The document outlines the modules and topics covered in a VLSI design course. Module I introduces VLSI design methodologies and flow, as well as fabrication of MOSFETs. Module II covers static and switching characteristics of MOS inverters and combinational logic circuits. Module III discusses sequential logic circuits, dynamic logic circuits, semiconductor memories, and design for testability. The accompanying lab portion involves designing, simulating, synthesizing, and testing combinational and sequential logic circuits, as well as layout design of basic gates and an ALU/microprocessor.
The document outlines the modules and topics covered in a VLSI design course. Module I introduces VLSI design methodologies and flow, as well as fabrication of MOSFETs. Module II covers static and switching characteristics of MOS inverters and combinational logic circuits. Module III discusses sequential logic circuits, dynamic logic circuits, semiconductor memories, and design for testability. The accompanying lab portion involves designing, simulating, synthesizing, and testing combinational and sequential logic circuits, as well as layout design of basic gates and an ALU/microprocessor.
The document outlines the modules and topics covered in a VLSI design course. Module I introduces VLSI design methodologies and flow, as well as fabrication of MOSFETs. Module II covers static and switching characteristics of MOS inverters and combinational logic circuits. Module III discusses sequential logic circuits, dynamic logic circuits, semiconductor memories, and design for testability. The accompanying lab portion involves designing, simulating, synthesizing, and testing combinational and sequential logic circuits, as well as layout design of basic gates and an ALU/microprocessor.
The document outlines the modules and topics covered in a VLSI design course. Module I introduces VLSI design methodologies and flow, as well as fabrication of MOSFETs. Module II covers static and switching characteristics of MOS inverters and combinational logic circuits. Module III discusses sequential logic circuits, dynamic logic circuits, semiconductor memories, and design for testability. The accompanying lab portion involves designing, simulating, synthesizing, and testing combinational and sequential logic circuits, as well as layout design of basic gates and an ALU/microprocessor.
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VLSI DESIGN
Module I 08 Hours Introduction: Historical Perspective, VLSI Design Methodologies, VLSI Design Flow, Design Hierarchy, Concept of Regularity, Modularity and Locality, VLSI Design Styles, Computer-Aided Design Technology. Fabrication of MOSFETs: Introduction, Fabrication Processes Flow Basic Concepts, The CMOS n-Well Process, Layout Design Rules, Stick Diagrams, Full-Customs Mask Layout Design. MOS Transistor: The Metal Oxide Semiconductor (MOS) Structure, The MOS System under External Bias, Structure and Operation of MOS Transistor (MOSFET), MOSFET Current-Voltage Characteristics, MOSFET Scaling and Small-Geometry Effects, MOSFET Capacitance. (Chapter 1 to 3 of Text Book 1 and for Stick Diagram Text Book 2) Module II 14 Hours MOS Inverters Static Characteristics: Introduction, Resistive-Load Inverters, Inverters with n-Type MOSFET Load, CMOS Inverter. MOS Inverters Switching Characteristics and Interconnect Effects: Introduction, Delay-Time Definitions, Calculation of Delay-Times, Inverter Design with Delay Constraints, Estimation of Interconnect Parasitics, Calculation of Interconnect Delay, Switching Power Dissipation of CMOS Inverters. Combinational MOS Logic Circuits: Introduction, MOS Logic Circuits with Depletion nMOS Loads, CMOS Logic Circuits, Complex Logic Circuits, CMOS Transmission Gates (Pass Gates). (Chapter 5 to 7 of Text Book 1) Module III 18 Hours Sequential MOS Logic Circuits: Introduction, Behaviour of Bistable Elements, SR Latch Circuits, Clocked Latch and Flip-Flop Circuits, CMOS D-Latch and Edge-Triggered FlipFlop. Dynamic Logic Circuits: Introduction, Basic Principles of Pass Transistor Circuits, Voltage Bootstrapping, Synchronous Dynamic Circuit Techniques, Dynamic CMOS Circuit Techniques, High Performance Dynamic CMOS Circuits. Semiconductor Memories: Introduction, Dynamic Random Access Memory (DRAM), Static Random Access Memory (SRAM), Non-volatile Memory, Flash Memory. Design for Testability: Introduction, Fault Types and Models, Ad Hoc Testable Design Techniques, Scan-Based Techniques, Built-In Self-Test (BIST) Techniques, Current Monitoring IDDQ Test. Text Books: 1. Sung-Mo Kang and Yusuf Leblebici, CMOS Digital Integrated Circuits: Analysis and Design, 3rd Edn., Tata McGraw-Hill Publishing Company Limited, 2003. 2. K. Eshraghian and N.H.E. Weste, Principles of CMOS VLSI Design a Systems Perspective, 2nd Edn., Addison Wesley, 1993. Reference Books: 1. Jan M. Rabaey, Anantha Chandrakasan, Borivoje Nikolic, Digital Integrated Circuits A Design Perspective, 2nd Edn., PHI. 2. Wayne Wolf, Modern VLSI Design System on Chip Design, 3rd Edn., PHI. 3. Debaprasad Das, VLSI Design, Oxford University Press, New Delhi, 2010. 4. John P. Uyemura, CMOS Logic Circuit Design, Springer (Kluwer Academic Publishers), 2001. 5. Ken Martin, Digital Integrated Circuit Design, Oxford University Press, 2000.
VLSI DESIGN LABORATORY
1. Design Entry and simulation of combinational logic circuits (8 bit adders, 4 bit multipliers, address decoders, multiplexers), Test bench creation, functional verification, and concepts of concurrent and sequential execution to be highlighted. Design Entry and simulation of sequential logic circuits (counters, PRBS generators, accumulators). Test bench creation, functional verification, and concepts of concurrent and sequential execution to be highlighted. Synthesis, P&R and Post P&R simulation for all the blocks/codes developed in Expt. No. 1 and No. 2 given above. Concepts of FPGA floor plan, critical path, design gate count, I/O configuration and pin assignment to be taught in this experiment. Generation of configuration/fuse files for all the blocks/codes developed as part of Expt.1. and Expt. 2. FPGA devices must be configured and hardware tested for the blocks/codes developed as part of Expt. 1. and Expt. 2. The correctness of the inputs and outputs for each of the blocks must be demonstrated at least on oscilloscopes (logic analyzer preferred). Design a schematic and simple layout for CMOS Inverter, parasitic extraction and simulation. Design a schematic and simple layout for CMOS NAND gate, parasitic extraction and simulation. Design a schematic and simple layout for CMOS NOR gate, parasitic extraction and simulation. Design an ALU or a 4-bit Microprocessor with limited instructions.
