sec) 5 Walking data words test (2 sec) 6 Walking data bytes test (12 sec) 7 Partial words test (2 sec) 8 Byte patterns test (1 sec) 9 RAS/CAS corners test (3 sec) 10 Random read/write test (22 sec) 11 Alternating address Description Runs all tests in this menu in current mode. Verifies the data path between the CPU and memory. Runs a quick check of all data lines. Verifies address paths in memory. Runs a quick test of all address lines, up to size of memory. Scans memory to check for stuck bits, either 1 or 0. Runs a short test, walking a byte of ones through a field of 64 words of zeros. Test is repeated with complemented data. Runs a short test, walking a byte of ones through a field of 64 words of zeros. Test is repeated with complemented data. Tests intermixed words, half-words, and bytes to verify ability of memory/CPU to merge data. Spins through all 256 possible data patterns within each byte of a long word, one byte at a time. Runs a quick test between several locations that cause maximum change in the Row Address, Column Address, and RAS/CAS line. Randomly reads or writes memory locations and tests memory controller sequencing. Tests even and odd addresses, stressing PC byte marks.

12 13 14 42 43 44 45 71

test (23 sec) Random data test (34 sec) Random address test (13 sec) MP memory test (14 sec) Fill memory with data pattern Check memory with data Log2 patterns test (28 sec) Parity/ECC bits test (90 sec) Read all locations

Runs a longer test, placing random data in every location. Tests DRAM cell verification. Runs a longer test, generating random addresses for reading and writing. Stresses DRAM addressing. Longer option also available for a test that quietly reads all memory locations. Option not available Enables you to input data pattern and memory range. Verifies the data pattern and memory range specified in Test 42. Runs a longer test of a set of log2-based (binary) data patterns. Runs a longer test to verify that each bit of a byte can propagate into the parity/ECC term. Reads through all memory locations, looking for errors. Gives a checksum at the end. You can run this test twice to compare the checksums. Enables you to set hexadecimal base addresses for the memory tests. You can repeat this test to confirm whether checksums for both tests are the same. Enables you to set the memory range for testing.

72 Dump from specified address 73 Set test address range 74 91 92 93 95 99

The default range is the entire testable address space. Show memory size Displays memory size and test range. and test range Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C looping is pressed or when an error is encountered if option 92 is active. Stop/continue on Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option error 91, looping continues after an error is encountered. Extended/normal Enables or disables extended mode on tests where extended mode is an available option. test mode Enable/disable Enables or disables caching on the system. cache Exit Exits this diagnostics menu.

Card diagnostics
About card diagnostics
The card diagnostics are a collection of tests of the different cards that you can install in your storage system.

For detailed information

To run diagnostic tests on the cards and adapters in the system, see the following sections: Agent/RLM diagnostics CNA Diagnostics FC-AL diagnostics Gigabit diagnostics IPSec diagnostics iSCSI diagnostics NVRAM diagnostics Performance Acceleration Module I diagnostics Flash Cache Module diagnostics RMC diagnostics SAS diagnostics SCSI diagnostics TOE diagnostics

Card diagnostics

Agent/Remote LAN Management (RLM) diagnostics

About the Agent/RLM diagnostic tests
The Agent/RLM diagnostic tests the interface of the remote LAN management card that is in your system. The Agent/RLM diagnostic tests can generate error messages associated with the hardware. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode.

RMC diagnostic test menu

The following table describes the tests in the RMC diagnostic test menu: Test Test no 1 Comprehensive test 2 Appl-Agent interface test 3 Appl PS On-Off test 4 RLM memory test 5 RLM Sensor test 6 RLM-Agent interface test 7 RLM IRQ test 8 RLM NMI test 9 RLM primary reset [Mfg] 10 RLM secondary reset [Mfg] 11 RLM PS On-Off test 12 RLM Watchdog reset [Mfg] 13 RLM internal enet lpbk [Mfg] 14 RLM external enet lpbk [Mfg] 70 Show Agent ring Description Runs tests 2 through 8 of this menu in current mode. Tests the interface between the appliance and the agent. Tests the agent functionality to turn the power supply on or off from the appliance. Note: This test will only run when both power supplies are installed and turned on. Causes the RLM to run a memory test to test all the available memory on it, and return the test status. Tests the temperature on the RLM and sensor interrupt. The agent interface performs a read from the agent and compares the result with the agent read from the appliance. Generates an IRQ. The RLM sends the agent a command to generate an NMI. Option is unavailable. Option is unavailable. Turns the power supply on and off, and checks the power supply status. Option is unavailable. Option is unavailable. Option is unavailable. Displays all the SEL records in a user-readable format.

71 72 73 75 91 92 93 99

Displays information about the RLM agent ID, the firmware revision, the FIFO depth, the ring depth, and the maximum number of power supplies supported. Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C looping is pressed or when an error is encountered if option 92 is active. Continue/stop Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping on error looping continues after an error is encountered. Extended/normal Enables or disables extended mode on tests where extended mode is an available option. test mode Exit Exits this diagnostics menu.

buffer info Show RLM info Show Restart reason Delete SEL [Mfg] Show Agent info

Displays the RLM serial number, revision, part number, and MAC address. Displays the reason the system was rebooted. Option not available.

Card diagnostics

Converged Network Adapter diagnostics

About the converged network adapter diagnostic test menu
The converged network adapter (CNA) group of diagnostics test the functioning of the adapter that is in your system. The tests range from a status check of the adapter to the testing of data movement through the adapter. Types of CNA cards tested: Fibre Channel Ethernet

Converged Network Adapter diagnostics

Fibre Channel diagnostics

About the Fibre Channel diagnostic tests
This group of diagnostics tests the functioning of the Fibre Channel funtionality of the CNAs that are in your system. This diagnostic test can generate error messages associated with the hardware and software.

CNA-FC diagnostic test menu

The following table describes the available tests in the CNA-FC diagnostic menu. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices: Test Test no 1 Comprehensive test 2 Self test 3 4 5 Interrupt test Internal loopback test External loopback test [Xtnd] Show ISP information Reset adapter CNA card selection Enable/disable looping Stop/continue on error Extended/normal test mode Exit Description This is a superset of tests 2 through 5 starting with the Interrupt test and followed by the Self and loopback tests. Verifies and tests the firmware commands, mailboxes, status, error information, and the selftest (POST). Tests the hardware interrupt mechanism. If there is network traffic going though the hardware, the card will generate the interrupt to inform software to handle it. Tests data transmission and reception between host memory and ISP81xx device internally, tests frame CRC and length errors in FW, and tests the data integrity in the host. Extended test mode: Tests card functionality and data movement between between host and external link through a loopback device. Requires loopback plug. Displays HW and FW information on the selected FC device. Performs hard reset of the adapter which causes an MPI FW reset that affects all ports. Enables the selection of a specific Ethernet card in the system. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

71 74 90 91 92 93 99

Converged Network Adapter diagnostics

Ethernet diagnostics
About the Ethernet diagnostic tests
This group of diagnostics tests the functioning of the Ethernet funtionality of the CNAs that are in your system. This diagnostic test can generate error messages associated with the hardware, software, and user input.

Ethernet diagnostic test menu

The following table describes the tests in the CNA Ethernet diagnostic menu. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices: Test Test Description no 1 Comprehensive This is a superset of tests 2 through 5 and it will test the adapter's entire Ethernet functions. test 2 Reset test This test will reset the port of the card to test the hardware port reset function. The port reset function will reset both FC and NIC functions for the port. 3 Interrupt test Tests the hardware interrupt mechanism. If there is network traffic going though the hardware, the card will generate the interrupt to inform software to handle it. 4 Internal There are two types of internal loopbacks: PCS and HSS internal loopbacks. In the loopback test comprehensive CNA NIC portion, the PCS internal loopback mode is tested and in the stress test, the HSS internal loopback is tested. 5 External Extended test mode: Tests card Ethernet functionality and data movement between host and loopback test Ethernet cable. Requires loopback plug. [Xtnd] 70 Display NIC The network information about the card is displayed. information 90 CNA card Enables the selection of a specific CNA card in the system. selection 91 Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is looping pressed or when an error is encountered if option 92 is active. 92 Stop/continue on Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, error looping continues after an error is encountered. 93 Extended/normal Enables or disables extended mode on tests where extended mode is an available option. test mode 99 Exit Exits this diagnostics menu.

Card diagnostics

FC-AL diagnostics
About the FC-AL diagnostic tests
The FC-AL (Fibre Channel Arbitrated Loop) group of diagnostics tests the functioning of the Fibre Channel arbitrated loop adapters that are in your system. The tests range from EEPROM data verification through data transfer integrity testing. The FC-AL diagnostic tests can generate error messages associated with the interface and disk shelf. To perform disk or shelf diagnostics, select test 90 and identify the channel. This returns you to the main FC-AL menu. Then select test 80 or 81. Note: Altering disks or cabling in a loop adapter requires you to perform either Test 41 or Test 42 before running any FC-AL test. If you change a multiple loop adapter, run Test 41. If you change a single loop adapter, run Test 42. Caution: There are limitations to running Fibre Channel Diagnostics: This test does not support switches, media changeres, connections to the SAN environment, and Fibre Channel adapters functioning in target mode. The external loopback test does not detect the presence or absence of a loopback device before running, nor does it distinguish an open loop or broken cable. For example, the external loopback test fails if no loopback is attached. Users are responsible for correctly attaching the loopback device, and enabling external loopback tests. Running diagnostics on a Multipath High Availability nodes: If you are running tests 41, 42, 73 or option 4 of test 81 on a node in a MultiPath High Availability cabled pair of nodes, verify that one of the following is true: The partner node is at the CFE or Loader boot prompt. The partner node is powered off. The multipath high availability cabling for both nodes has been removed such that the appliance is only responsible for its own storage and not that of its partner.

FC-AL diagnostic test menu

Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices. The following table describes the available tests in the FC-AL diagnostic menu: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. FCAL test 2 Self test Verifies and tests the FC-AL chip configuration, firmware commands, mailboxes, status, error information, the serial EEPROM data, the ISP power-on self-test (POST), the on-chip SSRAM with fixed and random patterns, the SSRAM/DMA of fixed and random patterns between SSRAM and most locations of main memory, and ISP firmware in SSRAM. 3 ISP interrupt test Verifies the device's ability to generate interrupts, and the system's ability to handle interrupts correctly.

4 5 6 7 8 9

Int loop test Bus reset test [Xtnd] Ext loop test [Xtnd] Read-only bus test Read/write bus test [Mfg] Disk read test (FCTEST)

Tests data movement between main memory and the FC-AL chip, using on-chip loopback capability for 10 bit and 1 bit. Extended test mode: Tests the FC-AL loop integrity and LRC functionality by resetting the bus. Extended test mode: Tests the functionality and data movement between memory and FC-AL cable. Requires loopback plug. Tests the FC-AL loop integrity by reading from each disk attached to the FC-AL interface. Option not available. Tests the FC-AL adapter loop integrity by reading from each disk attached to the FC-AL onboard interface. This test has optional parameters. Requires disks attached to the FC host adapter. Option not available. Lists the status of all the disks on all FC-AL adapters on the storage system. Requires disks attached to the FC host adapter. Lists the status of all the disks on the specified FC-AL adapters. Requires disks attached to the FC host adapter. Tests the external LEDs on the FC-AL card. Displays information about the ISP Fibre Channel chip. Displays all devices attached to a specific FC-AL adapter. Lists disk information for all disks attached to the system. Resets the selected FC-AL adapter to its original state. Displays the serial EEPROM data. Option not available. Displays the link statistics maintained for all drives on a Fibre Channel loop. Accesses the disk bus pattern diagnostics submenu. Accesses the disk shelf diagnostics submenu. Enables you to select a specific FC-AL card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91,

10 Disk read/write test [Mfg] 41 Scan all disks on all FC-AL adapters 42 Scan and show disks on selected FC-AL adapters 43 FC-AL adapter LED test 71 Show ISP FC chip info 72 Show attached FC-AL devices 73 Show all disks (probe-scsi-all) 74 Reset FC-AL adapter 75 Show serial EEPROM data 76 Program serial EEPROM data [Factory] 77 Display fcstat link_status 80 Go to disk diagnostic menu 81 Go to shelf diagnostics menu 90 FC-AL channel selection 91 Enable/disable looping 92 Stop/continue

looping on error looping continues after an error is encountered. 93 Extended/normal Enables or disables extended mode on tests where extended mode is an available option. test mode 99 Exit Exits this diagnostics menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk diagnostics submenu

The following table describes the FC-AL disk diagnostics submenu: Test Test no 1 Perform drive self diagnostic test 2 Low frequency pattern [Mfg] 3 Low transition density pattern [Mfg] 4 Half-rate square pattern [Mfg] 5 Quarter-rate square pattern [Mfg] 6 Contiguous '3' pattern [Mfg] 7 Composite pattern [Mfg] 40 Read drive defect list 99 Exit this menu Description The drive seeks a reserved non user-accessible cylinder and writes, reads, and verifies data for each data surface. Option not available.

Displays primary and grown defect list. This test has optional parameters. Requires disks attached to the FC host adapter. Returns the user to the main FC-AL menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk shelf diagnostics submenu

The following table describes the disk shelf diagnostics submenu for the FC-AL card. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode: Test no 1 2 3 4 5 6 7 8 9 10 11 12 70 93 99 Test Turn shelf LED on Turn shelf LED off Get trunk information Description

Turns on the drive LEDs on the target disk shelf. Turns off the drive LEDs on the target disk shelf. Displays the list of disk shelves and their firmware revisions on the target FC-AL card. Get shelf drive map Displays the list of drives on the disk shelves of the target FC-AL card. Get shelf environment Displays the environmental parameters for the disk shelves on the target FCinformation AL card. Check SES temperature sensors Check SES temperature sensors against threshold value. Check SES FANs Check SES fan status. Check SES Power Supply Check SES Power Supply status. Check SES ESH (HUB) Check SES HUB status on the ESH. Check all SES elements Check status of all SES elements in the shelf. Loop integrity/LRC test [Xtnd] Extended test mode: Tests the FC-AL loop integrity and LRC functionality. Show HUB status Display status of each port in the HUB for each ESH module. Display sector size for FC-AL Displays the sector size for the drives on the disk shelves. devices Extended/normal test mode Enables or disables extended mode on tests where extended mode is an available option. Exit this menu Returns the user to the main FC-AL menu.

Card diagnostics

Gigabit diagnostics
About the Gigabit diagnostic tests
The Gigabit group of diagnostics tests the functioning of the Gigabit Ethernet (GbE) cards that are in your system. The tests range from a status check of the card to the testing of data movement through the system while the GbE card is being used. The GbE diagnostic tests can generate error messages associated with the hardware and software. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices.

GbE diagnostic test menu

The following table describes the GbE diagnostic tests: Test Test no 1 Comprehensive GBE test 2 Reset test 3 EEPROM test 4 Internal lp test 1G Description Runs all tests in this menu in current mode. Runs a test that verifies if the registers have the specified default values on reset on a reset of Intel GBE card. Runs a series of tests that reads and verifies EEPROM data on the GbE card. Places the device into an internal loopback mode to validate the correct functionality of the internal logic operations on the device. Note If your system is running an Copper GbE card, this test is not supported. Extended test mode: Requires loopback plug to verify data correctness by transmitting data from the device to itself across the attached loopback. Tests data movement between main memory and the GbE card, using onboard loopback capability.

5 6 7 8 9 10

External lp test 1G (Xtnd) Internal lp test 10B Internal lp test 100B External lp test 10B (Xtnd) External lp test 100B (Xtnd) Interrupt test

Extended test mode: Tests card functionality and data movement between memory and the Ethernet cable. Requires loopback plug.

11 Quick Interrupt test 40 MAC loop test

Tests the transmit and receive interrupts to verify the device's ability to generate interrupts, and the system's ability to handle interrupts correctly. Tests and verifies that all the device interrupts are working. Data is not transfered during this test. This test will test data from the transmitter to the receiver before it goes to the MAC. Note

41 Port-port 10B test (Xtnd) 42 Port-port 100B test (Xtnd) 43 Port-port 1 G test (Xtnd) 70 Display MAC address 71 Display all registers 72 Display EEPROM 73 Set MAC address [Factory] 90 GbE card selection 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

If your system is running an Intel Copper GbE card, it requires a loopback plug. This test tests the data path from one channel to another for the dual channel NICS, requires a twisted pair network cable to be connected between the 2 ports.

Verifies and displays the MAC address of the card. Displays all the card memory registers. Displays the EEPROM data on the GbE card. This is test is unavailable. Enables the selection of a specific GbE card in the system. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Card diagnostics

IPSec diagnostics
About the IPSec diagnostic tests
The IPSec group of diagnostics tests the functioning of the Internet Protocol Security (IPSec) card that is in your system. The IPSec diagnostic tests can generate error messages associated with the hardware.

IPSec diagnostic test menu

The following table describes the tests in the IPSec diagnostic menu: Test Test no 1 Comprehensive Ipsec test 2 DES_SHA1 self test 3 3DES_SHA1 self test 4 DES_MD5 self test 5 3DES_MD5 self test 70 Dump card info 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Self test with the DES SHA1 algorithm. Self test with the 3DES SHA1 algorithm. Self test with the DES MD5 algorithm. Self test with the 3DES MD5 algorithm. Displays information about the card. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Card diagnostics

iSCSI diagnostics
About the iSCSI diagnostic tests
The iSCSI group of diagnostics tests the functioning of the iSCSI card that are in your system. The tests range from a status check of the card to the testing of data movement through the system while the iSCSI card is being used. The iSCSI diagnostic tests can generate error messages associated with the hardware. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode.

iSCSI diagnostic test menu

The following table describes the iSCSI diagnostic tests: Test Test no 1 Comprehensive iSCSI HBA test 2 Self test 3 Memory test 4 iSCSI interrupt test 5 Internal lp test (1G) 6 Internal lp test (100) 7 Internal lp test (10) 8 External lp test (1G) [Xtnd] 9 External lp test (100) [Xtnd] 10 External lp test (10) [Xtnd] 70 Display iSCSI chip information 71 Reset iSCSI target HBA 90 iSCSI Target HBA selection 91 Enable/disable Description Runs all tests in this menu in current mode. Run the ISCSI adapter built in self test (BIST). Tests the onboard memory. Tests the interrupt mechanism. Checks transmit and receive interrupts, as well as timer interrupts. Tests data movement between main memory and the iSCSI card, using onboard loopback capability.

Extended test mode: Tests card functionality and data movement between memory and the Ethernet cable. Requires loopback plug.

Displays information about the iSCSI chip. Resets the selected iSCSI adapter to its original state Enables the selection of a specific iSCSI card in the system. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C

looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Card diagnostics

NVRAM diagnostics
About the NVRAM diagnostic test menu
The NVRAM group of diagnosticss test the functioning of the NVRAM cards in the system, including PCI connectivity, data transfer, and data registers. In addition, the NVRAM diagnostics, together with other tests, run a set of memory tests on the NVRAM board. These memory tests focus on the memory module strips plugged into the cards. The NVRAM diagnostic tests can generate error messages associated with the hardware and user input.

Types of NVRAM cards tested

Type of NVRAM card NVRAM6 Platforms using the card FAS6030/FAS6040/V6030/V6040 FAS6070/FAS6080/V6070/V6080/SA600 FAS3040/FAS3070/V3040/V3070 NVRAM5 NVMEM FAS3020/V3020 FAS250 FAS270/FAS270c/GF270c FAS2020 FAS2040 FAS2050/SA200 Description Provides a total of 512 MB of battery backed-up SDRAM. Provides a total of 2 GB of battery backed-up SDRAM. Provides a total of 512 MB of battery backed-up SDRAM. Provides a total of 512 MB of battery backed-up SDRAM in one bank. Provides a total of 512 MB of battery backed-up SDRAM in one bank (64 MB for non-volatile memory). Provides a total of 1 GB of battery backed-up SDRAM in one bank (128 MB for non-volatile memory). Provides a total of 1 GB of battery backed-up SDRAM in one bank (128 MB for non-volatile memory). Provides a total of 4 GB of battery backed-up SDRAM in one bank 512 MB for non-volatile memory). Provides a total of 2 GB of battery backed-up SDRAM in one bank (256 MB for non-volatile memory).

NVRAM diagnostics

NVRAM6 diagnostics
The following table describes the NVRAM6 test menu: Test Test no 1 Comprehensive NVRAM test 2 NVRAM memory menu 3 NVRAM IB menu 4 NVRAM ECC menu [Xtnd] 5 NVRAM environmental test 6 NVRAM EEPROM test 7 NVRAM FLASH test 8 NVRAM i2c test 70 Set NVRAM properties [Mfg only] 71 Display NVRAM properties 72 Display NVRAM EEPROM 73 Display NVRAM status 74 Display NVRAM config space 76 Upgrade NVRAM firmware [Xtnd] 77 Clear NVRAM properties [Mfg only] 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Accesses the NVRAM memory menu. Accesses the IB menu which tests the part of the adapter associated with clustering. Accesses the error correction code menu. Accesses the environmental test menu. Tests the NVRAM EEPROM subcomponent. Tests the NVRAM FLASH subcomponent. Tests the NVRAM i2c bus. Option not available. Displays information about the NVRAM6 adapter. Displays information about the NVRAM6 Electrically Erasable Programmable Read Only Memory (EEPROM) contents. Displays information about the NVRAM6 status. Displays information about the NVRAM6 configuration space. Extended test mode: Updates the firmware on the NVRAM6. Option not available. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

NVRAM6 diagnostics

Memory diagnostics
The following table describes the NVRAM6 memory test menu: Test Test no 1 Comprehensive NVRAM memory test 2 NVRAM memory walking data test 3 NVRAM memory walking address test 4 NVRAM memory partial word test 5 NVRAM memory random data test 6 NVRAM memory random address test 10 NVRAM DIMM SPD test 11 Display NVRAM DIMM SPD 12 Dump NVRAM DIMM SPD 20 Inject ECC errors [Xtnd only] 21 Inject/read ECC errors [Xtnd only] 50 NVRAM DMA Write-Read-Verify 51 NVRAM DMA Write-only 52 NVRAM DMA Read-only 70 NVRAM memory dump 71 NVRAM memory poke 72 NVRAM memory custom pattern 74 Memory fill power cycle test 75 Memory write power cycle test 76 Memory read power Description Runs all tests in current mode. Runs quick test of data lines. Runs quick test of all address lines to verify address paths in NVRAM memory. Tests intermixed data sizes. Runs longer test by writing and reading random data to all NVRAM locations. Runs longer test using random addresses. Compares NVRAM DIMM properties (SPD) against supported values. Displays NVRAM DIMM properties (SPD) as field-value pairs. Displays NVRAM DIMM properties (SPD) as a hexadecimal dump. Extended test mode: Injects ECC errors into the NVRAM DIMM, without triggering detection. Extended test mode: Injects ECC errors into the NVRAM DIMM, and then triggers detection. Fills system memory with a random data pattern, and then DMA transfers this pattern back-and-forth from NVRAM memory. Fills system memory with a random data pattern, and then DMA transfers this pattern to NVRAM memroy. Fills NVRAM memory with a random data pattern, and then DMA transfers this pattern to system memory. Allows the user to dump a region of memory. Allows the user to write to a region of memory. Fills NVRAM memory with a user-specified data pattern. Fills NVRAM memory with data patterns for power cycle test. Fills NVRAM memory with data patterns for power cycle test, which does burst writes. Fills NVRAM memory with data patterns for power cycle test, which does burst reads.

cycle test 77 Memory DMA write Fills NVRAM memory with data patterns for power cycle test, which does DMA writes. power cycle test 78 Verify data retention Checks the retention of data in NVRAM after a power cycle. Data comes from data patterns entered in Test 75. 80 Memory class change Option not available. [Mfg only] 90 NVRAM card Enables the selection of a specific NVRAM card for testing. selection 91 Enable/disable Enables or disables continuous running of a diagnostic test. The test is stopped when looping Ctrl-C is pressed or when an error is encountered if option 92 is active. 92 Stop/continue on Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option error 91, looping continues after an error is encountered. 93 Extended/normal test Enables or disables extended mode on tests where extended mode is an available option. mode 99 Exit Exits this diagnostics menu.

Cluster interconnect diagnostics

NVRAM6 IB diagnostics
The following table describes the tests in the NVRAM6 IB diagnostic test: Test Test no 1 Comprehensive NVRAM cluster test 2 Internal loopback RDMAW test 3 Internal loopback send test 4 Link test [Xtnd] 5 External loopback RDMAW test [Xtnd] 6 External loopback send test [Xtnd] 70 Reset port performance counter 71 Display port performance counter 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Test remote direct memory access write (RDMAW) between host memory and NVRAM6 card, using onchip loopback. Test data transfer between host memory and NVRAM6 card, using onchip loopback. Extended test mode: Verify external link status. Point to point cable needed. Extended test mode: Test remote direct memory access write (RDMAW) between host memory and NVRAM6 card, using external loopback. Point to point cable needed. Extended test mode: Test data transfer between host memory and NVRAM6 card, using external loopback. Point to point cable needed. Resets the counter on the performance of the cluster ports. Displays information about the performance of the cluster ports. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

NVRAM6 diagnostics

Error Correction Code (ECC) diagnostics

The following table describes the NVRAM6 ECC test menu: Test Test no 1 Comprehensive NVRAM ECC test 2 NVRAM ECC FIFO test 3 NVRAM ECC memory sweep 70 Plant ECC error 71 Plant and read ECC error 72 Wait for and print ECC errors 73 System disable command 74 System enable command 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Tests the ECC FIFO that acts as a buffer. Tests that all of memory can be corrected. Inserts an ECC error into memory. Inserts an ECC error into memory and then reads memory, thereby causing a correction. Waits for ECC errors without causing them to occur. Issues a command to disable the InfiniBand interface. This happens by default when entering the ECC menu. ssues a command to enable the InfiniBand interface. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

NVRAM6 diagnostics

Environmental diagnostics
The following table describes the NVRAM6 environmental test menu. The NVRAM6 environmental test can generate environmental error messages associated with the battery or the temperature sensors. The corrective action for this error message grouping is below the error message description: Test Test no 1 Comprehensive NVRAM env test 2 NVRAM env subsytem test 3 NVRAM battery test 4 NVRAM charger test 70 GPIO bit control 71 GPIO dump 72 Turn battery on 73 Turn charger on 74 LM81 I2C dump 75 LM81 I2C write 76 Force GPIO interrupt 77 Charge Battery 78 Discharge Battery 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Tests the interrupt conditions for each sensor. Tests the battery. Tests the battery charger. Allows the user to toggle the general purpose IO lines. Dumps the settings of the general purpose IO lines. Turns on the battery. Turns on the battery charger. Allows the user to read the devices on the NVRAM board. Allows the user to write to the devices on the NVRAM board. Force an interrupt from the NVRAM board through the general purpose IO line. Charges the NVRAM battery to a user-specified voltage. Discharges the NVRAM battery to a user-specified voltage. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Environmental error message range and affected item

The following tablelists the error code range and part of the error strings identifying the affected item. The full error string depends on your system configuration: Error code range ENV01500x Partial error string NVRAM6-battery-1

ENV01501x ENV01502x ENV01503x ENV01504x ENV01505x ENV01506x ENV01507x ENV01508x ENV01509x ENV01510x ENV01511x ENV01512x ENV01513x ENV01514x ENV01515x ENV01516x ENV01517x

NVRAM6-battery2-1 NVRAM6-temperature-1 NVRAM6-battery-2 NVRAM6-battery2-2 NVRAM6-temperature-2 NVRAM6-battery-5 NVRAM6-battery2-5 NVRAM6-temperature-5 NVRAM6-battery-6 NVRAM6-battery2-6 NVRAM6-temperature-6 NVRAM6-battery-7 NVRAM6-battery2-7 NVRAM6-temperature-7 NVRAM6-battery-8 NVRAM6-battery2-8 NVRAM6-temperature-8

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error code range: Error code range ENV01500x - ENV01501x, ENV01503x - ENV01504x, ENV01506x - ENV01507x, ENV01509x - ENV01510x, ENV01512x - ENV01513x, ENV01515x - ENV01516x ENV01502x, ENV01505x, ENV01508x, ENV01511x, ENV01514x, ENV01517x Corrective action 1. Verify that the NVRAM6 battery is connected. 2. Call NetApp Technical Support if the error is not corrected.

Call NetApp Technical Support if the error is not corrected.

NVRAM diagnostics

NVRAM5 diagnostics
The following table describes the NVRAM5 test menu: Test Test no 1 Comprehensive NVRAM test 2 NVRAM memory menu 3 NVRAM IB menu 4 NVRAM ECC menu [Xtnd] 5 NVRAM environmental test 6 NVRAM EEPROM test 70 Set NVRAM properties [Mfg only] 71 Display NVRAM properties 72 Display NVRAM EEPROM 73 Display NVRAM status 74 Display NVRAM config space 76 Upgrade NVRAM firmware [Xtnd] 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Accesses the NVRAM memory menu. Accesses the IB menu which tests the part of the adapter associated with clustering. Accesses the error correction code menu. Accesses the environmental test menu. Tests the contents of the NVRAM5 EEPROM. Menu not available. Displays information about the NVRAM5 adapter. Displays information about the NVRAM5 Electrically Erasable Programmable Read Only Memory (EEPROM) contents. Displays information about the NVRAM5 status. Displays information about the NVRAM5 configuration space. Extended test mode: Updates the firmware on the NVRAM5. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

NVRAM5 diagnostics

Memory diagnostics
The following table describes the NVRAM5 memory test menu: Test Test no 1 Comprehensive NVRAM memory test 2 NVRAM memory walking data test 3 NVRAM memory walking address test 4 NVRAM memory partial word test 5 NVRAM memory random data test 6 NVRAM memory random address test 70 NVRAM memory dump 71 NVRAM memory poke 74 Memory fill power cycle test 75 Memory write power cycle test 76 Memory read power cycle test 77 Memory DMA write power cycle test 78 Verify data retention 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Runs quick test of data lines. Runs quick test of all address lines to verify address paths in NVRAM memory. Tests intermixed data sizes. Runs longer test by writing and reading random data to all NVRAM locations. Runs longer test using random addresses. Allows the user to dump a region of memory. Allows the user to write to a region of memory. Fills NVRAM memory with data patterns for power cycle test. Fills NVRAM memory with data patterns for power cycle test, which does burst writes. Fills NVRAM memory with data patterns for power cycle test, which does burst reads. Fills NVRAM memory with data patterns for power cycle test, which does DMA writes. Checks the retention of data in NVRAM after a power cycle. Data comes from data patterns entered in Test 75. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Cluster interconnect diagnostics

NVRAM5 IB diagnostics
The following table describes the tests in the NVRAM5 IB diagnostic test: Test Test no 1 Comprehensive NVRAM cluster test 2 Internal loopback RDMAW test 3 Internal loopback send test 4 Link test [Xtnd] 5 External loopback RDMAW test [Xtnd] 6 External loopback send test [Xtnd] 70 Reset port performance counter 71 Display port performance counter 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Test remote direct memory access write (RDMAW) between host memory and NVRAM5 card, using onchip loopback. Test data transfer between host memory and NVRAM5 card, using onchip loopback. Extended test mode: Verify external link status. Point to point cable needed. Extended test mode: Test remote direct memory access write (RDMAW) between host memory and NVRAM5 card, using external loopback. Point to point cable needed. Extended test mode: Test data transfer between host memory and NVRAM5 card, using external loopback. Point to point cable needed. Resets the counter on the performance of the cluster ports. Displays information about the performance of the cluster ports. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

NVRAM5 diagnostics

Error Correction Code (ECC) diagnostics

The following table describes the NVRAM5 ECC test menu: Test Test no 1 Comprehensive NVRAM ECC test 2 NVRAM ECC FIFO test 3 NVRAM ECC memory sweep 70 Plant ECC error 71 Plant and read ECC error 72 Wait for and print ECC errors 73 System disable command 74 System enable command 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Tests the ECC FIFO that acts as a buffer. Tests that all of memory can be corrected. Inserts an ECC error into memory. Inserts an ECC error into memory and then reads memory, thereby causing a correction. Waits for ECC errors without causing them to occur. Issues a command to disable the InfiniBand interface. This happens by default when entering the ECC menu. ssues a command to enable the InfiniBand interface. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

NVRAM5 diagnostics

Environmental diagnostics
The following table describes the NVRAM5 environmental test menu. The NVRAM5 environmental test can generate environmental error messages associated with the battery or the temperature sensors. The corrective action for this error message grouping is below the error message description: Test Test no 1 Comprehensive NVRAM env test 2 NVRAM env subsytem test 3 NVRAM battery test 4 NVRAM charger test 70 GPIO bit control 71 GPIO dump 72 Turn battery on 73 Turn charger on 74 LM81 I2C dump 75 LM81 I2C write 76 Force GPIO interrupt 90 NVRAM card selection 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Tests the interrupt conditions for each sensor. Tests the battery. Tests the battery charger. Allows the user to toggle the general purpose IO lines. Dumps the settings of the general purpose IO lines. Turns on the battery. Turns on the battery charger. Allows the user to read the devices on the NVRAM board. Allows the user to write to the devices on the NVRAM board. Force an interrupt from the NVRAM board through the general purpose IO line. Enables the selection of a specific NVRAM card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Environmental error message range and affected item

The following tablelists the error code range and part of the error strings identifying the affected item. The full error string depends on your system configuration: Error code range ENV011080 through ENV011089 ENV011100 through ENV011109 ENV011090 through ENV011099 ENV011110 to ENV011119 Partial error string NVRAM5-battery-10 NVRAM5-battery-11 NVRAM5-temperature-10 NVRAM5-temperature-11

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error code range: Error code range ENV011080 through ENV011089, ENV011100 through ENV011109 ENV011090 through ENV011099, ENV011090 through ENV011099 Corrective action 1. Verify that the NVRAM5 battery is connected. 2. Call NetApp Technical Support if the error is not corrected. Call NetApp Technical Support if the error is not corrected.

NVRAM diagnostics

NVMEM diagnostics
The following table describes the NVMEM test menu for the FAS20xx: Test Test no 1 Comprehensive NVMEM test 2 Battery test 71 Set battery armed 75 Fill for power cycle test, burst write 76 Fill for power cycle test, burst read 77 Fill for power cycle test 78 Verify data retention 82 Display from given address 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Tests the battery. Toggles between arming and disarming the battery Fills NVRAM memory with data patterns for power cycle test, which does burst writes. Fills NVRAM memory with data patterns for power cycle test, which does burst reads. Fills NVRAM memory with data patterns for power cycle test. Checks the retention of data in NVRAM after a power cycle. Data comes from data patterns entered in Test 75. Displays the contents of a memory address location. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

NVRAM diagnostics

NVMEM diagnostics
The following table describes the NVMEM test menufor the FAS200: Test Test no 1 Comprehensive NVMEM test 2 Battery test 71 Turn battery off 72 Turn charger on 75 Fill for power cycle test, burst write 76 Fill for power cycle test, burst read 77 Fill for power cycle test 78 Verify data retention 82 Display from given address 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in current mode. Tests the battery. Turns off the battery. Turns on the battery charger. Fills NVRAM memory with data patterns for power cycle test, which does burst writes. Fills NVRAM memory with data patterns for power cycle test, which does burst reads. Fills NVRAM memory with data patterns for power cycle test. Checks the retention of data in NVRAM after a power cycle. Data comes from data patterns entered in Test 75. Displays the contents of a memory address location. Enables or disables continuous running of a diagnostic test. The test is stopped when CtrlC is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Card diagnostics

Performance Acceleration Module I diagnostics

About the Performance Acceleration Module I diagnostic tests
The Performance Acceleration Module I group of diagnostics, also known as the IOmem diagnostics, tests the functioning of the Performance Acceleration Module I that is in your system. The IOmem diagnostic tests can generate error messages associated with the hardware, software, and user input.

IOmem diagnostic test menu

The following table describes the IOmem test menu: Test Test no 1 Comprehensive PAM I test 2 DMA Random data test 3 DMA W/R Random data test 4 DMA Write Random local read test Flag 5 PIO 64 Write thenREad QuickCheck 6 DMA Bit Toggling test 7 DMA local Write Step test 8 DMA local Write test 51 Show Configuration 56 Show DIMM Log 58 Show Temp Sensors 59 Show DIMM 62 Update FPGA [Xtnd only] 63 Choose FPGA file Description Runs tests 2 through 8 in current mode. Runs a random test pattern by writing to an entire region and performing a read and compare. Runs a random test pattern by writing to a 1 GB region and performing a read and compare before moving to the next 1GB region. Tests memory with local DMA writes and a random data pattern. Writes a quick Programmed IO memory test to the first and last location on each page then performs a read and compare. Test memory with a sequence of checkerboard (bit toggling) patterns. Select option 73 in this menue to define which tests are run. Performs memory tests by way of the local DMA writes and the step function Data pattern. This test is useful in identifying address decoding issues. Performs a memory test by way of local DMA writes. Displays all information about the card and anything on it. Displays the errors captured in the DIMM Log. Display the sensor and FPGA temperature. Displays the DIMM size, part number, and serial number. Extended mode: Updates the Primary EEPROM. The new FPGA bits will be loaded after a reboot. Displays the contents of firmware directory and allows the uses the option to choose the FPGA file to load. Displays the module name, part number, serial number, and revision.

64 Show FRU information 66 Show ECC Stats and Provides a summary of the ECC status. Summary 68 Show pass/fail status Provides a summary of the status. 69 Toggle Training Flag By default, after each comprehensive test, the DMA controller is retrained. Use this option to enable or disable this feature. 70 Toggle Voltage By default, after each comprehensive test, the voltage margin is cycled. Use this option

73 74 81 86

88 89 90 91 92 93 93 99

Enables the selection of a specific card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Stop/continue on error Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Extended/normal test Enables or disables extended mode on tests where extended mode is an available option. mode Toggle detail mode Use this option to to define the amount of error information detail required. Exit Exits this diagnostics menu.

Margining Set Bit Toggle Flag Show memory Set Address Range Toggle Show Summary Flag (global) Set Comprehensive Test Mask (global) Set Detail Dump Options (global) Memory card selection Enable/disable looping

to enable or disable this feature. Use this option to control the pattern sequencing in option 6. Displays the memory contents. Sets the memory address range for subsequent tests. Enables or disables the display of test summary information after each comprehensive loop. Enables the definition of which tests to be run in option 1. Fills NVRAM memory with data patterns for power cycle test, which does burst reads.

Card diagnostics

Flash Cache module diagnostics

About the Flash Cache module diagnostic tests
The Flash Cache module group of diagnostics, also known as the PAM II (Performance Acceleration Module II) diagnostics, tests the functioning of the Flash Cache module that is in your system. The Flash Cache module diagnostic tests can generate error messages associated with the hardware, software, and user input.

Flash Cache diagnostic test menu

The following table describes the Flash Cache module test menu: Test Test no 1 Comprehensive Flash Cache test 2 Self test 3 DMA Random data test 4 DMA W/R Random test 5 DMA Bit Toggling test 44 Raw flash write/read QuickCheck 51 Show Configuration 53 Show LED state 56 Show Bad Block table 58 Show Temp Sensors 59 Show DIMM 61 Update FPGA [Xtnd only] 62 Choose FPGA file 63 64 66 67 69 Description Runs tests 2 through 5 in current mode. Verifies the PCI configuration, the FPGA status and the DMA engine of the card. Runs a random test pattern by writing to an entire region and performing a read and compare. Runs a random test pattern by writing to a 1 GB region and performing a read and compare before moving to the next 1GB region. Test memory with a sequence of checkerboard (bit toggling) patterns. Select option 73 in this menue to define which tests are run. Writes a quick programmed IO memory test on the selected range and then performs a read and compare. Displays all information about the card and anything on it. Displays the LED status. Displays the card's bad block information.

Displays the sensor and FPGA temperature. Displays the DIMM size, part number, and serial number. Extended mode: Updates the Primary EEPROM. The new FPGA bits will be loaded after a reboot. Displays the contents of firmware directory and allows the user the option to choose the FPGA file to load. Reload backup FPGA Extended mode: Sets up backup FPGA bits. The backup FPGA will be loaded after a [Xtnd only] reboot. Show FRU Displays the module name, part number, serial number, and revision. information Show BCH Stats and Provides a summary of the BCH status. Summary Clear Flash [Xtnd Extended mode: Disables the adapter and all adapter channels. Clears all elements of only] Flash cache. Show Flash Displays the flash memory hardware location. Designator Map

74 80 81 86

88 90 91 92 93 93 99

Show memory Show Address Range Set Address Range Toggle Show Summary Flag (global) Set Comprehensive Test Mask (global) Memory card selection Enable/disable looping Stop/continue on error Extended/normal test mode Toggle detail mode Exit

Displays the memory contents. Displays the memory address range for subsequent tests. Sets the memory address range for subsequent tests. Enables or disables the display of test summary information after each comprehensive loop. Enables the definition of which tests to be run in option 1. Enables the selection of a specific card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Use this option to to define the amount of error information detail required. Exits this diagnostics menu.

Card diagnostics

Remote Management Card (RMC) diagnostics

About the RMC diagnostic tests
The RMC diagnostic tests the functioning of the remote management card that is in your system. The RMC diagnostic tests can generate error messages associated with the hardware, software, and user. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode.

RMC diagnostic test menu

The following table describes the tests in the RMC diagnostic test menu: Test Test no 1 Comprehensive test 2 RMC Self Test 3 I2C Cable Status Test 4 SEL Access Test 5 External Power Test [Xtnd] 6 LAN Cable Status Test [Xtnd] 71 Show RMC Status 72 Show RMC Firmware Revision 73 Update RMC Firmware [Mfg] 91 Enable/disable looping 92 Continue/stop looping on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Forces the RMC to do a self- test and then reports the result of the test. Checks to see if the I2C cable connecting the RMC to the BMC is in place. Checks to see if the RMC can read the BMCs System Event Log. Checks to see if an external power source has been connected to the RMC. Checks to see if a LAN cable has been connected to the RMC. Displays the current status of the RMC card. Displays the version of the RMC firmware. Option is unavailable. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Card diagnostics

SAS diagnostics
About the SAS diagnostic tests
The SAS (Serial Attached SCSI) group of diagnostics tests the functioning of the SAS interfaces that are in your system. The tests range from EEPROM data verification through data transfer integrity testing. The SAS diagnostic tests can generate error messages associated with the interface and disk shelf. To perform disk or shelf diagnostics, select test 90 and identify the channel. This returns you to the main SAS menu. Then select test 80 or 81. Note Altering disks or cabling in a loop adapter requires you to perform either Test 41 or Test 42 before running any SAS test. If you change a multiple loop adapter, run Test 41. If you change a single loop adapter, run Test 42.

SAS diagnostic test menu

The following table describes the available tests in the SAS diagnostic menu. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Type xtnd n to cancel Extended test mode. Caution: Disconnect all network connections prior to running network diagnostics. Running with attached networks can adversely affect other attached devices: Test Test Description no 1 Comprehensive Runs all tests in this menu in current mode. SAS test 2 Self test Verifies and tests the SAS chip configuration, firmware commands, mailboxes, status, error information, the serial EEPROM data, the ISP power-on self-test (POST), the on-chip SSRAM with fixed and random patterns, the SSRAM/DMA of fixed and random patterns between SSRAM and most locations of main memory, and ISP firmware in SSRAM. 3 ISP interrupt test Verifies the device's ability to generate interrupts, and the system's ability to handle interrupts correctly. 4 Int loop test Tests data movement between main memory and the FC-AL chip, using on-chip loopback capability for 10 bit and 1 bit. 6 Ext loop test Tests the functionality and data movement between memory and SAS cable. Requires loopback plug. 7 Read-only bus Tests the SAS loop integrity by reading from each disk attached to the SAS interface. test Requires the presence of disks. 8 Read/write bus Option not available. test [Mfg] 9 Disk read test Tests the SAS loop integrity by reading from each disk attached to the SAS onboard interface. This test has optional parameters. Requires the presence of disks. 10 Disk read/write Option not available. test [Mfg] 41 Scan all disks on Lists the status of all the disks on all SAS interfaces on the storage system. Requires the

42

71 72 73 74 76

78 80 81

90 91 92 93 99

all SAS Scan and show disks on selected SAS Show ISP SAS chip info Show attached SAS devices Show all disks (probe-scsi-all) Reset SAS interface Program onboard WWN [Factory] Zeroing disk test [Mfg] Go to disk diagnostic menu Go to shelf diagnostics menu SAS interface selection Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

presence of disks. Lists the status of all the disks on the specified SAS interface. Requires the presence of disks. Displays information about the ISP SAS chip. Displays all devices attached to a specific SAS interface. Scan and List disk information for all disks attached to the system. Resets the selected SAS interface to its original state. Option not available. Option not available. Accesses the disk bus pattern diagnostics submenu. Accesses the disk shelf diagnostics submenu. Enables you to select a specific SAS interface for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk diagnostics submenu

The following table describes the FC-AL disk diagnostics submenu: Test Test no 1 Perform drive self diagnostic test 2 Low frequency pattern [Mfg] 3 Low transition density pattern [Mfg] 4 Half-rate square pattern [Mfg] 5 Quarter-rate square pattern [Mfg] 6 Contiguous '3' pattern [Mfg] 7 Composite pattern [Mfg] 40 Read drive defect list 99 Exit this menu Description The drive seeks a reserved non user-accessible cylinder and writes, reads, and verifies data for each data surface. Option not available.

Displays primary and grown defect list. This test has optional parameters. Requires disks attached to the FC host adapter. Returns the user to the main FC-AL menu.

[Up] [Diskdiagnostics] [Diskshelfdiagnostics]

Card diagnostics

Disk shelf diagnostics submenu

The following table describes the disk shelf diagnostics submenu for the SCSI card: Test no 1 2 3 4 5 6 7 8 9 10 11 12 70 93 99 Test Turn shelf LED on Turn shelf LED off Get trunk information Description

Turns on the drive LEDs on the target disk shelf. Turns off the drive LEDs on the target disk shelf. Displays the list of disk shelves and their firmware revisions on the target FC-AL card. Get shelf drive map Displays the list of drives on the disk shelves of the target FC-AL card. Get shelf environment Displays the environmental parameters for the disk shelves on the target FCinformation AL card. Check SES temperature sensors Check SES temperature sensors against threshold value. Check SES FANs Check SES fan status. Check SES Power Supply Check SES Power Supply status. Check SES ESH (HUB) Check SES HUB status on the ESH. Check all SES elements Check status of all SES elements in the shelf. Loop integrity/LRC test [Xtnd] Extended test mode: Tests the FC-AL loop integrity and LRC functionality. Show HUB status Display status of each port in the HUB for each ESH module. Display sector size for FC-AL Displays the sector size for the drives on the disk shelves. devices Extended/normal test mode Enables or disables extended mode on tests where extended mode is an available option. Exit this menu Returns the user to the main FC-AL menu.

Card diagnostics

SCSI diagnostics
About the SCSI diagnostic tests
The Small Computer System Interface (SCSI) group of diagnostics tests the functioning of the SCSI adapters that are in your system. The tests range from checking firmware versions and disk access through Static Read Random Access Memory (SSRAM) and data transfer integrity. The SCSI diagnostic tests generate error messages associated with the adapter. Note: Tests that are labeled [Xtnd] often require loopback plugs for complete test operation and will indicate failures without these plugs. Caution: Do not run [Xtnd] mode diagnostics on network adapter cards with live network connections. Disconnect all network connections prior to running network diagnostics in [Xtnd] mode. Running with attached networks can adversely affect other attached devices. Type xtnd n to cancel Extended test mode.

SCSI Controller diagnostic test menu

The following table describes the tests in the SCSI Controller diagnostic test: Test Test no 1 Comprehensive SCSI test 2 SCSI card self test Description Runs all tests in this menu in current mode. Verifies the PCI configuration registers, the SCSI chip configuration, firmware commands, mailboxes, and status and error information. Reads and verifies the serial EEPROM data. Tests the on-chip SSRAM with fixed and random data patterns. Tests the DMA of fixed and random data patterns between SSRAM and most locations of main memory. Runs built-in self-test Tests the ISP SCSI adapter interrupt. Extended test mode: Tests SCSI adapter loop integrity by reading from each disk attached to the SCSI adapter. Option not available. Tests the SCSI adapter connection by reading from each disk attached to the SCSI interface. Option not available. Displays information about the ISP chip. Displays the SCSI devices attached to the system. Resets the SCSI adapter. Displays the serial EEPROM data.

3 4 5 6 7 71 72 74 75

SCSI interrupt test Read-only bus test [Xtnd] Read/write bus test [Mfg] Disk read test (FCTEST) Disk read/write test Show ISP chip info Show attached SCSI devices Reset SCSI adapter Show serial EEPROM data

76 Program serial EEPROM data [Factory] 78 Set serial # and revision [Factory] 79 Zero disk test area [Factory] 90 SCSI card selection 91 Enable/disable looping 92 Stop/continue looping on error 93 Extended/normal test mode 99 Exit

Option not available. Option not available. Option not available. Enables you to select a specific SCSI card for testing. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Card diagnostics

TCP Offload Engine diagnostics

About the TCP Offload Engine diagnostic tests

The TCP Offload Engine group of diagnostics tests the functioning of the TCP Offload Engine (TOE) cards that are in your system. The tests range from a status check of the card to the testing of data movement through the system while the TOE card is being used. The TOE diagnostic tests can generate error messages associated with the hardware.

TOE diagnostic test menu

The following table describes the TOE diagnostic tests: Test Test no 1 Comprehensive TOE test 2 EEPROM test 3 MC3 BIST 4 5 6 MC4 BIST Interrupt test Internal lp test Description Runs all tests in this menu in current mode. Runs a series of tests that reads and verifies EEPROM data on the card. Runs a series of internal functional tests on the payload memory region of the card which holds the TCP data. Runs a series of internal functional tests on the CAM memory region of the card which holds the TCP connection information. Tests the interrupt mechanism. Checks transmit and receive interrupts, as well as timer interrupts. Tests data movement between main memory and the TOE card, using onboard loopback capability. Note This test will only run on a T204 copper card. Extended test mode: Tests functionality and data movement within the card. Requires loopback plug. Note This test will only run on a T210 optical card. Extended test mode: Tests card functionality and data movement between memory and the cable. Requires loopback plug. Allows the user to dump an extensive list of registers located in the controller. Enables the selection of a specific TOE card in the system. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Internal lp test (Xtnd)

8 70 90 91 92 93 99

External lp test (Xtnd) Dump Registers TOE card selection Enable/disable looping Stop/continue looping on error Extended/normal test mode Exit

CF card diagnostics
About the CF card diagnostic tests
The CF (CompactFlash) card group of diagnostics tests the functionality of CompactFlash card that is in your system. Use these diagnostics for testing and verifying card data. The CF card diagnostic tests can generate error messages associated with the hardware.

CF card diagnostic test menu

The following table describes the tests in the CF card diagnostic test menu: Test Test no 1 Comprehensive test 2 Reset test 3 Self test 4 Read test 5 Sector read 6 Write test [Mfg only] 10 Read test (entire card) [Mfg only] 70 Display drive info 71 Display registers 72 Display sector 73 Display checksum 91 Enable/disable looping 92 Stop/continue looping on error 99 Exit Description Runs all tests in this menu in current mode. Verifies the reset functionality of the CF card. Runs the internal self-test supported by the CF card. Verifies data read transfers from the CF card. Verifies the read from a specific sector that the user selects. Option not available.

Displays CF card information. Displays the contents of specific registers. Displays the contents of individual sectors that the user selects. Displays the value of checksum info. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Exits this diagnostics menu.

Stress diagnostics
About the stress diagnostics
This section describes the stress diagnostic tests. They simulate heavy traffic on the storage system to identify malfunctioning components or those that might malfunction in the near future. The stressable devices displayed depend on the cards in the system. FAS270c only: If you are running diagnostics on system module B and you responded that system module A is running Data ONTAP or Diagnostics, then only tests 1 and 3 are available for running. Running diagnostics on a Multipath High Availability nodes: If you are running diagnostics on a node in a Multi Path High Availability cabled pair of nodes, verify that one of the following is true: The partner node is at the CFE or Loader boot prompt. The partner node is powered off. The multipath high availability cabling for both nodes has been removed such that the appliance is only responsible for its own storage and not that of its partner.

System stress diagnostic menu

The following table describes the menu numbers and tests in the system stress diagnostic test menu: Test Test no 1 Stress all devices 2 Stress selected devices 3 Interrupt stress all devices 4 Interrupt stress selected devices 5 Run NDST [Mfg] 71 Show all devices 72 Show selected devices 90 Select devices 91 Enable/disable looping 92 Stop/continue on error 93 Extended/normal test mode 99 Exit Description Runs all tests in this menu in current mode. Runs stress diagnostics on the selected devices. Interrupts all tests in this menu in current mode. Interrupts stress diagnostics on the selected devices. Option not available. Displays all testable system devices. Displays the devices selected for testing. Enables you to select a system device for the stress test. Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. Enables or disables extended mode on tests where extended mode is an available option. Exits this diagnostics menu.

Error Messages
About this section
This section defines the coding conventions used, lists and defines the error messages generated by the diagnostic tests, and recommends the corrective action to address errors you encounter.

Topics in this section

The error messages are documented alphabetically and are described in the following sections. Error message coding conventions DBH0301 through DBH0501 DBS0307 DCH0001 through DCH0501 DCS0001 through DCS0501 DCU0500 through DCU0501 DGH0001 through DGH0827 DGS0006 DHH0001 DIH0001 through DIH0023 DIS0001 through DIS0040 DIU0001 throguh DIU0036 DLH0001 through DLH1004 DMH0001 through DMH0352 DMS0060 through DMS0061 DNH0101 through DNH0602 DNU0002 through DNU0106 DPH0001 through DPH0029 DRH0001 through DRH0034 DRS0010 DRU0009 DSH0001 through DSH1015 DTH0001 through DTH0053 DTS0002, DTS0003, and DTS0010 DZH0101 through DZH3002 DZS0431 through DZS0435

Error message coding conventions

How to determine error message type
When a diagnostic test encounters an error, the diagnostic tool generates an error message. The type of message that is generated and displayed on your console helps you determine what failed during the diagnostic test. Error messages are composed of four components. The alphabetic portion of the error message code helps you identify the system generating the error, the module generating the error, and the type of error encountered. The numeric portion of the error code uniquely identifies the error for the module reporting the error. The numeric identifier is followed by a colon and the error message text. The following is an example of error message syntax. Example: "SMTnnnn: The XYZ card failed to reset" System code The system code identifies the kernel for which the error is generated. The types of system codes are shown in the following table: System code letter C D E F W System generating the error Data ONTAP kernel critical problem Diagnostic kernel error Data ONTAP kernel error Firmware error Data ONTAP kernel warning message

Note Error codes of the type "ENVxxxxxx" indicate that an environmental error code was generated. These codes, along with the corrective action, are listed in Environmental Error Messages. Module code The module code identifies the software driver, hardware adapter, or firmware for which the error is generated. Typically, the hardware error messages generated by the diagnostic tool are associated with the diagnostic kernel system code. Also generated by the diagnostics are Data ONTAP kernel and firmware error messages. Only the diagnostic kernel messages are documented in this section. The types of diagnostic kernel module codes are shown in the following table. Module code letter B C G Module generating the error Hardware bridges CNA errors GbE adapters, iSCSI adapters, and TCP Offload Engine (TOE) adapter

H I L M N P R S T Z Type code

Disk shelf Performance Accelerator module and Flash Cache module FC-AL adapters Memory and onboard SIMMs NVRAM CompactFlash unit Remote management card (RMC) and Remote LAN Management SCSI adapters Baseboard management controller Motherboard and backplane adapters

The last letter of the error message code identifies the probable error type; what caused the error to be generated. The types of probable type codes are shown in the following table: Type code letter H S U Type generating the error Hardware card or adapter Software error User error

Message variable conventions

In the online message text, you see values displayed for conditions found on the system. These values change as conditions in the system change. In error messages in this guide, these values are displayed in italics. The following table illustrates this convention: Convention ASCII_value dec_value hex_value Definition This denotes that an ASCII code is displayed. This denotes that a decimal value is displayed. This denotes that a hexadecimal value is displayed.

DBH0301 through DBH0501

Message type
This error message grouping covers errors associated with the bridge cards that are in the storage system. These errors are generated when you run the Option 2: Check CPU/Hostbridge CNB20HE status option and Option 3: Check SIO (OSb4) status option from the Motherboard Diagnostics menu. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group: Error Sample message code DBH0301 Vendor ID incorrect DBH0302 DBH0303 DBH0304 DBH0305 DBH0306 DBH0308 DBH0501 Description

This error message can appear with a variety of cards. Check the test that yielded this error message to determine which bridge is faulty. Device ID incorrect Incorrect bridge chip device ID found during testing. Base class incorrect Incorrect bridge chip base class detected during testing. Subclass incorrect Incorrect bridge chip subclass detected during testing. Incorrect revision number Incorrect bridge chip revision number detected during testing. Bridge at bus hex_value, slot Might indicate an error in the bridge chip, or more likely, a problem with a hex_value has error device on the bus managed by the bridge. The following bridge error Internal bridging software error detected during testing. bits could not be located No CIOB found on The motherboard does not have the CIOB. motherboard.

Corrective action
To correct the displayed error, replace the card or contact NetApp Technical Support.

DBS0307
Message type
This error message grouping covers software errors associated with the bridge cards that are in the storage system. These errors are generated when you run the Option 2: Check CPU/Hostbridge CNB20HE status option and Option 3: Check SIO (OSb4) status option from the Motherboard menu.

Error message description

The following message can be generated for this message group: Error code DBS0307 Sample message No error bits selected to clear Description Card memory was not cleared before the diagnostic was run.

Corrective action
Report this error to NetApp Technical Support for analysis.

DCH0001 through DCH0501

Message type
This error message grouping covers hardware errors associated with Converged Network Adapters (CNAs) that are in the storage system: Function Fibre Channel Ethernet Error code range DCH0001 through DCH0015 DCH0500 through DCH0501

DCH0001 through DCH0501

DCH0001 through DCH0015

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error code DCH0001 DCH0002 DCH0003 DCH0004 DCH0005 DCH0006 DCH0007 DCH0008 DCH0009 Sample message Description Adapter could not get the links up. Adapter to host interrupt did not complete. Adapter FW is in an invalid state. Adapter FW did not respond to reset command. Adapter FW did not respond to a command request. One or more of self-test components failed. Loopback adapter is not connected. Host to adapter mailbox command register memory map test failed.

Adapter link initialization failed Adapter interrupt timed out Invalid adapter state Adapter reset failed Command request failed Command request timed out Adapter self test failed Loop is open Adapter mailbox command register test failed DCH0010 Loopback pattern match failed DCH0011 Adapter login timed out DCH0012 IDC AE timed out

Failed to match incoming and outgoing patterns during loopback test. Adapter FW failed to perform internal login. Adapter FW failed to process Internal Driver Communication Asynchronous Event. DCH0013 FW DCBX AE timed out Adapter FW failed to process internal Data Center Bridging Exchange Asynchronous Event. DCH0014 Specified adapter not found The adapter was functioning but is no longer accessible. DCH0015 Unexpected number of ports found Potential adapter FW issue with onboard ports.

Corrective action for DCH0001 through DCH0015

The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DCH0001, DCH0008 Corrective action 1. Check SFP(s) and loopback adapters are connected. 2. Repeat the test. DCH0002-DCH0003 1. Verify latest Adapter FW is running in the ISP information. 2. Repeat the test. DCH0004, DCH0009, DCH0014 1. Reseat the adapter. 2. Reboot to the Diagnostics program.

3. Repeat the test. DCH0005-DCH0007 DCH0011-DCH0012 DCH0010, DCH0013 1. Reset the adapter . 2. Repeat the test. 1. Check SFP(s) and loopback adapters are connected. 2. Reset the adapter. 3. Repeat the test. DCH0015 1. Verify a supported FCoE adapter is available. 2. Reset the adapter. 3. Repeat the test.

DCH0001 through DCH0501

DCH0500 through DCH0501

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error code DCH0500 DCH0501 Sample message Data at sending buffer differs from data at receiving buffer Did not receive data Description Failed to get data packets. Failed to receive data packets.

Corrective action
Check the cable, make sure there is loopback plug when running external loopback tests. Call technical support if the error is not corrected.

DCS0001 through DCS0501

Message type
This error message grouping covers software errors associated with Converged Network Adapters (CNAs) that are in the storage system: Function Fibre Channel Ethernet Error code range DCS0001 through DCS0006 DCS0500 through DCS0501

DCS0001 through DCS0501

DCS0001 through DCS0006

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error Sample message code DCS0001 Driver is busy servicing an existing command request DCS0002 Runtime internal software error DCS0003 Invalid adapter state DCS0004 Diag interface to driver is disabled DCS0005 Runtime internal Diag-driver interface error DCS0006 Driver internal error Description Driver has not completed a previous mailbox command request. Internal Sysdiag and or driver software error. Sysdiag software initialization of adapter state failed. Internal Sysdiag and or driver software error Internal driver software error.

Corrective action
Reset the adapter and repeat the test.

DCS0001 through DCS0501

DCS0500 through DCS0501

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error code DCS0500 DCS0501 Sample message Reset failed Failed to set loopback mode Description Unable to reset the NIC function. Unable to set loopback mode.

Corrective action
Replace the CNA card. Call technical support if the error is not corrected because there is a possible software issue.

DCU0500 through DCU0501

DCU0500 through DCU0501

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error code DCU0500 DCU0501 Sample message No CNA card in that slot Invalid port Description User selected a nonexistent CNA. User selected an invalid port.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DCU0500 DCU0501 Corrective action Enter valid slot number. Enter valid port number.

DGH0001 through DGH0827

Message type
This error message grouping covers hardware errors associated with GbE cards that are in the storage system. The following GbE cards are tested: Type of GbE card Alteon cards Intel cards Giganet DAFS card FAS250 GbE interface IPSec card TOE card iSCSI card Error code range DGH0001 through DGH0022 DGH0140 through DGH0149 DGH0250 through DGH0285 DGH0400 through DGH0417 DGH0500 through DGH0504 DGH0600 through DGH0609 DGH0800 through DGH0827

DGH0001 through DGH0827

DGH0001 through DGH0022

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error Sample message code DGH0001 GbE_InitNICmem failed dec_value DGH0002 GbE_InitNICph1 failed dec_value DGH0003 GbE_InitNICph2 failed dec_value DGH0004 Got event type hex_value before firmware_operational event DGH0005 Data send - hex_value, data receive - hex_value DGH0007 Write to the memory failed DGH0008 Data send - hex_value data receive - hex_value count dec_value DGH0009 Failed to send data out DGH0010 Failed count - dec_value unit dec_value pattern - dec_value DGH0011 CPU in reset state DGH0012 CPU ROM failed DGH0013 CPU halted DGH0014 CPU invalid instruction DGH0015 Invalid data fetch DGH0016 Invalid instruction fetch DGH0017 Bad memory alignment DGH0018 CPU in unknown state DGH0020 No GbE in slot dec_value DGH0021 Found dec_value GbE cards but original scan found dec_value DGH0022 Failed to initialize the card Description Failed to initialize memory for the NIC. Failed to initialize the NIC hardware. Failed to load the firmware. This firmware event appears when the firmware started and the firmware event is received. This message confirms that another event has not occurred. Data sent does not match data received. Failed to write to the NIC memory. Displays the data sent, received, and packet count. Failed on the transmit. Displays the fail count and the pattern at which the test failed. Shows error detected on the CPU.

Selected slot does not have a GbE card. Number of cards initialized does not match those found. Reported by the stress diagnostics. Initialization of the card failed.

Corrective action
Replace the GbE card or contact NetApp Technical Support.

DGH0001 through DGH0827

DGH0140 through DGH0159

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error Sample message code DGH0140 GbE revision dec_value not supported DGH0141 DGH0142 DGH0143 DGH0144 DGH0145 DGH0146 DGH0147 DGH0148 DGH0149 DGH0152 DGH0153 DGH0154 DGH0155 DGH0156 DGH0157 DGH0158 DGH0159 Bad EEPROM node address Could not initialize the registers Could not allocate the memory Register ASCII_value, expected hex_value, actual hex_value Did not receive Sent hex_value received hex_value offset dec_value Did not transmit Could not get the interrupts Checksum read hex_value expected hex_value\n, checksum, EEPROM_SUM Receive data error descriptor dec_value Receive carrier extension error descriptor dec_value Receive sequence error descriptor dec_value Receive symbol error descriptor dec_value Receive CRC or alignment error descriptor dec_value Transmit error underrun Transmit error late collision Transmit error excess collisions Description Listed card firmware revision is not supported. Only revision 3 is supported. EEPROM has an incorrect node address. Failed to initialize the device registers. Failed to allocate memory for the card. Registers do not contain the expected default values. Existing and expected values are displayed. Failed to receive packets. Data sent does not match the data received. Sent and received data is displayed. Failed to transmit packets. Failed to get interrupts. Read and expected (default) checksums do not match. An error was received with the given value.

Transmit error.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DGH0140-DGH0146 DGH0148-DGH0149 DGH0147 Corrective action Replace the GbE card or contact NetApp Technical Support. 1. Check that the external loopback plug is connected. 2. If it is connected and the GbE card still fails, call NetApp Technical Support.

DGH0001 through DGH0827

DGH0250 through DGH0285

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error Sample message code DGH0250 The control register offset is out of bounds DGH0251 Failed to set up command queue DGH0252 Failed to set up interrupt queue DGH0253 Failed to reset NIC DGH0254 NIC in wrong state DGH0255 Queue not found DGH0256 Interrupt bit not set DGH0257 DGH0258 DGH0259 DGH0260 DGH0261 DGH0262 DGH0263 DGH0264 DGH0265 DGH0266 DGH0267 DGH0268 DGH0269 DGH0270 DGH0271 DGH0272 DGH0273 DGH0274 DGH0275 DGH0276 DGH0277 DGH0278 DGH0279 DGH0280 Invalid parameter Invalid state Resource error EEPROM checksum mismatch Invalid command Unknown error hex_value Reply message expected Notify message expected Loopback start failure Set loopback failure Allocate packet failure Data mismatch Packet not received Reset loopback failure Link could not be established Loopback packet not sent DMA test fail Could not get the interrupt Card failed to reboot DRAM data bus failure DRAM address bus stuck high failure DRAM address bus stuck low failure DRAM address bus shorted failure Memory test report device failure Description Outbound message register does not have the correct value. Failed to allocate memory and initialize the command queue. Failed to allocate memory and initialize the interrupt queue. Failed to reset the card. After reset, the card is not in standby state. Return interrupt queue is empty. Card did not set the interrupt bit after executing the command, and timed out. Return error status from the card.

Read and expected checksum do not match. Return error code from card. Host was expecting a reply message, but did not get it. Host was expecting a notify message, but did not get it. Return error code from card during loopback test and DMA test.

Host was waiting for interrupt, but timed out. Card failed to reboot during warm reset. Return error code from card during warm reset.

DGH0281 Flash checksum mismatch DGH0282 Could not initialize the registers DGH0283 Flash manufacture ID and device ID do not match DGH0284 8M PCI memory, i960 switches 1 & 2 must be on DGH0285 hex_value PCI memory should be 16M

Failed to initialize device registers. Read out manufacture ID and device ID of the flash are not what was expected. Unless 16M is mapped in, switches 1 and 2 are not set to On. 16M should be mapped in.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DGH0250-DGH0268 DGH0270-DGH0285 DGH0269 Corrective action Replace the GbE card. 1. Check that the external loopback plug is connected. 2. If it is connected and the GbE card still fails, call NetApp Technical Support.

DGH0001 through DGH0827

DGH0400 through DGH0417

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error Sample message code DGH0400 Invalid slot DGH0401 CFE command did not work status dec_value DGH0402 DGH0403 DGH0404 DGH0405 DGH0406 Description

DGH0407 DGH0408 DGH0409 DGH0410 DGH0411 DGH0412 Did not get an interrupt-status hex_value DGH0413 Did not reset sbm_macenable val DGH0414 No on-board ethernet detected\n" DGH0415 DGH0416 DGH0417 status 0x%llx\n"

Invalid slot selected to run the test. The command issued to the common firmware environment (CFE) did not respond; the command status is returned. Slot dec_value receive error send(hex_value) Did not receive any data; displays the sent and the 0x%x recv(hex_value) 0x%x buf dec_value offset received data and offset at which the data mismatch dec_value occurred. Receive failed dsc dec_value Failed the receive operation and shows the descriptor at which the receive failed. Transmit failed dec_value Failed the transmit operation and shows the descriptor at which the receive failed. Ring is full The buffer ring is full trying to allocate more buffers than available. Receive ring to allocate is full dsc hex_value\n", The receive buffer is full trying to allocate more dsc); buffers than available. No 10B link Did not detect a 10Bt link. No 100B link Did not detect a 100Bt link. No 1G link Did not detect a 1G link. status 0x%llx loop dec_value\n" Displays the transmit and receive status in case of an error. Did not get the expected interrupt. The status of the expected interrupt is also shown. Did not reset the mac enable register. Failed to detect an onboard Ethernet interface.

Displays the transmit and receive status in case of an error.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DGH0400-DGH0406 Corrective action Contact NetApp Technical Support.

DGH0410-DGH0417 DGH0407-DGH0409

1. Check that the external loopback plug is connected. 2. If it is connected and the GbE card still fails, call NetApp Technical Support.

DGH0001 through DGH0827

DGH0500 through DGH0504

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error code DGH0500 DGH0501 DGH0502 DGH0503 DGH0504 Sample message Startup failed. DES_SHA1 self test error status hex_value 3DES_SHA1 self test error status dec_value DES_MD5 self test error status hex_value 3DES_MD5 self test error status dec_value Description Failed to initialize the card. Failed the self test for the DES SHA1. Failed the self test for the 3DES SHA1. Failed the self test for the DES MD5. Failed the self test for the 3DES MD5.

Corrective action
Replace the card or contact NetApp Technical Support.

DGH0001 through DGH0827

DGH0600 through DGH0609

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error Sample message code DGH0600 Failed in MAC training slot dec_value DGH0601 Failed in start up slot dec_value DGH0602 Training Did Not Finish slot dec_value DIP4 Errors Encountered slot dec_value Did not transmit slot dec_value Did not receive slot dec_value offset dec_value Data miscompare sent hex_value received hex_value DGH0607 loop dec_value mr hex_value ms hex_value DGH0608 Failed to get card format information DGH0609 Failed to get card microcode information DGH0603 DGH0604 DGH0605 DGH0606 Description Failed in the setup process of the card, loss of syncronization. Failed in the setup process of the card. Failed in the setup process of the card. Did not finish the syncronization process. DIP4 type errors encountered in setup. Failed to send any data out. Did not receive back any data. Received data with a miscompare. Failed on the specified loop with errors during the loopback test. Failed to get any information from the card EEPROM. Failed to read the card microcode.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DGH0600-DGH0603 DGH0608-DGH0609 DGH0604-DGH0607 Corrective action Replace the TOE card or contact NetApp Technical Support. 1. Check that the external loopback plug is connected. 2. If it is connected and the TOE card still fails, call NetApp Technical Support.

DGH0001 through DGH0827

DGH0800 through DGH0827

Error message description
The following messages can be generated for this message group. The corrective action for this error message grouping is below the error message description: Error code DGH0800 DGH0801 DGH0802 DGH0803 DGH0804 DGH0805 DGH0806 DGH0807 DGH0808 DGH0809 DGH0810 DGH0811 DGH0812 DGH0813 DGH0814 DGH0815 DGH0816 DGH0817 DGH0818 DGH0819 DGH0820 Sample message Failed control sram pattern Failed dram pattern test 1 Failed dram pattern test 2 Failed dram pattern test 3 Failed dram pattern test 4 Failed control sram address lines walking test Failed dram address lines walking test Failed control sram data lines walking test Failed dram data lines walking test Failed to enter eboot Can't allocate response buffer iSCSI interrupt not set iSCSI interrupt not reset Can't get sysconfig information Can't get revision information Device not ready Fail init ports Can't allocate mbuf Fail set promiscous mode Fail activate port Fail config port Description Card has bad SRAM. Card has bad DRAM.

Card has bad SRAM. Card has bad DRAM. Card has bad SRAM. Card has bad DRAM. Card failed to execute boot firmware. Unable to allocate memory. Card fail to set an interrupt. Card fail to reset interrupt. Unable to get card system configuration information. Unable to get card revision. Card is not ready. Card failed to initialize the ports. Unable to allocate memory. Unable to set the card to promiscuous mode. Unable to activate the port. Unable to configure the port.

DGH0821 DGH0822 DGH0823 DGH0824 DGH0825 DGH0826 DGH0827

Fail get link up Fail xmt request Fail send Fail receive Frame drop Uncorrect receive length Data compare error

Failed to get the link up. Unable to send a transmit request. Unable to send data. Unable to receive data. A frame was dropped. The received data length is incorrect. The received data is incorrect.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DGH0800-DGH0820 DGH0821DGH0827 Corrective action Replace iSCSI card or contact NetApp Technical Support. 1. Check that the external loopback plug is connected. 2. If it is connected and the iSCSI card still fails, call NetApp Technical Support.

DGS0006
Message type
This error message grouping covers software errors associated with GbE cards that are in the storage system.

Error message description

The following message can be generated for this message group: Error code DGS0006 Sample message Couldn't fill recv ring Description Failed to initialize the receive rings.

Corrective action
Replace the card or contact NetApp Technical Support.

DHH0001
Message type
This error message grouping covers hardware errors associated with the disk shelves that are connected to the storage system or with the Fibre Channel or SAS cards that are in the storage system.

Error message description

The following message can be generated for this message group: Error Sample message Description code DHH0001 SES Admin failed to obtain SES System is aborting the operation because the SCSI enclosure services structure; aborting operation (SES) administrator failed to access the correct target disk shelf ID.

Corrective action
To correct this error, complete the following steps: Step 1 2 3 4 Action Make sure that the drive bays for SES monitoring on the target disk shelf have disk drives. Check the FC-AL or SAS connection. If the connection is good, replace the FC-AL or SAS adapter. Contact NetApp Technical Support.

DIH0001 through DIH0023

Message type
This error message grouping covers errors associated with the Performance Acceleration Module I or Flash Cache module that is in the storage system. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group: Error code DIH0001 DIH0002 DIH0003 Sample message GET_VMARGIN_STATE Memory controller failed to train Unable to get CompactFlash card info Description Failed to get voltage margin state from the driver. DIMM memory controller failed to train. Unable to read system CompactFlash card information. Failed to boot off of primary FPGA image. FGPA image is out of date. Memory training bit that was set has not been removed. The memory training bit was not set and the subsequent pattern comparison resulted in a "miscompare". The Performance Accelerator module is not supported on this filer. Unexpected adapter or slot width detected.

DIH0004 Board is running backup FPGA Image DIH0005 [IOmem only] Build data code is earlier than required DIH0006 Train bit still set DIH0007 Train bit NOT set, train pattern miscompare DIH0008 Unsupported storage system platform DIH0009 Wider PCIe width expected_min: dec_value got:dec_value DIH0010 Narrower PCIe width expected_max:dec_value got:dec_value DIH0011 Unexpected PCIe width detected DIH0012 ZDI_IOCTL_GET_TEMP_INFO DIH0013 SET_VMARGIN_STATE DIH0014 UECC DIMM dec_value and/or DIMM dec_value addr:hex_value engine: dec_value synd:hex_value col:hex_value row: hex_value bank:hex_value rank:hex_value rd_buffer_count=hex_value DIH0015 CECC addr:hex_value dimm:dec_value bit: dec_value engine: dec_value synd:hex_value col:hex_value row: hex_value bank:hex_value rank:hex_value rd_buffer_count=dec_value DIH0016 data miscompare addr= hex_value exp= hex_value got= hex_value error_bits= hex_value

Unable to get sensor temperature information. Unable to set voltage margin. An uncorrectable error occured and since the occurence could not to isolated to a single DIMM, the message displays the DIMM pair, address, and read buffer count. A correctable error occured and the message displays the address, the DIMM number, bit, DMA controller, syndrome, column, row, bank, rank, and read buffer count. A data "miscompare" occured and the message displays the address, the value expected, the value read, and the bits in error. DIH0018 PIO Read miscompare, win= hex_value loc= hex_value A data "miscompare" occured during the PIO test rd= hex_value exp= hex_value and the message displays the window, the address

DIH0019 PIO_UCECC = dec_value, PIO_CECC = dec_value DIH0020 SET_FRU_INFO DIH0021 Set_Memory data miscompare, addr:hex_value expected: hex_value got:hex_value error_bit: hex_value DIH0022 [Flash Cache only] Build data code is earlier than required DIH0023 [Flash Cache only] Build data code is earlier than required

within the window,the value read, and the value expected. An uncorrectable PIO error was detected. Unable to set FRU information. Unable to set local memory. FGPA image is out of date. FGPA image is out of date.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group Corrective action DIH0001-DIH0002 1. Replace the card. DIH0004 2. Call technical support if the error is not corrected. DIH0006-DIH0007 DIH0009-DIH0021, DIS0023 DIH0003 1. Check the CompactFlash card. 2. Reinstall the software. DIH0005 1. Update to the most current Service Image release. 2. Boot the diagnostics program. 3. Enter:
Xtnd yes

4. Enter:
iomem

5. Update the FPGA by entering:

62

DIH0008 DIH0022

Install the Performance Accelerator module (IOmem adapter) in a supported storage system. 1. Update to the most current Service Image release. 2. Boot the diagnostics program. 3. Enter:
Xtnd yes

4. Enter:
pam2

5. Update the FPGA by entering:

61

DIS0001 through DIS0040

Message type
This error message grouping covers errors associated with the Performance Acceleration Module I or Flash Cache module that is in the storage system. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group: Error code DIS0001 DIS0002 DIS0003 DIS0004 DIS0005 DIS0006 DIS0007 DIS0008 DIS0009 DIS0010 DIS0011 DIS0012 DIS0013 DIS0014 DIS0015 DIS0016 DIS0017DIS0018 DIS0019 DIS0020 DIS0021 DIS0022 DIS0023 DIS0024 DIS0025 DIS0026 DIS0027 Sample message ZDI_IOCTL_GET_STATS Failed to get PCI information GET_FRU_INFO GET_MEMORY_INFO GET_FPGA_INFO Initialization error occurred while scanning for iomem cards Unable to allocate PROM xsvf buffer GET_CARD_STATE Failed to allocate I/O control block DMA request rejected Local DMA fill error Max dma read size is dec_value Max dma write size is dec_value DMA write error DUMP REGISTERS Data miscompare addr= hex_value exp= hex_value got= hex_value error_bits= hex_value DMA_write failed DMA_pattern failed DMA_write failed SET_WINDOW_STATE FRU info mismatch DIMM info not equal DMA local write error Failed to clear memory Unsupported test pattern option Failed to reset DIMM dec_value error log. Description Unable to get driver statistics. Unable to get PCI information. Unable to get FRU information. Unable to get memory configuration information. Unable to get FPGA information. Error detected while probing for IOmem cards. Failed to allocate memory during FPGA update. Unable to get card status information. Unable to allocate memory for control block information. Driver rejected DMA request. Unable to fill memory with local DMA. Exceeded maximum DMA read size. Exceeded maximum DMA write size. DMA write failed. Unable to dump FPGA registers. A data "miscompare" occured and the message displays the address, the expected value, the value read, and the bits in error. DMA write failed. Failed to load DMA pattern. DMA write failed. Unable to set the window state. Detected mismatch in the FRU information. Detected mismatch in the DIMM information. DMA local write failed. Unable to clear the memory. The selection of an unsupported test pattern was detected. Unable to reset DIMM log.

DIS0028 Unsupported bit_toggle test pattern option The selection of an unsupported bit toggle test pattern option was detected. DIS0029 Failed to get initialization state Unable to get the initialization state. DIS0030 No new address buffer allocated Run out of system memory. DIS0031 Failed to allocate Zodiac I/O message DIS0032 Failed to allocate data buffer DIS0033 GET_DMA_INFO Unable to get DMA information. DIS0034 ZDI_IOCTL_GET_INDICATOR_STATE Unable to get LED information. DIS0035 DMA erase error DMA erase failed. DIS0036 bad block module is not initialized Card failed to initialize. DIS0037 can not retrieve bad block Failed to get bad block information. DIS0038 Card is not ready for sanitizing Card state is not ok. DIS0039 Can not clear card Failed to clear data in flash card. DIS0040 Clearing fail Can not clear the card.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DIS0002-DIS0006 DIS0008 DIS0010-DIS0011 DIS0014-DIS0022 DIS0024-DIS0025 DIS0027, DIS0029 DIS0033-DIS0037 DIS0012 DIS0001,DIS0007, DSI0009, DIS0013, DIS0023, DIS0026, DIS0028, DIS0030-DIS0032, DIS0038-DIS0040 Corrective action 1. Replace the adapter. 2. Call technical support if the error is not corrected.

Enter a valid voltage margin. Call technical support as there is a possible software issue.

DIU0001 through DIU0036

Message type
This error message grouping covers errors associated with the Performance Acceleration Module I or Flash Cache module that is in the storage system. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group: Error code DIU0001 DIU0002 DIU0003 DIU0004 DIU0005 DIU0006 DIU0007 DIU0008 DIU0009 DIU0010 DIU0011 DIU0012 Sample message Failed to open ZDI firmware package FPGA file not in ZDI firmware package Failed to read FPGA file Unsupported FPGA file selection option zodiag_get_hex_value, limiting input to dec_value hex chars zodiag_get_hex_value, detected illegal hex char Exceeded number of retries ( dec_value). zodiag_show_memory, invalid start_addr value. (tries=dec_value) Aborting start_address prompt after dec_value unsuccessful tries... zodiag_show_ecc_memory, invalid start_addr value. (tries=dec_value) Detected illegal vmargin setting. Exceeded vmargin tries = dec_value. Aborting... Description Unable to open FPGA bitstream file. FPGA is not in installed package. Unable to read FPGA file. Detected unsupported FPGA file select option. Exceeded maximum hex chars for value. Detected illegal hex char in input. Exceeded max number of retries for valid option. Detected invalid start address value. Exceeded max number of retries for set start address option Detected invalid start address value. Detected illegal voltage margin setting Exceeded number of retries for set voltage margin option. Detected more hex characters than expected. Detected illegal hex character.

DIU0013 Limiting input address to 9 hex chars... DIU0014 Detected illegal hex char. 'ascii_value' char_loc= dec_value DIU0015 Exceeded number of retries ( dec_value). Aborting... Exceeded number of retries. DIU0016 Limiting input address to 16 hex chars... Exceeded more hex characters than expected. DIU0017 Addr > BOARD_SIZE ( hex_value) Requested memory address is greater than memory available on board. DIU0018 Invalid start_addr value. (tries=dec_value) Detected invalid start address. DIU0019 Aborting set_addr after dec_value unsuccessful Exceeded max number of reties while setting address. tries... Unable to get valid input. DIU0020 Getline failed DIU0022 FPGA filename not set Unable to set FPGA filename. DIU0023 Choose_FPGA_file failed Unable to choose FPGA file. DIU0024 Failed to get FPGA info Firmware packaging error.

DIU0025 Sampling factor cannot be zero. DIU0027 Detected illegal value for bit_toggle flag dec_value DIU0028 Detected illegal value for bit_toggle pattern dec_value DIU0029 Detected illegal value for reset DIMM log chc= dec_value DIU0031 Failed to sync DIMM Logs DIU0032 Invalid address interface value DIU0033 Invalid address bank value DIU0034 Invalid address block value DIU0035 Invalid address page value DIU0036 Invalid address chip value

Detected illegal value for set sampling factor. Detected illegal value for set bit toggle flag Detected unsupported option in set bit toggle value. Detected unsupported option in reset DIMM Log. Unable to save DIMM Logs. Detected invalid address interface value. Detected invalid address bank value. Detected invalid address block value. Detected invalid address page value. Detected invalid address chip value.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DIU0001, DIU0003 DIU0022-DIU0023 DIU0002 DIU0004 DIU0005-DIU0007 DIU0013-DIU0016 DIU0008-DIU0010 DIU0018-DIU0019 DIU0011-DIU0012 DIU0017 DIU0020 DIU0021 DIU0024 DIU0025 DIU0026 DIU0027 DIU0028 DIU0029 DIU0031 DIU0032-DIU0036 Corrective action Install valid ZDI firmware package Choose valid FPGA file from firmware package. Choose valid option. Enter valid hexadecimal string value. Enter valid start address value. Enter valid voltage margin string. Choose valid memory address. Enter valid characters. Choose valid slot number. Choose valid end address value. Choose valid sampling factor value. Enter valid value for check status flag. Enter valid value for bit toggle flag. Enter valid bit toggle value. Choose supported option in reset DIMM log. Call technical support as there is a possible software issue. Enter valid address values.

DLH0001 through DLH1004

Message type
This error message grouping covers hardware errors associated with Fibre Channel and SAS cards that are in the storage system. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group: Error code DLH0001 DLH0003 DLH0004 Sample message Could not reset ISP on adapter ASCII_value Mailbox timeout Mailbox command returned with a failure note Description Card failed to reset the chip. Card failed to finish the given mailbox command. During execution of the mailbox command, the value put on the incoming mailbox does not match the value that was received in the outgoing mailbox. Card has an unrecognized vendor ID (not ISP2100 or ISP2200). Card has an unrecognized device ID (not ISP2100 or ISP2200). After reset, the card does not come back alive.

DLH0005 ISP VID is hex_value but should be hex_value DLH0006 ISP DID is hex_value but should be either hex_value or hex_value DLH0007 RISC status was hex_value, but should be hex_value DLH0009 ISP firmware simple command DLH0010 ISP firmware bad command test DLH0011 ISP firmware wraparound failed DLH0012 ISP firmware wraparound DLH0013 DLH0014 DLH0015 DLH0016

DLH0019 DLH0020

Card failed to execute a simple command (NOP operation). Card failed to execute an invalid command. Card failed to execute a wraparound mailbox command. The data transmitted to and received by the mailbox does not match. Expected dec_value ISP2100 controllers, but Card received an unexpected number of ISP chips. only found 1 Copy to SSRAM on channel dec_value failed Card failed to write to Synchronous Static Random Access Memory (SSRAM). Read from SSRAM on channel dec_value Card failed to read from SSRAM. failed Data mismatch at SSRAM word dec_value, Read and written data do not match. channel dec_value, Note read hex_value, expected hex_value, dest The word is the address offset from the starting address in hex_value, source hex_value the word. RISC checksum failed Card failed when verifying the checksum of the downloaded firmware code. FCAL loop is open, channel dec_value Card failed to reconnect to the loop. Check the cable, disk, and terminator plug. Card failed to download the EEPROM.

DLH0021 Could not save new ISP 2100 settings to EEPROM; giving up after 2 retries

DLH0023 Unable to execute firmware: error code 0004 Card failed to execute the downloaded firmware. DLH0025 FCAL loop is open, channel dec_value Card failed to reconnect to the loop. DLH0026 DLH0030 DLH0032 DLH0033 DLH0034 DLH0035 DLH0036 DLH0037 DLH0038 DLH0039 DLH0040 DLH0041 DLH0042 DLH0043 DLH0044 DLH0045 DLH0046 DLH0047 DLH0070 DLH0071 DLH0072 DLH0073 DLH0074 DLH0100 Check the cable, disk, and terminator plug. No FCAL in slot dec_value No card was found in designated slot. isp2100_diag_reset_isp: while resetting ISP, Card failed to come back after reset. ISP never came ready on adapter dec_value FCAL ISP POST test failed: error code Card failed to execute the POST code given by the FC-AL dec_value, count dec_value failing FIFO: vendor. hex_value, FIFO addr: hex_value NOP command failed execution Card failed to execute the NOP command. Unexpected number of ISP 2100s; found Chip number is incorrect. dec_value The HCCR_INTR bit was not reset Test failed to flush the previous command. FCAL interrupt test failed, the interrupt test Card/test failed to set the interrupt bit to the main CPU. never got set FCAL interrupt bit either never got reset or it Test either failed to flush the previous command or the regenerated an interrupt interrupt bit was reset. There is a link failure or loss of sync or System failed to receive the link status from the Fibre invalid CRC Channel chip. FCTEST confidence factor is < 95 The fctest has a confidence factor of < 95%. ISP internal loop test 10 bit failed during Applies to ISP2200 card only: Card failed to execute the mail, channel dec_value internal loop test (before the serial transceiver). ISP internal loop test 1 bit failed during mail, channel dec_value ISP external loop test failed during mail, Applies to ISP2200 card only: Card failed to execute the channel dec_value external loop test. Data mismatch doing dec_value at word Card has a data mismatch when executing an internal or dec_value, channel dec_value, received external loop test. hex_value, send hex_value ISP failed to get device link status at channel Card failed to get device link status before the fctest. dec_value, device dec_value ISP failed to get adapter link status at Card failed to get adapter link status before the fctest. channel dec_value ISP failed to execute fctest at channel Card failed to execute the fctest. dec_value ISP failed to get device link status at channel Card failed to get device link status after the fctest. dec_value, device dec_value Unrecognized signature The save EEPROM data has an invalid signature. Invalid NVRAM minimum version The save EEPROM data has an invalid NVRAM version. EEPROM data checksum error The save EEPROM data has an invalid checksum. Serial number in EEPROM is not equal to the Serial numbers saved in EEPROM and in FLASH do not one in FLASH match. Never saw LIP occur after executing internal Card never saw the loop initialization process (LIP) back up loopback test after executing the internal loopback test. LED test failed LED test failed.

DLH1000 Self test failed with error of class dec_value, subclass dec_value, info dec_value DLH1001 Interrupt test failed with error of class dec_value, subclass dec_value, info dec_value DLH1002 External loopback test failed with error of class dec_value, subclass dec_value, info dec_value DLH1003 Failed to relip with error of class dec_value, subclass dec_value, info dec_value DLH1004 Internal loopback test failed with error

Card self test failed. Failed to get interrupt from the card. The card failed to execute external loopback test. The card failed to generate a lip or close the loop. Inconclusive test or transient error..

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group Corrective action DLH0001-DLH0007 Replace the FC-AL card or contact NetApp Technical Support. DLH0009-DLH0016 DLH0019, DLH0021 DLH0023 DLH0026-DLH0030 DLH0032-DLH0041 DLH0070-DLH0074 DLH0100 DLH1000-DLH1003 DLH0020, DLH0025 1. Check the external connection. DLH0042-DLH0043 2. If the FC-AL card still fails, replace the card or contact NetApp Technical Support. DLH0044-DLH0047 DLH1004 1. Check the external connection, disk, and disk shelf. 2. If the FC-AL card still fails, replace the card or contact NetApp Technical Support. Rerun the test.

DMH0001 through DMH0352

Message type
This error message grouping covers hardware errors associated with the storage appliance onboard memory. When the memory diagnostics encounter errors, or if recoverable ECC errors occur, the diagnostics attempt to analyze the error and identify the failing DIMMs. Bank part numbers are silk-screened on the motherboard, adjacent to the SIMM sockets. Example: When an error is encountered, the diagnostics display an error message similar to the following:
ERROR: Addr=04b1329e: Exp=55aa55aa, Act=55af55aa, Diff=00050000 ** DIMM banks indicating errors: U101 ** Cache SRAMs indicating errors: E44

Error message description

The following messages can be generated for this message group: Error code DMH0001-DMH0059 Sample message Description

Addr=hex_value: Exp=hex_value, Data might be corrupted and a specific DIMM is bad. Act= hex_value, Diff=hex_value Read/write error. ** SIMM banks indicating errors: hex_value Addr=hex_value Exp=hex_value, Act= hex_value, Diff=hex_value

DMH0101-DMH0106 DMH0301-DMH0352

An error in cache memory is found and identified. Cache errors require replacement of the motherboard.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DMH0001DMH0059 DMH0101DMH0352 Corrective action Replace the DIMM/SIMM for DIMM/SIMM errors. Call NetApp Technical Support for cache errors. 1. Replace the motherboard 2. Call NetApp Technical Support if the error is not corrected.

DMS0060 through DMS0061

Message type
This error message grouping covers software errors associated with the onboard memory in the storage system.

Error message description

The following messages can be generated for this message group: Error Sample message code DMS0060 Unknown platform type = dec_value! DMS0061 Invalid memory configuration, dimmMap = hex_value Description The storage system type cannot be determined by the test. The test encountered an invalid memory configuration for the storage system. One or more DIMMs might be malfunctioning, inaccessible, or missing.

Corrective action
Contact NetApp Technical Support.

DNH0101 through DNH0602

Message type
This error message grouping covers hardware errors associated with the NVRAM in the storage system. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group. Error Sample message code DNH0101 No NVRAM card found DNH0103 No NVRAM in slot dec_value DNH0104 Data mismatch at hex_value on slot dec_value, dec_value bytes from cardbase at hex_value pass dec_value read hex_value, expected hex_value DNH0110 No NVRAM memory found Description No NVRAM found in the system. NVRAM card was not found in the correct slot. A read/write error occurred. No memory was found on the NVRAM card. Test shows unexpected data.

DNH0143 Addr=hex_value, Exp=hex_value, Act= hex_value, Diff=hex_value DNH0145 Majority vote for address not reached ( hex_value, hex_value, Indicates that the address of the location hex_value) being written to when power was lost could not be obtained. DNH0106- Addr=hex_value Exp=hex_value, Act= hex_value, A read/write error was encountered. DNH0109 Diff=hex_value DNH0112DNH0143 DNH0301DNH0302 DNH0311DNH0312 Test forced an ECC error. Status register is DNH0321 Soft error register value is not correct: Exp=dec_value, Act= dec_value not correct. DNH0322 Soft error count not generated The status register did not count the errors. DNH0323- No ACK received I2C write failed. DNH0324 An EEPROM read/write error occurred. DNH0325 EEPROM byte=dec_value, val=hex_value, exp= hex_value DNH0326 Soft error register value shows error = hex_value Status register shows an unexpected error. DNH0327 Cannot clear soft error register = hex_value Test could not clear the status register bit. DNH0328 Hard error register value shows error = hex_value Status register shows an unexpected error. DNH0329 Cannot clear hard error register = hex_value Test could not clear the status register bit. DNH0330 NVRAM battery needs to be charged NVRAM battery voltage is low and needs charging or replacing.

DNH0331 NVRAM battery voltage too high DNH0332 DNH0402 DNH0416 DNH0417 DNH0423 DNH0424 DNH0425 DNH0426 DNH0435 NVRAM battery in the chassis is *missing or dead* Command status reads as busy Expected interrupt hex_value did not occur Unexpected interrupt hex_value Clear command did not clear memory Incorrect number of unlogged ECC corrections dec_value ECC log 0 incorrect mask=hex_value, addr= hex_value ECC log 1 incorrect mask=hex_value, addr= hex_value Unable to read the flash ID

NVRAM adapter is bad, incorrect voltage read. NVRAM battery is missing or discharged. Previous command was not completed. Missing interrupt. Unexpected interrupt occurred. Memory was supposed to be cleared, but was not. Log data shows memory errors, or expected errors not logged. Flash that stores NVRAM microcode is not responding properly. A sector of flash memory that stores NVRAM microcode could not be written to. Test encountered an invalid serial number for the storage system type or NetCache appliance. The test encountered an invalid revision number for the storage system type or NetCache appliance. The test encountered an invalid memory size for the storage system type or NetCache appliance. Memory errors read from the NVRAM card have not been corrected. Single-bit ECC error not corrected. NVRAM installed with wrong memory size. Unable to communicate with the NVRAM flash. NVRAM programmed with a bad part number, or unable to read part number. Unlogged ECC correction is incorrect.

DNH0436 Flash write error address = hex_value DNH0440 Invalid nvram serial number dec_value DNH0441 Invalid nvram revision number hex_value DNH0442 Board part number ( hex_value) does not match DIMM size DNH0443 ECC PCI correction DNH0444 ECC silent correction Loc=hex_value, Exp=hex_value, Act= hex_value DNH0445 Wrong size DIMM ( dec_value MB) for this platform DNH0446 A front panel is hex_value detected on this system DNH0447 Unrecognized part number (string-value)

DNH0448 ECC unlogged correction Adr=hex_value, Exp=hex_value, Act= hex_value Odd ECC cacheline correction is incorrect. DNH0449 ECC odd cacheline correction Addr=hex_value, Exp=hex_value, Act= hex_value DMA memory transfer shows unexpected DNH0461 DMA failed: Engine= dec_value, Ctrl=hex_value Addr=hex_value, Exp=hex_value, Act= hex_value, data. Diff=hex_value DNH0462 DMA ECC: Engine= dec_value, Exp=hex_value, hex_value, hex_value, hex_value Act= hex_value, hex_value, hex_value, hex_value DNH0463 DMA time out: Engine= dec_value, Desc Exp=hex_value, Desc Act= hex_value

DNH0471 Vendor ID incorrect - Expected hex_value, Actual hex_value This card has a different vendor than what testing reads. DNH0472 Device ID incorrect - Expected hex_value, Actual hex_value This card is of a different type than what testing reads. DNH0473 Class incorrect - Expected hex_value, Actual hex_value This card is of a different class than what testing reads. DNH0474 Completion buffer timeout Command issued to NVRAM, but NVRAM did not reply. DNH0490 NVRAM front panel EEPROM wrote hex_value, read EEPROM read and/or write failed. hex_value NVRAM5 IB failed to create the DNH0500 NVRAM5 IB fail create CQ completion queue. DNH0501 NVRAM5 IB fail QP prep NVRAM5 IB failed the queue pair preparation. DNH0502 NVRAM5 IB fail create QP NVRAM5 IB failed to create the queue pair. DNH0503 NVRAM5 IB fail transit QP from reset to init NVRAM5 IB failed to transition the queue pair from reset to initialized state. DNH0504 NVRAM5 IB fail transit QP from init to rtr NVRAM5 IB failed to transition the queue pair from initialized state to ready-toreceive. DNH0505 NVRAM5 IB fail transit QP from rtr to rts NVRAM5 IB failed to transition the queue pair from ready-to- receive to ready-tosend. DNH0506 NVRAM5 IB fail memory registration NVRAM5 IB failed memory region registration. DNH0507 NVRAM5 IB fail post send request NVRAM5 IB failed post send request. DNH0508 NVRAM5 IB fail post rcv request NVRAM5 IB failed post receive request. DNH0509 NVRAM5 IB fail completion poll NVRAM5 IB failed completion poll. DNH0510 NVRAM5 IB error verify data NVRAM5 IB error in verifying data. DNH0511 NVRAM5 IB fail link up on port ( dec_value) NVRAM5 IB failed to get the link up on the identified port. DNH0512 NVRAM5 IB slot ( dec_value) failed initialization The identified slot for NVRAM5 IB failed to initialize. DNH0550 Timeout waiting for ECC correction ECC errors not corrected or not recorded in logs. DNH0551 NVRAM5 did not receive expected ECC error NVRAM5 failed to receive the expected error correction code. DNH0552 NVRAM5 EEPROM write failed: exp hex_value got NVRAM5 read and expected EEPROM hex_value write do not match. DNH0553 NVRAM5 received wrong ECC error: dec_value NVRAM5 received the wrong error correction code. DNH0554 NVRAM5 received too many ECC errors NVRAM5 received too many error correction codes. DNH0555 NVRAM5 ECC did not correct data: exp hex_value got NVRAM5 error correction code did not hex_value correct the data. DNH0556 NVRAM5 battery is too low or disconnected at 4590 mV NVRAM5 battery power is below normal.

DNH0600 NVRAM DMA mismatch: Addr1: hex_value Data1: hex_value Addr2: hex_value Data2: hex_value DNH0601 NVRAM SPD byte dec_value unsupported: dec_value DNH0602 NVRAM battery dec_value is too low or disconnected at dec_value mV

DMA memory transfer shows unexpected data The DIMM in the NVRAM adapter shows unsupported properties (SPD). NVRAM battery power is below normal.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group. Error message group DNH0101-DNH0330 DNH0471-DNH0473 Corrective action 1. Replace the NVRAM adapter for platforms with an NVRAM adapter or Replace the SDRAM DIMM in the FAS250. 2. Call NetApp Technical Support if the error is not corrected. DNH0331-DNH0332 DNH0430, DNH0432, DNH0556, DNH0602 DNH0402-DNH0426 DNH0435-DNH0436 DNH0442 DNH0445-DNH0446 DNH0473, DNH0550 DNH0601 DNH0440-DNH0441 DNH0447 DNH0443 DNH0461-DNH0463 DNH0600 DNH0490 DNH0500- DNH0512 Replace the NVRAM battery.

Replace the NVRAM adapter.

Replace the storage system head. 1. Replace the NVRAM adapter. 2. Replace the storage system head. Replace the NVRAM adapter and the attached front panel. 1. Reseat the cables. 2. Reseat the adapter. 3. Replace the adapter. 1. Reseat the DIMM. 2. Reseat the adapter. 3. Replace the adapter.

DNH0551- DNH0555

DNU0002 through DNU0106

Message type
This error message grouping covers user errors associated with the NVRAM in the storage system.

Error message description

The following messages can be generated for this message group: Error code Sample message DNU0002 Might be missing last bank of SIMMs DNU0106 Might be missing last bank of SIMMs Description Test cannot verify the existence of the last bank of SIMMs. Test cannot find the last bank of SIMMs.

Corrective action
Check the storage system for the last bank of SIMMs. If it is there, verify that it is seated properly, then rerun the diagnostic test. If the same error occurs, call NetApp Technical Support.

DPH0001 through DPH0029

Message type
This error message grouping covers user errors associated with the CompactFlash unit. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group. Error code Sample message DPH0001 Incorrect status hex_value DPH0002 Invalid model DPH0003 Incorrect size dec_value, current cylinders dec_value, current heads dec_value, current sectors per track dec_value DPH0004 BSY status bit not cleared DPH0005 DRQ status bit not cleared DPH0006 Command error DPH0009 Drive not ready DPH0010 Write complete error DPH0013 First read failed for sector hex_value DPH0014 Second read failed for sector hex_value DPH0015 Sector dec_value conflicting CRCs CRC1= dec_value, CRC2= dec_value DPH0016, Invalid sector selected DPH0017 DPH0018 Read failed for sector hex_value DPH0019 Mismatch; wrote hex_value, read hex_value DPH0020 DPH0021 DPH0023 DPH0024 DPH0025 DPH0026 DPH0029 DPH0028 Invalid sector selected Reset failed Formatter device error Sector buffer error ECC circuitry error Controlling MP error Slave failed status hex_value Read failed for sector hex_value Description Status value shows error. Model number not supported. Card shows size not supported or incorrectly programmed. Busy bit is not cleared. Data request is not cleared. Command is not executed. Drive is not ready to respond. Did not complete write command. Could not read on first try. Could not read on second try. CRC error on read. Sector selected is not correct. Failed on read command. Read data does not match what was written. Sector selected is not correct. Failed to reset card. Formatter device is incorrect. Buffer type error is detected. ECC circuitry type error is detected. Multiprocessor type error is detected. Failed to read slave device. Failed on read command.

Corrective action
1. Replace CompactFlash card. 2. Call NetApp Technical Support.

DRH0001 through DRH0034

Message type
This error message grouping covers errors associated with the remote management card that is in the storage system. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group: Error code DRH0001 DRH0002 DRH0003 DRH0004 DRH0005 DRH0006 DRH0007 DRH0008 DRH0011 DRH0012 DRH0021 DRH0022 DRH0023 DRH0024 DRH0025 DRH0026 DRH0027 DRH0028 DRH0029 DRH0030 DRH0031 DRH0033 Sample message Failed to Reset the RMC Card RMC Self Test Error No External Power Source detected for the RMC Card RMC I2C Cable connection not detected RMC card failed to access the BMC SEL Failed to access the BMC SEL. This is a BMC error Incorrect or corrupt SEL data retrieved by the RMC No LAN cable connection detected for the RMC card Failed to get the RMC Firmware revision Failed to update the RMC Firmware Expected temperature interrupt didn't happen Expected critical interrupt didn't happen Temperature out of range Fail access agent Fail get correct agent information Fail access sensor Not all power supply present Not all power supply on Fail turn off power supply Fail turn on power supply Expected Appliance IRQ didn't happen NMI didn't happen Description The remote management card could not be reset. The remote management card failed its self-test. The remote management card did not detect any external power sources. The remote management card did not detect the cable connecting it to the motherboard. The remote management card failed to read the baseboard management controller System Event Log. The baseboard management controller failed to read its System Event Log. The remote management card did not retrieve correct System Event Log data. The remote management card did not detect a LAN cable connection. The remote management card failed to read its firmware version. The remote management card failed to update its firmware. The temperature interrupt test failed. The interrupt request test failed. The temperature is above the expected range. The test to gain access to the agent failed. The test failed to get the correct agent information. The test failed to gain access to the sensor failed. The platform does not have all its power supplies. Not all the platform power supplies are on. The test failed in the attempt to turn off the power supply. The test failed in the attempt to turn on the power supply. The appliance IRQ test failed. The agent failed to generate an NMI.

DRH0034 Wrong reboot reason from CPLD

An invalid reason was given for the reboot.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DRH0001-DRH0002 DRH0005 DRH0007 DRH0011-DRH0012 DRH0003 DRH0004 DRH0006 DRH0008 DRH0021-DRH0022 DRH0026 DRH0034 DRH0023 DRH0027 Corrective action Replace the remote management card.

1. Check the external power source. 2. Replace the remote management card. 1. Check the cable connecting the remote management card to the motherboard. 2. Replace the remote management card. Replace the motherboard. 1. Check the LAN cable. 2. Replace the remote management card. 1. Replace the RLM card. 2. Call NetApp Technical Support. 1. Verify that the actual temperature in the enviroment is not too high or too low. 2. Replace the RLM card. 1. Verify that all the power supplies are present before rerunning the test. 2. If the error continues to occur, check the agent on the motherboard. 3. If the error continues to occur, check the power supply. 1. Verify that all the power supplies are on before rerunning the test. 2. If the error continues to occur, check the agent on the motherboard. 3. If the error continues to occur, check the power supply. 1. Check the agent on the motherboard. 2. If the error continues to occur, check the power supply. 1. 2. 3. 4. Reseat the RLM card. If the error continues to occur, replace the RLM card. If the error continues to occur, check the agent on the motherboard. Call NetApp Technical Support.

DRH0028

DRH0029-DRH0030 DRH0024-DRH0025 DRH0031-DRH0033

DRS0010
Message type
This error message grouping covers software errors associated with the remote management card (RMC).

Error message description

The following message can be generated for this message group: Error Sample message code DRS0010 The RMC has incorrect firmware. Please update the firmware. Description The remote management card has incorrect firmware.

Corrective action
1. Update the remote management card firmware. 2. Replace the remote management card.

DRU0009
Message type
This error message grouping covers user errors associated with the remote management card (RMC) in the storage system.

Error message description

The following message can be generated for this message group: Error Sample message Description code DRU0009 Too many RMC cards in the system. Only The system has an unsupported number of remote one card is allowed. management cards. Only one is allowed.

Corrective action
1. Make sure there is only one remote management card in the system. 2. Replace the remote management card.

DSH0001 through DSH1015

Message type
This error message grouping covers hardware errors associated with the SCSI cards in the storage system. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group: Error Sample message code DSH0001 Not a NetApp Dual SCSI card; bridge test skipped DSH0002 PLX VID is hex_value but should be hex_value or hex_value DSH0003 PLX DID is hex_value but should be hex_value, hex_value, hex_value DSH0004 PLX revision is hex_value; illegal dec_value DSH0005 Base class is hex_value but should be hex_value DSH0006 SubClass is hex_value but should be hex_value DSH0007 Interrupt pin is hex_value but should be hex_value DSH0008 PLX selftest failed DSH0009 EEPROM data error DSH0010 Could not reset ISP DSH0011 ISP VID is hex_value but should be hex_value DSH0012 ISP DID is hex_value but should be hex_value or hex_value DSH0013 ISP revision is hex_value; illegal dec_value DSH0014 RISC status was hex_value but should be hex_value DSH0015 MBOX register 1 was hex_value but should be hex_value DSH0016 ISP firmware simple command test failed DSH0017 ISP firmware bad command test failed Description SCSI card found is not a NetApp Dual SCSI card. Test found the wrong PLX VID. Test found an unexpected PLX DID. Revision found is illegal. Test found an incorrect SCSI base class. Test found an incorrect subclass. Test found an incorrect interrupt pin on the SCSI cable. Test failed to run the PLX self test. Test found an invalid EEPROM value in one of the bits. SCSI adapter cannot reset itself. Test found the wrong SCSI VID. Test found the wrong SCSI DID. Test found the wrong SCSI revision. SCSI adapter never came back alive. SCSI adapter returned a different product ID word.

SCSI adapter failed to execute NOP operation. Invalid command entered; the SCSI adapter responds with invalid return status. DSH0018 ISP firmware wraparound failed SCSI adapter failed to execute the wraparound mailbox command. DSH0019 ISP firmware wraparound mailbox # During execution of the wraparound mailbox command, dec_value: read hex_value, expected the value put on the incoming mailbox does not match the hex_value value that was received in the outgoing mailbox. DSH0020 Expected dec_value ISP controllers, but found Number of ISP chips found does not match the number

DSH0021 DSH0022 DSH0023 DSH0024

dec_value Copy to SSRAM on slot dec_value failed Read from SSRAM on slot dec_value failed Data mismatch at SSRAM word dec_value, slot dec_value, read hex_value, expected hex_value, dest hex_value, source hex_value Read of firmware from SSRAM failed

recorded. SCSI adapter failed to copy DMA data to the SSRAM. SCSI failed to read DMA data to the host. Value read from SSRAM does not match the value written to SSRAM. SCSI adapter failed to dump the firmware value written to the host. Firmware data written to SSRAM does not match the firmware data that was read from SSRAM. SCSI adapter failed the firmware checksum. HCCR interrupt bit has not cleared existing data. SCSI adapter interrupt is not set. SCSI adapter interrupt is not set or the interrupt was set again. SCSI adapter failed to execute the loaded firmware. Vendor ID numbers on the device and in the device database do not match. Cannot find SCSI adapter in the specified slot. SCSI adapter failed to copy the firmware to SSRAM. SCSI adapter failed to copy the Qlogic stress code to SSRAM. SCSI adapter failed when doing a checksum for a given Qlogic stress code. Cannot execute Qlogic stress code. SCSI device failed to read the SSRAM in the identified slot. SCSI device failed to read the SSRAM in the identified slot during the firmware test. Failed to reset SCSI adapter card. Failed to reset SCSI chip. Value read from SSRAM does not match the value written to SSRAM.

DSH0025 Firmware data mismatch at word dec_value, read hex_value, expected hex_value DSH0026 Firmware checksum failed DSH0027 The HCCR_INTR bit was not reset DSH0028 SCSI interrupt test failed, the interrupt test never got set DSH0029 SCSI interrupt bit either never got reset or it regenerated DSH0030 Unable to execute firmware: error code hex_value DSH0031 Expected vendor hex_value, device dec_value saw vendor hex_value, device dec_value DSH0032 No SCSI in slot dec_value DSH0033 Copy of firmware to SSRAM failed DSH0034 Copy of stress Qlogic code to SSRAM failed DSH0035 Qlogic stress code checksum failed DSH0036 Unable to execute Qlogic stress code DSH0037 Read from SSRAM on slot dec_value failed DSH0038 Read from firmware from SSRAM in slot dec_value failed DSH0039 Failed to reset adapter card DSH0040 Failed to reset ISP DSH0041 Data mismatch at SSRAM word hex_value, slot dec_value, read hex_value, expected hex_value DSH0042 Firmware data mismatch at word dec_value, read hex_value, expected hex_value DSH0050 Failed to flush previous pending mailbox command DSH0051 Mailbox command failed to finish

Firmware data written to SSRAM does not match the firmware data that was read from SSRAM. SCSI adapter failed to flush the previous pending mailbox command. SCSI adapter found a timeout when executing a mailbox command. DSH1000 SCSI adapter in slot dec_value, port dec_value Adapter is marked dead. is dead DSH1001 SCSI adapter in slot dec_value, port dec_value Adapter is busy executing the OSM event and cannot be is currently in OSM event mode disturbed.

DSH1002 Failed to initialize SCSI adapter in slot dec_value, port dec_value DSH1003 Timeout when initializing SCSI adapter in slot dec_value, port dec_value DSH1004 Failed to reset SCSI adapter in slot dec_value, port dec_value DSH1005 Timeout when resetting SCSI adapter in slot dec_value, port dec_value DSH1006 Failed to reset SCSI adapter bus in slot dec_value, port dec_value DSH1007 Timeout when resetting SCSI adapter bus in slot dec_value, port dec_value DSH1008 Failed to reset target in slot dec_value, port dec_value DSH1009 Timeout when resetting target in slot dec_value, port dec_value DSH1010 Failed to rescan SCSI adapter in slot dec_value, port dec_value DSH1011 Timeout when rescanning SCSI adapter in slot dec_value, port dec_value DSH1012 Timeout from SCSI during disk init in slot dec_value, port dec_value DSH1013 OSM event happened for SCSI card in slot dec_value, port dec_value and failed to handle it DSH1014 ISP VID is 0x%x but should be 0x%x DSH1015 ISP DID is 0x%x but should be 0x%x

Adapter failed to do hardware initialization. A timeout occurred during the hardware initialization. Resetting of the SCSI adapter failed. A timeout occurred while the SCSI adapter was being reset. Adapter failed to do a bus reset. A timeout occurred while the adapter bus was being reset. Adapter failed to do specific disk reset. A timeout occurred while a specific disk was being reset. Adapter failed to do a rescan. A timeout occurred during rescanning. A timeout occurred during disk initialization through this adapter. An OSM event happened during the task and the adapter failed to handle it. Wrong vendor ID. Wrong device ID.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DSH0001-DSH0038 DSH0040-DSH0051 DSH1000-DSH1007 DSH1013-DSH1015 DSH0039 DSH1008 DSH1009-DSH1012 Corrective action Replace the SCSI card or contact NetApp Technical Support.

1. Check that the external loopback plug is connected. 2. If it is connected, and the SCSI card still fails, call NetApp Technical Support. Replace the bad disk. Call NetApp Technical Support. 1. Replace the bad disk. 2. Replace the SCSI card. 3. Call NetApp Technical Support.

DTH0001 through DTH0053

Message type
This error message grouping covers hardware errors associated with baseboard management controller (BMC). The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group: Error Sample message code DTH0001 Failed to get the Version Info for current BMC Firmware DTH0004 Failed to Enter BMC Firmware Transfer Mode. Retrying! DTH0005 Failed to Write BMC Firmware. Retrying! DTH0006 Failed to Read BMC Firmware DTH0007 Failed to Verify newly programmed Firmware! Restarting! DTH0008 BMC Firmware is corrupted. Restarting programming! DTH0009 Failed to get the Current SDR Version Information DTH0011 Failed to Clear the SDR Repository! Retrying! DTH0012 Failed to Add a SDR record! Retrying! DTH0013 Failed to Verify the newly added SDR records! Restarting! DTH0014 Failed to Read a Sensor Record DTH0015 Failed to Read the Sensor Repository Information DTH0016 Failed to Reserve the Sensor Repository DTH0017 Failed to Read the System Event Log Information DTH0018 Failed to Read a System Event Log record DTH0019 Failed to Add a System Event Log record DTH0020 Failed to Reserve the System Event Log DTH0021 Failed to Set the System Event Log timer DTH0022 Failed to Get the System Event Log timer DTH0023 Failed to Verify the newly written record in the Event Log DTH0024 The BMC Timer is not running at the right speed Description Could not get the version information for the current BMC firmware. Could not enter BMC firmware transfer mode to start writing the Flash. Could not write the BMC firmware to the FLASH. Could not read BMC firmware from the FLASH. Could not verify newly programmed firmware in the FLASH. BMC firmware is corrupted. Could not get the current version information for the sensor data repository. Could not clear the sensor data repository. Could not add a sensor data repository record. Could not verify the newly added sensor data repository records. Could not read a sensor record from the sensor data repository. Could not read the sensor repository information. Could not reserve the sensor repository. Could not read the system event log information. Could Could Could Could Could Could not read a system event log record. not add a system event log record. not reserve the system event log. not set the system event log timers time. not get the system event log timers time. not verify the newly written record in the event log.

The BMC timer is not running at the right speed.

DTH0025 Failed to get the RTC Time. This is not a BMC Error. DTH0026 Failed to Set the BMC Watchdog Timer DTH0027 Failed to Start the BMC Watchdog Timer DTH0028 Failed to Enable the BMC's NMI generation capability DTH0029 BMC should have generated an NMI but did not DTH0030 Failed to Get the BMC's Device ID DTH0031 Failed to Get the reason for System Restart DTH0032 Failed to Display text successfully on the LCD DTH0033 Failed to Retrieve the BMC's Self Test Information DTH0034 Failed to Get the System GUID DTH0035 Failed to Set the System GUID DTH0036 BMC does not support a Self Test option DTH0037 Sensor Data Repository Empty DTH0039 BMC Boot Firmware Code is Corrupted. DTH0040 BMC FRU internal use area is Corrupted. DTH0041 Sensor Data Repository is Corrupted. DTH0042 System Event Log is Corrupted. DTH0043 Platform Information Area is Corrupted. DTH0044 DTH0045 DTH0046 DTH0047 DTH0048 DTH0049 DTH0050 DTH0051 DTH0052 DTH0053

The real- time clock time could not be read. Could not set the BMC watchdog timer. Could not start the BMC watchdog timer. Could not enable the BMC's NMI generation capability. BMC should have generated an NMI but did not. Could Could Could Could not get the BMC's device identification. not get the reason for system restart. not display text successfully on the LCD. not retrieve the BMC's self test information.

Could not get the system GUID. Could not set the system GUID. BMC does not support a self test option. Sensor data repository was found to be empty. The BMC Boot firmware was found to be corrupted The BMC internal FRU area was found to be corrupted The Sensor Data Repository was found to be corrupted The System Event Log was found to be Corrupted. The BMC Platform Information Area was found to be corrupted. BMC FRU device is Inaccessible. The BMC FRU device could not be accessed BMC Sensor Data Repository is Inaccessible. BMC Sensor Data Repository could not be accessed. BMC System Event Log is Inaccessible. BMC System Event Log could not be accessed IPMB Signal Error. There was a Signal Error on the BMC Private Bus BMC RAM test error. BMC RAM had errors during self test BMC fatal hardware error. The BMC had a fatal internal hardware error. Management controller error. The BMC had a Management controller error during Self Test Private I2C bus error. A BMC Private I2C bus had an error. BMC internal exception. The BMC had an internal error. BMC A/D timeout error. The BMC analog to digital converter failed to respond

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DTH0001 DTH0009 Corrective action 1. Update the BMC firmware. 2. Replace the motherboard. 1. Update the BMC sensor data repository.

2. Replace the motherboard. DTH0004-DTH0008 DTH0011-DTH0053 Replace the motherboard or contact NetApp Technical Support.

DTS0002, DTS0003 DTS0010

Message type
This error message grouping covers software errors associated with the baseboard management controller (BMC).

Error message description

The following message can be generated for this message group: Error Sample message code DTS0002 Failed to Find a new BMC Firmware image DTS0003 Failed to Find a new Valid BMC Firmware image DTS0010 Failed to get the New SDR Version Information Description Could not find a new BMC firmware image. Could not find a new BMC firmware image with valid checksums. Could not get the new sensor data repository version information from the BMC.

Corrective action
Replace the CompactFlash card.

DZH0101 through DZH3002

Message type
This error message grouping covers hardware errors associated with the motherboard or backplane of the storage system. The corrective action for this error message grouping is below the error message description.

Error message description

The following messages can be generated for this message group: Error Sample message code DZH0101 Unexpected GPR value of = hex_value, expected range = hex_value DZH0104 Conflicting CRCs; CRC1 = hex_value, CRC2 = hex_value DZH0105 First CRC has garbage: CRC1= hex_value DZH0106 Second CRC has garbage: CRC2= hex_value DZH0123 Noisy com port dec_value DZH0124 Com port dec_value hung; never saw <receive ready> DZH0125 Com port dec_valuedata received does not match data sent DZH0126 DZH0127 DZH0137 DZH0138 DZH0150 Description Invalid register read. Bad boot ROM/FLASH encountered.

Motherboard was not ready to receive data from the serial port.

DZH0154 DZH0155 DZH0160 DZH0161 DZH0162 DZH0163 DZH0164 DZH0158 Unable to read backplane SEEPROM SEEPROM, error code = dec_value DZH0159 Unable to read motherboard SEEPROM SEEPROM, error code = dec_value DZH0136 Unable to read motherboard SEEPROM, error code = DZH0165 dec_value

A data mismatch was received from the serial port. Burst data transfer hung Motherboard was not ready to receive data from the serial port. Com port dec_value burst data received does not match data A data mismatch was received from the sent serial port. Can't program backplane SEEPROM, error code = dec_value Failed to program the backplane SEEPROM. Can't program motherboard SEEPROM, error code = Failed to program the motherboard dec_value SEEPROM. Super I/O config error; config = hex_value, expected hex_value An invalid device ID was read from the Super I/O. Unable to read backplane SEEPROM, error code = dec_value Failed to read the backplane SEEPROM.

Failed to program the backplane SEEPROM. Failed to program the backplane SEEPROM. Failed to read the motherboard SEEPROM.

DZH0166 DZH0167 DZH0168 DZH0169 Can't program backplane SEEPROM SEEPROM, error code = dec_value DZH0170 Unrecognized device (ID = hex_value, hex_value) in slot dec_value DZH0171 No card detected in slot dec_value DZH0172 Card detected in (nonexistent) slot dec_value DZH0175 Unable to read backplane SEEPROM, error code = dec_value DZH0180 Unable to read Front Panel SEEPROM, error code = dec_value DZH0194 DZH0191 Unable to read IO Board SEEPROM, error code = dec_value DZH0197 DZH0195 Invalid CPU dec_value installed DZH0196 Incorrect sensor ASCII_value DZH0192 Can't program onboard FC-AL SEEPROM SEEPROM, error code = dec_value DZH0193 Can't program Front Panel SEEPROM SEEPROM, error code = dec_value DZH0198 Can't program IO Board SEEPROM SEEPROM, error code = dec_value DZH0199 Unable to read onboard FC-AL SEEPROM, error code = dec_value DZH0215 Invalid CPU dec_value microcode revision DZH0216 Invalid CPU microcode revision DZH0218 Invalid CPU dec_value MHz DZH0219 UNKNOWN model DZH0301 DZH0302 DZH0303 DZH0304 DZH0305 DZH0306 DZH0307 DZH0308 DZH0309 DZH0310 DZH0311 DZH0312 DZH0313 DZH0314 21071 - CA GCR register wrong 21071 - CA TENR register wrong 21071 - DA DCSR register wrong 21071 - DA PCI base address register wrong 21071 - DA PCI mask register wrong 21071 - DA host address extension register 0 wrong 21071 - CA error detected - hex_value Host chipset errors detected Corrected 1-bit ECC error Uncorrectable ECC error System bus parity error Attempt to access nonexistent memory PCI bus system error PCI bus data parity error

Failed to program the backplane SEEPROM. Unrecognized PCI device. No PCI device found in indicated slot. Invalid PCI card found in indicated slot. Failed to read backplane SEEPROM. Failed to read the front fanel SEEPROM. Failed to read the I/Oboard SEEPROM. Invalid CPU slot installed. An incorrect sensor type was found. Failed to program the onboard FC-AL SEEPROM. Failed to program the Front Panel SEEPROM. Failed to program the I/O Board SEEPROM. Failed to read the onboard FC-AL SEEPROM. CPU has unsupported microcode. CPU speed is unsupported. Model number is incorrect (for example, storage system or NetCache model number). Invalid register read.

Error in reading the register. Chipset error is detected. 1-bit ECC error is detected. Unknown ECC error is detected. System bus error is detected. Memory access out of bounds. PCI bus error is detected. PCI bus data parity error is detected.

DZH0315 DZH0316 DZH0317 DZH0318

PCI bus address parity error PCI master abort PCI target abort Invalid PTE on scatter-gather

DZH0319 FLASH not write enabled error DZH0320 I/O timeout occurred (R/W > 1) DZH0321 Correctable ECC error occurred while error register locked DZH0322 Uncorrectable ECC error occurred DZH0323 System bus parity error occurred DZH0324 Access to nonexistent memory occurred DZH0325 PCI bus system error occurred while error register locked DZH0326 PCI bus address parity error occurred DZH0327 PCI master abort occurred while error register locked DZH0328 PCI target abort occurred while error register locked DZH0329 Invalid PTE error on scatter/gather occurred DZH0330 FLASH not write-enabled error DZH0331 I/O timeout occurred while error register locked DZH0332 An error occurred while error register locked DZH0333 DZH0334 DZH0335 DZH0336 DZH0337 DZH0338 DZH0339 DZH0340 DZH0341 DZH0342 DZH0343 DZH0344 DZH0345 DZH0346 Tsunami error detected P0 - hex_value Tsunami error detected P1 - hex_value Unknown system; cannot check ISA bridge Unknown system; cannot check PCI bridge Conflicting CRCs (FLASH half = dec_value) First CRC has garbage (FLASH half = dec_value) Second CRC has garbage (FLASH half = dec_value) Conflicting CRCs; CRC1 = hex_value, CRC2 = hex_value First CRC has garbage CRC1 = hex_value Second CRC has garbage CRC2 = hex_value Conflicting CRCs (FLASH half = dec_value) First CRC has garbage (FLASH half = dec_value) Second CRC has garbage (FLASH half = dec_value) System info checksum error

PCI bus address parity error is detected. PCI bus master abort is detected. PCI bus target abort is detected. Invalid PTE on scatter-gather access is detected. Could not write the FLASH. One-second I/O timeout occurred. Correctable ECC error with error register locked. Uncorrectable ECC error with error register locked. System bus parity error with error register locked. Memory access out of bounds with error register locked. PCI bus system error with error register locked. PCI bus address parity error with error register locked. PCI bus master abort with error register locked. PCI bus target abort with error register locked. Invalid PTE on scatter-gather access with error register locked. Cannot write FLASH error with error register locked. One-second I/O timeout with error register locked. Errors occurred while the error register was locked. Chipset error occurred. Error in chipset register. Invalid system type. Incorrect CRC. CRC in first half is incorrect. CRC in second half is incorrect. Incorrect CRC. CRC in first half is incorrect. CRC in second half is incorrect. Incorrect CRC. CRC in first half is incorrect. CRC in second half is incorrect. Checksum is not correct.

DZH0347 System information missing DZH0348 DZH0349 DZH0350 DZH0351 DZH0352 DZH0353 DZH0354 DZH0355 DZH0356 DZH0357 DZH0358 DZH0359 DZH0360 DZH0361 DZH0362 DZH0363 DZH0364 DZH0365 DZH0366 DZH0367 DZH0368 DZH0369 DZH0370 DZH0371 DZH0372 DZH0373 DZH0374 DZH0375 DZH0376 DZH0377 DZH0378 DZH0379 DZH0415 DZH0416 DZH0419 Cache size ( hex_value) mismatch with model ( ASCII_value) Conflicting CRCs (FLASH half = dec_value) First CRC has garbage (FLASH half = dec_value) Second CRC has garbage (FLASH half = dec_value) Conflicting CRCs; CRC1 = hex_value, CRC2 = hex_value CRC has garbage; CRC = hex_value R/W test, address = hex_value expected = hex_value Readback, address = hex_value expected = hex_value Conflicting CRCs; CRC1 = hex_value, CRC3 = hex_value Conflicting CRCs; CRC1 = hex_value, CRC2 = hex_value CRC has garbage; CRC = hex_value R/W test; address = hex_value expected = hex_value Readback; address = hex_value expected = hex_value Conflicting CRCs; CRC1 = hex_value, CRC3 = hex_value Battery dead; RTC not functional Update-busy signal never cleared Seconds not counting properly Day-of-week not in proper range Tiny NVRAM; address = hex_value expected = hex_value Tiny NVRAM; address = hex_value expected = hex_value Super I/O config reg 0 error Super I/O config reg 1 error Super I/O config reg 2 error Invalid super I/O chip ID; Read = hex_value, expected = hex_value Super I/O device ID error Super I/O revision error Super I/O power control error Noisy com port dec_value Com Port dec_value hung Com Port dec_value data received does not match Burst data transfer hung Com Port dec_value burst data received does not match Expected overtemp signal missing (sensor) Can't write FLASH

System information is not programmed correctly. Incorrect cache size found. Incorrect CRC. CRC in first half is incorrect. CRC in second half is incorrect. Incorrect CRC. Onboard NVRAM has an incorrect value. Incorrect value read back from NVRAM. Incorrect CRC.

Onboard NVRAM has an incorrect value. Incorrect value read back from onboard NVRAM. Incorrect CRC. RTC battery is not working. Signal refresh did not take place. RTC seconds value is incorrect. RTC day of week is incorrect. Onboard NVRAM test failed on data mismatch. NVRAM failed the data compare check. Incorrect register configuration.

Incorrect device ID. Incorrect revision. Incorrect power control settings. Comm port signal error detected. Comm port stuck. Comm port failed on data mismatch. Comm port failed on data transfer. Comm port failed on data comparison. No over-temperature signal detected. Cannot program the FLASH.

DZH0428 Unrecognized device (ID = hex_value, hex_value) in slot dec_value DZH0431 No card detected in slot dec_value DZH0432 Card detected in (nonexistent) slot dec_value DZH0435 DZH0436 DZH0437 DZH0438 DZH0446 DZH0447 DZH0448 DZH0449 DZH0450 DZH0451 Expected overtemp interrupt A did not occur Expected overtemp interrupt B did not occur Expected overtemp interrupt C did not occur Bad CRC in PS_dec_value; got hex_value, expected hex_value Backplane over temperature Read i2c failed Write EEPROM failed Read EEPROM failed Failed to read PS status remove Jumper J1 (backplane)

Incorrect device is detected. No card is in the selected slot. A card is found in a slot that does not exist. Expected interrupt signal did not occur.

Incorrect CRC on power supply EEPROM. Backplane temperature is beyond range. i2c cannot be read. Cannot write to the EEPROM. Cannot read from the EEPROM. Need to remove the jumper to read the power supply status. Incorrect CRC. Onboard NVRAM read/write test failed. Onboard NVRAM test failed on data comparison. Incorrect CRC. Cache data error. Unexpected data read. CPU failed MP cache test. Expected voltage interrupt did not occur.

DZH0452 Conflicting CRCs; CRC1 = hex_value, CRC2 = hex_value DZH0453 CRC has garbage; CRC = %08x DZH0454 R/W test; address = hex_value expected = hex_value, actual = hex_value\n DZH0455 Readback; address = hex_value expected = hex_value, actual = hex_value DZH0456 Conflicting CRCs; CRC1 = hex_value, CRC3 = hex_value DZH0507 MP table checksum bad DZH0508 DZH0601 Data error in cache tag test DZH0602 MP cache test CPU dec_value is too slow DZH0801 Expected ASCII_value (i.e., voltage) overvoltage interrupt did not occur DZH0802 Expected ASCII_value (i.e., voltage) undervoltage interrupt did not occur DZH2000 Unable to write Xstorage system PEF Table entry DZH2001 DZH2002 DZH3000

DZH3001 DZH3002

Unable to add the Platform Event Filter entry into the table, which controls the watchdog functionality. Watchdog did not bite The expected watchdog interrupt did not occur. Incorrect CIOB installed. The motherboard requires revision The wrong revision of CIOB was found on %d, but revision %d was found. the motherboard. PCI Express Correctable Error from HT2000 ( %d ): EXB( %d, The chipset detected an error on a PCI %d, %d ): RootErr(hex_value(s)); Br[ %d ](%d, %d, %d ): Express bus, but the hardware has already DevStatus( hex_value(s)); Br[ %d ](%d, %d, %d ): corrected it. DevStatus( hex_value(s)). Unexpected watchdog The watchdog hardware is faulty. Unexpected NMI: <Message string will identify either the If the front panel is identified, then the

Front Panel or the RLM.>

error could be due to a faulty front panel or a faulty front panel-to-motherboard connection. If the RLM is identified, then the error could be due to a faulty RLM or a faulty front panel-to-RLM connection.

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error message group: Error message group DZH0101-DZH0106 DZH0123-DZH0127 DZH0136-DZH0138 DZH0150 DZH0154-DZH0168 DZH0175-DZH0194 DZH0196 DZH0197-DZH0198 DZH0301-DZH0308 DZH0319 DZH0330 DZH0354-DZH0355 DZH0359 DZH0366-DZH0379 DZH0416, DZH0419 DZH0454-DZH0455 DZH0415 DZH0435-DZH0437 DZH0446 DZH0195 DZH0309-DZH0312 DZH0318 DZH0320-DZH0324 DZH0329 DZH0330-DZH0353 DZH0356-DZH0358 DZH0360-DZH0365 DZH0447-DZH0450 DZH0452-DZH0453 DZH0456 DZH0170-DZH0172 DZH0313-DZH0317 DZH0325-DZH0328 DZH0394-DZH0398 DZH0438 Corrective action Motherboard error, call NetApp Technical Support.

1. 2. 3. 4.

Check that the fans are running. Replace the defective fans. Check that the air vents are clear of dirt or debris. Clean the vents if clogged. Replace the motherboard if the fans are working and the vents are clear. Call NetApp Technical Support if the error is not corrected.

Call NetApp Technical Support.

1. 2. 3. 4.

Check that the correct PCI device is in the correct slot. Replace the PCI device. Replace the motherboard if the PCI device is not working. Call NetApp Technical Support if the error is not corrected.

1. Check that the power supplies are connected and running. Replace the defective power supply.

2. Replace the motherboard if power supplies are good. 3. Call NetApp Technical Support for instructions if the error is not corrected. DZH0442-DZH0445 1. Check the battery connections. 2. Replace the battery if connections are good. 3. Call NetApp Technical Support for instructions if the error is not corrected. 1. Replace the CPU. 2. If the CPU is good, replace the motherboard. 3. Call NetApp Technical Support if the error is not corrected. 1. Replace the motherboard. 2. Call NetApp Technical Support if the error is not corrected. 1. Check the device at the indicated slot and replace it with the correct device. 2. If the device is correct, replace the motherboard. 3. Call NetApp Technical Support if the error is not corrected. 1. Check the jumper location and move it to the correct location. 2. If this does not solve the error, call NetApp Technical Support. 1. Check power supplies and replace defective units. 2. Call NetApp Technical Support if the error is not corrected. 1. Ignore this message if it only appears once, because the hardware has already corrected it. 2. Call NetApp Technical Support if the message is persistent. 1. Ignore this message if it only appears once, because the hardware has already corrected it. 2. If the message is persists, replace the motherboard. 1. Ignore this message if it only appears once, because the hardware has already corrected it. 2. If the message is persists, replace the identified HW component. 3. If the message is still persists, replace the motherboard.

DZH0215-DZH0216

DZH0218-DZH0219 DZH0507-DZH0508 DZH0601-DZH0602 DZH2000-DZH2002 DZH0428 DZH0431-DZH0432 DZH0451 DZH0801-DZH0802 DZH3000

DZH3001

DZH3002

DZS0431 through DZS0435

Message type
This error message grouping covers software errors associated with the motherboard and backplane.

Error message description

The following message can be generated for this message group: Error Sample message code DZS0431 AMD cpu to cpu link speed does not match the expected value DZS0432 AMD cpu to HT2000 link speed does not match the expected value DZS0433 HT2000 toAMD cpu link speed does not match the expected value DZS0434 HT2000 to HT1000 link speed does not match the expected value DZS0435 HT1000 to HT2000 link speed does not match the expected value DZS0435 i2c read error: dec_value Description There is a mismatch in the current CPU link frequency and width and those of the factory settings. There is a mismatch in the current CPU to HT2000 link frequency and width and those of the factory settings. There is a mismatch in the current HT2000 to CPU link frequency and width and those of the factory settings. There is a mismatch in the current HT2000 to HT1000 link frequency and width and those of the factory settings. There is a mismatch in the current HT1000 to HT2000 link frequency and width and those of the factory settings. i2c cannot be read.

Corrective action
Call NetApp Technical Support.

Environmental Error Messages

About this section
This section lists and defines the environmental error messages generated by running the environmental status test in the miscellaneous motherboard test menu. It also lists the Corrective action for each error message grouping that you can take to address errors you encounter.

Topics in this section

The error messages are listed according to the platform in which the motherboard and any related daughterboard resides are described in the following sections according to the type of sensor which is reporting the error condition: FAS250 environmental error codes FAS270/GF270 environmental error codes FAS20xx/SA200 environmental error codes FAS3020/V3020 environmental error codes FAS3040/FAS3070/V3040/V3070 environmental error codes FAS31xx/V31xx environmental error codes FAS60xx/V60xx/SA600 environmental error codes

FAS250 environmental error codes

Message type
The FAS250 environmental error messages are tabulated according to the sensors that generate them: Temperature sensors Voltage power sensors Chassis and CPU fan sensors Power supply sensors

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS250 environmental error codes

Temperature sensors
Temperature sensor error message description
Error messages can be generated by the following temperature sensors. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01030x ENV01031x Sensor description Motherboard temperature (motherboard temp). Front panel temperature (Front panel temp).

The following table lists the error messages that can be generated by the temperature sensors on the motherboard. The corrective action for this error message grouping is below the error message description. Note: "[d]" in the sample error message represents one of the four temperature sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read [d]. [d] exceeds the critical high threshold. [d] exceeds the warning high threshold. [d] falls below the warning low threshold. [d] falls below the critical low threshold. Missing interrupt when [d] exceeds the warning high threshold. Missing interrupt when [d] falls below the warning low threshold.

Corrective action
1. Check to see whether the PSU fans are working properly (from the Diagnostics menu, as well as by physically looking at them). 2. If the fans are bad, replace the PSUs. 3. If the fans are good, replace the motherboard.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS250 environmental error codes

Voltage power sensors

Voltage power sensor error message description
Error messages can be generated by the voltage power sensors on the motherboard, the memory board, and the power supplies. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01032x ENV01033x ENV01034x ENV01035x ENV01036x ENV01037x Sensor description 3.3 Volt 5.0 Volt 12 Volt 2.5 Volt 1.2 Volt Battery voltage (VBatt)

The following table lists the error messages that can be generated by the voltage power sensors. The corrective action for these error messages is below the error message description. Note: "[d]" in the sample error message represents one of the seven voltage power sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read the [d] power sensor. [d] power sensor exceeds the critical high threshold. [d] power sensor exceeds the warning high threshold. [d] power sensor falls below the warning low threshold. [d] power sensor falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold.

Corrective action
Replace the power supply. If the problem remains, replace the motherboard.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS250 environmental error codes

Fan sensors
Fan sensor error message description
Error messages can be generated by the fan sensors for existence and status. The corrective action for all fan sensor error messages is below all the error message descriptions.

Fan sensors
Status error messages can be generated by the following power supply fans within each power supply module. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01038x ENV01039x ENV01040x ENV01041x Sensor description PSU 1 Fan 1 (Power supply unit 1 fan 1). PSU 1 Fan 2 (Power supply unit 1 fan 2). PSU 2 Fan 1 (Power supply unit 2 fan 1). PSU 2 Fan 2 (Power supply unit 2 fan 2).

The following table lists the error messages that can be generated by the baseboard and power supply fan sensors. Note: "[d]" in the sample error message representsone of the six baseboard fan sensors or one of the four power supply fan sensors: If "x" is... 1 2 3 4 5 6 7 8 9 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur [d] cant be speeded up [d] cant be slowed down Description Cannot read [d] sensor. [d] speed read exceeds the critical high threshold. [d] speed read exceeds the warning high threshold. [d] speed read exceeds the warning low threshold. [d] speed read exceeds the critical low threshold. Missing interrupt when the [d] speed exceeds the warning high threshold. Missing interrupt when the [d] speed exceeds the warning low threshold. [d] cannot be speeded up by the system. [d] cannot be slowed down by the system.

Corrective action
Replace the power supply unit.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS250 environmental error codes

Power supply sensors

Power supply sensor error message description
Error messages can be generated by the power supply sensors for existence and status. The corrective action for all power supply sensor error messages is below all the error message descriptions.

Power supply sensors for existence

Error messages can be generated by the power supply sensors for existence. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01042x ENV01043x Sensor description for existence PSU1 PSU2

The following table lists the error messages that can be generated for the power supply existence sensors. Note: "[d]" in the sample error message represents one of the two sensors indicating the existence of the power supplies: If "x" is... 2 3 4 Sample error message [d] is not installed [d] is installed, but powered off [d] is installed and powered on, but not functioning Description [d] is missing. [d] is off. [d] is not functioning.

Corrective action
1. Install the power supply. 2. Turn the power supply on. 3. Replace the power supply.

FAS270/GF270 environmental error codes

Message type
The FAS270/GF270 environmental error messages are tabulated according to the sensors that generate them: Temperature sensors Voltage power sensors Chassis and CPU fan sensors Power supply sensors

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS270/GF270 environmental error codes

Temperature sensors
Temperature sensor error message description
Error messages can be generated by the following temperature sensors. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01060x ENV01061x Sensor description Motherboard temperature (motherboard temp). Front panel temperature (Front panel temp).

The following table lists the error messages that can be generated by the temperature sensors on the motherboard. The corrective action for this error message grouping is below the error message description. Note: "[d]" in the sample error message represents one of the four temperature sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read [d]. [d] exceeds the critical high threshold. [d] exceeds the warning high threshold. [d] falls below the warning low threshold. [d] falls below the critical low threshold. Missing interrupt when [d] exceeds the warning high threshold. Missing interrupt when [d] falls below the warning low threshold.

Corrective action
1. Check to see whether the PSU fans are working properly (from the Diagnostics menu, as well as by physically looking at them). 2. If the fans are bad, replace the PSUs. 3. If the fans are good, replace the motherboard.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS270/GF270 environmental error codes

Voltage power sensors

Voltage power sensor error message description
Error messages can be generated by the voltage power sensors on the motherboard, the memory board, and the power supplies. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01062x ENV01063x ENV01064x ENV01065x ENV01066x ENV01067x Sensor description 3.3 Volt 5.0 Volt 12 Volt 2.5 Volt 1.2 Volt Battery voltage (VBatt)

The following table lists the error messages that can be generated by the voltage power sensors. The corrective action for these error messages is below the error message description. Note: "[d]" in the sample error message represents one of the seven voltage power sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read the [d] power sensor. [d] power sensor exceeds the critical high threshold. [d] power sensor exceeds the warning high threshold. [d] power sensor falls below the warning low threshold. [d] power sensor falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold.

Corrective action
Replace the power supply. If the problem remains, replace the motherboard.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS270/GF270 environmental error codes

Fan sensors
Fan sensor error message description
Error messages can be generated by the fan sensors for existence and status. The corrective action for all fan sensor error messages is below all the error message descriptions.

Fan sensors
Status error messages can be generated by the following power supply fans within each power supply module. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01068x ENV01069x ENV01070x ENV01071x Sensor description PSU 1 Fan 1 (Power supply unit 1 fan 1). PSU 1 Fan 2 (Power supply unit 1 fan 2). PSU 2 Fan 1 (Power supply unit 2 fan 1). PSU 2 Fan 2 (Power supply unit 2 fan 2).

The following table lists the error messages that can be generated by the baseboard and power supply fan sensors. Note: "[d]" in the sample error message representsone of the six baseboard fan sensors or one of the four power supply fan sensors: If "x" is... 1 2 3 4 5 6 7 8 9 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur [d] cant be speeded up [d] cant be slowed down Description Cannot read [d] sensor. [d] speed read exceeds the critical high threshold. [d] speed read exceeds the warning high threshold. [d] speed read exceeds the warning low threshold. [d] speed read exceeds the critical low threshold. Missing interrupt when the [d] speed exceeds the warning high threshold. Missing interrupt when the [d] speed exceeds the warning low threshold. [d] cannot be speeded up by the system. [d] cannot be slowed down by the system.

Corrective action
Replace the power supply unit.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS270/GF270 environmental error codes

Power supply sensors

Power supply sensor error message description
Error messages can be generated by the power supply sensors for existence and status. The corrective action for all power supply sensor error messages is below all the error message descriptions.

Power supply sensors for existence

Error messages can be generated by the power supply sensors for existence. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01072x ENV01073x Sensor description for existence PSU1 PSU2

The following table lists the error messages that can be generated for the power supply existence sensors. Note: "[d]" in the sample error message represents one of the two sensors indicating the existence of the power supplies: If "x" is... 2 3 4 Sample error message [d] is not installed [d] is installed, but powered off [d] is installed and powered on, but not functioning Description [d] is missing. [d] is off. [d] is not functioning.

Corrective action
1. Install the power supply. 2. Turn the power supply on. 3. Replace the power supply.

FAS20xx/SA200 environmental error codes

Message type
The FAS20xx/SA200 environmental error messages are tabulated according to the sensors that generate them: Temperature sensors Voltage sensors Current sensors Other battery sensors Fans Power status sensors

[Up] [Temperature] [Voltage] [Current] [Battery] [ Fans] [Power status]

FAS20xx/SA200 environmental error codes

Temperature sensors
Temperature sensor error message description
Error messages can be generated by the temperature sensors. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01538x ENV01539x ENV01540x ENV01547x ENV01552x ENV01553x ENV01554x ENV01555x Sensor description Board temperature top Board temperature bottom CPU temperature Battery temperature Board top temperature Board bottom temperature PSU starboard temperature PSU port temperature

The following table lists the error messages that can be generated by the temperature sensors. The corrective action for these error messages is below the error message description. Note: "[d]" in the sample error message represents one of the temperature sensors: If "x" is... 1 2 3 4 5 6 7 8 Sample error message [d] does not read [d] is in critical high state [d]is in a high warning state [d] is in a low warning state [d] is in a critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur [d] failed to return to normal Description Cannot read [d] sensor. [d] falls exceeds the critical high threshold. [d] falls exceeds the high threshold warning. [d] falls below the low threshold warning. [d] falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold. Sensor [d] cannot be set to the normal state

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error code range: Error code range ENV01538x-ENV01540x ENV01547x Corrective action Replace the motherboard. 1. Replace the motherboard battery. 2. If the problem remains, replace the motherboard.

ENV01552x ENV01553x ENV01554x ENV01555x

Replace the top PCM motherboard in chassis. Replace the bottom PCM motherboard in chassis. Replace PSU 2. Replace PSU 1.

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FAS20xx/SA200 environmental error codes

Voltage sensors
Voltage power sensors error message description
Error messages can be generated by the voltage power sensors on the platform. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01530x ENV01531x ENV01532x ENV01533x ENV01534x ENV01535x ENV01536x ENV01537x ENV01546x ENV01549x ENV01550x ENV01551x ENV01558x ENV01559x ENV01560x ENV01561x ENV01562x ENV01563x Sensor description Board 1.1V sensor Board 1.2V sensor Board 1.5V sensor Board 1.8V sensor Board 2.5V sensor Board 3.3V sensor CPU 1.2V sensor 12V sensor Charger voltage Battery 8.0 voltage NVMEM 1.8V sensor NVMEM 8.0 V sensor PSU starboard 12V sensor PSU starboard 5V sensor PSU starboard 3.3V sensor PSU port 12V sensor PSU port 5V sensor PSU port 3.3V sensor

The following table lists the error messages that can be generated by the voltage power sensors. The corrective action for these error messages is below the error message description. Note: "[d]" in the sample error message represents one of the voltage sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d]is in a high warning state [d] is in a low warning state [d] is in a critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not Description Cannot read [d] sensor. [d] falls exceeds the critical high threshold. [d] falls exceeds the high threshold warning. [d] falls below the low threshold warning. [d] falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low

occur [d] failed to return to normal

threshold. Sensor [d] cannot be set to the normal state

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error code range: Error code range Corrective action ENV01530x-ENV01537x, ENV1550x Replace the motherboard. ENV01546x, ENV01549x, ENV1551x 1. Replace the motherboard battery. 2. If the problem remains, replace the motherboard. ENV01558x-ENV01560x ENV01561x-ENV01563x Replace PSU 2. Replace PSU 1.

[Up] [Temperature] [Voltage] [Current] [Battery] [Fans] [Power status]

FAS20xx/SA200 environmental error codes

Current sensors
Current sensors error message description
Error messages can be generated by the current sensors on the power supplies. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01542x ENV01544x ENV01564x ENV01565x ENV01566x ENV01567x Sensor description Battery Amp Charger Amp PSU starboard current 12 PSU starboard current 5 PSU port current 12 PSU port current 5

The following table lists the error messages that can be generated by the current sensors. The corrective action for these error messages is below the error message description. Note: "[d]" in the sample error message represents one of the current sensors: If "x" is... 1 2 3 4 5 6 7 8 Sample error message [d] does not read [d] is in critical high state [d]is in a high warning state [d] is in a low warning state [d] is in a critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur [d] failed to return to normal Description Cannot read [d] sensor. [d] falls exceeds the critical high threshold. [d] falls exceeds the high threshold warning. [d] falls below the low threshold warning. [d] falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold. Sensor [d] cannot be set to the normal state

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error code range: Error code range ENV01542x, ENV01544x ENV01564x-ENV01565x ENV01565x-ENV01567x Corrective action 1. Replace the motherboard battery. 2. If the problem remains, replace the motherboard. Replace PSU 2. Replace PSU 1.

[Up] [Temperature] [Voltage] [Current] [Battery] [Fans] [Power status]

FAS20xx/SA200 environmental error codes

Battery sensor
Battery sensor error message description
Error messages can be generated by the following battery sensors. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01543x ENV01545x ENV01548x Sensor description Battery capacity Charger cycles Battery run time

The following table lists the error messages that can be generated by the real time clock sensor on the motherboard. The corrective action for this error message grouping is below the error message description. Note: "[d]" in the sample error message represents the status of the battery sensor: If "x" is... 1 2 3 4 5 6 7 8 Sample error message [d] does not read [d] is in critical high state [d]is in a high warning state [d] is in a low warning state [d] is in a critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur [d] failed to return to normal Description Cannot read [d] sensor. [d] falls exceeds the critical high threshold. [d] falls exceeds the high threshold warning. [d] falls below the low threshold warning. [d] falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold. Sensor [d] cannot be set to the normal state

Corrective action
1. Replace the motherboard battery. 2. If the problem remains, replace the motherboard.

[Up] [Temperature] [Voltage] [Current] [Battery] [Fans] [Powerstatus]

FAS20xx/SA200 environmental error codes

Fan sensors
Fan sensors error message description
Error messages can be generated by the following fan sensors. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01556x ENV01557x Sensor description PSU starboard fan PSU port fan

The following table lists the error messages that can be generated by the fan sensors. The corrective action for this error message grouping is below the error message description. Note: "[d]" in the sample error message represents one of the two fan sensors: If "x" is... 1 2 3 4 5 6 7 8 Sample error message [d] does not read [d] is in critical high state [d]is in a high warning state [d] is in a low warning state [d] is in a critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur [d] failed to return to normal Description Cannot read [d] sensor. [d] falls exceeds the critical high threshold. [d] falls exceeds the high threshold warning. [d] falls below the low threshold warning. [d] falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold. Sensor [d] cannot be set to the normal state

Corrective action
The following table lists the error message groupings and corrective action that can be taken for the error code range: Error code range ENV01556x ENV01557x Corrective action Replace PSU 2. Replace PSU 1.

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FAS20xx/SA200 environmental error codes

Power status sensors

Power status sensor error message description
Error messages can be generated by the status sensors for power. The corrective action for this error message is below all the error message descriptions. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01541x Sensor description Power status.

The following table lists the error messages that can be generated for the power supply existence sensors. Note: "[d]" in the sample error message represents one of the two sensors indicating the existence of the power supplies: If "x" is... 1 2 4 5 Sample error message [d] does not read [d] is in bad state [d] expected interrupt-to-bad did not occur [d] expected interrupt-to-normal did not occur Description [d] is not responding. [d] is not functioning. The interrupt indicating that [d] sensor is malfunctioning. The interrupt indicating that [d] sensor is back to normal.

Corrective action
Replace the motherboard.

FAS3020/V3020 environmental error codes

Message type
The FAS3020/V3020 environmental error messages are tabulated according to the sensors that generate them: Temperature sensors Voltage power sensors Chassis and CPU fan sensors Power supply sensors

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FAS3020/V3020 environmental error codes

Temperature sensors
Temperature sensor error message description
Error messages can be generated by the following temperature sensors. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01240x ENV01241x ENV01247x ENV01248x ENV01251x ENV01252x ENV01253x Sensor description CPU 1 temperature (computer processing unit 1 temp). CPU 2 temperature (computer processing unit 2 temp). PSU 1 temperature (power supply 1 temp). PSU 2 temperature (power supply 2 temp). Backplane MB temperature (backplane motherboard temp). Backplane HDD temperature (backplane hard disk drive temp). Front panel temperature (Front panel temp).

The following table lists the error messages that can be generated by the temperature sensors on the motherboard. The corrective action for this error message grouping is below the error message description. Note: "[d]" in the sample error message represents one of the four temperature sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read [d]. [d] exceeds the critical high threshold. [d] exceeds the warning high threshold. [d] falls below the warning low threshold. [d] falls below the critical low threshold. Missing interrupt when [d] exceeds the warning high threshold. Missing interrupt when [d] falls below the warning low threshold.

Corrective action
1. Check to see whether the PSU fans are working properly (from the Diagnostics menu, as well as by physically looking at them). 2. If the fans are bad, replace the PSUs. 3. If the fans are good, replace the motherboard.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS3020/V3020 environmental error codes

Voltage power sensors

Voltage power sensor error message description
Error messages can be generated by the voltage power sensors on the motherboard, the memory board, and the power supplies. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01242x ENV01243x ENV01244x ENV01245x ENV01246x Sensor description CPU Core Volt (computer processing unit core voltage) 12 Volt 3.3 Volt 1.8 Volt 1.2 Volt

The following table lists the error messages that can be generated by the voltage power sensors. The corrective action for these error messages is below the error message description. Note: "[d]" in the sample error message represents one of the seven voltage power sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read the [d] power sensor. [d] power sensor exceeds the critical high threshold. [d] power sensor exceeds the warning high threshold. [d] power sensor falls below the warning low threshold. [d] power sensor falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold.

Corrective action
Replace the power supply. If the problem remains, replace the motherboard.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS3020/V3020 environmental error codes

Fan sensors
Fan sensor error message description
Error messages can be generated by the fan sensors for existence and status. The corrective action for all fan sensor error messages is below all the error message descriptions.

Fan sensors
Status error messages can be generated by the following power supply fans within each power supply module. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01254x ENV01255x ENV01256x ENV01257x ENV01258x ENV01259x ENV01260x ENV01261x Sensor description Sys 1 Fan 1 (Chassis fan 1 unit 1). Sys 1 Fan 2 (Chassis fan 1 unit 2). Sys 2 Fan 1 (Chassis fan 2 unit 1). Sys 2 Fan 2 (Chassis fan 2 unit 2). PSU 1 Fan 1 (Power supply unit 1 fan 1). PSU 1 Fan 2 (Power supply unit 1 fan 2). PSU 2 Fan 1 (Power supply unit 2 fan 1). PSU 2 Fan 2 (Power supply unit 2 fan 2).

The following table lists the error messages that can be generated by the baseboard and power supply fan sensors. Note: "[d]" in the sample error message representsone of the six baseboard fan sensors or one of the four power supply fan sensors: If "x" is... 1 2 3 4 5 6 7 8 9 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur [d] cant be speeded up [d] cant be slowed down Description Cannot read [d] sensor. [d] speed read exceeds the critical high threshold. [d] speed read exceeds the warning high threshold. [d] speed read exceeds the warning low threshold. [d] speed read exceeds the critical low threshold. Missing interrupt when the [d] speed exceeds the warning high threshold. Missing interrupt when the [d] speed exceeds the warning low threshold. [d] cannot be speeded up by the system. [d] cannot be slowed down by the system.

Corrective action

Replace the power supply unit.

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FAS3020/V3020 environmental error codes

Power supply sensors

Power supply sensor error message description
Error messages can be generated by the power supply sensors for existence and status. The corrective action for all power supply sensor error messages is below all the error message descriptions.

Power supply sensors for existence

Error messages can be generated by the power supply sensors for existence. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01249x ENV01250x Sensor description for existence PSU1 PSU2

The following table lists the error messages that can be generated for the power supply existence sensors. Note: "[d]" in the sample error message represents one of the two sensors indicating the existence of the power supplies: If "x" is... 2 3 4 Sample error message [d] is not installed [d] is installed, but powered off [d] is installed and powered on, but not functioning Description [d] is missing. [d] is off. [d] is not functioning.

Corrective action
1. Install the power supply. 2. Turn the power supply on. 3. Replace the power supply.

FAS3040/FAS3070/V3040/V3070 environmental error codes

Message type
The FAS3040/FAS3070/V3040/V3070 environmental error messages are tabulated according to the sensors that generate them: Temperature sensors Voltage power sensors Chassis and CPU fan sensors Power supply sensors

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FAS3040/FAS3070/V3040/V3070 environmental error codes

Temperature sensors
Temperature sensor error message description
Error messages can be generated by the following temperature sensors. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01612x ENV01613x ENV01614x ENV01615x ENV01616x ENV01281x ENV01282x Sensor description CPU 1 temperature (computer processing unit 1 temp). CPU 2 temperature (computer processing unit 2 temp). PSU 1 temperature (power supply 1 temp). PSU 2 temperature (power supply 2 temp). LCD board temperature (platform's LCD board temp). MB front zone temperature (motherboard temp in the front). MB rear zone temperature (motherboard temp in the rear).

The following table lists the error messages that can be generated by the temperature sensors on the motherboard. The corrective action for this error message grouping is below the error message description. Note: "[d]" in the sample error message represents one of the four temperature sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read [d]. [d] exceeds the critical high threshold. [d] exceeds the warning high threshold. [d] falls below the warning low threshold. [d] falls below the critical low threshold. Missing interrupt when [d] exceeds the warning high threshold. Missing interrupt when [d] falls below the warning low threshold.

Corrective action
1. Check to see whether the PSU fans are working properly (from the Diagnostics menu, as well as by physically looking at them). 2. If the fans are bad, replace the PSUs. 3. If the fans are good, replace the motherboard.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS3040/FAS3070/V3040/V3070 environmental error codes

Voltage power sensors

Voltage power sensor error message description
Error messages can be generated by the voltage power sensors on the motherboard, the memory board, and the power supplies. Note: The "x" in the code represents the actual error condition. Platform and sensor code ENV01608x ENV01609x ENV01610x ENV01611x ENV01619x ENV01620x ENV01621x ENV01622x ENV01623x ENV01624x Sensor description CPU3.3 Volt active CPU3.3 Volt standby CPU5 Volt CPU12 Volt PSU1 AC IN PSU1 12 Volt PSU1 5 Volt PSU2 AC IN PSU2 12 Volt PSU2 5 Volt

The following table lists the error messages that can be generated by the voltage power sensors. The corrective action for these error messages is below the error message description. Note: "[d]" in the sample error message represents one of the seven voltage power sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read the [d] power sensor. [d] power sensor exceeds the critical high threshold. [d] power sensor exceeds the warning high threshold. [d] power sensor falls below the warning low threshold. [d] power sensor falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold.

Corrective action
Replace the power supply. If the problem remains, replace the motherboard.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS3040/FAS3070/V3040/V3070 environmental error codes

Fan sensors
Fan sensor error message description
Error messages can be generated by the fan sensors for existence and status. The corrective action for all fan sensor error messages is below all the error message descriptions.

Fan sensors
Status error messages can be generated by the following power supply fans within each power supply module. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01600x ENV01601x ENV01602x ENV01603x ENV01604x ENV01605x ENV01606x ENV01607x ENV01627x ENV01628x ENV01640x ENV01641x Sensor description Sys 1 Fan 1 (Chassis fan 1 unit 1). Sys 1 Fan 2 (Chassis fan 1 unit 2). Sys 2 Fan 1 (Chassis fan 2 unit 1). Sys 2 Fan 2 (Chassis fan 2 unit 2). PSU 1 Fan 1 (Power supply unit 1 fan 1). PSU 1 Fan 2 (Power supply unit 1 fan 2). PSU 2 Fan 1 (Power supply unit 2 fan 1). PSU 2 Fan 2 (Power supply unit 2 fan 2). System Fan FRU 1. System Fan FRU 2. SYS_FAN_1 present. SYS_FAN_2 present.

The following table lists the error messages that can be generated by the baseboard and power supply fan sensors. Note: "[d]" in the sample error message representsone of the six baseboard fan sensors or one of the four power supply fan sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read [d] sensor. [d] speed read exceeds the critical high threshold. [d] speed read exceeds the warning high threshold. [d] speed read exceeds the warning low threshold. [d] speed read exceeds the critical low threshold. Missing interrupt when the [d] speed exceeds the warning high threshold. Missing interrupt when the [d] speed exceeds the warning low threshold.

8 9

[d] cant be speeded up [d] cant be slowed down

[d] cannot be speeded up by the system. [d] cannot be slowed down by the system.

Corrective action
Replace the power supply unit.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS3040/FAS3070/V3040/V3070 environmental error codes

Power supply sensors

Power supply sensor error message description
Error messages can be generated by the power supply sensors for existence and status. The corrective action for all power supply sensor error messages is below all the error message descriptions.

Power supply sensors for existence

Error messages can be generated by the power supply sensors for existence. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01625x ENV01626x ENV01638x ENV01639x Sensor description for existence PSU1 PSU2 PSU2 present. PSU1 present.

The following table lists the error messages that can be generated for the power supply existence sensors. Note: "[d]" in the sample error message represents one of the two sensors indicating the existence of the power supplies: If "x" is... 2 3 4 Sample error message [d] is not installed [d] is installed, but powered off [d] is installed and powered on, but not functioning Description [d] is missing. [d] is off. [d] is not functioning.

Corrective action
1. Install the power supply. 2. Turn the power supply on. 3. Replace the power supply.

FAS31xx/V31xx environmental error codes

Message type
The FAS31xx/V31xx environmental error messages are tabulated according to the sensors that generate them: Temperature sensors Voltage power sensors Chassis and CPU fan sensors Power supply sensors

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS31xx/V31xx environmental error codes

Temperature sensors
Temperature sensor error message description
Error messages can be generated by the following temperature sensors. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01856x ENV01857x ENV01858x ENV01859x ENV01860x ENV01861x ENV01862x Sensor description CPU 1 temperature (computer processing unit 1 temp). CPU 2 temperature (computer processing unit 2 temp). Front CPU temperature. MB front temperature (motherboard temp in the front). Rear CPU temperature. MB central temperature (motherboard temp in the center). MB Rear PCI temperature (motherboard temp in the rear).

The following table lists the error messages that can be generated by the temperature sensors on the motherboard. The corrective action for this error message grouping is below the error message description. Note: "[d]" in the sample error message represents one of the four temperature sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read [d]. [d] exceeds the critical high threshold. [d] exceeds the warning high threshold. [d] falls below the warning low threshold. [d] falls below the critical low threshold. Missing interrupt when [d] exceeds the warning high threshold. Missing interrupt when [d] falls below the warning low threshold.

Corrective action
1. Check to see whether the PSU fans are working properly (from the Diagnostics menu, as well as by physically looking at them). 2. If the fans are bad, replace the PSUs. 3. If the fans are good, replace the motherboard.

[Up] [Temperature] [Voltagepower] [Fans] [Powersupply]

FAS31xx/V31xx environmental error codes

Voltage power sensors

Voltage power sensor error message description
Error messages can be generated by the voltage power sensors on the motherboard, the memory board, and the power supplies. Note: The "x" in the code represents the actual error condition. Platform and sensor code ENV01870x ENV01871x ENV01872x ENV01873x ENV01874x ENV01875x ENV01876x ENV01877x ENV01878x ENV01879x ENV01880x ENV01881x ENV01882x Sensor description HT1000 POWER OK PCI Express 1.2Volt Northbridge 1 PCI Express 1.2Volt Northbridge 2 Power Supply CPU1 & CPU2 1.2V core voltage CPU1 2.5V DDR Memory Voltage CPU2 2.5V DDR Memory Voltage CPLD voltage OK CPU1 VRM Core Voltage CPU2 VRM Core Voltage CPU1 & CPU2 1.2V Hyper Transport Voltage 5V and 3.3V NMI Button 12V hot plug chip

The following table lists the error messages that can be generated by the voltage power sensors. The corrective action for these error messages is below the error message description. Note: "[d]" in the sample error message represents one of the seven voltage power sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read the [d] power sensor. [d] power sensor exceeds the critical high threshold. [d] power sensor exceeds the warning high threshold. [d] power sensor falls below the warning low threshold. [d] power sensor falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold.

Corrective action

Replace the power supply. If the problem remains, replace the motherboard.

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FAS31xx/V31xx environmental error codes

Fan sensors
Fan sensor error message description
Error messages can be generated by the fan sensors for existence and status. The corrective action for all fan sensor error messages is below all the error message descriptions.

Fan sensors
Status error messages can be generated by the following power supply fans within each power supply module. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01840x ENV01841x ENV01842x ENV01843x ENV01844x ENV01845x ENV01846x ENV01847x ENV01848x ENV01849x ENV01850x ENV01851x ENV01852x ENV01853x ENV01854x ENV01855x ENV01883x ENV01884x ENV01885x ENV01886x ENV01887x ENV01888x ENV01889x Sensor description SYS_FAN_A1 Fan 1 (Chassis fan A1 unit 1). SYS_FAN_A1 Fan 2 (Chassis fan A1 unit 2). SYS_FAN_A2 Fan 1 (Chassis fan A2 unit 1). SYS_FAN_A2 Fan 2 (Chassis fan A2 unit 2). SYS_FAN_A3 Fan 1 (Chassis fan A3 unit 1). SYS_FAN_A3 Fan 1(Chassis fan A3 unit 2). SYS_FAN_B1 Fan 1 (Chassis fan B1 unit 1). SYS_FAN_B1 Fan 2 (Chassis fan B1 unit 2). SYS_FAN_B2 Fan 1 (Chassis fan B2 unit 1). SYS_FAN_B2 Fan 2 (Chassis fan B2 unit 2). SYS_FAN_B3 Fan 1 (Chassis fan B3 unit 1). SYS_FAN_B3 Fan 1(Chassis fan B3 unit 2). CPU 3.3V Active CPU 3.3V Stadby CPU 5V CPU 12V Partner controller present SYS_FAN_A1 present SYS_FAN_A2 present SYS_FAN_A3 present SYS_FAN_B1 present SYS_FAN_B2 present SYS_FAN_B3 present

The following table lists the error messages that can be generated by the baseboard and power supply fan sensors. Note: "[d]" in the sample error message representsone of the six baseboard fan sensors or one of the four power supply fan sensors:

If "x" is... 1 2 3 4 5 6 7 8 9

Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur [d] cant be speeded up [d] cant be slowed down

Description Cannot read [d] sensor. [d] speed read exceeds the critical high threshold. [d] speed read exceeds the warning high threshold. [d] speed read exceeds the warning low threshold. [d] speed read exceeds the critical low threshold. Missing interrupt when the [d] speed exceeds the warning high threshold. Missing interrupt when the [d] speed exceeds the warning low threshold. [d] cannot be speeded up by the system. [d] cannot be slowed down by the system.

Corrective action
Replace the power supply unit.

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FAS31xx/V31xx environmental error codes

Power supply sensors

Power supply sensor error message description
Error messages can be generated by the power supply sensors for existence and status. The corrective action for all power supply sensor error messages is below all the error message descriptions.

Power supply sensors for existence

Error messages can be generated by the power supply sensors for existence. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01863x ENV01864x ENV01865x ENV01866x ENV01867x ENV01868x ENV01869x Sensor description for existence PS1 AC IN PS1 12V PSU1 present. PCI reset PS2 AC IN PS2 12V PSU2 present.

The following table lists the error messages that can be generated for the power supply existence sensors. Note: "[d]" in the sample error message represents one of the two sensors indicating the existence of the power supplies: If "x" is... 2 3 4 Sample error message [d] is not installed [d] is installed, but powered off [d] is installed and powered on, but not functioning Description [d] is missing. [d] is off. [d] is not functioning.

Corrective action
1. Install the power supply. 2. Turn the power supply on. 3. Replace the power supply.

FAS60xx/V60xx/SA600environmental error codes

Message type
The FAS60xx/V60xx/SA600 environmental error messages are tabulated according to the sensors that generate them: Temperature sensors Voltage power sensors Chassis and CPU fan sensors Power supply sensors

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FAS60xx/V60xx/SA600environmental error codes

Temperature sensors
Temperature sensor error message description
Error messages can be generated by the following temperature sensors. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01393x ENV01394x ENV01411x ENV01412x ENV01413x ENV01414x ENV01415x ENV01416x ENV01425x ENV01426x Sensor description I/O board temperature. Front panel temperature. CPU 0 temperature (computer processing unit 1 temp). CPU 1 temperature (computer processing unit 1 temp). CPU 2 temperature (computer processing unit 2 temp). CPU 3 temperature (computer processing unit 1 temp). MB Zone 1 temperature. MB Zone 2 temperature. PSU 1 temperature. PSU 2 temperature.

The following table lists the error messages that can be generated by the temperature sensors on the motherboard. The corrective action for this error message grouping is below the error message description. Note: "[d]" in the sample error message represents one of the four temperature sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read [d]. [d] exceeds the critical high threshold. [d] exceeds the warning high threshold. [d] falls below the warning low threshold. [d] falls below the critical low threshold. Missing interrupt when [d] exceeds the warning high threshold. Missing interrupt when [d] falls below the warning low threshold.

Corrective action
1. Check to see whether the PSU fans are working properly (from the Diagnostics menu, as well as by physically looking at them). 2. If the fans are bad, replace the PSUs. 3. If the fans are good, replace the motherboard.

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FAS60xx/V60xx/SA600 environmental error codes

Voltage power sensors

Voltage power sensor error message description
Error messages can be generated by the voltage power sensors on the motherboard, the memory board, and the power supplies. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01380x ENV01381x ENV01382x ENV01383x ENV01384x ENV01385x ENV01386x ENV01387x ENV01388x ENV01389x ENV01390x ENV01391x ENV01392x ENV01395x ENV01396x ENV01397x ENV01398x ENV01399x ENV01400x ENV01401x ENV01402x ENV01403x ENV01404x ENV01405x ENV01406x ENV01407x ENV01408x ENV01409x ENV01410x ENV01423x Sensor description CPU3.3 Volt active CPU5.0 Volt active CPU12 Volt CPU3.3 Volt standby CPU5.0 Volt standby Real time clock battery (RTC_batt). IOB HTLE core 1.2 Volt IOB VLDT 1.2 Volt IOB HTLE PCI-EX 1.2 Volt IOB3.3 Volt active IOB5.0 Volt IOB12 Volt IOB3.3 Volt standby CPU0 core voltage CPU1 core voltage CPU0 & 1 VDD25 2.5 Volt CPU0 & 1 VTT 1.2 Volt CPU2 core voltage CPU3 core voltage CPU2 & 3 VDD25 2.5 Volt CPU2 & 3 VTT 1.2 Volt HTLE SB1 core voltage HTLE VLDT voltage HTLE PCI-EX voltage FC core voltage FC bridge core voltage FC bridge ref voltage FC 3.3 voltage RLM standby voltage PSU 1 AC voltage

ENV01424x ENV01427x ENV01428x ENV01429x ENV01430x

PSU 2 AC voltage PSU 1 12 Volt PSU 2 12 Volt PSU 1 5 Volt PSU 2 5 Volt

The following table lists the error messages that can be generated by the voltage power sensors. The corrective action for these error messages is below the error message description. Note: "[d]" in the sample error message represents one of the seven voltage power sensors: If "x" is... 1 2 3 4 5 6 7 Sample error message [d] does not read [d] is in critical high state [d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur Description Cannot read the [d] power sensor. [d] power sensor exceeds the critical high threshold. [d] power sensor exceeds the warning high threshold. [d] power sensor falls below the warning low threshold. [d] power sensor falls below the critical low threshold. Missing interrupt when [d] power sensor exceeds the warning high threshold. Missing interrupt when [d] power sensor falls below the warning low threshold.

Corrective action
Replace the power supply. If the problem remains, replace the motherboard.

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FAS60xx/V60xx/SA600environmental error codes

Fan sensors
Fan sensor error message description
Error messages can be generated by the fan sensors for existence and status. The corrective action for all fan sensor error messages is below all the error message descriptions.

Fan sensors
Status error messages can be generated by the following power supply fans within each power supply module. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01419x ENV01420x ENV01421x ENV01422x ENV01431x ENV01432x ENV01433x ENV01434x ENV01435x ENV01436x ENV01437x ENV01438x ENV01439x ENV01440x ENV01443x ENV01444x ENV01445x ENV01446x ENV01447x Sensor description PSU 1 Fan 1 (Power supply unit 1 fan 1). PSU 1 Fan 2 (Power supply unit 1 fan 2). PSU 2 Fan 1 (Power supply unit 2 fan 1). PSU 2 Fan 2 (Power supply unit 2 fan 2). Sys Fan 0 (Chassis fan 0). Sys Fan 1 (Chassis fan 1). Sys Fan 2 (Chassis fan 2). Sys Fan 3 (Chassis fan 3). Sys Fan 4 (Chassis fan 4). Sys Fan 5 (Chassis fan 5). Sys Fan 6 (Chassis fan 6). Sys Fan 7 (Chassis fan 7). Sys Fan 8 (Chassis fan 8). Sys Fan 9 (Chassis fan 9). Fan FRU 1 present. Fan FRU 2 present. Fan FRU 3 present. Fan FRU 4 present. Fan FRU 5 present.

The following table lists the error messages that can be generated by the baseboard and power supply fan sensors. Note: "[d]" in the sample error message representsone of the six baseboard fan sensors or one of the four power supply fan sensors: If "x" is... 1 2 Sample error message [d] does not read [d] is in critical high state Description Cannot read [d] sensor. [d] speed read exceeds the critical high threshold.

3 4 5 6 7 8 9

[d] is in warning high state [d] is in warning low state [d] is in critical low state [d] expected high interrupt did not occur [d] expected low interrupt did not occur [d] cant be speeded up [d] cant be slowed down

[d] speed read exceeds the warning high threshold. [d] speed read exceeds the warning low threshold. [d] speed read exceeds the critical low threshold. Missing interrupt when the [d] speed exceeds the warning high threshold. Missing interrupt when the [d] speed exceeds the warning low threshold. [d] cannot be speeded up by the system. [d] cannot be slowed down by the system.

Corrective action
Replace the power supply unit.

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FAS60xx/V60xx/SA600environmental error codes

Power supply sensors

Power supply sensor error message description
Error messages can be generated by the power supply sensors for existence and status. The corrective action for all power supply sensor error messages is below all the error message descriptions.

Power supply sensors for existence

Error messages can be generated by the power supply sensors for existence. Note: The "x" in the code represents the actual error condition: Platform and sensor code ENV01417x ENV01418x ENV01441x ENV01442x ENV01448x ENV01449x ENV01450x ENV01452x ENV01453x ENV01454x ENV01455x Sensor description for existence PSU1 PSU2 PSU1 hard status PSU2 hard status PSU1 soft on PSU1 AC status PSU1 DC status PSU2 soft on PSU2 AC status PSU2 DC status PSU2 present

The following table lists the error messages that can be generated for the power supply existence sensors. Note: "[d]" in the sample error message represents one of the two sensors indicating the existence of the power supplies: If "x" is... 2 3 4 Sample error message [d] is not installed [d] is installed, but powered off [d] is installed and powered on, but not functioning Description [d] is missing. [d] is off. [d] is not functioning.

Corrective action
1. Install the power supply. 2. Turn the power supply on. 3. Replace the power supply.