Interferometry, Screw Thread & Gear Measurements
Interferometry, Screw Thread & Gear Measurements
Slit A P (Bright)
M (Dark)
O (Bright)
N (Dark)
Light Source
Q (Bright)
Slit C
Method of producing Interference bands
As shown in the fig, light passes through a very
narrow slit ‘A’ & then through the slits ‘B’ & ‘C’
which are close to each other.
Thus, two separate beams of light are formed
which will further travel towards a screen.
At a point ‘O’ where the rays travel equal
distances, and hence will be in phase, a bright
band is produced.
At a point ‘M’ where the path difference will be
equal to one half the wavelength, i.e. the
waves will be 180o out of phase, resulting in a dark
band.
Method of producing Interference bands
Similarly at a point ‘P’ where the path
difference is one wavelength, the waves will
be again in phase and result in a bright
band.
Thus, if the path difference is an ‘even
multiple of half wavelengths’ the light waves
will be in phase resulting in bright spots on
the screen.
If the path difference is an ‘odd multiple of
half wavelengths’ the light waves will be out
of phase resulting in dark spots on the
screen.
Optical Flats
Optical Flats
An optical flat is a circular piece of unstressed glass
or quartz usually about 5 cm or more. (High quality
optical quartz or borosilicate glass is commonly
used)
The upper & lower surfaces are ground optically flat
to get reference planes.
The flats will be coated with a thin film of titanium
oxide to reduce the light lost by reflection.
Type ‘A’ optical flats have only one flat surface while
type ‘B’ has two parallel flat surfaces.
Cleanliness is utmost important as dust will result in
inaccurate measurement. Also optical flats get
rapidly heated by handling & takes long time to
regain ambient temperature.
Principle of Operation of Optical flats
(Interferometry applied to flatness testing)
out of phase
Dark band
In phase
J M
G
Optical flat
C F
A L
H
E
B
Surface tested
D K
Principle of Operation of Optical flats
When an optical flat is put into close contact with a
surface to be tested, it will produce interference
fringes, which indicates the contour of the surface.
A ray of light entering at A is partly reflected at B
along BC and partly transmitted to be reflected at D
along DEF.
The difference in lengths of paths is (BD+DE) and if
this is an even multiple of half wavelength of incident
light, a bright band will be seen.
If at another position G, if the path difference
(HK+KL) is an odd multiple of a dark band will
result.
Principle of Operation of Optical flats
If the test surface is perfectly wrung together with
optical flat, then no air gap exists & hence no
interference fringes will be observed.
If the surface is nearly flat, widely spaced parallel
fringes will appear.
If the angle air wedge between test surface &
optical flat) is increased, the pitch of the fringes
become small.
The fringe pattern observed indicate the nature of
test surface. Some typical fringe patterns are
shown in fig which indicate the contour of the test
surface.
Pattern of fringes for different contours
Fringe pattern
surface
(b)
(a)
(c)
(d)
convex
optical flat
convex
concave
Pattern of fringes for different contours
(g)
(f)
(e)
concave convex
Pattern of fringes for different contours
Pattern (a) & (b) represent flat surfaces.
The inclination of optical flat is more in
case (b) than case (a).
Fig (c) represents spherical surface. Figs
(d) & (e) indicate concave & convex
surfaces which is decided by pressing the
flat slightly at the centre & the edges.
Fig (f) is the fringe pattern obtained for a
smooth cylindrical surface.
Fig (g) represents the pattern over a V-
block.
Autocollimator
Autocollimator is an optical device used for
measurement of small angular differences
accurately. It is essentially an ‘infinity telescope’
and a ‘collimator’ combined into one instrument.
A source of light ‘O’ is placed at the focal plane of
a collimating lens. The light rays from O incident
on the lens will travel as parallel beam & strike a
plane reflector which is normal to its optic axis.
The reflected rays travel back along the same path
and get refocused at the same point O.
If the plane reflector is tilted through a small angle
then the parallel beam gets deflected through 2
and will be refocused at O’, such that OO’=x= 2
f, where f is the focal length of the lens.
Principle of reflection
O'
X
O
Point source
Principle of reflection
Principle of Microptic Autocollimator
Lamp
f
diffuser
Cross line
(target) graticule
Pitch
Crest
Flank Addendum
Pitch line Flank
Thread angle
Angle Dedendum
Axial thickness
Root
Axis of thread
+
True thread
Cumulative
pitch error
Pitch
Max error Drunken
thread
_ Length of thread
Mean diameter
Fig (a)
Fig (b)
Length of thread
Length of thread
Fiducial Supports
Indicator
Measuring
Anvils Holding centres
Micrometer head
BENCH MICROMETER
Bench Micrometer
BENCH MICROMETER
Bench Micrometer
A good quality hand held micrometer is quite suitable for
measuring external thread, but only light pressure has to
be applied on the anvils to make only contact on the screw
threads.
Excessive pressure may lead to elastic deformation of
screw threads leading to errors.
A bench micrometer may be used for greater accuracy
which give direct readings of 0.0002 mm.
A standard cylinder of known diameter ‘S’ (which is nearly
equal to thread diameter) is held between centers & a
reading R1 between the fiducial indicator anvil &
micrometer anvil is taken. The cylinder is then removed.
Then the screw thread to be measured is held between
centers & a second micrometer reading R2 is taken.
Then D1 =S(+ or -) (R1~R2)
Holding centre Holding centre
Screw Thread
Holding centre
Fiducial Prism
indicator
anvil Standard Cylinder
Screw Thread
Micrometer anvil
Prism
0 10 Protractor arm
10
20
20
Pivot Protractor
Screw
Shadow Protractor
Shadow protractor
Shadow protractor is most convenient method for
measurement of flank angles using optical projection.
The shadow of the thread is viewed on a screen and the
angles are measured by means of a protractor.
For clear definition of a thread form on the screen it is
necessary to project the light beam along the thread helix
angle by using a lamp & collimating unit.
The protractor is supported at the screen on a straight edge.
The pivoted arm of the protractor is rotated until its shadow is
parallel to the flank & the first reading is taken.
The screw is then rotated 90o to its axis and the protractor is
swung about its pivot and adjusted to measure the angle of
the same flank and a second reading is taken.
The mean of the two readings is then the angle between the
flank & normal to the screw axis.
Measurement of effective diameter by Two wire method
E M
Dia 'd'
P
Pitch line B C
F
C D E
G
M
E
Measurement of effective diameter using two wire method
The effective diameter can not be measured directly
but can be calculated from the measurements made.
Wires of exactly known diameters are chosen such
that they contact the flanks at their straight portions.
E M
Dia 'd'
P
A
h B C
H
D
M
E
Effective diameter by three wire method
This method is more accurate than two wire
method as it ensures alignment of micrometer
faces parallel to the thread axis.
Here, three wires of exactly known diameters
are used, one on one side & the two on the other
side. The wires may be held in hand or hung
from a stand.
From the fig, M=diameter over the wires
E= effective diameter (to be found)
d= diameter of wires, h=height of wire center
above the pitch line, r=radius of wire, H=depth of
thread, D=major diameter of the thread.
Effective diameter by three wire method
d
From the triangle ABD , AD AB cosec cosec
2 2 2
P H P
H DE cot cot and CD cot
2 2 2 2 4 2
d P
Further h ( AD CD ) cosec cot
2 2 4 2
Distance over the wires, M E 2h 2r
P P
i.e. M E 2rcosec cot 2r E 2r 1 cosec cot
2 4 2 2 2 2
P
Or M E d 1 cosec cot
2 2 2
For Whitworth thread, 55o , depth of thread 0.64P
E D - 0.64P, cosec 2.1657, and cot 1.921
2 2
M D 3.1657d 1.605P where D is the major diameter of the thread.
For Metric threads, Depth of thread 0.6495P
E D 0.6495P, 60 , cos ec 2, cot 1.732
o
2 2
M D 3d 1.5155P
We can measure the value of M practically & then
compare with the theoretical values using formulae derived above.
After finding the correct value of M, as d is known, E can be found out.
Pitch Measuring machine
Fiducial Pointer T Micrometer
indicator
Column
work table
with carriage
Hollow base
Lamp
Collimator lens
Mirror
Base
TOOLMAKER’S MICROSCOPE
TOOLMAKER’S MICROSCOPE
GEAR TOOTH CALIPER
GEAR TESTER
GEAR TOOTH NOMENCLATURE
Anvil
P
Wire
E M
Screw thread D G F
C
M
A