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Statistical Quality Control

This document provides an overview of statistical quality control including statistical process control methods and acceptance sampling. It discusses measuring quality using attributes and variables. Control charts are introduced for attributes like p-charts and c-charts to monitor proportion defective and number of defects per unit. Control charts for variables include x-bar and R charts. Acceptance sampling uses statistical techniques to determine if a batch should be accepted or rejected based on inspecting a sample.

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Hunson Abadeer
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807 views

Statistical Quality Control

This document provides an overview of statistical quality control including statistical process control methods and acceptance sampling. It discusses measuring quality using attributes and variables. Control charts are introduced for attributes like p-charts and c-charts to monitor proportion defective and number of defects per unit. Control charts for variables include x-bar and R charts. Acceptance sampling uses statistical techniques to determine if a batch should be accepted or rejected based on inspecting a sample.

Uploaded by

Hunson Abadeer
Copyright
© © All Rights Reserved
Available Formats
Download as DOCX, PDF, TXT or read online on Scribd
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STATISTICAL QUALITY CONTROL

Learning Objectives
1. To understand the purpose and function of statistical quality control.
2. To understand the differences between attributes and variables.
3. To become familiar with basic methods of statistical process control.

Contents

Statistical Quality Control


Quality Measurement: Attributes and Variables
Statistical Process Control (SPC) Methods
Control Charts for Attributes:
p-Charts - Proportion Defective
c-Charts - Number of Defects Per Unit
Control Charts for Variables
Other Types of Attribute-Sampling Plans
Acceptance Sampling

Statistical quality control (SQC)


-

The application of statistical techniques to measure and evaluate the


quality of a product, service, or process.
Two basic categories:
I. Statistical process control (SPC):
- The application of statistical techniques to determine whether a process is
functioning as desired
II. Acceptance Sampling:
- The application of statistical techniques to determine whether a
population of items should be accepted or rejected based on inspection of
a sample of those items.

Quality Measurement: Attributes vs Variables


Attributes:
Characteristics that are measured as either "acceptable" or "not acceptable",
thus have only discrete, binary, or integer values.
Variables:
Characteristics that are measured on a continuous scale.

Statistical Process Control (SPC) Methods


Statistical process control (SPC) monitors specified quality characteristics of a
product or service so as:
To detect whether the process has changed in a way that will affect
product quality;
And to measure the current quality of products or services.
Control is maintained through the use of control charts. The charts have upper
and lower control limits and the process is in control if sample measurements
are between the limits.
Control Charts for Attributes
P Charts - measures proportion defective.
C Charts - measures the number of defects/unit.

Control Charts for Variables


X bar and R charts are used together - control a process by ensuring that the
sample average and range remain within limits for both.
Basic Procedure
1. An upper control limit (UCL) and a lower control limit (LCL) are set for the
process.
2. A random sample of the product or service is taken, and the specified quality
characteristic is measured.
3. If the average of the sample of the quality characteristic is higher than the
upper control limit or lower than the lower control limit, the process is
considered to be "out of control".

CONTROL CHARTS FOR ATTRIBUTES


p-Charts for Proportion Defective
p-chart: a statistical control chart that plots movement in the sample proportion
defective (p) over time
Procedure:
1. Take a random sample and inspect each item
2. Determine the sample proportion defective by dividing the number of
defective items by the sample size
3. Plot the sample proportion defective on the control chart and compare with
UCL and LCL to determine if process is out of control
The underlying statistical sampling distribution is the binomial distribution, but
can be approximated by the normal distribution with:
mean = u = np (Note - add the bars above the means used in all the
equations in this section)
standard deviation of p: sigmap = square root of (p(1 -p ) / n)
where p = historical population proportion defective and n = sample size
Control Limits:
UCL = u + z sigmap
LCL = u - z sigma p
z is the number of standard deviations from the mean. It is set based how
certain you wish to be that when a limit is exceeded it is due to a change in the
process proportion defective rather than due to sample variability. For example:
If z = 1 if p has not changed you will still exceed the limits in 32% of the
samples (68% confident that mean has changed if the limits are exceeded.
z = 2 - limits will be exceeded in 4.5 (95.5 % confidence that mean has
changed)
z = 3 - limits will be exceeded in .03 (99.7% confidence)

c-Charts for Number of Defects Per Unit


c-chart: a statistical control chart that plots movement in the number of defects
per unit.
Procedure:
1. Randomly select one item and count the number of defects in that item
2. Plot the number of defects on a control chart
3. Compare with UCL and LCL to determine if process is out of control
The underlying sampling distribution is the Poisson distribution, but can be
approximated by the normal distribution with: mean = c
standard deviation = square root of c

where c is the historical average number of defects/unit


Control Limits:
UCL = c + z c
LCL = c - z c

Control Charts for Variables


Two charts are used together: R-chart ("range chart") and X barchart
("average chart")
Both the process variability (measured by the R-chart) and the process average
(measured by the X bar chart) must be in control before the process can be
said to be in control.
Process variability must be in control before the X bar chart can be developed
because a measure of process variability is required to determine the -chart
control limits.
R-Chart for Process Variability:
UCLR = D4(R)
LCLR = D3(R)
where is the average of past R values, and D3 and D4 are constants based on
the sample size
-Chart for Process Average:
UCLR = X bar + A2(R)
LCL = X bar - A2(R)
where X bar is the average of several past values, and A2 is a constant based
on the sample size

Other Types of Attribute-Sampling Plans


Double-Sampling Plan:
Specifies two sample sizes (n1 and n2) and two acceptance levels (c1 and c2)
1. if the first sample passes (actual defects c1), the lot is accepted
2. if the first sample fails and actual defects > c 2, the lot is rejected
3. if first sample fails but c1 < actual defects c2, the second sample is taken and
judged on the combined number of defectives found.
Sequential-Sampling Plan:
Each time an item is inspected, a decision is made whether to accept the lot,
reject it, or continue sampling.

Acceptance Sampling
Goal: To accept or reject a batch of items. It is frequently used to test incoming
materials from suppliers or other parts of the organization prior to entry into
the production process.
Used to determine whether to accept or reject a batch of products. It measures
number of defects in a sample. Based on the number of defects in the sample
the batch is either accepted or rejected. An acceptance level c is specified. If
the number of defects in the sample is c the batch is accepted, otherwise it is
rejected and subjected to 100% inspection.

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