Assignment 3
Assignment 3
3
SEMICONDUCTOR DEVICES 10B11EC411 DUE DATE 25/04/2011
1. Derive the equation for drain current ID in NMOSFET, explain Transconductance (gm) and
discuss the effect of varying gate potential on ID and gm.
2. Explain the following in detail
a. Hot Electron effect.
b. Drain Induced barrier Lowering
c. Charge sharing in Short Channel MOSFET
d. Gate Induced Drain Leakage
3. Discuss in detail
a. Different types of Oxide tunneling in MOS Device with neat & clean diagrams
b. Kirk effect and Early effect in BJT
c. Channel length variation effect on Threshold voltage (Draw Diagram for VTH Vs
Channel Length)