P45N02LD Niko-Sem: N-Channel Logic Level Enhancement Mode Field Effect Transistor
P45N02LD Niko-Sem: N-Channel Logic Level Enhancement Mode Field Effect Transistor
P45N02LD Niko-Sem: N-Channel Logic Level Enhancement Mode Field Effect Transistor
MAY-24-2001
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
P45N02LD
TO-252 (DPAK)
NIKO-SEM
ABSOLUTE MAXIMUM RATINGS (T
C
= 25 C Unless Otherwise Noted)
PARAMETERS/TEST CONDITIONS SYMBOL LIMITS UNITS
Gate-Source Voltage V
GS
20 V
T
C
=25 C 45
Continuous Drain Current
T
C
=100 C
I
D
28
Pulsed Drain Current
1
I
DM
140
Avalanche Current I
AR
20
A
Avalanche Energy L =0.1mH E
AS
140
Repetitive Avalanche Energy
2
L =0.05mH E
AR
5.6
mJ
T
C
=25 C 55
Power Dissipation
T
C
=100 C
P
D
33
W
Operating J unction & Storage Temperature Range T
j
, T
stg
-55 to 150
Lead Temperature (
1
/
16
from case for 10 sec.) T
L
275
C
THERMAL RESISTANCE RATINGS
THERMAL RESISTANCE SYMBOL TYPICAL MAXIMUM UNITS
J unction-to-Case R
J C
3
J unction-to-Ambient R
J A
70
Case-to-Heatsink R
CS
0.7
C / W
1
Pulse width limited by maximum junction temperature.
2
Duty cycle 1
ELECTRICAL CHARACTERISTICS (T
C
= 25 C, Unless Otherwise Noted)
LIMITS
PARAMETER SYMBOL TEST CONDITIONS
MIN TYP MAX
UNIT
STATIC
Drain-Source Breakdown Voltage V
(BR)DSS
V
GS
=0V, I
D
=250A 25
Gate Threshold Voltage V
GS(th)
V
DS
=V
GS
, I
D
=250A 0.8 1.2 2.5
V
Gate-Body Leakage I
GSS
V
DS
=0V, V
GS
=20V 250 nA
V
DS
=20V, V
GS
=0V 25
Zero Gate Voltage Drain Current I
DSS
V
DS
=20V, V
GS
=0V, T
J
=125 C 250
A
On-State Drain Current
1
I
D(ON)
V
DS
=10V, V
GS
=10V 45 A
1. GATE
2. DRAIN
3. SOURCE
PRODUCT SUMMARY
V
(BR)DSS
R
DS(ON)
I
D
25 20m 45A
G
D
S
Free Datasheet http://www.datasheet4u.com/
2
MAY-24-2001
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
P45N02LD
TO-252 (DPAK)
NIKO-SEM
V
GS
=7V, I
D
=18A 20 30
Drain-Source On-State
Resistance
1
R
DS(ON)
V
GS
=10V, I
D
=20A 15 28
m
Forward Transconductance
1
g
fs
V
DS
=15V, I
D
=30A 16 S
DYNAMIC
Input Capacitance C
iss
600
Output Capacitance C
oss
290
Reverse Transfer Capacitance C
rss
V
GS
=0V, V
DS
=15V, f =1MHz
100
pF
Total Gate Charge
2
Q
g
25
Gate-Source Charge
2
Q
gs
2.9
Gate-Drain Charge
2
Q
gd
V
DS
=0.5V
(BR)DSS
, V
GS
=10V,
I
D
=20A
7.0
nC
Turn-On Delay Time
2
t
d(on)
7.0
Rise Time
2
t
r
V
DS
=15V, R
L
=1 7.0
Turn-Off Delay Time
2
t
d(off)
I
D
30A, V
GS
=10V, R
GS
=2.5 24
Fall Time
2
t
f
6.0
nS
SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS (T
C
= 25 C)
Continuous Current I
S
45
Pulsed Current
3
I
SM
150
A
Forward Voltage
1
V
SD
I
F
=I
S
, V
GS
=0V 1.3 V
Reverse Recovery Time t
rr
37 nS
Peak Reverse Recovery Current I
RM(REC)
I
F
=I
S
, dl
F
/dt =100A / S 200 A
Reverse Recovery Charge Q
rr
0.043 C
1
Pulse test : Pulse Width 300 sec, Duty Cycle 2.
2
Independent of operating temperature.
3
Pulse width limited by maximum junction temperature.
REMARK: THE PRODUCT MARKED WITH P45N02LD , DATE CODE or LOT #
Free Datasheet http://www.datasheet4u.com/
3
MAY-24-2001
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
P45N02LD
TO-252 (DPAK)
NIKO-SEM
TO-252 (DPAK) MECHANICAL DATA
mm mm
Dimension
Min. Typ. Max.
Dimension
Min. Typ. Max.
A 9.35 10.1 H 0.8
B 2.2 2.4 I 6.4 6.6
C 0.48 0.6 J 5.2 5.4
D 0.89 1.5 K 0.6 1
E 0.45 0.6 L 0.64 0.9
F 0.03 0.23 M 4.4 4.6
G 6 6.2 N
Free Datasheet http://www.datasheet4u.com/