Application of Optical Sensors
Application of Optical Sensors
Reflective Object
Object Object
Figure 1.
Figure 2.
operating conditions. Generally, the minimum and/or maximum values are provided. These values are guaranteed and are tested during the manufacture of the sensor. Typical values, while sometimes provided, should only be used as a guide in the design process. They may or may not be tested during the manufacturing process and are not guaranteed. Table 2 at the end of this note provides the symbol, parameter and definition of data found in transmissive sensor datasheets.
100 90 80 70 60 50 40 30 20 10
A = 1 mm
s - Displacement (mm)
110
100 90 80 70 60 50 40 30 20 10
A = 0.5 mm
- 1.0
13658
1.5
s - Displacement (mm)
Figure 3.
110
100 90 80 70 60 50 40 30 20 10
A = 0.25 mm
s - Displacement (mm)
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1.2
I e rel ; e rel
IF = 20 mA 0.8
0.4
10000 ICEO - Collector Dark Current (nA) V CE = 10 V IF = 0 1000
0 - 10 0 10
94 7993
50
100
140
2.0
10
1.8 1.6 1.4 1.2 1.0 0.8 0.6 VCE = 5 V Ee = 1 mW/cm2 = 950 nm
1 0
96 11875
Temperature
Photo transistors and infrared emitting diodes are temperature dependent. As temperature increases, the light and dark current increases while emitter output decreases. Radiant intensity of the emitter decreases by - 0.7 %/C while the sensitivity of the phototransistor increases by + 1 %/C. So, an increase in the light current of the phototransistor is off-set by a decrease in the output of the emitter, Figure 8 and 9. Consequently, the change in the output of transmissive sensors due to temperature change is comparatively small at less than 10 % from - 25 C to + 70 C, Figure 10. Because of this, it is not recommended or necessary to try to compensate for changes in temperature in the design of transmissive sensor circuit. Temperature also plays an important role in determining the emitter forward current in the application. As an example, if the maximum forward current at an ambient temperature of 25 C is 50 mA. As shown in Figure 11, as power dissipation decreases the forward current must be reduced according to changes in the
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20
40
60
80
100
94 8239
1.5 1.4 1.3 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 - 30 - 20 -10 0 10 20 30 40 50 60 70 80 Tamb - Ambient Temperature (C)
V =5V CE I F = 20 mA d = 0.3 mm
96 11913
where the forward voltage of the emitter, VF, typically 1.2 V, is subtracted from the supply voltage, VCC, and divided by the forward current. Again, design in safety margin between actual operating conditions and the absolute maximum ratings. Intensities that are too high will reduce response time and potentially accelerate degradation. However, since the emitter points directly at the detector over a small gap, forward currents for transmissive sensors are typically low.
25
50
75
100
Switching Times
The speed of response of a phototransistor is dominated by the capacitance of the collector-base junction and the value of the load resistance. A phototransistor takes a certain amount of time to respond to sudden changes in light intensity. The response time is usually expressed by the rise time and fall time of the detector. If the light source driving the phototransistor is not intense enough to cause optical saturation, characterized by the storage of excess amounts of charge carriers in the base region, rise time equals fall time. Transmissive sensors are generally saturated when an object is not present so fall time is larger than rise time. The selection of the load resistor, RL, will also determine the amount of current-to-voltage conversion in the circuit. Reducing the value of RL may result in a faster response time at the expense of a smaller voltage signal.
Ambient Light
Ambient light can impair the sensitivity of the transmissive sensor though its effect is reduced compared to reflective sensors because of relative small gap sizes and the in-line nature of the emitter and detector. Steady light falling directly on the detector may saturate the phototransistor. If an object intended to block the light path does not block the direct ambient light, the phototransistor may remain saturated and no signal will be generated. Varying ambient light results in incorrect signals and missed detections. In many applications, it is difficult to precisely determine the ambient light and its effects. Therefore, the influence of ambient light must be minimized by using optical filters, inspired mechanical design and, if necessary, AC operation. Most of Vishay's transmissive sensors are molded from epoxy that blocks visible light. Still, a large portion of sunlight is in the infrared. Locate or house the sensor so it is recessed to eliminate direct light. Pulsed operation can be helpful in some applications. AC operation is the most effective protection against ambient light.
Degradation
End-users purchasing a transmissive sensor want an accurate estimate of how long the sensor will last. Many will have minimum life requirements. Unlike most traditional light sources, infrared emitting diodes do not fail catastrophically. Instead, the light output degrades over time, Figure 12. Therefore the useful life of a transmissive sensor can be defined by the time when it fails to provide sufficient light for the intended application. Infrared and visible light emitting diode life is often quoted to be 100000 hours but this is based on the average life span of a single, 5 mm epoxy encapsulated emitter. Vishay's reflective sensors also have a single emitter that is epoxy encapsulated. With some similarity, average life span can be considered comparable. As a rule-of-thumb, plan for 30 % degradation of the emitter over the life time of the sensor.
Emitter Intensity
Emitter intensity depends largely on the forward current, IF. The absolute maximum forward current is found in the datasheet. For some of Vishay's transmissive sensors, the maximum forward current is 25 mA at an ambient temperature of 25C. If the forward current is too low, the optical output of the emitter will not be stable. A current limiting resistor is required. Without it, the current of the diode is theoretically limitless and the diode will burn out. The value of the current limiting resistor is calculated using the formula: RL = (VCC - VF) / IF
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1.2
0.8
0.4
0 0
15208
100
1000
10000
Figure 12.
The three main causes of degradation are: A loss of efficiency caused by mechanical stress deforming the crystal structure A loss of optical coupling caused by delamination between epoxy and chip A loss of efficiency caused by thermal stress on the crystal structure The rate of degradation or aging is affected by: Chip technology: GaAs and GaAIAs Double Hetero (DH) technologies result in lower rates, while GaAIAs and GaAIAs/GaAs technologies result in higher rates of aging
Table 2 Parameter VR IF Symbol Reverse voltage Forward Current Gap Aperture IFSM PV TJ VCEO VECO IC Tamb Tstg VF ICEO Forward surge current Power dissipation Junction temperature
Package technology: metal can packaging technologies result in lower rates, and epoxy packaging technologies result in higher rates of aging Chip size: The smaller the chip, the higher the current density. A higher current density results in faster aging There are a number of ways to minimize emitter degradation or aging. First, minimize the junction temperature. As long as the junction temperature, TJ, is kept below 100 C, heating of the pn-junction will cause no significant degradation. To reduce junction temperature, minimize the forward current and the ambient temperature. Second, in applications where there is temperature cycling, keep the forward current for the corresponding temperature well below that shown in Figure 11. This is especially important since degradation due to mechanical stress and delamination is potentially greater in epoxy-based sensors. Transmissive sensor datasheets include a curve showing Total Power Dissipation versus Ambient Temperature. Use this curve as a guide to minimize degradation. Vishay features state-of-the-art chip technologies and high quality standards in the assembly process resulting in low degradation rate of our sensor components.
Relative IC / IF (CTR)
Definition The maximum permissible applied voltage to the anode of the LED such that the current flows in the reverse direction The direct or continuous current flowing in the forward direction of a diode, from the anode to the cathode Distance from emitter face (or post) to detector face The opening in the detector post that admits light The maximum permissible surge or pulse current allowed for a specified temperature and period in the forward direction The maximum power that is consumed by the collector junction of a phototransistor The spatial mean value of the collector junction temperature during operation
Collector emitter voltage The positive voltage applied to the collector of a phototransistor with the emitter at a reference potential and open base Emitter collector voltage The positive voltage applied to the emitter of a phototransistor with the collector at a reference potential and open base Collector current Ambient Temperature Storage Temperature Forward voltage Collector dark current The current that flows to the collector junction of a phototransistor The maximum permissible ambient temperature The maximum permissible storage temperature without an applied voltage The voltage drop across the diode in the forward direction when a specified forward current is applied The current leakage of the phototransistor when a specified bias voltage is applied so that the polarity of the collector is positive and that of the emitter is negative on condition that the illumination of the sensor is zero The continuous voltage between the collector and emitter when the detector is in its "ON" state as measured with the Kodak neutral test card, white side Amount of time it takes the output voltage to go from 10 % of the lower specified value to 90 % of the upper specified value The time required for the output voltage to go from 90 % of the upper specified value to 10 % of the lower specified value Document Number: 81452 Rev. 1.0, 27-Sep-06
VCEsat tr tf
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