Cmos Comparator: Term Paper Eem-511: Analog Electronics Design
Cmos Comparator: Term Paper Eem-511: Analog Electronics Design
Cmos Comparator: Term Paper Eem-511: Analog Electronics Design
+1
Where
=1/
c
is the -3dB frequency of the single (dominant) pole
approximation to the frequency response of the comparator.
Open loop comparators
Open-loop, continuous time comparators are an operational amplifier without frequency compensation
to obtain the largest possible bandwidth, hence improving its time response. Since the precise gain and
linearity are of no interest in comparator design, no-compensation does not pose a problem. However,
due to its limited gain-bandwidth product, open-loop comparators are too slow for many applications.
On the other hand, a cascade of open-loop amplifiers usually has a significantly larger gain
bandwidth product than a single-stage amplifier with the same gain. However, since it costs
more area and power consumption, cascading does not give practical advantages for many
applications.
The comparator shown above is a two stage open loop comparator. It has two poles of interest,
one is the output pole of first stage p
1
and the second is the output pole of second stage, p
2
.
These poles are expressed as
P
1
=
1
1
(
2
+
4
)
P
2
=
1
2
(
6
+
7
)
Where C
1
is the sum of capacitances connected to the output of first stage and C
2
is the sum of
capacitances connected to the output of the second stage. The frequency response can be
expressed as
A
V
=
A
V
0
(
s
p
1
+1)
s
p
2
+1
Fully dynamic latched comparators
Resistor Divider Comparator (or Lewis-Gray Comparator)
Since the input transistor M1A/B and M2A/B operate in the triode region and act like voltage
controlled resistors, this comparator is called Resistive Divider Comparator. The advantage of this
comparator is its low power consumption (No DC power consumption) and adjustable
threshold voltage (decision level) which is defined as
Vin(threshold)=(WB/WA)Vref (1)
Where WA=W1A=W2A WB=W1B=W2B Vin=Vin+ -Vin- Vref=Vref+-Vref-
During reset phase (Clk=0V), PMOS reset transistor M9 and M10 charge Out nodes up
to VDD (this makes NMOS transistor M3 and M4 on and the node voltage at VD3,4 discharge to
ground) and input transistor M1 and M2 discharge Di nodes to ground while NMOS
transistor M5 and M6 are off. During evaluation phase (Clk=VDD), as both switch transistor
M5 and M6 are on, each node voltage at Di+and Di instantly rises up to the certain values,
which are defined as
VDi+=rds1 on (Vout-)/( rds1 on+ rds3,4 on+ rds5,6 on) (2)
VDi-=rds2 on (Vou+)/( rds2 on+ rds3,4 on+ rds5,6 on) (3)
Then, each Out node voltage starts to discharge from VDD to ground inversely proportional to
the applied input voltage such a way; Vin+ VDi VGS3 ID3 Vout- VGS4 Vout+ (VGS3).
With positive feedback operation from the back-to-back cross-coupled inverter pairs (M7/M3 and
M8/M4), one Out node will discharge to ground and the other Out node will charge up to VDD again
and this comparator will finish its comparison. Since the input transistor M1 and M2 are operated
in the linear region during evaluation phase, the transconductance for those transistors are can be
approximately written as
gm1,2=nCox(W1,2/L) Vds1,2
gm3,4=nCox(W3,4/L)( Vgs3,4-Vtn)
The transconductance of transistor M3 and M4 is much larger than that of the input transistor pair;
hence the differential voltage gain built between Di nodes from the input transistor pair is not big
enough to overcome an offset voltage caused from such a small mismatch between transistor M3
and M4 pair. As a result, those transistors are the most critical mismatch pair in this comparator
and needed to be sized big enough to minimize the offset voltage at the cost of the increased power
consumption. Besides, the mismatch between transistor M5 and M6 pair (which is switches and
operated in the linear region) also causes the considerable input-referred offset voltage.
Furthermore, as the common mode voltage Vcom of the input transistor pair increases, the relative
difference between the voltage controlled resistors (rds1,2) becomes smaller at the same amount of
the input voltage difference Vin and this in turn increases the offset voltage.
It can be concluded that despite its advantages such as zero-static power consumption
and adjustable threshold voltage, since Lewis-Gray comparator shows a high offset voltage
and its high offset voltage dependency on a different common mode voltage Vcom, it is only
suitable for low resolution comparison.
Pre-amplifier Based Latched Comparators
The main advantages of the pre-amplifier based latched comparators are their fast speed and low
input referred latch offset voltage. Typically, pre-amplifier, which consists of one or two stages of an
open-loop comparator, has a gain of 4 - 10 V/V and it can reduce the input referred latch offset
voltage by its gain. For example, if a pre-amplifier has gain of 10 V/V and a latch stage has an offset
voltage of 50mV, then the input-referred latch offset voltage will be 5 mV. In addition, by using pre-
amplification stage, kickback noise can be considerably reduced (by isolation between the drains of
the differential pair transistors and the regeneration nodes) and meta-stability problem also can be
relaxed. Latched comparators commonly employ one or two clock signals (Clk and Clkb) to
determine the modes of operation: Track Mode (Reset): output is reset and input is tracked,
Latch Mode (Evaluation): output is toggled by using a positive feedback.
During reset phase (Clkb=0V), both complementary output Vout+ and Vout are reset to 0V by reset
(switch) transistor M10 and M11. During evaluation phase (Clkb=VDD), as the reset transistors are
off, the comparison will be performed by a positive feedback from transistor M7 and M9. While this
comparator present low kickback noise, relatively large static power consumption and slow
regeneration due to its limited current operation make it less attractive.
It can be concluded that pre-amplifier based latched comparators, which is a combination of a pre-
amplifier and a latch, offer fast speed and low offset while they still consume static power.
Pull up pre-amplifier
M
1
M
2
V
i
+
V
i
-
V
o
+
V
o
-
Pull-up
( )
( )
L
1
mL
m1
V
L W
L W
g
g
A
: up pull diode NMOS
= =
-
( )
( )
L
1
p
n
mL
m1
V
L W
L W
g
g
A
: up pull diode PMOS
= =
-
L m1 V
R g A
: up pull Resistor
=
-
NMOS pull-up suffers from body effect, affecting gain accuracy
PMOS pull-up is free from body effect, but subject to P/N mismatch
Gain accuracy is the worst for resistive pull-up as resistors (poly, diffusion, well, etc.)
Bults preamp
NMOS diff. pair loaded with PMOS diodes and PMOS latch (PFB)
High DM gain, low CM gain, good CMRR
Simple, no CMFB
(W/L)34 > (W/L)56 needs to be ensured for stability
Songs Preamplifier
M
1
M
2
M
7
M
3
M
4
V
i
+
V
i
-
V
o
+
V
o
-
M
5
M
6
M
1
M
2
M
5
M
4
M
3
V
i
+
V
i
-
V
o
+
V
o
-
R
L
R
L
X
NMOS diff. pair loaded with PMOS diodes and resistors
High DM gain, low CM gain, good CMRR
Simple, no CMFB
Gain not well-defined
Songs Preamplifier(Differential mode)
Songs Preamplifier(Common mode)
V
id
g
m1
V
id
r
o1
r
o3
R
L
V
od
V
ic
g
m1
V
gs1
2r
o5
1
g
m3
V
oc
V
gs1
( )
L m1
L o3 o1 m1
dm
V
R g
//R //r r g A
~
=
~
+
~
cm m1
V
m1 o5 m3
m3 o5
g 1
A
1 2g r g
1
2g r
Chos Comparator
The M1R and M2R added to set the comparator threshold.
Vth=
W
R
W
i
. V
+
R
M
2R
M
1R
V
i
+
V
i
-
M
7
M
8
M
5
M
6
M
1
Q
+
Q
-
M
2
M
9
M
10
M
4
M
3
V
R
-
V
R
+
( ) ( )
( ) ( )
(
+ ' =
(
+ ' =
+
+
th R
R
th i
i
2
th R
R
th i
i
1
V V
L
W
V V
L
W
k G
V V
L
W
V V
L
W
k G
REFERENCES
- Philip E. Allen and Douglas R. Holberg, CMOS Analog Circuit
Design, 2nd ed. New York, NY: Oxford, 2002.
- B. Razavi, Design of Analog CMOS Integrated Circuits,
McGraw-Hill,2001.
- B. Razavi and B. A. Wooley, Design techniques for high-speed
high resolution comparators, IEEE J. Solid-State Circuits, vol.
27, no. 6, pp. 19161926, Dec. 1992.
- The Design of a Two-Stage Comaprator, [Online]. Available
http://people.rit.edu/ssm8867/pdf/analogbody.pdf
- W. Sansen, Analog Design Essentials, Springer-Verlag, 2006.