Reliability Prediction Basics
Reliability Prediction Basics
Reliability Prediction Basics
Reliability predictions are one of the most common forms of reliability analysis. Reliability predictions predict the failure rate of components and overall system reliability. These predictions are used to evaluate design feasibility, compare design alternatives, identify potential failure areas, trade-off system design factors, and track reliability improvement.
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time zero and have a constant failure rate, if evaluated over a very long time period and using an infinite or very large sample size of components or systems. Reliability (for non-repairable items) can be defined as the probability that an item will perform a defined function without failure under stated conditions for a stated period of time. One must grasp the concept of probabilities in order to understand the concept of reliability. The numerical values of both reliability and unreliability are expressed as a probability from 0 to 1 and have no units. Reliability stated in another way: The Reliability, R(t), of a component or system is defined as the probability that the component or system remains operating from time zero to time t1, given that it was operating at time zero. Or stated another way for repairable items: The Reliability, R(t), is defined as the probability that the component or system experiences no failures during the time interval zero to t1 given that the component or system was repaired to a like new condition or was functioning at t0. And: The Unreliability, F(t), of a component or system is defined as the probability that the component or system experiences the first failure or has failed one or more times during the time interval zero to time t, given that it was operating or repaired to a like new condition at time zero. Or stated another way: The Unreliability, F(t), of a component or system at a given time is simply the number of components failed to time t divided by the total number of samples tested. The following relationship holds true since a component or system must either experience its first failure in the time interval zero to t or remain operating over this period. R(t) + F(t) = 1 or Unreliability F(t) = 1 R(t)
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The Unavailability, Q(t), of a component or system is defined as the probability that the component or system is not operating at time t, given that is was operating at time zero. Or stated another way: Unavailability, Q(t) is the probability that the component or system is in the failed state at time t and is equal to the number of the failed components at time t divided by the total sample. Therefore, the following relationship holds true since a component or system must be either operating or not operating at any time: A(t) + Q(t) = 1 Both parameters are used in reliability assessments, safety and cost related studies. The following relationship holds: Unavailability Q(t) Unreliability F(t) For a non-repairable component or system: Unavailability Q(t) = Unreliability F(t) NOTE: This general equality only holds for system unavailability and unreliability if all the
components within the system are non-repairable up to time t.
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Mean Time Between Failures (MTBF) Mean Time To Failure (MTTF) Mean Time To Repair (MTTR)
MTBF =
OR
NOTE: Although MTBF was designed for use with repairable items, it is commonly used for
both repairable and non-repairable items. For non-repairable items, MTBF is the time until the first (an only) failure after t0.
MTTF =
For repairable systems, MTTF is the expected span of time from repair to the first or next failure.
Failure Frequencies
There are four failure frequencies, which are commonly used in reliability analyses.
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Failure Density f (t ) - The failure density of a component or system, f (t ) , is defined as the probability per unit time that the component or system experiences its first failure at time t, given that the component or system was operating at time zero. Failure Rate r (t ) - The failure rate of a component or system, r (t ) , is defined as the probability per unit time that the component or system experiences a failure at time t, given that the component or system was operating at time zero and has survived to time t. Conditional Failure Intensity (or Conditional Failure Rate) (t ) - The conditional failure intensity of a component or system, (t ) , is defined as the probability per unit time that the component or system experiences a failure at time t, given that the component or system was operating, or was repaired to be as good as new, at time zero and is operating at time t. Unconditional Failure Intensity or Failure Frequency (t ) - The unconditional failure intensity of a component or system, (t ) , is defined as the probability per unit time that the component or system experiences a failure at time t, given that the component or system was operating at time zero.
R (t ) + F ( t ) = 1
f (t ) =
t
dF (t ) dt
F (t ) = f (u ).du
0
r (t ) =
f (t ) 1 F (t )
t
r ( u ). du R(t ) = e 0
F (t ) = 1 e 0
r ( u ). du
f (t ) = r (t )e 0
r ( u ). du
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The definitions for failure rate r ( t ) and conditional failure intensity (t ) differ in that that the failure rate definition addresses the first failure of the component or system rather than any failure of the component or system. In the special cases of the failure rate being constant with respect to time or if the component is non-repairable these two quantities are equal. In summary :
(t ) = r (t ) for non-repairable components (t ) = r (t ) for constant failure rates (t ) r (t ) for the general case
The difference between the conditional failure intensity (CFI) (t ) and unconditional failure intensity (t ) is that the CFI has an additional condition that the component or system has survived to time t. The relationship between these two quantities may be expressed mathematically as
(t ) = (t )[1 Q (t )]
For most reliability and availability studies the unavailability Q (t ) of components and systems is very much less than 1. In such cases
(t ) ( t )
Constant Failure Rates
If the failure rate is constant then the following expressions apply :
R ( t ) = e t F ( t ) = 1 e t f ( t ) = e t
As can be seen from the equation above a constant failure rate results in an exponential failure density distribution.
Non-repairable items
Non-repairable items are components or systems such as a light bulb, transistor, rocket motor, etc. Their reliability is the survival probability over the items expected life or over a specific period of time during its life, when only one failure can occur. During the component or systems life, the instantaneous probability of the first and only failure is called the hazard rate or failure rate, r ( t ) . Life values such as MTTF described above are used to define non-repairable items.
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Repairable Items
For repairable items, reliability is the probability that failure will not occur in the time period of interest; or when more than one failure can occur, reliability can be expressed as the failure rate, , or the rate of occurrence of failures (ROCOF). In the case of repairable items, reliability can be characterized by MTBF described above, but only under the condition of constant failure rate. There is also the concern for availability, A(t), of repairable items since repair takes time. Availability, A(t), is affected by the rate of occurrence of failures (failure rate, ) or MTBF plus maintenance time; where maintenance can be corrective (repair) or preventative (to reduce the likelihood of failure). Availability, A(t), is the probability that an item is in an operable state at any time
Availability A(t ) =
Some systems are considered both repairable and non-repairable, such as a missile. It is repairable while under test on the ground; but becomes a non-repairable system when fired. NOTE: Failure rate, , is applied loosely to non-repairable items. What is really meant in a
repairable system, which contains a part, is that the part will contribute to the overall system failure rate by the stated part failure rate. The part being non-repairable cannot have a failure rate.
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This failure pattern is also demonstrated by electronic equipment that has aged beyond its useful life (right hand side of the bath tub curve) and the failure rate is rapidly increasing with time.
0.9
0.8
0.7
Early Life or High Failure Rate Stage (Failure of Weak or Defective Components) (Burn-in Period)
0.6
0.5
0.4
0.3
0.2
0.1
0.0 10 20 30 40 50 60 70 80
100
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This increasing failure rate (IFR) pattern is demonstrated by repairable equipment when wear out modes begin to predominate or electronic equipment that has aged beyond its useful life (right hand side of the bath tub curve) and the failure rate is increasing with time.
Redundancy
Redundancy is briefly defined as the existence of two or more means, not necessarily identical, for accomplishing a given single function. There are different types of redundancy. Active Redundancy Has all items operating simultaneously in parallel. All items are working and in use at the same time, even though only one item is required for the function. There is no change in the failure rate of the surviving item after the failure of a companion item. Pure Parallel No Change in the failure rate of surviving items after failure of a companion item. Shared Parallel Failure rate of remaining items change after failure of a companion item. Standby Redundancy Has alternate items activated upon failure of the first item. Only one item is operating at a time to accomplish the function. One items failure rate affects the failure characteristics of others as they are now more susceptible to failure beause they are now under load. Hot Standby Same as Active Standby or Active Redundancy. Cold Standby (Passive) Normally not operating. Do not fail when they are on cold standby. Failure of an item forces standby item to start operating. Warm Standby Normally active or operational, but not under load. Failure rate will be less due to lower stress. R-out-of-n Systems Redundant system consisting of n items in which r of the n items must function for the system to function (voting decision).
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