Electrical Testing Measurement Handbook Vol 7
Electrical Testing Measurement Handbook Vol 7
Electrical Testing Measurement Handbook Vol 7
Handbook
Volume 7
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TABLE OF CONTENTS
ELECTRICAL MEASUREMENT AND TESTING CONTACT-LESS SENSING AND THE AUTO-DETECT INFRASTRUCTURE Forward - Khaled Nigim . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5 DONT RISK IT: USE CORRECT ELECTRICAL MEASUREMENT TOOLS AND PROCEDURES TO MINIMIZE RISK AND LIABILITY Larry Eccleston . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7 ISOLATION TECHNOLOGIES FOR RELIABLE INDUSTRIAL MEASUREMENTS National Instruments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11 RESISTANCE MEASUREMENTS, THREE- AND FOUR-POINT METHOD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15 CLAMP-ON GROUND RESISTANCE TESTER, MODELS 3711 & 3731 STEP-BY-STEP USAGE Chauvin Arnoux, Inc. and AEMC Instruments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21 MEASURING MAGNETIC FIELDS, ELECTRIC AND |MAGNETIC FIELDS Australian Radiation Protection and Nuclear Agency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23 ELECTRIC AND MAGNETIC FIELDS, MEASUREMENTS AND POSSIBLE EFFECT ON HUMAN HEALTH, WHAT WE KNOW AND WHAT WE DONT KNOW IN 2000 California Department of Health Services and the Public Health Institute California Electric and Magnetic Fields Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25 A NEW APPROACH TO QUICK, ACCURATE, AFFORDABLE FLOATING MEASUREMENTS Tektronix IsolatedChannel Technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .31 HIGH-VOLTAGE MEASUREMENTS AND ISOLATION -GENERAL ANALOG CONCEPTS NI Analog Resource Center. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .35 STANDARD MEASUREMENTS: ELECTRIC FIELDS DUE TO HIGH VOLTAGE EQUIPMENT Ralf Mller and Hans-Joachim Frster . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .39 IDENTIFICATION OF CLOSED LOOP SYSTEMS NI Analog Resource Center . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43 SELECTING AND USING TRANSDUCERS FOR TRANSFORMERS FOR ELECTRICAL MEASUREMENTS William D. Walden . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .45 HOW TO TROUBLESHOOT LIKE AN EXPERT, A SYSTEMATIC APPROACH Warren Rhude, Simutech Multimedia Inc. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .53 ELECTRICAL INDUSTRIAL TROUBLESHOOTING Larry Bush . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55 THE ART OF MEASURING, LOW RESISTANCE Tee Sheffer and Paul Lantz, Signametrics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59 STANDARDS FOR SUPERCONDUCTOR AND MAGNETIC MEASUREMENTS National Institute of Standards and Technology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63 MULTI CHANNEL CURRENT TRANSDUCER SYSTEMS DANFYSIK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .67 FALL-OF-POTENTIAL GROUND TESTING, CLAMP-ON GROUND TESTING COMPARISON Chauvin Arnoux, Inc.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .69 AN INTRODUCTION TO ANTENNA TEST RANGES, MEASUREMENTS AND INSTRUMENTATION Jeffrey A. Fordham Microwave Instrumentation Technologies, LLC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .71
DERIVING MODEL PARAMETERS FROM FIELD TEST MEASUREMENTS J.W. Feltes, S. Orero, B. Fardanesh,E. Uzunovic, S. Zelingher, N. Abi-Samra . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .79 TESTING ELECTRIC STREETLIGHT COMPONENTS WITH LABVIEW-CONTROLLED VIRTUAL INSTRUMENTATION Ahmad Sultan, Computer Solutions, Inc. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85 ASSET MANAGEMENT, THE PATH TO MAINTENANCE EXCELLENCE Mike Sondalini, Feed Forward UP-TIME Publications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87 THINK SYNCHRONIZATION FIRST TO OPTIMIZE AUTOMATED TEST ni.com . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .89 USING NATIONAL INSTRUMENTS SYSTEM IDENTIFICATION, CONTROL DESIGN AND SIMULATION PRODUCTS FOR DESIGNING AND TESTING A CONTROLLER FOR AN UNIDENTIFIED SYSTEM ni.com . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .93 MAGNETO-MECHANICAL MEASUREMENTS FOR HIGH CURRENT APPLICATIONS Jack Ekin, NIST- Electromagnetic Division . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101 A BASIC GUIDE TO THERMOGRAPHY Land Instruments International Infrared Temperature Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .105
ELECTRICAL MEASUREMENT AND TESTING CONTACT-LESS SENSING AND THE AUTO-DETECT INFRASTRUCTURE
Forward by Khaled Nigim
Maintaining a highly functional electric system is dependent on the operational and maintenance level of the integrated components that are geared together to serve the customer. An effective preventive maintenance setup is dependent on the reliability of the sensing devices and relaying instrumentation as well as on the operators understanding of the process functionality. Early measuring devices were designed and based on electromechanical indicating instrumentation. Their solo operability necessitated around the clock operator attention. Such devices were accurate but provided limited adaptability for interfacing with todays centralized centers. As the semi-conducting integrated circuits devices start to invade the market, many instruments are now inter-actable with each other and some can be used to sense and record data from various sensing elements in a sequential manner and generate their own diagnostic reports within a very brief time. Todays sensors are built around plug-and-play infrastructure which is based on the IEEE 1451.4 standard that brings plug-and-play capabilities to the world of transducers. With plug-and-play technology, the operator stores a Transducer Electronic Datasheet (TEDS) directly on a sensor. The sensor identifies itself with all needed information once and is hooked to a data bus. TEDScompatible measurement systems can auto-detect and automatically configure these smart sensors for measurement, reducing setup time and eliminating transcription errors that commonly occur during sensor configuration. This enables the operator to focus on overall system operation rather than on individual component operation. Furthermore, measuring relaying units and associated sensing elements technologies has advanced rapidly over the past 20 years. A particular advancement is noted in the contactless measuring sensors and measured data handling capability. This progression in the testing and measurement field provides a wider scope of applications and shorter time for interrupting early failure signals. As an example, the cases where infra-red imaging techniques are used are now part of the routine maintenance of distribution transformers. The infrared image indicates the hottest spot and temperature distribution inside a large distribution transformer without the need of embedding sensors. Earlier techniques for measuring temperature were based on collecting data from various temperature sensors entrenched inside the transformer windings. If one or more sensors were faulty, the gathered data would be incomplete and the transformer has to be taken out of service. Replacing the sensors is a timely and costly procedure. Todays data handling and processors that either control the data flow from one or more sensors or part of the human machine interface supervisory system, have the capability to run self-diagnostics routines to alert the operator to any abnormal behavior from the various sensing elements, and generate a check list to help figure out any culprits. This edition of the Electrical Testing and Measurement Handbook introduces the fundamental applications of electrical testing and instrumentation and guidelines on the correct procedures, and how to interpret and diagnose measured reports that enable the operator to maintain a high degree of functionality of the system with minimum interruption. This handbook addresses various practical aspects of todays electrical engineering infrastructure through selected articles available for scientific sharing. The articles are grouped into 4 sections. Section 1 addresses the basics and fundamentals of electric testing techniques using various measuring sensors normally incorporated in many of today measuring instruments. Section 2 addresses safe operation, procedures and handling of instruments. Section 3 introduces various sensing and measuring devices that can be used in a wide area of application. And finally, section 4 showcases field applications of instrumentation in various parts of the electrical engineering industry. The Electricity Forum endeavors to provide correct and timely information for their readers in their handbook series. We welcome readers suggestions and constructive feedback, and contributions. Please submit your technical articles that show case your experience in testing and measurement tools and systems directly to the handbook editors desk ([email protected]).
DONT RISK IT: USE CORRECT ELECTRICAL MEASUREMENT TOOLS AND PROCEDURES TO MINIMIZE RISK AND LIABILITY
Larry Eccleston, Product Testing Manager, Fluke Corporation, Member, IEC Standards Committee 1. EXECUTIVE SUMMARY
Between five and ten times on any given day, arc flash explosions sufficient to send a burn victim to a special burn center take place in the U.S. These incidents and other less serious electrical accidents result in injury sometimes death lost work time, medical costs and insurance claims, downtime, the list goes on. The cost to both the victim, the victims family and the company involved, are high. Yet many of these accidents can be prevented. The combination of training, good measurement technique, and the use of proper tools can significantly reduce the chance of an accident occurring. electrical accidents: disruption of operations, higher insurance costs, litigation and, most importantly, human suffering. In todays society, where medical costs are escalating and lawsuits are common, wise managers will take every step to reduce the level of risk, help increase employee safety and minimize the organizations operational and financial exposure. This means that management must ensure that employees use appropriate personal protective equipment, including new-generation test tools independently tested to help ensure that they perform up to specification. And employees must use that equipment correctly, and receive training in safe electrical measurement procedures.
IS YOUR COMPANY AT RISK? HOW WOULD YOU ANSWER THE FOLLOWING QUESTIONS?
1. Do you have a documented electrical measurement safety program? 2. Do you regularly inspect your electrical measurement equipment for damage that could imperil safety? 3. Do your workers involved in taking electrical measurements receive annual, intensive training on how to work safely? 4. Does your organization insure that only properly rated test instruments are used in your facility? If you answered yes to three of the questions above, congratulations youre doing a better job than most employers to reduce the chance of accidents associated with taking electrical measurements. But theres still room to do more. This resource kit was designed to help you develop an electrical measurement safety program that significantly reduces your risk. The high-energy electrical systems common in todays workplace bring not only increased efficiency, but increased levels of hazard and risk for electrical workers and their employers. Workers taking electrical measurements on high-energy systems frequently work close to potentially lethal electrical currents. This danger can significantly increase due to the presence of transient voltage spikes. Transient spikes riding on these powerful industrial currents can produce the conditions that cause the extremely hazardous phenomenon of arc flash. To help manage the risks inherent in high-energy electrical systems, national and international standards bodies have developed rules that categorize electrical environments according to their potential danger. Personal protective equipment, including test instruments, is categorized according to the NFPA-70E Standard for Electrical Safety Requirements for Employee Workplaces, related to the incident energy levels and arc flash boundary distances. To help ensure safety in todays high-energy, high-hazard environments, leading manufacturers have re-engineered their test instruments to enhance both reliability and safety. Such tools can help companies avoid the many perils caused by high-energy
8 As a result of these trends, industrial and business operations today incorporate higher levels of electrical energy, which can lead to increased hazard and risk for those who build and maintain these systems. It is common for industrial and commercial maintenance workers and electricians to work with high levels of energy. In the U.S., 480-volt, three-phase electrical supply systems are commonplace. In Canada, systems use up to 600 volts. Although classified as low voltage, both 480-volt and 600-volt systems can easily deliver potentially lethal amounts of current sufficient to fuel an arc flash an extremely hazardous occurrence.
Electrical Testing and Measurement Handbook Vol. 7 burn center take place in the U.S.
Electrical Testing and Measurement Handbook Vol. 7 be designed for the environment to which they will be exposed, and for the manner in which they will be used. (Part II, Chapter 3, Paragraph 3-4.10.2) A table included in NFPA Standard 70E, Table 3-3.9, Hazard Risk Category Classifications, provides additional guidance regarding the personal protective equipment recommended for use in work on a variety of equipment types at various voltage levels.i
10 Visually inspect for frayed or broken wires. The length of exposed metal on test probe tips should be minimal. Test leads can fail internally, creating a hazard that cannot be detected through visual inspection. But it is possible to use the meters own continuity testing function to check for internal breaks. Step 1: Insert leads in V/ and COM inputs Step 2: Select , touch probe tips. Good leads are 0.1 0.3 .
NFPA 70E Standard for Electrical Safety Requirements for Employee Workplaces, 2000 Edition, pages 55 through 58. 2000 NFPA
ii
For more information on these testing organizations, visit their websites: http://www.ul.com/ http://www.csa.ca/Default.asp?language=English http://www.tuvamerica.com/services/electrical/lowvolt.cfm
NFPA 70E Standard for Electrical Safety Requirements for Employee Workplaces, 2000 Edition, page 63. 2000 NFPA
iii iv
Ibid, pp 64-66.
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UNDERSTANDING ISOLATION
Isolation electrically separates the sensor signals, which can be exposed to hazardous voltages1, from the measurement systems low-voltage backplane. Isolation offers many benefits including: Protection for expensive equipment, the user, and data from transient voltages Improved noise immunity Ground loop removal Increased common-mode voltage rejection Isolated measurement systems provide separate ground planes for the analog front end and the system backplane to separate the sensor measurements from the rest of the system. The ground connection of the isolated front end is a floating pin that can operate at a different potential than the earth ground. Figure 1 represents an analog voltage measurement device. Any commonmode voltage that exists between the sensor ground and the measurement system ground is rejected. This prevents ground loops from forming and removes any noise on the sensor lines.
Figure 1. Bank Isolated Analog Input Circuitry Hazardous Voltages are greater than 30 Vrms, 42.4 Vpk or 60 VDC Figure 2. Isolated Data Acquisition Systems
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Electrical Testing and Measurement Handbook Vol. 7 second coil by placing it in close vicinity of the changing magnetic field from the first coil. The voltage and current induced in the second coil depend on the rate of current change through the first. This principle is called mutual induction and forms the basis of inductive isolation.
OPTICAL COUPLING
LEDs produce light when a voltage is applied across them. Optical isolation uses an LED along with a photo-detector device to transmit signals across an isolation barrier using light as the method of data translation. A photo-detector receives the light transmitted by the LED and converts it back to the original signal.
Inductive isolation uses a pair of coils separated by a layer of insulation. Insulation prevents any physical signal transmission. Signals can be transmitted by varying current flowing through one of the coils, which causes a similar current to be induced in the second coil across the insulation barrier. Inductive isolation can provide high-speed transmission similar to capacitive techniques. Because inductive coupling involves the use of magnetic fields for data transmission, it can be susceptible to interference from external magnetic fields.
CAPACITIVE COUPLING
Capacitive isolation is based on an electric field that changes based on the level of charge on a capacitor plate. This charge is detected across an isolation barrier and is proportional to the level of the measured signal. One advantage of capacitive isolation is its immunity to magnetic noise. Compared to optical isolation, capacitive isolation can support faster data transmission rates because there are no LEDs that need to be switched. Since capacitive coupling involves the use of electric fields for data transmission, it can be susceptible to interference from external electric fields.
INDUCTIVE COUPLING
In the early 1800s, Hans Oersted, a Danish physicist, discovered that current through a coil of wire produces a magnetic field. It was later discovered that current can be induced in a
Figure 6b. Digital Isolation
Electrical Testing and Measurement Handbook Vol. 7 The following sections cover analog and digital isolation in more detail and explore the different techniques for implementing each.
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ANALOG ISOLATION
The isolation amplifier is generally used to provide isolation in the analog front end of data acquisition devices. ISO Amp in Figure 6a represents an isolation amplifier. The isolation amplifier in most circuits is one of the first components of the analog circuitry. The analog signal from a sensor is passed to the isolation amplifier which provides isolation and passes the signal to the analog-to-digital conversion circuitry. Figure 7 represents the general layout of an isolation amplifier.
Figure 8. Use of Isolation Amplifiers in Flexible Signal Conditioning Hardware
DIGITAL ISOLATION
Analog-to-digital converters are one of the key components of any analog input data acquisition device. For best performance, the input signal to the analog-to-digital converter should be as close to the original analog signal as possible. Analog isolation can add errors such as gain, non-linearity and offset before the signal reaches the ADC. Placing the ADC closer to the signal source can lead to better performance. Analog isolation components are also costly and can suffer from long settling times. Despite better performance of digital isolation, one of the reasons for using analog isolation in the past was to provide protection for the expensive analog-to-digital converters. As the ADCs prices have significantly declined, measurement equipment vendors are choosing to trade ADC protection for better performance and lower cost offered by digital isolators (see Figure 9).
In an ideal isolation amplifier, the analog output signal is the same as the analog input signal. The section labeled isolation in Figure 7 uses one of the techniques discussed in the previous section (optical, capacitive, or inductive coupling) to pass the signal across the isolation barrier. The modulator circuit prepares the signal for the isolation circuitry. For optical methods, this signal needs to be digitized or translated into varying light intensities. For capacitive and inductive methods, the signal is translated into varying electric or magnetic fields. The demodulator circuit then reads the isolation circuit output and converts it back into the original analog signal. Because analog isolation is performed before the signal is digitized, it is the best method to apply when designing external signal conditioning for use with existing non-isolated data acquisition devices. In this case, the data acquisition device performs the analog-to-digital conversion and the external circuitry provides isolation. With the data acquisition device and external signal conditioning combination, measurement system vendors can develop general-purpose data acquisition devices and sensor-specific signal conditioning. Figure 8 shows analog isolation being implemented with flexible signal conditioning that uses isolation amplifiers. Another benefit to isolation in the analog front end is protection for the ADC and other analog circuitry from voltage spikes. There are several options available on the market for measurement products that use a general-purpose data acquisition device and external signal conditioning. For example, the National Instruments M Series includes several non-isolated, general-purpose multifunction data acquisition devices that provide high-performance analog I/O and digital I/O. For applications that need isolation, you can use the NI M Series devices with external signal conditioning, such as the National Instruments SCXI or SCC modules. These signal conditioning platforms deliver the isolation and specialized signal conditioning needed for direct connection to industrial sensors such as load cells, strain gages, pH sensors, and others.
Figure 9. Declining Price of 16-Bit Analog-to-Digital Converters Graph Source: National Instruments and a Leading ADC Supplier
Compared to isolation amplifiers, digital isolation components are lower in cost and offer higher data transfer speeds. Digital isolation techniques also give analog designers more flexibility to choose components and develop optimal analog front ends for measurement devices. Products with digital isolation use currentand voltage-limiting circuits to provide ADC protection. Digital isolation components follow the same fundamental principles of optical, capacitive, and inductive coupling that form the basis of analog isolation.
14 Leading digital isolation component vendors such as Avago Technologies (www.avagotech.com), Texas Instruments (www.ti.com), and Analog Devices (www.analog.com) have developed their isolation technologies around one of these basic principles. Avago Technologies offers digital isolators based on optical coupling, Texas instruments bases its isolators on capacitive coupling, and Analog Devices isolators use inductive coupling.
Electrical Testing and Measurement Handbook Vol. 7 encoding and converts rising and falling edges on the digital lines to 1 ns pulses. These pulses are transmitted across the isolation barrier using the transformer and decoded on the other side by the receiver circuitry (see Figure 11). The small size of the transformers, about three-tenths of a millimeter, makes them practically impervious to external magnetic noise. iCouplers can also lower measurement hardware cost by integrating up to four isolated channels per integrated circuit (IC) and, compared to optocouplers, they require fewer external components.
OPTOCOUPLERS
Optocouplers, digital isolators based on the optical coupling principles, are one of the oldest and most commonly used methods for digital isolation. They can withstand high voltages and offer high immunity to electrical and magnetic noise. Optocouplers are often used on industrial digital I/O products, such as the National Instruments PXI-6514 isolated digital input/output board (see Figure 10) and National Instruments PCI-7390 industrial motion controller.
Figure 11. Introduction Coupling-Based iCoupler Technology from Analog Devices Source: Analog Devices (www.analog.com/iCoupler)
Measurement hardware vendors are using iCouplers to offer high-performance data acquisition systems at lower costs. National Instruments industrial data acquisition devices intended for high-speed measurements, such as the isolated M Series multifunction data acquisition devices, use iCoupler digital isolators (see Figure 12). These devices provide 60 VDC continuous isolation and 1,400 Vrms/1,900 VDC channel-to-bus isolation withstand for 5 s on multiple analog and digital channels and support sampling rates up to 250 kS/s. National Instruments C Series modules used in the NI PAC platform, NI CompactRIO, NI CompactDAQ, and other high-speed NI USB devices also use the iCoupler technology.
Figure 10. Industrial Digital I/O Products Optpcouplers
For high-speed analog measurements, optocouplers, however, suffer from speed, power dissipation, and LED ware limitations associated with optical coupling. Digital isolators based on capacitive and inductive coupling can alleviate many optocoupler limitations.
CAPACITIVE ISOLATION
Texas Instruments offers digital isolation components based on capacitive coupling. These isolators provide high data transfer rates and high transient immunity. Compared to capacitive and optical isolation methods inductive isolation offers lower power consumption.
INDUCTIVE ISOLATION
iCoupler technology, introduced by Analog Devices in 2001 (www.analog.com/iCoupler), uses inductive coupling to offer digital isolation for high-speed and high-channel-count applications. iCouplers can provide 100 Mb/s data transfer rates with 2,500 V isolation withstand; for a 16-bit analog measurement system that implies sampling rates in the mega hertz range. Compared to optocouplers, iCouplers offer other benefits such as reduced power consumption, high operating temperature range up to 125 C, and high transient immunity up to 25 kV/ms. iCoupler technology is based on small, chip-scale transformers. An iCoupler has three main parts a transmitter, transformers, and a receiver. The transmitter circuit uses edge trigger
SUMMARY
Isolated data acquisition systems can provide reliable measurements for harsh industrial environments with hazardous voltages and transients. Your need for isolation is based on your measurement application and surrounding environments. Applications that require connectivity to different specialty sensors using a single, general-purpose data acquisition device can benefit from external signal conditioning with analog isolation. Where as applications needing lower-cost, high-performance analog inputs benefit from measurement systems with digital isolation technologies.
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Figure 1
To avoid errors due to galvanic currents in the earth, TPI ground test instruments use an AC current source. A frequency other than 60 hertz is used to eliminate the possibility of interference with stray 60 hertz currents flowing through the earth. The three-point measurement technique is utilized to eliminate the effect of lead length. The test procedure, known as the Fall-of-Potential Method, is described on the following page.
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Electrical Testing and Measurement Handbook Vol. 7 When making a test where sufficient spacing exists, the instrument will read zero or very near zero when the P2 potential probe is placed near the ground-under-test. As the electrode is moved out toward the remote electrode, a plateau will be reached where a number of readings is approximately the same value (the actual ground resistance is that which is measured at 62% of the distance between the ground mat being tested and the remote current electrode). Finally, as the potential probe approaches the remote current electrode, the resistance reading will rise dramatically. It is not absolutely necessary to make a number of measurements as described above and to construct a graph of the readings. However, we recommend this as it provides valuable data for future reference and, once you are setup, it takes only a few minutes to take a series of readings. The electrical fields associated with the ground grid and the remote electrodes are illustrated on AN0009-5. An actual ground test is detailed on AN0009-6, and a sample Ground Test Form is provided on AN0009-7. See AN0009-8 for a simple shop-built wire reel assembly for testing large ground systems.
Figure 2
SHORT-CUT METHOD
The short cut method described here determines the ground resistance value and verifies sufficient electrode spacing and it does save time. This procedure uses the 65' leads supplied with the TPI instruments. Connect the T1 instrument jack with the 15' green lead to the ground system being tested. Connect the T3 instrument jack with the red lead to the remote current electrode (spike) placed at distance of 65' (full length of conductor) from the ground grid being tested. Connect the T2 instrument jack with the black lead to the potential probe placed at 40 feet (62% of the 65' distance) from the ground grid being tested and measure the ground resistance. Move the P2 potential probe 6' (10% of the total distance) to either side of the 40' point and take readings at each of these points. If the readings at these two points are essentially the same as that taken at the 40' point, a measurement plateau exists and the 40' reading is valid. A substantial variation between readings indicates insufficient spacing.
Figure 3
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Figure 4
EQUAL-POTENTIAL PLANES
THE EXISTENCE OF EQUAL-POTENTIAL PLANES
When current flows through the earth from a remote test electrode (in the case of a ground test) or remote fault, the voltage drop which results from the flow of current through the resistance of the earth can be illustrated by equal-potential planes. The equal-potential planes are represented in the dashed lines in drawings below where the spacing between concentric lines represents some fixed value of voltage. The concentration of the voltage surrounding a grounding element is greatest immediately adjacent to that ground. This is shown by the close proximity of lines at the point where the current enters the earth and again at the point where the current leaves the earth and returns to the station ground mat. In order to achieve a proper test using the Fall-of-Potential Ground Test Method, sufficient spacing must exist between the station ground mat being tested and the remote current electrode such that the equal-potential lines do not overlap. As shown by the black line in the Sample Plot, adequate electrode spacing will result in the occurrence of a plateau on the resistance plot. This plateau must exist at 62% of the distance between the ground mat and the remote electrode for the test to be valid. Insufficient spacing results in an overlap of these equal-potential planes, as illustrated at the bottom of this page and by the red line on the Sample Plot. See the Safety Note on AN0009-6 for information on the hazards of Step and Touch-Potentials.
Figure 5
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Figure 6
Ground Test Data Remote Current Probe C2 @ 100 Feet P2 Distance from Transformer in Feet 10 20 30 40 50 60 62* 70 80 90 100 * Actual Ground resistance. Instrument Reading in Ohms 1.83 3.59 3.85 3.95 4.0 4.25 4.3 4.5 5.4 7.3 25.02
TEST PROCEDURE
Terminal T1 of the TPI MFT5010 tester was connected to the transformer case ground with the short green lead. The remote Current Probe C2 was driven in the ground at a location 100 feet from the transformer and connected to Terminal T3 of the instrument with the red test lead.
Terminal T2 of the tester was connected, using the 100' black lead, to the P2 potential probe. This ground stake was inserted into the ground at 10' intervals and a resistance measurement was made at each location and recorded in the table above. The relatively constant readings in the 4 ohm range between 40 and 70 feet are a definite plateau that indicates sufficient lead
Electrical Testing and Measurement Handbook Vol. 7 spacing. The initial readings close to the transformer are lower, and there is a pronounced tip-up as the P2 probe approaches the remote current electrode C2.
19 The measured ground resistance at 62 feet (62% of the distance) was 4.3 ohms and is taken as the system ground resistance. This is an excellent value for this type of an installation.
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REEL ASSEMBLY
A SHOP-BUILT GROUND TEST WIRE REEL ASSEMBLY
This simple, low-cost, and easy-to-build wire reel assembly is handy for making Ground (Earth) Resistance measurements on large ground systems. The unit shown below has 500 feet of wire for testing medium-to-large ground fields typical of those found in industrial plants and substations. For testing even larger systems, such as those installed for power generating plants, wire lengths of 1000 feet can be used. Wrap-on wire markers are installed every ten feet on the current lead to simplify placement of the remote current and potential probes. Your electrical distributor will probably have empty surplus reels available for the asking the ones shown below are about 12 inches in diameter. The conductor is standard #12 THHN. Even though the TPI ERT1500 and the MFT5010 use an AC test signal, the test results are unaffected by the inductance of any wire left on the reels.
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10. Wait for reading to stabilize and record reading. Lock reading by pressing HOLD. 11. Remove instrument from ground wire or rod and reclamp to gauge. 12. Observe reading the reading should be within 1.0W of gauge value. If reading is OK measurement is valid. If reading is wrong, clean instrument (see instructions below) and repeat from step 4.
3. Check calibration locate the 25W calibration gauge supplied with the tester and clamp the meter around any leg of the gauge.
step 3
22 ment is oriented such that no debris or filings will fall into the unit while cleaning. Check with your finger afterwards to be sure that no foreign material remains on the jaw surfaces (both top and bottom).
Electrical Testing and Measurement Handbook Vol. 7 on the LCD. The important points to consider for proper use of the clamp-on ground tester are: 1. There is a series-parallel resistance path down stream from the measurement point that is lower in resistance than the point being measured. 2. That the earth is the return path to the point where the clamp-on meter is connected and not wire or other metal structures (see Figure C). 3. If the measurement point is not connected to a seriesparallel low resistance network (such as the case with a single rod), a temporary path may be created by connecting a jumper cable from the measurement point to a low resistance like a pole ground (see Figure D).
PRINCIPLES OF OPERATION
Usually, a common distribution line grounded system can be simulated as a simple basic circuit as shown in Figure A or an equivalent circuit, shown in Figure B. If voltage E is applied to any measured grounding system. Rx through a special transformer (used in Models 3711 and 3731), current I flows through
the circuit, thereby establishing the following equation. Therefore, E/I = Rx is established. If it is detected with E kept constant, measured grounding resistance can be obtained. Refer again to Figures A and B. Current is fed to a special transformer via a power amplifier from a 2.3 kHz constant voltage oscillator. This current is detected by a detection CT. Only the 2.3 kHz signal frequency is amplified by a filter amplifier. This occurs before the A/D conversion and after synchronous rectification. It is then displayed on the LCD of the Model 3711/3731 meter. The filter amplifier is used to cut off both earth current at commercial frequency and high-frequency noise. Voltage is detected by coils wound around the injection CT, which is then amplified, rectified, and compared by a level comparator. If the clamp is not closed properly, an open jaw annunciator appears
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HEALTH EFFECTS
Currently there is no evidence that exposure to electric fields is a health hazard (excluding electric shock). Whether exposure to magnetic fields is equally harmless remains an open question. A large number of scientific studies performed on animals and cells have not found a health risk. Some epidemiological studies, however, have suggested a weak link between intense and prolonged exposure to magnetic fields and childhood leukaemia.
PERFORMING MEASUREMENTS
Measurements of the magnetic field in the home are generally taken in the middle of the room at about one metre from the ground or in locations where people spend a significant amount of time, for example, the bed. Measurements should also be performed several times over the course of a day. This is to allow for possible variations to electricity demand which presumably would peak during the evening at about 7.00 pm. Measurements can also be made at any other locations of interest. It is important to remember that, as mentioned earlier, research suggests that if any health effects exist, they are associated with prolonged magnetic field exposure. Measurements taken with the gauss meter are instantaneous (i.e. measured at one point in time) and do not accurately reflect prolonged exposure levels.
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26 periods of sudden loudness or a constant tone, and can be pure or jarring. Similarly, magnetic fields can be strong or weak, be of high frequency (radio waves) or low frequency (powerline waves), have sudden increases (transients) or a constant strength, consist of one pure frequency or a single dominant frequency with some distortion of other higher frequencies (harmonics). It is also important to describe the direction of magnetic fields in relation to the flow of current. For instance, if a magnetic field oscillates back and forth in a line it is linearly polarized. It may also be important to describe how a fields direction relates to other physical conditions such as the earths static magnetic fields.
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DOSE-RESPONSE RELATIONSHIP
A special problem in the study of health effects of environmental factors is how to measure exposure in a way that adequately reflects the true amount of the persons exposure to the substance being studied. This true amount is called the dose. With cigarette smoke and toxic chemicals, there is a positive relationship between the size (or strength) of the dose and the adverse health effect it produces: the higher the dose, the greater the effect. With magnetic fields, however, some laboratory evidence suggests that this is not always the case, and very confusing relationships have been seen. Biological effects or changes appear at strengths of certain levels, disappear at higher levels, only to appear again at still higher levels. Varying the frequency (speed of alternation), for example from 60 Hz to 120 Hz, shows similar effect windows of magnetic fields. To complicate things further, some laboratory experiments have shown an effect with intermittent (pulsed) exposures, others with spikes or transients, and still others with continuous exposure. There is some evidence that the orientation of alternating fields in relation to the direction of the earths static magnetic field is also important in making a biological effect. Generally, the effects observed are only biological changes that may or may not translate into true health effects.
LIMITATIONS OF DIRECT MAGNETIC FIELD MEASUREMENTS MAGNETIC FIELDS GENERATED BY CURRENT FLOWING THROUGH WIRES CAN BE REDUCED
Two wires with current flowing in opposite directions create magnetic fields going in opposite directions. If the wires are placed close together and have currents of similar magnitude the magnetic fields cancel each other. This principle is often used to lower magnetic fields. For example, an underground distribution cable has a hot line (carrying current to the user) and a neutral line (carrying it away) that generate low magnetic fields when they are placed close together. The underground cables can be placed close together because it is possible to insulate them heavily to prevent arcing. Overhead power lines cannot be placed this close together because of the weight of the needed insulation and the need for worker safety. For most distribution and transmission lines, however, California utilities use three-wire or four-wire systems. The current in these lines alternates in strength and direction in slightly different phases (not alternating completely together). It is sometimes possible to optimize these phase differences so that the magnetic fields from the wires cancel each other. Those human health studies investigating the relationship of magnetic field exposure and cancer measured magnetic fields using one-time, short-term measures (i.e., for 24 hours) of one area such as the bedroom, or one-time spot measurements (i.e., for one minute) in several different rooms of the participants homes. It was assumed that these home measurements adequately estimate a persons total exposure. However, these measures can not be used to assess the biological importance of the length of exposure, the number of times there are high exposures, or the presence of other components of the field such as harmonics. Also, field intensity (strength) varies at different times of day and different seasons, depending on electricity use. Dinnertime readings are often higher than readings in the middle of the night. In addition, an area measure may not reflect a personal exposure that is dependent on the amount of time a person spends in the area measured.
1. WEAK FIELDS MAY HAVE TOO LITTLE ENERGY TO CAUSE BIOLOGICAL EFFECTS
The electromagnetic spectrum covers a large range of frequencies (expressed in cycles per second or Hertz). The higher the frequency, the greater the amount of energy in the field. Xrays have very high frequencies, and are able to ionize molecules and break chemical bonds, which damages genetic material and can eventually result in cancer and other health disorders. High frequency microwave fields have less energy than x-rays, but still enough to be absorbed by water in body tissues, heating them and possibly resulting in burns. Radio frequency fields from radio and TV transmitters are another step weaker than microwaves. Although they alternate millions of times per second, they
28 cant ionize molecules and can only heat tissues close to the transmitter. Electric power fields (50 and 60 Hz) have much lower frequencies than even radio waves and hence emit very low energy levels that do not cause heating or breakage of bonds. They do create electrical currents in the body, but in most cases these currents are much weaker than those normally existing in living organisms. For these reasons, many scientists argue that it is unlikely that 60 Hz power frequency magnetic fields at the strengths commonly found in the environment have any physical or biological effects on the body.
Electricity Testing and Measurement Handbook Vol. 7 leukemia and residential proximity to this type of power lines.1 For these studies, a childs exposure to magnetic fields was estimated three ways. First, the type and proximity of power lines (wire codes) near the childs home was assessed. Those houses with lines nearby with the potential to carry high current were classified as high current configuration and were assumed to have higher magnetic field levels (due to higher current) than houses near lower current configuration power lines (figure 1). Second, exposure was estimated by measurements of magnetic fields taken in the childs home at the time of the study often many years after diagnosis of their cancer. And third, exposure was approximated by estimating what the home magnetic field levels were right after the children were diagnosed, using line distance from the house and past utility records of current flow in the lines during the appropriate time period. The NRC made a statistical summary and comparison of these eleven studies. They concluded that children living in high current configuration houses are 1.5 times as likely to develop childhood leukemia than children in other homes. Despite this conclusion, the NRC was a unable to explain this elevated risk and recommended that more research be done to help clarify the issue. One reason for this uncertainty is that wire-code classification assumes that houses with high wire-codes have higher magnetic field levels than low wire-code houses, but high wirecodes may also be a proxy for some type of exposure besides magnetic fields that is not yet understood. For example, high wire-code houses tend to have higher traffic density nearby, resulting in higher air pollution levels. However, traffic density seems to be an unlikely explanation for the wire-code association found in these studies. In 1997, the NRC statement seemed to be contradicted by the findings of Dr. M. S. Linet of the National Cancer Institute in a large epidemiological study1i. Her researchers estimated exposure to magnetic fields in two ways, wire-codes as defined above (based on distance of different types of power lines near the home) and home area measurements. The study found no association between living in high wire-code houses and childhood leukemia. On the other hand, the study found that children living in houses with high average magnetic field levels did have higher rates of cancer in general.
Figure 1. Summary of results of power line distance(wire code) and childhood leukemia studies.
29 magnetic fields? First, no magnetic field epidemiological study has found an association with disease that is as strong as that implicating a two-pack-a-day smoking habit. The strength of the association found for leukemia in electric train engineers, who are exposed to magnetic fields of hundreds of milligauss all day long, is no stronger than the strength of the association relating residential magnetic field levels (generally less than 10 mG) to childhood leukemia. Second, there is no laboratory evidence about magnetic field exposure that is as convincing as that for lung cancer and smoking magnetic field animal studies have been inconsistent. These differences make scientists much more cautious about interpreting the magnetic field epidemiology as dangerous than the environmental tobacco smoke epidemiology.
GOVERNMENTAL REGULATION
STATE REGULATIONS
Lack of understanding has kept scientists from recommending any health-based regulations. Despite this, several states have adopted regulations governing transmission line-generated magnetic fields at the edge of the right-of-way (ROW, the area immediately surrounding power lines left clear for access for maintenance and repairs) because of concern about the risk of electric shock from strong electric fields present in these areas (table 3). All current regulations relate to transmission lines; none govern distribution lines, substations, appliances or other sources of electric and magnetic fields. The California Department of Education requires minimum distances between new schools and the edge of transmission line rights-of-way. The setback guidelines are: 100 feet for 50-133 kV lines, 150 feet for 220-230 kV lines, and 350 feet for 500-550 kV lines. Once again, these were not based on specific biological evidence, but on the rationale that the electric field drops to background levels at the specified distances.
Table 3. Transmission line EMF standards and guide-lines adopted by certain states for utilities rights-of-way (ROW).
OCCUPATIONAL STUDIES
The occupational studies looking at magnetic field exposure and various health outcomes show mixed results. Occupations assumed to have higher than normal magnetic field levels included electricians, telephone linemen, electric welders, electronic technicians, utility workers, electrical engineers and sewing machine operators. In general, but not always, workers of these occupations were more likely to have higher rates of brain tumors, leukemia, testicular tumors and male breast cancer than expected. A particular brain tumor (astrocytoma) occurred more often among men who worked for many years in jobs with high estimated exposure levels such as electricians, linemen, and electrical engineers.3 A large study of Canadian and French utility workers found an association between estimated high magnetic field exposures based on area measures of certain occupations and myeloid leukemia, a rare type of blood cancer.4 On the other hand, another large study found no increase in mortality from brain tumors, leukemia or other cancers among electrical workers with estimated high magnetic field exposure over many years.5 Differences among study results may exist simply because the studies used different study populations and methods for estimating high occupational magnetic field exposure. Also, these surrogate measures estimating high occupational magnetic field levels could be proxies for other types of exposure at work besides magnetic fields.
COMPARING THE SCIENTIFIC EVIDENCE ON MAGNETIC FIELDS TO THAT OF ENVIRONMENTAL TOBACCO SMOKE
There are regulations in place protecting us from environmental tobacco smoke. They are based on the strength of its association with disease and the consistent epidemiological evidence for it. Whats the difference between this evidence and that for
The California Public Utilities Commission (CPUC), upon the recommendation of a Consensus Group composed of citizens, utility representatives, union representatives, and public officials, recommended that the states investor-owned utilities carry out no and low cost EMF avoidance measures in construction of new and upgraded utility projects. This means that 4% of the total project cost is allocated to mitigation measures if these measures will reduce magnetic field strength by at least 15%. The strategy is to address public concern and cope with
30 potential but uncertain risks until a policy based on scientific fact can be developed. The CPUC also followed the Consensus Groups recommendation to establish the research, education and technical assistance programs of the California EMF Program under the guidance of the California Department of Health Services. It is expected to provide information that will be useful to those responsible for making public policy in the future.
Electricity Testing and Measurement Handbook Vol. 7 computer monitor. Table 1 shows how quickly fields fall off as one moves away from appliances they virtually disappear at 35 feet. You might stop using an electric appliance you do not really need. You may also consider home testing, which can identify faulty electrical wiring that can produce shock hazards and current code violations as well as elevated magnetic fields. In California, the investor-owned utilities are required by the CPUC to provide magnetic field measurement at no charge to their customers. So far, in the absence of conclusive scientific evidence, there is no sufficient basis for enacting laws or regulations to limit peoples exposure to EMF, so it is up to individuals to decide what avoidance measures to take, based on the information available.
FEDERAL EFFORTS
At the Federal level, the Federal Energy Policy Act of 1992 included a five-year program of electric and magnetic field (EMF) Research and Public Information Dissemination (EMF-RAPID). The EMF-RAPID Program asked these questions: Does exposure to EMF produced by power generation, transmission, and use of electric energy pose a risk to human health? If so, how significant is the risk, who is at risk, and how can the risk be reduced? In 1998, a working group of experts gathered by the EMF-RAPID Program met to review the research that has been done on the possible health risks associated with EMF. This group reviewed all of the studies that have been done on the subject, and then voted on whether they believed that exposure to EMF might be a health risk. They then published a report describing their findings. A majority of the scientists on this working group voted that the epidemiology studies of childhood leukemia and residential EMF exposures provide enough evidence to classify EMF as a possible human carcinogen.6 This means that, based on the evidence, these researchers believe that it is possible that EMF causes childhood leukemia, but they are not sure. About half of the groups members thought that there is also some evidence that workplace exposure to EMF is associated with chronic lymphocytic leukemia in adults. The group also concluded that there was not enough evidence to determine whether EMF exposure might cause other diseases.6 The EMF-RAPID Program released its final report to Congress in 1999. This report explains the programs findings, including the results of its working group and many research projects. The final report states that the NIEHS believes that there is weak evidence for possible health effects from [power frequency] ELF-EMF exposures, and until stronger evidence changes this opinion, inexpensive and safe reductions should be encouraged.7 (page 38) The report specifically suggests educating power companies and individuals about ways to reduce EMF exposure, and encouraging companies to reduce the fields created by appliances that they make, when they can do so inexpensively7 (page 38). For more information on the EMF-RAPID program or to look at these reports, contact the EMF-RAPID Program, National Institute of Environmental Health Sciences, National Institutes of Health, P.O. Box 12233, Research Triangle Park, North Carolina27709, or visit their Web site at http://www.niehs.nih.gov/ emfrapid. When ordering a copy of the final report, refer to NIH publication number 99-4493.
REFERENCES
1. a) Wertheimer N et al. Electrical wiring configurations and childhood cancer. American Journal of Epidemiology. 1979; 109:273-84. b) Fulton JP et al. Electrical wiring configurations and childhood leukemia in Rhode Island. American Journal of Epidemiology. 1979; 111:292-96. c) Savitz DA et al. Case control study of childhood cancer and exposure to 60-Hz magnetic fields. American Journal of Epidemiology. 1988; 128:21-38. d) Coleman M et al. Leukaemia and residence near electricity transmission equipment: A case-control study. British Journal of Cancer. 1989; 60:793-98. e) London SJ et al. Exposure to residential electric and magnetic fields and risk of childhood leukemia. American Journal of Epidemiology. 1991; 134:923-37. f) Feychting M. et al. Magnetic fields and cancer in children residing near Swedish high-voltage power lines. American Journal of Epidemiology. 1993; 138:467-81. g) Fajardo-Gutierrez AJ et al. Residence close to high-tension electric power lines and its association with leukemia in children (Spanish). Biol Med Hosp Infant Mex. 1993; 50:32-38. h) Petridou ED et al. Age of exposure to infections and risk of childhood leukaemia. British Medical Journal. 1993; 307:774. i) Linet MS et al. Residential exposure to magnetic fields and acute lymphoblastic leukemia in children. New England Journal of Medicine. 1997; 337:1-7. 2. Zaffanella L. Survey of residential magnetic sources. EPRI Final Report. 1993; No. TR 102759-v1. No. TR 102759-v2. 3. Savitz DA et al. Magnetic field exposure in relation to leukemiaand brain cancer mortality and electric utility workers. American Journal of Epidemiology. 1995; 141: 1-12. 4. Theriault G et al. Cancer risk associated with occupationalexposure to magnetic fields among utility workers in Ontario and Quebec, Canada and France. American Journal of Epidemiology. 1994; 139: 550-572. 5. Sahl JD et al. Cohort and nested case-control studies of hematopoietic cancers and brain cancer among electric utility workers. Epidemiology. 1993; 4: 104-114. 6. National Institute of Environmental Health Sciences. Assessment of health effects from exposure to power-line frequency electric and magnetic fields. NIEH Working Group Report. 1998. 7. National Institute of Environmental Health Sciences. Health effects from exposure to power-line frequency electric and magnetic fields. NIEH Final Report ot Congress. 1998.
CONCLUSION
Public concern about possible health hazards from the delivery and use of electric power is based on data that give cause for concern, but which are still incomplete and inconclusive and in some cases contradictory. A good deal of research is underway to resolve these questions and uncertainties. Until we have more information, you can use no and low cost avoidance by limiting exposure when this can be done at reasonable cost and with reasonable effort, like moving an electric clock a few feet away from a bedside table or sitting further away from the
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1 What is the differential measurement range? 2 What is the common mode measurement range? 3 What are the loading characteristics of the probe? Are they balanced or unbalanced? 4 What is the Common Mode Rejection Ratio (CMRR) over the measurement frequency range?
TRADITIONAL OSCILLOSCOPES
Traditional oscilloscopes are limited to making groundreferenced measurements. Lets examine why: Most oscilloscopes have their signal common terminal connected to the protective grounding system, commonly referred to as earth ground or just ground. This is done so that all signals applied to, or supplied from, the oscilloscope have a common connection point. This common connection point is usually the oscilloscope chassis and is held at (or very near to) zero volts by virtue of the third-wire ground in the power cord for AC-powered equipment. It also means that, with few exceptions, all measurements must be made with respect to earth ground. This constrains the typical oscilloscope (at least in a single measurement) from being used to measure potential differences between two points where neither point is at earth ground. A common, but risky, practice is to disconnect the oscilloscopes AC main power cord ground and attach the probe ground lead to one of the test points. Tektronix strongly recommends against this unsafe measurement practice. Unfortunately, this practice puts the instrument chassis, which is no longer grounded to earth, at the same voltage as the test point that the probe ground lead is connected to. The user touching the instrument
32 becomes the shortest path to earth ground. Figure 1 illustrates this dangerous situation. V1 is the offset voltage above true ground, and VMeas is the voltage to be measured. Depending upon the unit-under-test (UUT), V1 may be hundreds of volts, while VMeas might be a fraction of a volt.
Electricity Testing and Measurement Handbook Vol. 7 complexity to the measurement apparatus. They may require an independent power supply, and their gain and offset characteristics must be factored into every measurement. Differential probeequipped oscilloscopes emphasize performance and safety (bandwidth, isolation), trading off form-factor benefits such as portability and cost.
Figure 1: A floating measurement in which dangerous voltages occur on the oscilloscope chassis. V1 may be hundreds of volts.
Floating the chassis ground in this manner threatens the user, the UUT, and the instrument. In addition, it violates industrial health and safety regulations, and yields poor measurement results. Moreover, line-powered instruments exhibit a large parasitic capacitance when floated above earth ground. As a result, floating measurements will be corrupted by ringing, as shown in Figure 2.
Figure 2: Ringing caused by parasitic inductance and capacitance distorts the signal and invalidates measurements
Battery-operated oscilloscopes, such as the TDS3000B Series oscilloscopes, when operated from AC line power using a standard power cord, exhibit the same limitations as traditional oscilloscopes. However, AC power is not always available where you want to make oscilloscope measurements. In the case of the TDS3000B Series oscilloscopes, the optional battery pack (TDS3BATB) allows you to operate the oscilloscope without the need for AC power. However, it can only make safe floating measurements up to 30 VRMS. Traditional oscilloscopes emphasize performance (bandwidth, versatility), trading off the ability to make floating measurements.
In regard to capacitance, even isolated, battery-powered oscilloscopes exhibit capacitance with respect to earth ground. In Figure A, Cparasitic describes the oscilloscopes parasitic capacitance from its ground reference (through the isolated housing) to earth ground. Like parasitic inductance, Cparasitic must be kept to a minimum in order to force the resonant frequency of the LC circuit as high as possible. If Cparasitic is large, ringing may occur within the test frequency range, hampering the measurement. An instruments parasitic capacitance to ground is dictated by its internal design. The physical environment can also prompt ringing. Holding the instrument or placing it on a large conductive surface during measurements can actually increase Cparasitic and lead to ringing. For extremely sensitive measurements, it might even be necessary to suspend the oscilloscope in mid-air!
Electricity Testing and Measurement Handbook Vol. 7 patent-pending technology enables Tektronix to offer the worlds first four-input Isolated Channel, low-cost, battery-operated oscilloscope, featuring eight hours of continuous battery operation. The TPS2000 Series oscilloscopes are ideal for engineers and technicians who need to make four-channel isolated measurements and need the performance and ease-of- use of a low-cost, battery operated oscilloscope. The TPS2000 Series four Isolated Channel input architecture provides true and complete channel-to-channel isolation for both the positive input and the negative reference leads, including the external trigger input. Figure 3 illustrates the Isolated Channel concept. The most demanding floating measurement requirements are found in power control circuits, such as motor controllers and uninterruptible power supplies, and industrial equipment. In such application areas, voltages and currents may be large enough to present a threat to users and test equipment. Isolated Channel technology is the preferred solution for measurement quality and is designed with your safety in mind.*2 The TPS2000 oscilloscopes offer an ideal solution when a large common mode signal is present. True channel-to-channel isolation minimizes parasitic effects; the smaller mass of the measurement system is less prone to interaction with the environment.
33 quency information, such as glitches and edge anomalies that eludes other oscilloscopes in its class, so that you can be sure to get a complete view of your signal to speed debug and characterization.
Figure 3: TPS2000 Series oscilloscopes Isolated Channel architecture provides complete isolation from dangerous voltages
The channel-to-channel isolation of the TPS2000 Series provides a real-world measurement advantage in addition to its obvious safety benefits. Figure 4 is a screen image depicting waveforms taken at two different points in a power control circuit. Notice that the lower waveforms are about 200 A p-p, while the upper trace is about 5 V p-p. Because each of the TPS channels is fully isolated from the other (including the negative reference leads), and equipped with its own uncompromised Digital Real Time digitizer, theres no cross-talk between the two signals. Were the oscilloscope channels not adequately isolated, there might be misleading artifacts coupled from the 200 A signal to the smaller waveform; these might be misinterpreted as a circuit problem when in reality its an instrument problem. The ability of the TPS Series to discretely capture two waveforms of vastly differing amplitudes reduces guesswork and improves productivity.
A properly isolated battery-powered instrument doesnt concern itself with earth ground. Each of its probes has a Negative Reference lead that is isolated from the instruments chassis, rather than a fixed ground lead. Moreover, the Negative Reference lead of each input channel is isolated from that of all other channels. This is the best insurance against dangerous short circuits. It also minimizes the signal degrading impedance that hampers measurement quality in single-point grounded instruments. The TPS2000 Series oscilloscope inputs are always floating whether operated from battery power or connected to AC power through an AC power adapter. Thus, these oscilloscopes do not exhibit the same limitations as traditional oscilloscopes.
Figure 4: The 4-channel TPS2024oscilloscopes channel-to-channel isolation eliminates cross-talk effects when large and small signals are captured simultaneously
34 wave. The rapid changes in impedance and current in turn affect the voltage waveform on the power grid. As a result, the line voltage is corrupted by harmonics; the normally sinusoidal shape of the voltage waveform may be flattened or distorted. Theres a limit to the amount of harmonic distortion that equipment can tolerate. Load-induced harmonics can cause motor and transformer overheating, mechanical resonances, and dangerously high currents in the neutral wires of three phase equipment. In addition, line distortions may violate regulatory standards in some countries. The TPS2024s comprehensive, four-channel capability, along with its optional power analysis software, enables connection to all three conductors of a three-phase system to measure and analyze line harmonics. Its Harmonics mode invoked with a single buttoncaptures the fundamental frequency plus harmonics 2 through 50. Using only the oscilloscopes standard voltage probe, its possible to execute a harmonic voltage measurement. An optional current probe acquires current harmonics with the same ease. Figure 5 illustrates a current harmonic measurement. The amplitudes are computed by the instruments internal DFT (Discrete Fourier Transform) algorithm. In this case the bar graph reveals a very strong fifth harmonic level. Excessive fifth harmonic levels (along with certain other odd harmonics) are a classic cause of neutral-wire currents in three-phase systems.
Electricity Testing and Measurement Handbook Vol. 7 require a current probe (or its equivalent) and a voltage probe working in tandem. All of these measurements employ the instruments one-button application function.
Figure 6: TPS Series instantaneous power analysis
Figure 7: TPS Series waveform analysis Figure 8: TPS Series dv/dt and di/dt cursors (dv/dt cursors shown)
Figure 9: TPS Series switching loss display showing turn-on, turn-off and conduction losses
CONCLUSION
Engineers and technicians confront high voltages and currents and must often make potentially hazardous floating measurements. Where other alternatives may lack the versatility, accuracy or affordability to make floating measurements, the TPS2000 Series employs unique IsolatedChannel technology to allow engineers and technicians to make these measurements quickly, accurately and affordably.
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WHAT IS ISOLATION?
Isolation is a means of physically and electrically separating two parts of a measurement device, and can be categorized into electrical and safety isolation. Electrical isolation pertains to eliminating ground paths between two electrical systems. By providing electrical isolation, you can break ground loops, increase the common-mode range of the data acquisition system, and level shift the signal ground reference to a single system ground. Safety isolation references standards have specific requirements for isolating humans from contact with hazardous voltages. It also characterizes the ability of an electrical system to prevent high voltages and transient voltages from transmitting across its boundary to other electrical systems with which you can come in contact. Incorporating isolation into a data acquisition system has three primary functions: preventing ground loops, rejecting common-mode voltage, and providing safety.
COMMON-MODE VOLTAGE
An ideal differential measurement system responds only to the potential difference between its two terminals, the (+) and (-) inputs. The differential voltage across the circuit pair is the desired signal, yet an unwanted signal can exist that is common to both sides of a differential circuit pair. This voltage is known as common-mode voltage. An ideal differential measurement system completely rejects, rather than measures, the commonmode voltage. Practical devices however, have several limitations, described by parameters such as common-mode voltage range and common-mode rejection ratio (CMRR), which limit this ability to reject the common-mode voltage. The common-mode voltage range is defined as the maximum allowable voltage swing on each input with respect to the measurement system ground. Violating this constraint results not only in measurement error, but also in possible damage to components on the board. Common-mode rejection ratio describes the ability of a measurement system to reject common-mode voltages. Amplifiers with higher common-mode rejection ratios are more effective at rejecting common-mode voltages. The CMRR is defined as the logarithmic ratio of differential gain to common-mode gain.
CMRR (dB) = 20 log (Differential Gain/Common-Mode Gain). (Equation 1)
GROUND LOOPS
Ground loops are the most common source of noise in data acquisition applications. They occur when two connected terminals in a circuit are at different ground potentials, causing current to flow between the two points. The local ground of the system can be several volts above or below the ground of the nearest building, and nearby lightning strikes can cause the difference to rise to several hundreds or thousands of volts. This additional voltage itself can cause significant error in the measurement, but the current that causes it can couple voltages in nearby wires as well. These errors can appear as transients or periodic signals. For example, if a ground loop is formed with 60 Hz AC power lines, the unwanted AC signal appears as a periodic voltage error in the measurement. When a ground loop exists, the measured voltage, Vm, is the sum of the signal voltage, Vs, and the potential difference, Vg, which exists between the signal source ground and the measurement system ground, as shown in Figure 1. This potential is generally not a DC level; therefore, the result is a noisy measurement system, often showing power-line frequency (60 Hz) components in the readings.
Common-mode voltage is shown graphically in Figure 2. In this circuit, CMRR in dB is measured as 20 log Vcm/Vout where V-= Vcm.
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Electricity Testing and Measurement Handbook Vol. 7 isolation barrier is typically an air gap. The light intensity is proportional to the measured signal. The light signal is transmitted across the isolation barrier and detected by a photoconductive element on the opposite side of the isolation barrier.
In a non-isolated differential measurement system, an electrical path still exists in the circuit between input and output. Therefore, electrical characteristics of the amplifier limit the common-mode signal level that can be applied to the input. With the use of isolation amplifiers, the conductive electrical path is eliminated and the common-mode rejection ratio is dramatically increased.
ISOLATION CONSIDERATIONS
There are several terms with which to be familiar when configuring an isolated system: Installation Category: A grouping of operating parameters that describe the maximum transients that an electrical system can safely withstand. Installation categories are discussed in more detail later. Working Voltage: The maximum operating voltage at which the system can be guaranteed to continuously safely operate without compromising the insulation barrier. Test Voltage: The level of voltage to which the product is subjected during testing to ensure conformance. Transient Voltage (Over-voltage): A brief electrical pulse or spike that can be seen in addition to the expected voltage level being measured. Breakdown Voltage: The voltage at which the isolation barrier of a component breaks down. This voltage is much higher than the working voltage, and often times is higher than the transient voltage. A device cannot operate safely near this voltage for an extended period of time.
ELECTROMAGNETIC ISOLATION
Electromagnetic isolation uses a transformer to couple a signal across an isolation barrier by generating an electromagnetic field proportional to the electrical signal. The field is created and detected by a pair of conductive coils. The physical barrier can be air or some other form of non-conductive barrier.
Figure 4. Transformer
CAPACITIVE ISOLATION
Capacitive coupling is another form of isolation. An electromagnetic field changes the level of charge on the capacitor. This charge is detected across the barrier and is proportional to the level of the measured signal.
ISOLATION TYPES
Physical isolation is the most basic form of isolation, meaning that there is a physical barrier between two electrical systems. This can be in the form of insulation, an air gap, or any non-conductive path between two electrical systems. With pure physical isolation however, we imply that no signal transfer exists between electrical systems. When dealing with isolated measurement systems, you must have a transfer, or coupling, of energy across the isolation barrier. There are three basic types of isolation that can be used in a data acquisition system:
Figure 5. Capacitor
ISOLATION TOPOLOGIES
It is important to understand the isolation topology of a device when configuring a measurement system. Different topologies have several associated cost and speed considerations.
OPTICAL ISOLATION
Optical isolation is common in digital isolation systems. The media for transmitting the signal is light and the physical
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CHANNEL-TO-CHANNEL
The most robust isolation topology is channel-to-channel isolation. In this topology, each channel is individually isolated from one another and from other non-isolated system components. In addition, each channel has its own isolated power supply. In terms of speed, there are several architectures from which to choose. Using an isolation amplifier with an analog to digital converter (ADC) per channel is typically faster because you can access all of the channels in parallel. A more cost-effective, but slower architecture, involves multiplexing each isolated input channel into a single ADC. Another method of providing channel-to-channel isolation is to use a common isolated power supply for all of the channels. In this case, the common-mode range of the amplifiers is limited to the supply rails of that power supply, unless front-end attenuators are used.
BANK
Another isolation topology involves banking, or grouping, several channels together to share a single isolation amplifier. In this topology, the common-mode voltage difference between channels is limited, but the common-mode voltage between the bank of channels and the non-isolated part of the measurement system can be large. Individual channels are not isolated, but banks of channels are isolated from other banks and from ground. This topology is a lower-cost isolation solution because this design shares a single isolation amplifier and power supply.
INSTALLATION CATEGORIES
Figure 7. Bank Topology
The IEC defined the term Installation Category (sometimes referred to as Over-voltage Category) to address transient voltages. When working with transient voltages, there is a level
38 of damping that applies to each category. This damping reduces the transient voltages (over-voltages) that are present in the system. As you move closer to power outlets and away from high-voltage transmission lines, the amount of damping in the system increases. The IEC has created four categories to partition circuits with different levels of over-voltage transient conditions. Installation Category IV Distribution Level (transmission lines) Installation Category III Fixed Installation (fuse panels) Installation Category II Equipment consuming energy from a Category III fixed installation system. (wall outlets) Installation Category I Equipment for connection to circuits where transient over-voltages are limited to a sufficiently low level by design.
SERIAL COMMUNICATION
Reliability is a number one concern when designing equipment to be resistant to the interference inherent in a harsh environment. Commercial and industrial applications such as POS networks, ATMs, bank teller stations, and CNC-based production lines are susceptible to voltage spikes and noise. Isolation reduces the possibility of damaging control systems and ensure that systems can remain operational. Other applications that may require isolation are industrial process control, factory automation, serial networking devices, high speed modems, monitoring equipment, long distance communication devices, printers and remote serial device control.
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MEASUREMENT METHODS
An E field sensor basically consists of a pair of condenser plates placed side by side, across which the dielectric current is measured. The disadvantage of this simple arrangement is its directional characteristic. To measure accurately, the direction of the field lines has to be known and the sensor positioned accordingly. This is seldom possible in practice. As a result, the trade association [1] requires the measurement to be made in each of the three orthogonal spatial axes and the so-called equivalent field strength calculated by summing the squares of the three field components. This is theoretically possible with a simple probe by making three consecutive measurements in the three directions, assuming that the field remains constant over time. The practical answer is to use a sensor that has a three dimensional structure. Modern measuring equipment uses sensors made up from three plate condensers arranged at right angles to each other, and calculate the equivalent field strength automatically. The isotropy, i.e. the actual non-directionality of the sensor, is important in this context. This can be assessed by rotating the sensor in an homogeneous field; the indicated field strength must remain constant [3]. This is the only way to ensure that dangerous field strengths are not present.
Figure 1: High-voltage line. Results of electric field measurements in one and three dimensions
MEASUREMENT CONDITIONS
Several factors must be observed if measurements are to conform to relevant standards [1]: No person should be present in the immediate vicinity of the measurement. Objects in the vicinity that distort the field, such as trees, bushes, machinery, etc., must be noted. Environmental effects such as air humidity, temperature, type of terrain, etc., must also be noted. No condensation may be present on the sensor or its supporting tripod as this will lead to measurement errors. The persons operating the measuring instrument must ensure that they do not stand between the field source and the probe during the measurement. These measures are required in order that comparable and reproducible results can be obtained under varying operating conditions.
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Figure 2: Measurement path beneath two high voltage lines that cross. Green areas indicate bushes and trees
Figure 3 shows the field strength profile that was measured. The starting point of the measurement in the diagram is at the position of the mast. The last measurement was made at a distance of 60 m from this point. The effect of the mast can be clearly seen up to the area where the lines cross. The crossing begins 30 m from the starting point. A field strength maximum occurs at the 28 m point. This is due to the addition of the field strengths of the two lines. In the area of the crossing, the field components of the upper line are compensated, resulting in a minimum at this point. The field strength increases again rapidly after the crossing area, at 52 m. This is due to the fact that the screening effect of the mast is now reduced and the area of the crossing has been left. Figure 4 shows the relative difference between the one-dimensional and three-dimensional measurements. The maxima are found at the entry and exit of the crossing. The difference is up to 13%. The lower conductors in the crossing area compensate out the field components of the upper conductors. The variation in the field within the area of the crossing in figure 3 is due to the uneven terrain. This section is therefore shown in more detail in figure 5.
Figure 3: Electric field profile where two high voltage lines cross.
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Figure 5 clearly shows the effect of the terrain on the measurement result. A threedimensional measurement is clearly to be preferred where the terrain is very uneven. Accurate results are not given by a one-dimensional measurement or by a computer simulation.
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REFERENCES
[1] Precision Engineering and Electrical Engineering Trade Association: Rules for health and safety at work involving exposure to electric, magnetic or electromagnetic fields (in German) [2] Electric and Magnetic Fields Everyday Electricity (in German) Electricity Industry Information Center (Informationszentrale der Elektrizittswirtschaft e.V.) 60596 Frankfurt [3] Progress Report VDI Series 8: Measurement, Control and Regulation Dipl.-Ing. Georg Bahmeier, Untermeitingen Field probes for calibration and for determining the magnitude and direction of electric field strength (in German) [4] International Standard IEC 833: Measurement of power frequency electric fields [5] German Standard VDE 0848 Part 1: Endangerment due to electromagnetic fields. Measurement and calculation methods (in German) [6] German Standard VDE 0848 Part 4: Safety in electromagnetic fields. Field strength limit values for personal safety in the frequency range from 0 Hz to 30 kHz.
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Often it is necessary to identify a system that must operate in a closed-loop fashion under some type of feedback control. This may be due to safety reasons, an unstable plant that requires control, or the expense required to take a plant offline for test. In these cases, it is necessary to perform closed-loop identification. There are three basic approaches to closed-loop identification. These approaches are direct, indirect, and joint input-output. In this article we outline each approach and the system identification techniques that may be used to implement them.
INDIRECT
The second method of interest in closed-loop identification is the Indirect Approach as shown in Figure 2. In this method we identify the closed loop system (Gcl) using measurements of the reference input r(t) and the output y(t) and retrieve the plant model making use of a known regulator structure. The transfer function for the open loop plant G, with regulator H, can be retrieved from
DIRECT
The first method of interest is the Direct Approach. In this method, we measure the output of the system y(t) and the input to the plant u(t), ignoring any feedback and the reference signal, to obtain the model. This is illustrated in Figure 1. This has the advantage of requiring no knowledge about the feedback in the system and becomes an open-loop identification problem. The suggested system identification model structures when using this method are ARX, ARMAX and state-space models. Optimal accuracy occurs if the chosen model structure contains the true system (including the noise properties) and the main drawback to the method is that a poor noise model can introduce bias into the model. This bias will be small when any or all of the following hold The noise model is representative of the actual noise The feedback contribution to the input spectrum is small The signal to noise ratio is high Spectral analysis will not provide correct results in the closed-loop case when using the direct approach so avoid nonparametric methods of identification such as impulse response and bode response estimation. The advantages in using the indirect approach are that any method will work in determining the closed-loop transfer function Gcl and the need for an accurate representation of the noise model is alleviated. The main disadvantage is that any error in H (including deviations due to saturations or anti-windup logic) will be imposed directly into G resulting in bias errors.
JOINT INPUT-OUTPUT
The last method is the Joint Input-Output Approach. As shown in Figure 3, we consider the plant input u(t) and the system output y(t) as outputs of the system. The inputs to the system are the reference signal r(t) and the noise signal v(t).
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CONCLUSION
It is often necessary to perform identification under closed-loop conditions to increase safety or reduce the costs of the modeling. The three approaches outlined in this article provide accurate estimations of plant dynamics under feedback control using simple measurements. Using the LabVIEW System Identification Toolkit provides the necessary identification algorithms to aid in these closed-loop identification problems.
Where the system matrix A is comprised of two models, the closed-loop model Gcl and the model relating u(t) to r(t), Gru. The plant model, G, is then estimated from the relation.
This approach is advantageous because the regulator structure is not needed nor is an accurate noise model necessary. It suffers from the disadvantages of requiring additional acquisition hardware (sensors) and requires acquiring a greater quantity of data. When using the indirect and joint input-output methods, the reference signal r(t) should be as informative as possible. This means it should provide good spectral coverage of the domain of interest. This may be done by adjustments to the system set points (or adjustments to the regulator) as much as allowed by the system being identified.
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POTENTIAL TRANSFORMERS
Most manufactures transducers accept up to a maximum of 600 volts AC direct. For AC voltages greater than 600 volts, potential transformers are required. Potential transformers are precision transformers that step the voltage down to 120 volts AC, a standard transducer input. These transformers, particularly when used with power or watt transducers, must be instrument grade transformers. They must not only be precise in stepping down the voltage but in maintaining the phase or time relationship of the voltage. This is very important. Do not attempt to save money by using control class transformers. Transducer and meter loads are connected in parallel to the potential transformer. Take care not to exceed the transformer burden rating. This burden is expressed in VA for volt-amperes (the product of volts and amps).
CURRENT TRANSFORMERS
For AC applications, most manufacturers transducers will not accept direct current input over 20 amperes. For higher amperages, current transformers are utilized. CAUTION: Current transformers can and will develop a lethal voltage and possibly self destruct if the secondary is open when primary current is present! People have been hurt and equipment damaged when the secondary winding of a current transformer was opened. Never disconnect the secondary or leave it open when there is the possibility of primary current. It is essential that experienced persons install current transformers. If you must make a connection to the current transformer while it is in use, SHORT THE SECONDARY WINDING before doing anything. Some current transformers have a shorting block for this purpose. Auxiliary shorting blocks are available for this purpose too.
46 Current transformers are rated for the voltage class for which they are to be used. These classes are: 600 volts, 5000 volts, 8700 volts, 15 kilovolts, 25 kilovolts, and 34.5 kilovolts. Make certain that the current transformers are rated for the voltage with which they are working or that the conductor is insulated for the class voltage. Current transformers being used on conductors with voltages greater than 600 volts must have the secondary grounded to an earth ground.
Electricity Testing and Measurement Handbook Vol. 7 True RMS (Root Mean Square) measuring. These transducers calculate the RMS value of the voltage input and provide a DC output directly proportional to the effective value of the voltage input. This type should be used whenever the voltage is distorted. Transducer models are available for nominal input voltages of 69, 120, 240, and 480 volts. These typically have a measuring range of 0 to 125% of the nominal input rating. Thus, a 120-volt model has a range of 0 to 150 volts. For voltage input higher than 600 volts, one should use a potential transformer.
VOLTAGE TRANSDUCERS
Voltage transducers provide a DC current or voltage output directly proportional to the AC input voltage. AC voltage transducers typically have a transformer input to isolate the transducer from the voltage input. Following the transformer are the electronics.
CURRENT TRANSDUCERS
Current transducers provide a DC current or voltage output directly proportional to the AC input current. AC current transducers typically have a transformer input to isolate the transducer from the current input. Following the transformer are the electronics.
There are two types of AC voltage transducers. Absolute average measuring, rms than 600 volts, one should use a calibrated (or mean value measuring, potential transformer. rms calibrated). These inexpensive transducers simply convert the AC input to DC Current transducers provide a DC current or and have the output calibrated to voltage output directly proportional to the represent the root mean square AC input current. AC current transducers (RMS) value for sine wave input. Typically have a transformer input to isolate. This type is very adequate for the transducer from the current input. This type is very adequate for situations in which the voltage wave shape is not distorted. Any odd harmonic or discontinuity will introduce large error. Use the true RMS measuring type when distortion of a sine wave is present. True RMS (root mean square) measuring. These transducers calculate the RMS value of the current input and provide a DC output directly proportional to the effective value of the current input. This type should be used whenever the current is distorted. Ohio Semitronics, Inc. has a wide range of models available for various situations. Models are available with or without current transformers, with current transformers built in, and with split core current transformers.
There are two types of AC current transducers. Absolute average measuring, rms calibrated (or mean value measuring, rms calibrated). These inexpensive transducers simply convert the AC input to DC and have the output calibrated to represent the root mean square (RMS) value for sine wave input. This type is very adequate for situations in which the current wave shape is not distorted. Any odd harmonic or discontinuity will introduce large error. Use the true RMS measuring type when distortion of a sine wave is present. True RMS (root mean square) measuring. These transducers calculate the RMS value of the current input and provide a DC output directly proportional to the effective value of the current input. This type should be used whenever the current is distorted. Ohio Semitronics, Inc. has a wide range of models available for various situations. Models are available with or without current transformers, with current transformers built in, and with split core current transformers.
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The watt transducer must also measure the power in each of the branches of the circuit. Your house, apartment, or small office is wired in what is often referred to as the Edison system. This is a three-wire, single phase system with two power lines and a neutral. The watt transducer must measure the power in each of the power lines or mains. This circuit requires a two-element watt transducer. A two-element watt transducer has two-watt transducers in the same case. The outputs of the two transducers or multipliers are summed so that the output signal of the entire watt transducer represents total power. One, two, and three element watt transducers are discussed in Part II. What type of watt transducer to use? Analog watt transducers including Hall effect provide good accuracy even with distorted wave shapes, discontinuity, or where there is poor frequency regulation.
The single-phase watt transducer shown above has a single multiplier or element inside the electronics package. Often the combined loads of an entire house, apartment, or office are monitored with a watt transducer. This requires a two-element model with current transformers. The two-element, single-phase watt transducer is connected as shown below.
The two-element watt transducer shown above has two multipliers inside the electronics package. The output of these two multipliers is summed to obtain the total power. The output signal of this watt transducer thus represents the total power being used.
Electronic watt transducers with sampling or pulsewidth, pulse-height type multipliers provide excellent accuracy but may have problems with discontinuity or where there is poor frequency regulation. Before ordering watt transducers, it is to your advantage to assess your specific needs and conditions.
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Electricity Testing and Measurement Handbook Vol. 7 In special cases where a three-phase, four-wire load is known to be balanced in load and voltage, a single element watt transducer may be used to give an indication of total power by multiplying the value represented by the transducer output by three.
Factories and large stores are typically supplied with three-phase, four-wire power. Heavy loads such as motors are connected line-to-line in a three-phase, three-wire configuration and lighter loads are connected line to neutral. Three element watt transducers are required to monitor the entire facility. This requires the use of current transformers. The connections are shown below.
ANALOG METER
If you are using an analog meter, buy transducers that are supplied with a 0 to 1 mADC output and a 0 to 1 mADC meter movement. The meter supplier can scale the meter face to match the transducer range. Some examples are shown on the next page.
49 In the first example the rated output of the transducer is 1000 watts. We would like the digital meter to read 1000. If we supply 1 volt to the meter, it will read 1.000. Digital meter manufacturers build their meters so that the decimal point can be moved. This is done using wire jumpers on the connection strip of the meter, by DIP switches on the meter, or by wire jumpers or foil jumpers that the user cuts. Follow the meter manufacturers instructions. In our example, set the meter to display 1000 or 1000.0 when 1 volt is applied. How did we get the 1-volt from the transducer? Use Ohms law. The value of the resistor equals the desired voltage divided by the current. Or for our example, R=1/0.001 or 1000. Use of a 1000 resistor will provide 1 volt at full scale of 1 mADC. Our meter will read 1000 for 1000 watts. In the second example we used a twenty ampere current transducer with a digital meter. We want the meter to read 19.99 at full scale to take advantage of the four digits. (A 3-_ digit meter will read to 1.999 volts. Above this it will flash at you to let you know that the meter is over ranging.) How do we get 2 volts? Again use Ohms Law. The value of the resistor will be R=2/0.001 or 2000 . Set the decimal point so that the meter will read 19.99 at 1.999 volts. Your meter is now scaled to match the transducer.
DIGITAL METER
Some digital meters allow the user to scale the meter to display to the transducer range. If you use one of these meters with a watt transducer that has a 4 to 20 mADC output representing 0 to 960 kilowatts, simply adjust the meter to read 0 at 4 mADC and 960 at 20 mADC. If you are using a 0 to 2 volt DC input meter that does not allow scaling, use a scaling resistor. Some examples are shown below.
In both examples a 2-volt DC digital meter is being used. By applying Ohms Law (R=E/I, the value of the resistor equals the voltage divided by the current), one can determine the value of the resistor required. Remember that the output of the transducer is in milliamperes, 1/1000 of an ampere. How did we figure the value of the resistor? Always base the resistor on the rated output of the transducer, the rated output is the wattage level or current value that is represented by 1 mADC.
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VT-120A voltage transducer is wired in parallel with the load. PC5-010A is wired in series with the load for monitoring the current and in parallel with the load for monitoring the voltage. These are used as examples. Other transducers that may be used include the multifunction board level transducer PTB. This board provides analog outputs proportional to each phase of true RMS Current, each phase of true RMS voltage, and total power. This example uses digital meter which are scaled using precision load resistors.
Load resistors are selected as follows: Remember Ohms Law: R=V/I where R is the resistance in ohms ( ), V is the voltage that we want to apply to the digital meter, and I is the current from the transducer. The CT5-010A provides an output of 1 mADC at 10 amperes AC through terminals 3 and 4. 1 mADC represents 10 amperes AC. Adjust the decimal point of the digital meter so that it displays 10.00 with 1 mADC through a 1000 load resistor. The VT-120A provides an output of 1 mADC at 150 volts AC applied to terminals 3 and 4. 1 mADC represents 150 volts. Adjust the decimal point of the digital meter so that it displays 150.0 with 1 mADC through a 1500 load resistor. The PC5-010A provides an output of 1 mADC at 1000 watts. 1 mADC represents 1000 watts. Adjust the decimal point on the digital meter so that it displays 1000 with 1 mADC through the 1000 resistor. Now all three meters are scaled correctly and may be labeled amperes, volts, and watts. Note that the power does not equal volts times amperes. This is because the refrigerator has a power factor of 0.866 that is normal for older refrigerators. For the single-phase situation, power factor may be determined by dividing the power reading by the product of volts and amperes.
Electricity Testing and Measurement Handbook Vol. 7 We are assuming a balanced condition to compute power factor given one current reading, one voltage reading, and total power.
Power Factor: PF= watts (apparent power in VA). Apparent power for a three-phase, three-wire load may be calculated from the product of voltage, current, and the square root of 3 (1.732) or PF = watts (V*I*1.732) = 81,000 (479*231*1.732) = 0.423
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COMMENTS
A watt transducer monitoring a three-phase, three-wire load must be a two-element watt transducer because the voltage, as measured and the current are out of phase by 30 at unity power factor, +30 on one leg and -30 on the other leg. Total power measured by the watt transducer is as follows:
Ptotal = [Ia * Vac * Cos (_+ 30) +Ib * Vbc * Cos (_ - 30)]
This is a low power factor and is very typical of some lightly loaded induction motors. Where does the 1.732 come from? It is the square root of 3 rounded to three decimal places. The square root of three comes from the ratio of line to line voltage to line to neutral voltage in the three-phase system. Please refer to POWER MONITORING IN PART TWO of this brochure.
PITFALLS
Monitoring AC voltage and AC current is simple enough, but in monitoring power, one must follow the connection diagrams exactly. Watt transducers are polarity sensitive. They sense not only the power but also the direction in which it is flowing. Should a current transformer be installed backwards, the watt transducer will sense this as reverse power flow and provide an output reversed in polarity, a negative output Watt transducers are also phase sensitive. If a current transformer is installed on the wrong phase line, the watt transducer will interpret this as a 120-degree phase angle shift and give the wrong result. The most frequent complaint I receive on three-phase watt transducers is I am not getting the correct output. Conservatively stated, 90% of the time, the watt transducer is not correctly connected a current transformer may be installed backwards or on the wrong line, voltage connections may be cross phased, or voltage connections may reference the wrong line. The other 9.5% of the time, the following gives the user trouble. The electrical quantity WATT is a measure of the rate at which work is being done. If an electric motor is not doing any work or is doing very little work, it will not consume very much power in watts even though the electric current is relatively high. The power factor will be low and a watt transducer monitoring this motor will have a low output. This is to be expected! The output from a watt transducer reflects the rate at which the motor is doing work. If you encounter incorrect readings from a watt transducer, double check your connections against the connection diagram on the transducer case or connection sheet.
Where: Ia is the current in leg A Ib is the current in leg B Vac is the voltage between leg A and C Vbc is the voltage between leg B and C is the phase angle shift between the voltage and current the power factor angle. At a power factor of 0.867 one reading between two of the legs will be double that between the other two legs. The sum of the two is the correct total power. At a power factor of 0.500 one reading between two of the legs will be greater than 0 and the other will be 0. The total of the two is the correct total power. At a power factor of 0 the readings between the two sets of legs will be the same but opposite in sign. Again, the total of the two is the correct total power zero!
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STEP 1 OBSERVE
Most faults provide obvious clues as to their cause. Through careful observation and a little bit of reasoning, most faults can be identified as to the actual component with very little testing. When observing malfunctioning equipment, look for visual signs of mechanical damage such as indications of impact, chafed wires, loose components or parts laying in the bottom of the cabinet. Look for signs of overheating, especially on wiring, relay coils, and printed circuit boards. Dont forget to use your other senses when inspecting equipment. The smell of burnt insulation is something you wont miss. Listening to the sound of the equipment operating may give you a clue to where the problem is located. Checking the temperature of components can also help find problems but be careful while doing this, some components may be alive or hot enough to burn you. Pay particular attention to areas that were identified either by past history or by the person that reported the problem. A note of caution here! Do not let these mislead you, past problems are just that past problems, they are not necessarily the problem you are looking for now. Also, do not take reported problems as fact, always check for yourself if possible. The person reporting the problem may not have described it properly or may have made their own incorrect assumptions. When faced with equipment which is not functioning properly you should: Be sure you understand how the equipment is designed to operate. It makes it much easier to analyze faulty operation when you know how it should operate; Note the condition of the equipment as found. You should look at the state of the relays (energized or not), which lamps are lit, which auxiliary equipment is energized or running etc. This is the best time to give the equipment a thorough inspection (using all your senses). Look for signs of mechanical damage, overheating, unusual sounds, smells etc.; Test the operation of the equipment including all of its features. Make note of any feature that is not operating properly. Make sure you observe these operations very carefully. This can give you a lot of valuable information regarding all parts of the equipment.
PREPARATION
Before you begin to troubleshoot any piece of equipment, you must be familiar with your organizations safety rules and procedures for working on electrical equipment. These rules and procedures govern the methods you can use to troubleshoot electrical equipment (including your lockout/tagout procedures, testing procedures etc.) and must be followed while troubleshooting. Next, you need to gather information regarding the equipment and the problem. Be sure you understand how the equipment is designed to operate. It is much easier to analyze faulty operation when you know how it should operate. Operation or equipment manuals and drawings are great sources of information and are helpful to have available. If there are equipment history records, you should review them to see if there are any recurring problems. You should also have on-hand any documentation describing the problem. (i.e., a work order, trouble report, or even your notes taken from a discussion with a customer.)
54 continue to do this until you are left with only the part(s) that, if faulty, could cause the symptoms that the equipment is experiencing. To help you define the problem area you should have a schematic diagram of the circuit in addition to your noted observations. Starting with the whole circuit as the problem area, take each noted observation and ask yourself "what does this tell me about the circuit operation?" If an observation indicates that a section of the circuit appears to be operating properly, you can then eliminate it from the problem area. As you eliminate each part of the circuit from the problem area, make sure to identify them on your schematic. This will help you keep track of all your information.
Electricity Testing and Measurement Handbook Vol. 7 cases the fault will be such that you cannot identify the problem component by observation and analysis alone. In these circumstances, test instruments can be used to help narrow the problem area and identify the problem component. There are many types of test instruments used for troubleshooting. Some are specialized instruments designed to measure various behaviors of specific equipment, while others, like the multimeters, are more general in nature and can be used on most electrical equipment. A typical multimeter can measure AC and DC Voltages, Resistance, and Current. A very important rule when taking meter readings is to predict what the meter will read before taking the reading. Use the circuit schematic to determine what the meter will read if the circuit is operating normally. If the reading is anything other than your predicted value, you know that this part of the circuit is being affected by the fault. Depending on the circuit and type of fault, the problem area as defined by your observations, can include a large area of the circuit creating a very large list of possible and probable causes. Under such circumstances, you could use a divide and eliminate testing approach to eliminate parts of the circuit from the problem area. The results of each test provides information to help you reduce the size of the problem area until the defective component is identified. Once you have determined the cause of the faulty operation of the circuit you can proceed to replace the defective component. Be sure the circuit is locked out and you follow all safety procedures before disconnecting the component or any wires. After replacing the component, you must test operate all features of the circuit to be sure you have replaced the proper component and that there are no other faults in the circuit. It can be very embarrassing to tell the customer that you have repaired the problem only to have him find another problem with the equipment just after you leave. Please note, Testing is a large topic and this article has only touched on the highlights.
FOLLOW UP
Although this is not an official step of the troubleshooting process, it nevertheless should be done once the equipment has been repaired and put back in service. You should try to determine the reason for the malfunction. Did the component fail due to age? Did the environment the equipment operates in cause excessive corrosion? Are there wear points that caused the wiring to short out? Did it fail due to improper use? Is there a design flaw that causes the same component to fail repeatedly? Through this process, further failures can be minimized. Many organizations have their own follow-up documentation and processes. Make sure you check your organizations procedures. Adopting a logical and systematic approach such as the 5Step Troubleshooting Approach can help you to troubleshoot like an expert!
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TROUBLESHOOTING IN THE FIELD MOTOR TESTING MOTOR CONTROLLER PROGRAMMABLE LOGIC CONTROLLERS (PLC)
A laptop computer with PLC programming, communication, and operating programs is a necessary tool in todays modern plant. Engineers, production supervisors, maintenance supervisors, maintenance technicians, electricians, instrument technicians, and maintenance mechanics all need to have PLC and computer knowledge, training and skills in troubleshooting. On-the-job training on PLCs is usually not very effective until the person being trained has reached a certain level of expertise in several areas. Knowledge and skills in electricity, troubleshooting, and computer operation are necessary prerequisites to effectively assimilate basic PLC training. The author found that long-term retention of material studied was higher from a vocational course taken at a local junior college than from a fast-paced, cram-course through a manufacturer. The manufacturers course covered essentially the same material as a course at the junior college (JC). The major differences were the amount of study time and shop time. The JC course was four hours of class time per week for 15 weeks. There were three hours of shop time doing actual hands-on work relating to the problems and material covered in the first hour. Additional time was spent at home studying the manual and writing programs. Also, the JC was open at night for extra shop time on PLCs and computers. In contrast, the manufacturers course was five, eight hour days. Class work was extremely fast and condensed in order to cover the amount of material involved. The instructor was very knowledgeable and covered the course material as we tried to input the programs into desktop training equipment in order to see how it worked. By the end of each day, our minds were jammed with information. By the end of the week, we all passed the course, but I had a hard time remembering what we had studied on the first day. Basic troubleshooting techniques apply to every situation and occupation. Positive identification of the problem(s) is absolutely essential to solving the problems. Many times, the inexperienced troubleshooter will mistake one or more of the symptoms for the problems. Solving the symptom(s) will normally just postpone the problems to a later date, by which time, the problems may have grown to mountainous proportions. An example is when a person experiences a headache and takes a mild pain reliever, such as aspirin. The actual problem might be any number of things: eyes need to be checked, medication or lack of medication, muscle strain, stress, tumor, blood vessel blockage, or old war injury. The same thing occurs in industry, a fuse in a circuit blows and the maintenance person gets the replacement fuse and inserts it into the fuse holder. There are many things that could have caused the fuse to blow,
depending on the complexity of the circuit. Excess current caused the fuse to open (blow). Excess current could have been caused by: overload on the load; short circuit between the wires, grounded wires, short circuit in the load, ground in the load, voltage spike, voltage droop, etc. If the maintenance person does not troubleshoot the circuit prior to replacing the fuse and restoring power, negative consequences could arise. It is not uncommon for a process to develop a number of small problems and continue to function at a degraded level of operational capability. Then, one more small problem occurs and the whole process breaks down. Finding and correcting the last problem will not necessarily restore the operational capability of the process. The process continued operations with the small problems, but the small problems may not allow the process to restart from a dead stop. All the other small problems must be identified and corrected before the process is restored to full operational capability. This situation arises in industry as well as a person. The person can continue to function with a number of small problems, such as fatigue, blood pressure problems, hardening of the arteries, artery blockage, but one more small blood clot in the wrong place could easily cause the death of the person. Clearing the blood clot does no good to the person. He/she will not be restored to full operational capability.
56 If and when a problem is found, whether electrical or mechanical, the problem should be corrected and the fault-finding begun anew, a seemingly unrelated fault or defect could be the cause of the problem. When there is more than one fault, the troubleshooting is exponentially more difficult. Do not assume that all problems are solved after completing one. Always test the circuit and operation prior to returning the equipment to service. If available, check wiring diagrams and PLC programs to isolate problem. Variable Frequency Drive (VFD) can be reset by turning power off. Wait until screen is blank and restore power; on some VFDs, press Stop/Reset then press Start. Check that wiring is complete and that wires and connections are tight with no copper strands crossing from one terminal to another or to ground. Ensure that the neutral reading is good and that the neutral is complete and not open.
Electricity Testing and Measurement Handbook Vol. 7 replace all wires. If problem is on motor side of disconnect switch, open motor connection box and disconnect motor; Check motor for resistance to ground with megohmmeter. If reading is below 500,000 ohms, motor is grounded and must be replaced. Test motor windings for ohms between phases with ohmmeter A to B, B to C, A to C. Readings should be within 1 or 2 ohms of each other. If readings indicate open or a significant ohmage difference, replace motor; If motor test readings are good, test the motor leads between the disconnect switch and the motor connection box for continuity and ground resistance. If readings are not good, replace wires. If all readings are OK, reconnect motor, remove lockout, and restore to service. The problem could have been mechanical in nature; an overload on motor caused by the chain, belt, bad bearings, faulty gearbox, or power glitch.
MOTOR CONTROLLER:
Check motor Full Load Amps (FLA) at motor and check setting on controller overload (OL) device; most newer OL devices are adjustable between certain ranges, some older OL devices use heaters for a given amperage. If circuit disconnecting means in controller is a circuit breaker, it should be sized correctly. If the disconnecting means is a Motor Circuit Protector (MCP), the MCP must be correctly sized for the motor it is protecting and the MCP has a trip setting unit which has to be correctly set based on the Full Load Amperage of the motor. Using a small screwdriver, push in on the screw head of the device and move to a multiple of thirteen of the FLA. Example: a motor FLA of 10 amps would require that the MCP trip device be set to an instantaneous trip point of 130 amps. Fuses protecting the motor should be the dual element or current limiting type and based on the motor FLA.
Electricity Testing and Measurement Handbook Vol. 7 after correcting field fault. Shut down PLC prior to changing any module main power and 24V power. Locate fault in field circuit by disconnecting wires at module and field device. Check between wires for short circuit and to ground for short circuit. Replace wire is short circuit found Check device for ground, short circuit, mechanical and electrical operation, even when problem found in wires. Always check device for another fault. Problem in wires can cause problem in device or vice versa. If device defective, replace device and then check total circuit before placing in operation and after restoring circuit, check again to ensure circuit and module are operating correctly. Check power supply module. If no output, shut down power and replace supply module. Back plane can go bad, some of the modules with power and others with no power. Replace backplane. Sometimes, the PLC can be reset using the Reset key switch. Ensure that turning the PLC off wont interrupt other running sub-set programs, turn key switch to far right. After 15 seconds, turn to far left, wait, then return to middle position. This operation should reset program and enable a restart. The PLC program can have a latch relay with no reset under certain conditions. The key switch reset may have no effect on the latch. Try turning the power to the PLC off and back on. This operation may reset the latch and allow the program to be restarted. The PLC is usually part of a control circuit supplied with 120VAC through a 460V/120V transformer as part of a system with motors, controllers, safety circuits, and other controls. Occasionally, cycling the main 480V power off/on will be necessary to try to reset all the safety and control circuits. Possession and use of an up-to-date ladder diagram, elementary wiring diagram, manufacturers manuals & diagrams, troubleshooting skills, operators knowledge, and time are all required to solve issues involved in maintaining a modern manufacturing production line.
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Dont heap all the blame for a wrong measurement on the DMM (Delayed Neutron Monitor). There can be several less obvious sources of the errors. Testing assemblies and components usually includes checking the continuity of connectors, wires, traces, and lowvalue resistive elements. Such applications typically require both a DMM and a switching system. Many users select a DMM and switching cards based only on the specifications of the DMM and later are surprised to find that their measurements are an order of magnitude less accurate than expected. Many users dont recognize the error as a system problem and conclude that the DMM is not meeting its specification. Making accurate, stable, and repeatable resistance measurements is an art. There is plenty of technology involved, but the art is an important part, especially when you are measuring low resistance values. To achieve your accuracy goal, you need to understand the error sources in your application. It is important to start with a good DMM. But, there are significant error sources outside the DMM, some of which may not be obvious. Things may be more complex than they seem, and some types of errors may be misinterpreted.
The larger signal almost always produces a more accurate measurement. It is confusing to compare two DMMs having similar specifications in ohms if one has 10 times the current drive. The two are not the same. The one with the higher current will perform better, especially in a system. Good DMMs can measure signals down to a few microvolts. If you need to measure a resistance down to a few milliohms, a 1-mA test current only produces 1 V of signal per 1 m of resistance. In other words, you are operating right at the resolution limit of the DMM. With a 10-mA test current, there are 10 V of signal per 1 m of resistance. As a result, a DMM that uses 10x as much current for this test will give about 10x improvement in accuracy, stability, and repeatability for very low values. If your test has serious throughput requirements and you need to make hundreds of measurements per second, having a stronger signal combined with good noise performance in the DMM makes a huge difference. Remember that the DMMs accuracy at higher speeds may be much more important than its best accuracy.
TWO-WIRE
Everyone knows how easy it is to measure resistance using a two-wire connection. However, for low resistance, a two-
Figure 1. Two-Wire
wire connection has disadvantages (Figure 1). Test leads frequently add >1 of resistance, and your test probe may add another 0.1 of contact resistance to the measurement. These errors are significant if you are measuring 20 . You can eliminate most of the test-lead errors from a twowire connection by shorting the leads and setting the RelativeOhms control. This enables the DMM to subtract the test-lead resistance from the readings that follow. This is a very handy tool when you are doing manual testing, but it is less useful in an automated test.
FOUR-WIRE
A four-wire connection is the standard method for measuring low resistance. It eliminates the resistance of the test leads
60 from the measurement. One pair of leads carries the test current while the other pair of leads senses the voltage across the resistor under test (Figure 2).
Electricity Testing and Measurement Handbook Vol. 7 resistance measurements? Two-wire resistance measurements certainly are attractive because you can fit twice as many two-wire measurements onto a card as you can four-wire measurements. The economics are attractive. Perhaps you can put a short circuit on one of the inputs to the switching card and measure that short to make a Relative-Ohms measurement? This line of reasoning also might lead you to select the highest density switching card possible. However, there are reasons to be careful. A typical switching card does not have the same resistance through all of its channels. Channel 0 may add 0.2 to the reading while Channel 20 may add 0.8 . Consequently, measuring a short on one does not give a good compensation for the other because they do not have the same resistance. Even if you could correct for the difference in channel-tochannel resistance, relays typically have about 50 m of contact resistance that will shift around by 20 m from one reading to the next. You might think that high-current relays will have lower contact resistance, but it doesnt work that way. High-current relays usually have silver-plated contacts that give low resistance for currents above 100 mA. Unfortunately, silver-plated contacts have a high and unpredictable contact resistance for currents less than 50 mA. Relays are made of nickel-iron materials, and they all have problems with thermal EMFs. Frequently, this error source is not specified for high-density switching cards. If not, the thermal voltages probably are around 100 V. If your DMM uses 10 mA to make this measurement, the switching card adds 10 m of error to the measurement. If your DMM uses only 1 mA, the switch will add 100 m of error to the measurement. Keep in mind that this error voltage is made up of all of the closed relay contacts connected to the sense lines of the DMM. The more complex the switching system is, the higher the error will be.
Figure 2. Four-Wire
The resistance of the current-carrying leads doesnt matter because they are not in the measurement path. The resistance of the sensing leads doesnt matter since they dont carry any current. A four-wire connection is not immune to thermal EMF errors caused by mismatched materials. This usually is not important in manual testing situations, but it is a major issue in automated systems where a relay switch is used.
SIX-WIRE
What if the resistor you want to measure is in a circuit with other components or resistors as in networks or on a loaded circuit board? Then you need a six-wire guarded connection. This method makes it possible to measure resistance in situations where it would be impossible otherwise. The SMX2064 DMM offers this capability (Figure 3).
A guard amplifier drives the junction of parallel components to a voltage level that prevents any of the test current from leaking away from the resistor under test. This is a standard method used by large ATE in-circuit test systems. With the right DMM, you can implement it too.
One way to reduce this error is to use a DMM with the Offset-Ohms function. However, this method is very slow, it adds noise, and it is limited in its capability to reduce the error. For best results, start with a high-quality switching card that is specified for low thermal EMF error. How big a problem are thermal EMF voltages in relay switches? A high-quality switching card has about 10 V while
Electricity Testing and Measurement Handbook Vol. 7 a typical one has >100 V of thermal voltages. There are a few instrumentation quality switches that exhibit 1V or less. Take a look at Figure 5 to see the effect. The yellow plots depict the specs of two similar DMMs. One of the DMMs uses 1-mA excitation current while the other uses 10 mA. There are some things to note:
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EXAMPLES
A manufacturer of semiconductor protection devices uses an SMX2064 on its low-resistance four-wire range to accurately measure resistances around 20 before and after hitting the device with a high test voltage. Because the SMX2064 can take an accurate measurement in as little as 1 ms, test throughput is high. A manufacturer of hybrid circuits uses an SMX2064 to measure resistance values of less than 100 m. In this case, speed is not an issue, but getting a useable measurement is. Other DMMs that use only 1-mA excitation current did not qualify to do the job.
Both DMMs have very similar specifications as shown by the yellow lines. As soon as you combine them with a relay card that has 10-V offset, the system error is considerably greater than the DMM spec. For the DMM with 10-mA excitation, the system error is almost two times the DMM spec. For the DMM with 1-mA excitation, the system error is almost 10 times the DMM spec. If you combine the DMMs with a relay card that has 100-V offset, the error becomes huge. For the DMM with10-mA excitation, the system error is almost 10 times the DMM spec. For the DMM with 1-mA excitation, the system error is almost 100 times the DMM spec. The effect of the relay offset voltages overwhelms the DMM specifications in both cases, but the DMM that uses 10-mA excitation current produces a system spec between five and 10 times better than the DMM that uses 1-mA excitation.
CONCLUSION
If you need to measure low resistance values, you benefit by using a DMM that has a 10-mA excitation current. A 1-mA source gives a much weaker signal to measure and presents system-level problems, particularly if there are switching cards involved. If you expect a stable, accurate result, you almost certainly need to use a four-wire connection. The accuracy spec of the DMM is important but not the whole story. Remember that everything in the measurement path affects the accuracy of the measurement, especially switching cards. Your best bet is to combine a DMM with good ohms specifications and high test current and a switching card with a low thermal EMF spec, preferably an instrumentation type.
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CUSTOMER NEEDS
This project serves the U.S. superconductor industry, which consists of many small companies, in the development of new metrology and standards, and in providing difficult and unique measurements. We participate in projects sponsored by other government agencies that involve industry, universities, and national laboratories. The potential impact of superconductivity on electric power systems, alternative energy sources, and research magnets makes this technology especially important. We focus on: (1) developing new metrology needed for evolving, large-scale superconductors, (2) providing unique databases of superconductor properties, (3) participating in interlaboratory comparisons needed to verify techniques and systems used by U.S. industry, and (4) developing international standards for superconductivity needed for fair and open competition and improved communication. Electric power grid stability, power quality, and urban power needs are pressing national problems. Superconductive applications can address many of them in ways and with efficiencies that conventional materials cannot. Second-generation Y-Ba- Cu-O (YBCO) superconductors are approaching the
TECHNICAL STRATEGY
International Standards With each significant advance in superconductor technology, new procedures, interlaboratory
64 comparisons, and standards are needed. International standards for superconductivity are created through the International Electrotechnical Commission (IEC), Technical Committee 90 (TC 90). Critical Current Measurements One of the most important performance parameters for large-scale superconductor applications is the critical current. Critical current is difficult to measure correctly and accurately; thus these measurements are often subject to scrutiny and debate. The critical current is determined from a measurement of voltage versus current. Typical criteria are electric-field strength of 10 microvolts per meter and resistivity of 1014 ohm-meters.
Electricity Testing and Measurement Handbook Vol. 7 273 kelvins (0 degrees Celsius) and 4.2 kelvins (the boiling point of liquid helium). The value of RRR indicates the purity and the low-temperature thermal conductivity of a material, and is often used as a materials specification for superconductors. The low temperature resistivity of a sample that contains a superconductor is defined at a temperature just above the transition temperature or is defined as the normal-state value extrapolated to 4.2 kelvins. For a composite superconducting wire, RRR is an indicator of the quality of the stabilizer, which is usually copper or aluminum that provides electrical and thermal conduction during conditions where the local superconductor momentarily enters the normal state. For pure Nb used in radio-frequency cavities of linear accelerators, the low temperature resistivity is defined as the normal-state value extrapolated to 4.2 kelvins. This extrapolation requires precise measurements. We have studied some fundamental questions concerning the best measurement of RRR and the relative differences associated with different measurement methods, model equations for the extrapolation, and magnetic field orientations (when a field is used to drive the superconductor into the normal state). Magnetic Hysteresis Loss Measurements As part of our program to characterize superconductors, we measure the magnetic hysteresis loss of marginally stable, high-current Nb3Sn superconductors for fusion and particle-accelerator magnets. We use a magnetometer based on a superconducting quantum interference device (SQUID) to measure the magnetic hysteresis loss of superconductors, which is the area of the magnetization-versusfield loop. In some cases, especially for marginally stable conductors, we use special techniques to obtain accurate results. Measurement techniques developed at NIST have been adopted by other laboratories.
ACCOMPLISHMENTS
Electric field versus current at temperatures from 7.0 to 8.3 kelvins in steps of 0.1 kelvins for a Nb3Sn wire.These are typical curves for the determination of critical current.
Critical-current measurements at variable temperatures are needed to determine the temperature margin for magnet applications. The temperature margin is defined as the difference between the operating temperature and the temperature at which critical current Ic is equal to the operating current. When a magnet is operating, transient excursions in magnetic field H or current I are not expected; however, many events can cause transient excursions to higher temperatures T, such as wire motion, AC losses, and radiation. Hence the temperature margin of a wire is a key specification in the design of superconducting magnets. Variable-temperature critical-current measurements require data acquisition with the sample in a flowing gas environment rather than immersed in a liquid cryogen. Accurate high-current (above 100 amperes) measurements in a flowing gas environment are very difficult to perform. Residual Resistivity Ratio Measurements The RRR is defined as the ratio of electrical resistivity at two temperatures:
Critical current versus temperature of a high-Tc Bi2Sr2CaCu2O8+x wire at various magnetic fields. Such curves are used to determine the safe operating current at different temperatures and fields.
Superconductor Data Enables U.S. Company to Offer Product to Korean Project New bismuth-based hightemperature superconductor wires are under active consideration for a 600 kilojoule superconducting magnetic energy storage (SMES) project lead by the Korea Electrotechnology Research Institute. The purpose of the SMES system is to stabilize the electric power grid. The magnet will be wound with 10-kiloampere superconducting cables composed of many round wires. It will be cooled to 20 kelvins by cryocoolers. A U.S. company turned to us for critical current measurements at 20 kelvins to
Electricity Testing and Measurement Handbook Vol. 7 determine whether its conductor could meet the projects specifications for critical current. Critical current, the largest current a superconducting wire can carry, is a key performance and design parameter. Critical current depends on temperature, magnetic field and, in many cases, the angle of the magnetic field with respect to the conductor. We made variable-temperature critical-current measurements on three wire specimens in magnetic fields up to 8 teslas, at various magnetic-field angles, and at temperatures from 4 to 30 kelvins. NIST has the only such multiparameter, high-current, variable-temperature measurement capability in the U.S. The largest current applied to the 0.81 millimeter diameter wire samples was 775 amperes. The results showed that the angle dependence of critical current for the wires was less than just 3 percent over the useful range of field and temperature, and that the round wires could be used at higher magnetic fields and temperatures than tape conductors. These data will be used to design the safe operating limits of the SMES magnet system. Key Measurements for the International Thermonuclear Experimental Reactor Superconducting magnets are used in fusion energy projects such as the International Thermonuclear Experimental Reactor (ITER), to confine and heat the plasma. The superconductors for ITERs large magnet systems are all cable-in-conduit conductors (CICC), which provide both mechanical support for the large magnetic forces and a flow path for the liquid helium required to cool the cable. The superconducting magnet must be operated below the critical current of the cable, which is a function of magnetic field and temperature. Temperature is an important variable, and the local temperature of the conductor depends on the mass-flow rate of the coolant and the distribution of the heat load along the CICC. We designed and constructed a new variable temperature probe that allows us to make measurements in our 52-millimeter bore, 16-tesla magnet. This probe replaces one that was designed for our 86-millimeter bore, 12-tesla magnet. Fitting everything into the smaller bore was difficult, but the new probe performed as expected and allows us to make measurements at the ITER design field of 13 teslas. We made measurements up to 765 amperes with a Nb3Sn sample in flowing helium gas. Measurements were made at temperatures from 4 to 17 kelvins and magnetic fields from 0 to 14 teslas. Some measurements were made at 15 and 16 teslas for temperatures from 4 to 5 kelvins; however, these magnetic fields can be generated only when a sample is measured in liquid helium.
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Electric field versus temperature at currents from 66 to 84 amperes in steps of 1.5 amperes for a Nb3Sn wire. These are typical curves for the determination of temperature margin.
Critical current versus temperature at various magnetic fields for a Nb3Sn wire. These curves show the current carrying limits for various combinations of temperature and magnetic field.
The results of our unique variable-temperature measurements provide a comprehensive characterization and form a basis for evaluating CICC and magnet performance. We used these data to generate curves of electric field versus temperature at constant current and magnetic field. In turn, these give a direct indication of the temperature safety margin of the conductor. International Standards on Superconductivity Many of the 14 published IEC/TC 90 standards on superconductivity contain precision and accuracy statements rather than currently accepted statements of uncertainty. NIST has advocated that TC 90 adopt a more modern approach to uncertainty. In collaboration with the Information Technology Laboratory, we have developed a 50-page report on the possibility of changing statements of accuracy to statements of uncertainty in IEC/TC 90 measurement standards, which was presented at TC 90 meetings in June 2006. They included proposed change sheets for 13 of the 14 TC 90 document standards. Ultimately, all TC 90 delegates voted in favor of changing to uncertainty statements during the maintenance cycle of existing standards and during the development of new standards. Current Ripple a Source of Measurement Errors All high-current power supplies contain some current ripple and spikes. New high-performance conductors have high critical currents that require current supplies over 1000 amperes. High-current power supplies with the lowest level of current ripple and spikes are often more than a factor of ten times more expensive than conventional supplies. In addition, current ripple and spikes are a greater problem for short-sample critical current testing than for magnet operation because of the smaller load inductance. Therefore, we need to understand the effects of ripple and spikes on the measured critical current (Ic) and n-value, the index of the shape of the electric field-current curve. We focused on how ripple changes the n-value and showed that, in terms of percentage change, the effect of ripple on n-value was about 7 times that on Ic Interlaboratory comparisons often show variations in n-value much larger than the variations in Ic. We examined models and use the measurements on simulators to attempt to reproduce and understand the effects observed in measurements on superconductors. We believe that current ripple and spikes are sources of differences in n-values measured at different laboratories. New Method to Evaluate the Relative Stability of Conductors We recently started measuring voltage versus magnetic field (V-H) on Nb3Sn wires to assess their relative sta-
66 bility. Voltage versus current (V-I) at constant field is usually measured to determine Ic. Low-noise V-H measurements were made at constant or ramping current with the same electronic instruments, apparatus, and sample mount as used in Ic measurements. High-performance Nb3Sn wires exhibit flux-jump instabilities at low magnetic fields, and low-noise V-H curves on these wires show indications of flux jumps. V-H measurements also reveal that less stable wires will quench (abruptly and irreversibly transition to the normal state) at currents much smaller than Ic at the lower magnetic fields. This new method needs to be further understood and may be standardized to ensure that it provides accurate and reliable data.
Electricity Testing and Measurement Handbook Vol. 7 IEC 61788-5 Superconductivity Part 5: Matrix to Superconductor Volume Ratio Measurement Copper to Superconductor Volume Ratio of Cu/Nb-Ti Composite Superconductors IEC 61788-6 Superconductivity Part 6: Mechanical Properties Measurement Room Temperature Tensile Test of Cu/Nb-Ti Composite Superconductors IEC 61788-7 Superconductivity Part 7: Electronic Characteristic Measurements Surface Resistance of Superconductors at Microwave Frequencies IEC 61788-8 Superconductivity Part 8: AC Loss Measurements Total AC loss Measurement of Cu/Nb-Ti Composite Superconducting Wires Exposed to a Transverse Alternating Magnetic Field by a Pickup Coil Method IEC 61788-10 Superconductivity Part 10: Critical Temperature Measurement Critical Temperature of Nb-Ti, Nb3Sn, and Bi-System Oxide Composite Superconductors by a Resistance Method IEC 61788-11 Superconductivity Part 11: Residual Resistance Ratio Measurement Residual Resistance Ratio of Nb3Sn Composite Superconductors IEC 61788-12 Superconductivity Part 12: Matrix to Superconductor Volume Ratio Measurement Copper to NonCopper Volume Ratio of Nb3Sn Composite Superconducting Wires IEC 61788-13 Superconductivity Part 13: AC Loss Measurements Magnetometer Methods for Hysteresis Loss in Cu/Nb-Ti Multifilamentary Composites IEC 60050-815 International Electrotechnical Vocabulary Part 815: Superconductivity
STANDARDS COMMITTEES
Loren Goodrich is the Chairman of IEC/TC 90, the U.S. Technical Advisor to TC 90, the Convener of Working Group 2 (WG2) in TC 90, the primary U.S. Expert to WG4, WG5, WG6 and WG11, and the secondary U.S. Expert to WG1, WG3, and WG7. Ted Stauffer is Administrator of the U.S. Technical Advisory Group to TC 90.
STANDARDS
In recent years, we have led in the creation and revision of several IEC standards for superconductor characterization: IEC 61788-1 Superconductivity Part 1: Critical Current Measurement DC Critical Current of Cu/Nb-Ti Composite Superconductors IEC 61788-2 Superconductivity Part 2: Critical Current Measurement DC Critical Current of Nb3Sn Composite Superconductors IEC 61788-3 Superconductivity Part 3: Critical Current Measurement DC Critical Current of Ag-sheathed Bi-2212 and Bi-2223 Oxide Superconductor IEC 61788-4 Superconductivity Part 4: Residual Resistance Ratio Measurement Residual Resistance Ratio of Nb-Ti Composite Superconductors Critical current vs. temperature of a Bi-2212 tape at a magnetic field of 0.5 tesla and various magnetic field angles. Such curves are used to determine the safe operating current at various temperatures and field angles.
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Modular up to six channels High linearity Low offset High bandwidth up to 1MHz Extremely low phase shift High CMR due to galvanic insulation Transducer heads from 200A to 5000A Current and voltage output Optimised for power electronics needs
ZERO-FLUX-PRINCIPLE
The transducer consists of a transducer head and an electronic module. In the transducer head there are three iron cores with a common secondary winding but with separate auxiliary windings. The primary current lp, via the winding Lp, produces a magnetic field in the three iron cores of the transducer. Thereby Lp mostly consists of the primary conductor, which is lead through the transducer. The compensation current lc compensates the magnetic field of the primary current and provides a steady zero-flux in the iron core. This compensation current is driven by an operation amplifier to which both inputs are connected with a signal which is proportional with the AC- and DC-component of the primary conductor current. The AC-component is thus induced into the auxiliary winding Lh1. The DC-component and the very lowfrequency component comes from the socalled Zero-FluxDetector (symmetry detector). Via an oscillator and the auxiliary windings Lh2 and Lh3, the other two iron cores are driven into saturation in different directions.
68 Both iron cores and the auxiliary windings Lh2 and Lh3 are built identically. The currents via Lh2 and Lh3 are thus identical. In this case, the main core flux is zero. A direct current via the primary conductor results in a flux via the core. Therefore, both Zero-Flux-Detector cores can no longer be driven into saturation identically, and the two currents via Lh2 and Lh3 are no longer equal. The difference between the currents is proportional with the DC component of the current lp. The Zero-Flux-Detector processes this signal and leads it to the DC-input of the operation amplifier which drives the compensation current. This way the DC-component of the primary current can also be compensated. The compensation current is an accurate reproduction of the primary current, and can be evaluated as a galvanic separated signal by all types of measuring instruments. The burden resistor is only to be used if the measuring instrument only has voltage inputs. The advantage of this technology is mostly the high accuracy of the transducer. The sensitivity of the Zero-FluxDetector and of the iron cores allows the best possible ppm-accuracy. A transducer bandwidth of a few hundred kHz can easily be obtained.
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The tests were conducted with the following equipment manufactured by AEMC instrument: Model 4500, 4-Point Ground Resistance Tester Model 4630, 4-Point Ground Resistance Tester Model 3731, Clamp-On Ground Resistance Tester. Additionally, we used the AEMC Model 5600, a micro-ohmmeter to verify the bonding of the aluminum wire to the individual ground rods. The soil conditions in the test area were predominately loam with some gravel. Conditions on the day of the test were dry and sunny, some light rain had occurred the previous day to the test. Therefore, the soil was somewhat moist at the surface. The AEMC Model 5600 Micro-Ohmmeter was used to measure bonding resistance at each rod and was the first test completed. Measurements from each conductor to the rod were taken as well as measurements from conductor to
In the first test, the AEMC Model 4500 was used as 3Point ground tester. Rod number three was first disconnected from the other rods in the system so that its individual resistance could be measured. The X lead was attached to rod number three (see Figure 3). The Z lead was attached to an auxiliary electrode 100 feet away and the Y lead was initially connected to the auxiliary electrode 60 feet away. Readings were taken with the Y electrode at 90, 80, 70, 60, 50, 40, 30, 20 and 10 feet. Figure 3 shows the results of this test.
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The same test was repeated using the AEMC Model 4630 fall-of-potential ground tester. The results are shown in Figure 5.
Finally, the AEMC Model 3731 was used to measure the resistance at rod number three with all other rods detached from it. A temporary cable was installed between rod number three and the municipal grounding system, thus setting up the required parallel paths necessary for accurate measurement using a clamp-on ground tester (see Figure 6). Under these conditions, the reading was 84.5. The results of these tests showed that the clamp-on ground tester is indeed an effective tool in measuring ground resistance when used under the proper conditions. Readings between the clamp-on ground testing and the fall-of-potential ground testing method correlate. The advantages of using the clamp-on tester were the ability to test without disconnecting the rod from service and the ability to test without the need for auxiliary ground electrodes. These two points saved considerable amount of time in conducting the test
Figure 6. Single rod test using the Model 3731 clamp-on ground resistance tester
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INTRODUCTION
By definition, all of todays wireless communication systems contain one key element, an antenna of some form. This antenna serves as the transducer between the controlled energy residing within the system and the radiated energy existing in free space. In designing wireless systems, engineers must choose an antenna that meets the systems requirements to firmly close the link between the remote points of the communications system. While the forms that antennas can take on to meet these system requirements for communications systems are nearly limitless, most antennas can be specified by a common set of performance metrics.
GAIN
The gain, or power gain, is a measure of the ability to concentrate in a particular direction the net power accepted by the antenna from the connected transmitter. When the direction is not specified, the gain is usually taken to be its maximum value. Antenna gain is independent of reflection losses resulting from impedance mismatch.
RADIATION EFFICIENCY
The radiation efficiency of an antenna is the ratio of the power radiated by the antenna to the net power accepted at its input terminals. It may also be expressed as the ratio of the maximum gain to the directivity.
INPUT IMPEDANCE
Input impedance is the parameter which relates the antenna to its transmission line. It is of primary importance in determining the transfer of power from the transmission line to the antenna and vice versa. The impedance match between the antenna and the transmission line is usually expressed in terms of the standing wave ratio (SWR) or the reflection coefficient of the antenna when connected to a transmission line of a given impedance. The reflection coefficient expressed in decibels is called return loss.
RADIATION PATTERN
Antenna radiation patterns are graphical representations of the distribution of radiated energy as a function of direction about an antenna. Radiation patterns can be plotted in terms of field strength, power density, or decibels. They can be absolute or relative to some reference level, with the peak of the beam often chosen as the reference. Radiation patterns can be displayed in rectangular or polar format as functions of the spherical coordinates q and f. A typical antenna pattern in a rectangular format is shown below1.
POLARIZATION
The polarization of an antenna is defined as the polarization of the electromagnetic wave radiated by the antenna along a vector originating at the antenna and pointed along the primary direction of propagation. The polarization state of the wave is described by the shape and orientation of an ellipse formed by tracing the extremity of the electromagnetic field vector versus time. Although all antennas are elliptically polarized, most antennas are specified by the ideal polarization conditions of circular or linear polarization. The ratio of the major axis to the minor axis of the polarization ellipse defines the magnitude of the axial ratio. The tilt angle describes the orientation of the ellipse in space. The sense of polarization is determined by observing the direction of rotation of the electric field vector from a point behind the source. Right-hand and left-hand polarizations correspond to clockwise and counterclockwise rotation respectively.
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Electricity Testing and Measurement Handbook Vol. 7 aration between the transmitting antenna and the receiving antenna for a reasonable approximation of the far field gain and radiation patterns. At distances from a transmitting antenna, which are large compared with the antenna dimensions, the phase front of the emergent wave is nearly spherical in shape. For extreme separations, the radius of curvature is so large that for all practical purposes the phase front can be considered planar over the aperture of a practical antenna. As the antennas are brought closer together, a condition is reached in which, because of the short radius of curvature, there is an appreciable separation D between the wavefront and the edges of the antenna aperture.
Ground Reflection Range Spherical Phase Front Tangent to a Plane Antenna Aperture
A criterion that is commonly employed in determining the minimum permissible value of R is to hold D to a maximum of 1/16 wavelength (equivalent to 22.5 of phase variation). If this condition is met, the receiving antenna is said to be in the far field of the transmitting antenna. The mathematical expression for this minimum range:
Planar Near-Field Cylindrical Near-Field
A few of the more commonly used antenna test ranges are shown here. Regardless of the chosen test range, three key factors must be addressed and controlled to ensure a successful measurement. These factors are Spherical Near-Field the phase variations of the incident field, the amplitude variations of the incident field and the stray signals created by reflections within the test range.
The major effect of a small deviation D is to produce minor distortions of the sidelobe structure. Larger values of D will cause appreciable errors in the measured gain and lobe structure. Conversely, this condition can mask asymmetrical sidelobe structures which are actually present.
Electricity Testing and Measurement Handbook Vol. 7 of signal level, results in an asymmetrical aperture illumination and error in the measurement of the sidelobe structure.
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From the viewpoint of suppressing range surface reflections, it is also desirable to maintain the test height H, greater than or equal to 6D. If one must, for practical reasons, employ test heights less than approximately 4D, the ground-reflection technique should be considered.
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Electricity Testing and Measurement Handbook Vol. 7 integrated antenna assembly with its associated transmitting and control circuitry. Due to these issues, pulsed RF operation presents an additional set of test problems not often encountered in CW operation. As a result, instrumentation complexity increases and measurement system timing issues become critical. The basic pulsed antenna test parameters are identical to those encountered in CW measurements. Gain, sidelobe levels, pointing accuracy, beamwidth, null locations and depths, and polarization parameters are essential to fully characterizing an antenna. In addition to the traditional time invariant antenna performance parameters, some new time dependent parameters emerge when testing under pulsed conditions. These include transient effects such as beam formation and distortions as a function of time within a pulse or over an ensemble of pulses, power output (i.e. gain) as a function of time within a pulse or pulse burst, etc. Compounding these measurements is the additional burden of multi-channel, multi-frequency, and multi-state measurements as a function of pulse repetition frequency (PRF), duty factor (DF) and operating frequency. Due to the increasingly integrated nature of antennas with their transmitters, the measurement system must be responsive to external RF pulse generation and timing for both single and multiple pulse measurements.
Electricity Testing and Measurement Handbook Vol. 7 Often, a computer subsystem is added to the instrumentation to automate the entire measurement sequence. This computer subsystem employs a standard bus interface, like the IEEE-488, to setup and monitor the individual instruments. High-speed data busses are utilized for the measurement data to maximize data throughput and productivity. An automated antenna measurement system offers a high degree of repeatability, speed, accuracy, and efficiency with minimum operator interaction. Data storage is conveniently handled by a variety of media including a local hard drive, floppy disk, removable drives or bulk data storage on a local area network. After data acquisition is completed, an automated system supports analysis of the measured data such as gain and polarization plus a wide variety of data plotting formats such as rectangular, polar, three-dimensional, and contour plots.
75 The test positioner axes are controlled and read out by the positioner control and readout units. A typical control system consists of a control unit located in the operators console. It is interfaced to a power amplifier unit located near the test positioner. This configuration keeps the high power drive signals near the positioner and away from sensitive measurement instruments while providing remote control of positioner functions from the equipment console. The position readout unit is located in the equipment console to provide real time readout of position axes to the operator or, in the case of an automated system, to the computer. The source antenna is normally located at the opposite end of the range on a tower or other supporting structure. The signal source is installed near the source antenna to minimize signal loss. An outdoor enclosure protects the source from the elements. For some applications a multiplexer can be used between the signal source and a dual polarized source antenna. This configuration allows simultaneous co- and cross-polarization measurements to be performed. Motorized axes to position the source antennas polarization, height and boresight are controlled by a positioner control and indicator system. The signal source and positioner axes are remotely controlled from the operators console via serial digital link(s). Twisted pair cable, fiber optics or telephone lines can be used to interface the digital link from the source site to the control console. One or two positioner control systems may be used on an outdoor range depending upon the length of the range and the total number of axes to be controlled. On very long ranges, or in cases where the control room is not close to either positioner, it may be advantageous to use a separate control unit for each end of the range. Also, since outdoor ranges frequently have many axes due to the source tower axes, multiple controllers may be required to control all axes. A block diagram of a typical outdoor range is shown below.
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COMPACT RANGE
In a point-source compact range, the feed is usually located just in front of and below the test antenna. In this configuration, the receiver local oscillator and signal source can be located very close together. Special care must be taken to guard against direct leakage of the signal source into the test antenna. High quality RF cables and special shielding are sometimes used to insure against this stray leakage. Otherwise, instrumentation for the compact range is very similar to an anechoic chamber.
Compact Range with Automatic Control Configured for Multiple Port Measurements1
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NEAR-FIELD RANGE
Near-field ranges usually are configured for automatic control. The large numbers of measurements required, and the need to transform the near-field data to the far-field, requires the use of a computer system both for data acquisition and for data reduction and display. The configuration of a near-field range is similar to a very short indoor range. The antenna may be tested in the transmit mode, receive mode, or both. Consequently, the design of the RF system and the location of the source and receiver front end must be considered for each application. The figure below is one example of a planar near-field application where the test antenna is to be tested in both transmit and receive modes.
CONCLUSIONS
As technology progresses, the requirements placed upon wireless communication systems and their associated antennas will continue to become more stringent. For example, the desire to increase network capacity will result in the requirement to reduce adjacent channel interference within the system, which will result in more stringent antenna sidelobe and cross-polarization requirements. The verification of the performance of antennas selected to meet these and other requirements will, in turn, require test ranges with higher accuracy measurement capability. Fortunately, the technologies used to advance the art of antenna design is also being used to advance the design of antenna test and measurement ranges and instrumentation. Many of the simulation tools available to antenna designers are also used to design antenna ranges. The increased use of commercial off-theshelf hardware and software, in conjunction with the increased use of automated test instrumentation networked into the local area network, will ensure that current state-of-the-art antenna measurement systems meet the needs of the advanced antennas and systems coming to the wireless marketplace.
REFERENCES:
[1] Product Catalog, Microwave Measurements Systems and Product, Microwave Instrumentation Technologies, LLC. [2] R. Hartman and Jack Berlekamp, Fundamentals of Antenna Test and Evaluation, Microwave Systems New and Communications Tracking, June 1988. [3] J.S. Hollis, T.J. Lyon, and L. Clayton, eds., Microwave Antenna Measurements, Scientific-Atlanta, Inc., 1985. [4] R.C. Johnson and Doren Hess, Conceptual Analysis of Measurements on Compact Ranges, Antenna Applications Symposium, September 1979. [5] R.C. Johnson editor, Antenna Engineering Handbook, McGraw-Hill Inc., 3rd edition, 1993.
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STAGED TESTS
Staged field tests provide sufficient information to identify the values of the key parameters of the computer simulation models. Such tests are selected to minimize the effect on plant operation, allow ease of simulation of the staged tests, and, to the extent possible, reduce the complexity of the parameter derivation problem by having the response of an individual test significantly affected by only a few parameters. The test methodology described is just one testing methodology; other methods are used successfully also. However, the tools and procedures developed and used in this parameter derivation software could be adapted to these other variants in the testing process. The testing process is divided into two phases. One phase involves collecting steady-state measurements, which are used to establish base values of quantities and to identify values for parameters that are associated with steady-state operation. The second phase involves collecting the dynamic response of the generator, excitation system, and governor/turbine system to staged disturbances.
STEADY-STATE MEASUREMENTS
The steady-state measurements are divided into two groups: the open circuit saturation curve measurements and online measurements. The open circuit saturation curve is measured with the unit operating offline at rated speed. The generator field excitation is varied, and measurements of terminal voltage, field voltage, and field current are taken. The online measurements (also sometimes called V-curve measurements) are performed with the unit connected to the electrical network and placed at a given load. At that load level, the generator field excitation is varied to change the reactive power output. Typical measurement points are given in graphical form in Figure 1.
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DYNAMIC TESTS
The gains and time constants of the models can be determined only from tests that excite the dynamic response of the equipment. The models of concern are those of the generator, excitation system, and governor. The purpose of the dynamic tests is to provide a simple and safe disturbance to excite the unit in order to record its dynamic response. The usual approach is a series of load rejection tests with the unit initially carrying partial load. Each of the tests has identification of certain parameters as its primary goal. The loading of the machine is selected to isolate those parameters as much as possible in order to reduce the complexity of the derivation process. The initial conditions for a typical set of load rejections are listed in Table 1.
PROGRAM OVERVIEW
DeriveAssist works through a graphical user interface (GUI) and is written to operate on a personal computer. The program uses the MATLAB/Simulink and the Optimization Toolbox as the calculation engine for the parameter derivation process. MATLAB is a high-performance language for technical computing. Simulink is a graphical tool for modeling, simulation, and analysis of dynamic systems. The Optimization Toolbox is a collection of routines that extend the capability of MATLAB for such problems as nonlinear minimization, equation solving, and curve fitting. By combining these tools with the experience gained through years of testing and parameter derivation, the process of parameter identification and derivation has been significantly advanced. The program is organized to facilitate the derivation of the parameters in a logical order, starting with the steady-state tests and then proceeding to the dynamic tests. The main entry point into the program is a window with several pull down menus. Each menu item has several submenu choices. Each of these submenu choices performs a particular task. The submenus were also designed to reflect a particular test. The five menus are: File I/O Steady-state tests Dynamic tests Control tuning Help. The parameter derivation program is organized to facilitate the derivation of the parameters in a logical order, starting with the data from the steady-state tests and then proceeding to the dynamic tests for the generator, excitation system, and governor. Where a certain sequence of actions must be observed (i.e., read saturation curve first before trying to calculate the saturation parameters), the program performs a check and warns if the prerequisite tasks have not been performed.
Electricity Testing and Measurement Handbook Vol. 7 Xd only, then the error function to minimize uses only field current, Ifd. However, if the user selects Xq, the error function will be based on power angle. The last option is only possible when rotor angle measurements have been made during the field tests. Figure 3 shows the program output screen following the derivation of the generator steadystate reactances.
81 and measured quantities are quite different. For the generator, the information from the load rejection tests is used to calculate the time constants, the transient reactances and the subtransient reactances of the generator. For the excitation system, the AVR and exciter gains and time constants can be determined. The governor models vary significantly depending on the type of prime mover, that is, steam, gas, or hydroelectric turbine. However, the process determines the gains and time constants representing the governor and turbine dynamics. In all cases, a comparison was made between a measured signal and a simulated signal to define an error function. The program attempts to improve the model performance by adjusting the model parameters in the appropriate direction and repeating this simulation until the error signal is minimized. The process will be illustrated using the derivation of excitation system parameters, but the reader should keep in mind that the general process would be similar for the other equipment models.
82 Inputs to the excitation model are terminal voltage (from the generator) and reference voltage, while the output is field voltage Efd, which is fed back as an input to the generator model. The inputs and outputs allow data to be passed between MATLAB and Simulink and between the models. The parameters are defined such that they can be changed and passed to Simulink in the optimization process. As an example, Figure 5 shows what lies under the excitation system block in Figure 4. The primary input is the voltage Ecomp and the output is the field voltage Efd. The reference Vref is calculated from the initial condition of the test. Auxiliary signals such as those from the power system stabilizer and under- or over-excitation limiters are present in the model structure but are not exercised purposely by the selection of the tests, concentrating on the excitation parameters. The optimization phase of the model parameter derivation involves the automatic adjustment of the model parameters until the difference between the Simulink model response and the desired response (measured response) is minimized. The optimization process tries to find the combination of model system parameters that best provide the desired response, that is, to find the values of the excitation system model parameters that will move the initial model response as close as possible to the measured response.
every few seconds as the model parameters are adjusted, a new simulation is performed, and the new output is displayed. The simulation output gradually shifts from the original response to very closely match the desired response. Figure 6 shows the shows a comparison of a simulation using an initial set of parameters and the measured response. Note that the original parameters are not a good approximation of the actual equipment. The simulation, in this case, is quicker and much better damped. The response gets progressively closer to the measured output following each pass of the derivation process until; at last, the two curves are essentially one on top of the other. The final plot is shown in Figure 7. The whole optimization process to determine the parameters takes only a minute or two on a typical PC. Generator and governor model parameters are derived in a manner quite similar to that described for the excitation systems. The tests performed on the unit are considerably different, of course, as the determination of the governor response characteristic requires a test resulting in a power imbalance and subsequent movement of generator speed while the tests for the generator parameters require isolation of the generator dynamics by placing the AVR on manual.
ONGOING EFFORTS
The DeriveAssist parameter derivation software described so far allows the derivation of all the generator steady state parameters and includes most of the Simulink models for generators, exciters and governor systems. However, additional work is required to further develop the software. Some of the tasks for future work include: Derivation of excitation system parameters from AVR reference step tests Extension of the methodology to brushless excitation systems. Develop algorithms designed to assist the user in the tuning of equipment such as exciters and stabilizers.
A comparison of the simulation output and the measured (desired) output is displayed for each successive pass of the optimization process. The user sees the simulation output change
Electricity Testing and Measurement Handbook Vol. 7 There are also a few technical issues that require further attention, including: Additional investigations to overcome some problems in the automatic initialization of Simulink models Improvements to the model library and the ease of selecting the model structures for the excitation system and governor Improvements to the GUI and data passing between Simulink, MATLAB, and the Optimization Toolbox Additional reporting routines. The ongoing further development work will improve its functionality and expand its capabilities.
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ACKNOWLEDGMENTS
This article describes research sponsored by EPRI and NYPA. The authors would also like to acknowledge F.P. de Mello for his contributions to the original ideas behind the parameter derivation process used in this project and Ricardo J. Galarza for his contributions in the development of this parameter derivation software. The idea of developing this MATLABbased tool was originally conceived by Bruce Fardanesh.
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INTRODUCTION
Our task was to develop an automated test system for magnetic ballasts used in high-pressure sodium (HPS) streetlights. Our client, who manufactures ballasts for the North American and international markets, believes that product development and quality assurance require thorough and complete testing of prototypes and production samples to verify compliance with national and/or international standards. The test system needed to accommodate the following: Different types of core and coil ballasts, such as reactor, autotransformer, constant wattage autotransformer (CWA), and constant wattage isolated transformer (CWI) Operating voltages from 120 to 600 V and rated lamp wattage from 50 to 400 W Capacitors for wattage control and/or power factor correction Different lamp igniters Open-circuit, short-circuit, lamp-starting, and lamp running tests At the ballast input and output ports, we needed to measure true rms values of current and voltage, true power, and the ratio of watts to volt-amperes (power factor, if the voltage and current waveforms are clean sinusoids). Because HPS lamps are nonlinear loads, we monitor current and voltage peak values and crest factors, along with total harmonic distortion.
86 5B signal conditioning modules, to amplify and isolate the ltered signals National Instruments Lab-PC+, installed in the PC, to digitize the conditioned signals The cut-off frequency of the antialiasing lters was set to half the sampling frequency; the RC lters also serve to protect the electronics items from the high-voltage spikes generated when the igniter starts the lamp. We congured the Lab-PC+ board for bipolar differential input (four channels). We set the sampling frequency to 7680 Hz/channel. Acquisition was software-triggered on the rising slope of the input voltage.
EXAMPLE RESULTS
The results presented in the BallastVIEW screen are test results for a 200 W CWI ballast. The output power analyzer indicates that the lamp is operating at rated lamp power. Lamp voltage and current are very close to the ANSI reference specications (100 V and 2.4 A). Lamp current crest factor (CCF) is 1.6 (1.8 is the maximum permissible). The input power analyzer indicates that the ballast draws 2.037 A at rated input voltage. Ballast loss is approximately 39 W and the power factor is high (0.973 lagging). The waveform graph shows almost clean input voltage and current signals. Output (lamp) voltage is the square waveform of a typical arc in a high-intensity-discharge (HID) lamp, containing the full odd harmonics spectrum. The magnitude of the lamp voltage third-harmonic component is 39 percent of the fundamental. Total harmonic distortion (THD) of lamp voltage and lamp current are 33.84 percent and 3.73 percent, respectively. We veried the credibility of this system by obtaining agreement with test results from an independent test laboratory, electric utility companies, and customers of the ballast company. The result is a exible, high-performance, easy-to-use, and cost-effective PC-based measurement system, which saved time in both product development and production testing.
BALLASTVIEW PRESENTATION
The LabVIEW screen on the next page is the front panel of BallastVIEW. It illustrates a stack of VIs representing an input AC power analyzer, an output AC power analyzer, a waveform graph, and a harmonic analyzer. The controls at the top of the screen are switches for controlling acquisition, metering, harmonic analysis, and program execution. The user can capture a single shot or continuously acquire signals. For the power analyzers, the indicators (from left to right in each row) display the rms, maximum, minimum, peak average, and crest factor of each signal. The active and apparent power, and their ratios, are displayed in the right column. The waveform graph displays the signals acquired by the data acquisition (DAQ) board. Because both voltage current waveforms are displayed, the ordinate is labeled in relative units (PU). To nd the true amplitude of a particular signal, multiply its measured value from the graph, in PU, by the respective base value from the PU Base table (to the right of the waveform). The line spectrum, shown in the bottom right corner, displays harmonic magnitude in either peak volts/amperes or per unit values normalized to the fundamental component of the respective signal. Magnitude of harmonics can be checked by ipping the cursors of the harmonic magnitude indicator (bottom center). The user can window signals before applying the Fast Fourier Transform.
CONCLUSION
BallastVIEW measures and displays the electrical parameters required to test and develop ballasts and performs on-line waveform analysis. The result is a exible, high-performance, easy-to-use, and cost-effective PC-based measurement system, which saved time in both product development and production testing. An advantage of using LabVIEW is our ability to increase BallastVIEW functionality in the future, for example, by monitoring the ballast-lamp characteristic curves and compiling results. The core of the BallastVIEW program constitutes the cornerstone for testing other electrical products, such as transformers, rectiers, inverters, and UPSs, as well as for power line monitoring.
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ASSET MANAGEMENT
The Path to Maintenance Excellence Mike Sondalini, Managing Editor, Feed Forward UP-TIME Publications
This article tell the Japanese way of doing asset management and maintenance. If you think you already have a good system then you will enjoy reading this months newsletter as you compare yours and theirs. If you have a poor system then you will get a totally different view of how great maintenance can be done. tion as the previously mentioned methods but they arrive at the rating and the response to it in a unique, quick four-step process. They used a simple flow chart that production and maintenance worked through together, equipment by equipment. Those failures that caused safety and environmental risks were not allowed to happen and either the parts were carried as spares and changed out before failure or the plant item was put on a condition monitoring program. Those failures that caused production loss or affected quality also were either not allowed to happen or put into a condition-monitoring program. And those failures that didnt matter were treated as a breakdown. The flowchart let one arrive at a rating and a corrective action for each piece of equipment and component fast. No need to spend hours and days looking at failure modes and deciding what to do about them. If an equipment or component loss produced dangerous situations, or if the failure stopped production or affected quality, it was either changed out before the end of its working life or it was put on a monitoring program. The maintenance philosophy for every bit of plant could be arrived at in a four-step decision process. It was very easy to use and to decide what action to take.
OVERVIEW
I spent a week in Japan at the chemical plant of an internationally renowned chemical manufacturer. While there I asked them about how they do their maintenance. They told me about their maintenance philosophy. And I want to pass on to you what I learnt about the Japanese way of doing maintenance on that trip. You will read about how this Japanese company determines its equipment and component criticality. You will learn about a new, truly effective way, of making next years maintenance plan. We will cover condition monitoring the Japanese way. The Japanese are great maintenance investigators and you will be impressed when you learn how they do their failure analyses. We will also cover their psychology of maintenance the way they think about maintenance and how they look at it. You will be astounded at their mind-set.
88 plan! It would be one that is totally defendable and fully justifiable to upper management because it is well thought out, rooted in getting the best return for your money and based on the important business requirements to continue in operation. My suggestion to cover the period beyond the next two or three years (and only if it is necessary in your company), is to use the spreadsheet to make forecasts. Project ahead based on what you plan to do in the coming two to three years to fix the current problems. If you arent going to fix the problems then dont assume less maintenance in the future. Remember that a forecast is not a plan! A forecast is a best-guess suggestion, often known as blue sky dreaming. A plan is a set of action steps that over time will produce a desired result. They are totally different to each other.
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The second type or steady-state measurements occurs when one or more inputs of known value are applied to the DUT and its outputs can settle to their steady-state value before you measure the signals. In this case, the measurement process depends on the time of the measurement if you measure the signals too early, accuracy suffers because the source output may not have fully settled. Although you can measure the signals accurately any time after the output has settled, you must minimize the delay to reduce test time. Many test developers insert an arbitrary delay in their test programs to ensure accurate results. While this is a simple fix, test time suffers. Analog electronic component evaluation and manufacturing test often involves measurements of both transient and steady-state parameters.
90 Some examples are: Rotationally oriented measurements A master digitizer or oscilloscope, monitoring defects found on rotating circular or cylindrical devices such as computer hard drives, industrial cylindrical tubes, and automotive wheel shafts, passes a digital trigger to a slave counter/timer device making quadrature encoder measurements (position measurements). The system can correlate defects and anomalies to angular and radial position rather than time. High channel count measurements Multiple digitizers acquire data on reception of an external digital trigger from an external triggering module or a master digitizer in the system. With the examples above, two issues arise: The trigger signal should arrive at each slave device with minimal delay and skew between each other. The delay and skew are separate issues and need equal consideration. With a significant delay from the master to the slaves, you lose synchronization. Minimal path length for signal propagation from master to slaves is crucial for tight synchronization. The other important, but subtle, consideration is the skew between slave devices. So that each slave triggers at precisely the same time, you need to minimize the device-to-device skew in time. At the least, the delay and skew should be identified to some uncertainty. Measurements that require relatively low sampling rates can tolerate a degree of slack in the specifications of a system set up. At high sampling rates, these issues can affect the measurement integrity.
Electricity Testing and Measurement Handbook Vol. 7 tinually rewrites until it receives a trigger. After the device receives the trigger, the digitizer continues to acquire post-trigger samples if you specified a post-trigger sample count. The ability to correlate waveforms acquired on the various devices depends on the accuracy of the time-stamp of the trigger.
3. TRIGGERS AND A REFERENCE CLOCK TO INITIATE AND CONTROL THE TIMING ON ALL DEVICES
This scheme of synchronization is usually for high-speed synchronization. It involves start/stop trigger signals and a reference clock (typically 10 MHz) to all devices involved. The sampling clock of each measurement device is derived from the reference clock by dividing the reference clock to obtain higher speed sampling clocks. The master is set to look for an external trigger (analog or digital), or to start acquisition on a software command. When triggering conditions are met on the master, this device distributes a trigger signal to all slave devices to start operation.
The second issue concerns the intrinsic accuracy of the measurement device you should identify or calibrate the time that the device received the trigger signal to the first pre-trigger or post-trigger sampled point in each device. You can program many measurement devices, such as digitizers, to continuously acquire samples into a circular onboard memory buffer that con-
Electricity Testing and Measurement Handbook Vol. 7 With the previous scheme, you could have a direct feed of the sample clock to each device. This is the ideal scenario, however, it is not easy to pass a high-speed sampling clock (such as 100 MHz clocks) across cables and/or trigger buses because of line integrity and propagation delays. So, this scheme shares a common reference clock for generation of all sample clocks. The method usually employed to synchronize and generate sampling clocks is phase lock looping (PLL). This method basically monitors the phase of the reference clock and produces a high-speed sampling clock that is phase locked to the reference clock, as shown in Figure C above. Third-party frequency sources, such as rubidium and oven-controlled crystal oscillator (OCXO)-based frequency sources, are ideal for synchronization applications because of their accuracy. These are frequency sources with accuracies of better than 100 parts per billion (ppb). Thus, an OCXO source with 100 ppb accuracy yields a 10 MHz clock with 1 Hz uncertainty. Another important property of your reference clock is multiple output capability for multiple instrument synchronization. The reference clock from either the master instrument or a precision frequency source should be capable of being driven to multiple destinations without any loss of signal integrity. An example of this would be a minimal phase offset between the reference clock outputs from the frequency source. The same issues that arose in the previous scenarios are also relevant in this scheme. The trigger and reference clock signals should arrive at each slave device with minimal delay and skew between each other. At the least, the delay and skew should be known to some uncertainty. The issue of minimal skew between each device is crucial for high-speed digitization. If the skew is large, the time stamp of the incoming trigger on each device will not be coincident in time, and you cannot accurately correlate events captured on separate devices.
91 are shared via a ribbon. You can serially chain two, three, four, or five boards together, thus achieving synchronization of several I/O channels. Another attractive feature of these trigger buses is built-in switching, so you can route signals to and from the bus on-the-fly through software programming. This eases the burden of having to manually configure your timing and triggering signal distribution on your boards. You can find examples of these features in National Instruments measurement products in the form of the RTSI bus. Connections Integrated with the Measurement Platform Some of the computer-based measurement devices are implemented in form factors such as VME/VXI and CompactPCI/PXI. VME/VXI, an older industrial form factor, and PXI/CompactPCI, a newer industrial form factor, both address test and measurement, telecommunications, defense, industrial research, and many other markets. VXI and PXI extended VME and CompactPCI by adding timing and triggering buses to the form factors. This greatly simplifies synchronization of multiple devices.
SYNCHRONIZATION OPTIONS
Measurement devices come with three main options for connecting synchronization signals user-supplied cabling, proprietary vendor-defined cabling, and connections integrated with the measurement platform. User-Supplied Cabling User-supplied cabling of signals for synchronization is available for both computer-based and stand-alone measurement devices. For example, you can often externally synchronize your function generator or digital storage oscilloscope (DSO) to a reference frequency source. When you decide to synchronize your instrumentation, you have to ensure that your cables from your frequency source to the other components of your measurement system are precisely matched in length in order to avoid skew. The same criteria need to apply in distribution of your trigger signal from master to all slave devices. As noted above, your frequency source should have the ability to distribute a common reference clock to multiple destinations. This is the only synchronization option for traditional stand-alone instruments. Proprietary Vendor-Defined Cabling Some vendors of computer-based measurement devices, such as data acquisition boards, address synchronization by providing a proprietary bus, which may be external or internal to the computer. Sampling clocks, reference clocks, and triggers are distributed from master to slaves through the bus. These dedicated high-speed digital buses are designed to facilitate systems integration. The physical bus interface is a multipin connector on the board, and signals
92 that is oriented in a star configuration from a special Star trigger slot (defined as slot 2 in any PXI chassis). The trigger can provide an independent dedicated line for each of up to 13 peripheral slots on a single PXI backplane. The PXI Star line lengths are matched in propagation delay to within one nanosecond from the Star trigger slot. This feature addresses ultra high-speed synchronization where you can distribute start/stop trigger signals from the master measurement module in the Star trigger slot with low delay and skew.
Platform VXI PXI Trigger Bus 8 TTL, 2 ECL 8 TTL Reference Clock 10 MHz ECL 10 MHz TTL Star Bus Yes Yes
CONCLUSIONS
Computer-based measurement components are transforming creation of synchronized measurement systems from integration of loosely coupled, and often incompatible instruments, into an orderly engineering process that results in tightly integrated, high-performance systems. For synchronized measurements, timing and triggering details are critical keys to your automated measurements. Precise synchronization requires proper distribution of clocks and triggers. The three main synchronization schemes and proper knowledge of the pros and cons of each and the capabilities of your measurement devices help you to make the right decision in choosing your solution.
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USING NATIONAL INSTRUMENTS SYSTEM IDENTIFICATION, CONTROL DESIGN AND SIMULATION PRODUCTS FOR DESIGNING AND TESTING A CONTROLLER FOR AN UNIDENTIFIED SYSTEM
www.ni.com 1. INTRODUCTION
This article describes the process of designing a closed loop control system, or plant, using the NI System Identification and Control Design Assistants. A DC Motor will be the plant (Figure 1). tachometer as a function of motor velocity) and the set point (the command voltage you specify). The controller then determines the next voltage level to command to the motor to meet the specifications defined while designing the controller. Figure 2 shows the final closed-loop system.
Figure 2. The final closed loop system. The Plant Model is the QET (Figure 1).
Figure 1: The Quanser Engineering Trainer (QET) will be the plant for which we will design a closed loop controller.
The Quanser Engineering Trainer will be used in velocity mode. A voltage signal commands the motor to move and the tachometer output determines the velocity. The motor system is connected to a National Instruments Data Acquisition (DAQ) device, where Analog Input 0 (AI0) is connected to the tachometer and Analog Output 0 (AO0) is connected to the motor command input. For demonstration purposes, you can replace the DC motor with an RC circuit. This example uses the following LabVIEW add-ons: NI LabVIEW System Identification Toolkit NI LabVIEW Control Design Toolkit NI LabVIEW Simulation Module You can purchase these products together in the Control Design and Simulation Bundle. To use these add-ons, you must install the following software: NI LabVIEW 7.1 NI Signal Express 1.0 The closed-loop system acts on the difference between two quantities: the process variable (the voltage output of the
This example describes the process of designing a simple PI controller for a system with unidentified dynamics. Note that all functionality described in the Express Workbench environment is also available in LabVIEW. All project scripts and LabVIEW VIs described in this document are available as attachments to this document.
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Electricity Testing and Measurement Handbook Vol. 7 Next, you must have the DAQ device generate this signal as an analog output. Use the DAQmx Generate step to perform this function, shown in Figure 5.
Table 1 shows where to find the settings for this particular step and what values to use:
Table 1. Settings for creating the signal Step Signal Input/Output-> Create Signal Settings/Actions Signal Type = Triangle Wave Frequency = 1 Hz Amplitude = 3 V Sample Rate = 1kS/s Block Size = 5000 samples
Figure 5. DAQmx Generate step to output the created signal as an analog signal on the DAQ card.
To display the created signal on the data viewer in Express Workbench, drag the Calculated Signal Output to the Data View (Figure 4)
NOTE: This example does not synchronize the AO and AI channels of the DAQ device. Typically you should synchronize these channels, which you can accomplish using the Advanced Timing page, because any delays caused by the difference in timing between AI and AO would be described by the transfer function of the open loop system, resulting in some error in the identification. In this example, the sample rate for AI and AO is 1 kHz, so the maximum jitter between the two channels is 0.5 ms. This amount of jitter is negligible compared to the plant dynamics. Use the DAQmx Acquire step to acquire the response of the plant to the stimulus signal. Figure 6 shows this acquisition.
95 symbol are not dependent on the steps above. This symbol disappears after you use the Create and Acquire steps in the system identification process. When this dialog box appears, select the No button to create a new display for the signal. Next, run the project script once by clicking the green run arrow. This project generates and acquires 5000 data points at 1 kS/s for a total of five seconds of plant response data. This response data appears in the display you added in the previous step. Figure 8 shows the stimulus signal and the plant response data.
Figure 6. DAQmx Acquire step to acquire the response back from the DC motor plant as an analog signal to the DAQ card.
Table 3 shows the where to find and settings for this step:
Table 3. Settings for acquiring the signal on the appropriate Device and Channel (AI0 in this case). Step Signal Input/Output -> Acquire Signals -> NI DAQmx Acquire Settings/Actions Config Tab: Device: Make sure to select Device and Channel Config Tab: Acq. Timing: 5000 samples to read Config Tab: Acq. Timing: 1 kHz sample Rate
Figure 8. The stimulus signal is in the upper display. The plant response to this signal is in the lower display.
Next, drag the output of the DAQmx Acquire step to the data viewing window. Express Workbench notifies you that the data from the current step appears unrelated to the data already on the display. A small disconnect symbol, circled in Figure 7, is also displayed between the DAQmx Generate step and DAQmx Acquire step, which indicates that the steps below the disconnect
You use the stimulus signal and the response data to define a transfer function for the open loop DC motor system. To define this model, you will use a parametric estimation of the motor model. For more information about parametric estimation, refer to System Identification Model Structure Selection, located at www.ni.com >> NI Developer Zone >> Development Library >> Analysis and Signal Processing >> PID Control / System Characterization / Stability. In this example, you use the default settings of the Parametric Estimation step, shown in Figure 9, to create a firstorder transfer function. The model order is based on the plant dynamics.
Figure 7. Create a new display to view the output from the DAQmx acquire step. The yellow circle locates the disconnect symbol displayed between the DAQmx Generate and DAQmx Acquire steps. This symbol indicates that the steps below the disconnect symbol are not dependent on the steps above.
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Table 4 shows where to find and the settings for this step:
Table 4. Settings for identifying a parametric estimation of the QET DC motor plant system. Step System Identification -> Model Estimation > Parametric Estimation Settings/Actions Input Signals and Model Tab: Stimulus Signal: Calculated signal Response Signal: Device and Channel from NI DAQmx Acquire step. Add Display under DAQmx Acq Output Display Drag Estimated Response to new Display
At this step in the example, the transfer function is discrete. Although you can design a discrete proportional-integral (PI) controller in Express Workbench, this example converts the transfer function model to a continuous one because the motor is a continuous plant. To facilitate this design in the continuous domain, also known as the s-domain, this example transfers the model into a Control Design type function and then converts the model into continuous representation. Figures 11a and 11b show this process.
Notice that the disconnect symbol, shown in Figure 7, no longer appears. NI Express Workbench removes this icon because you used the Create and Acquire steps in the system identification process. Also, notice that the largest prediction error typically occurs in the beginning of the signal. This error occurs for two reasons: the initiation effects of spinning up the system (which is typically not in perfect mechanical balance) and because the numerical algorithm used to identify the model requires several time steps to initialize itself. For example, the disc that this particular QET DC motor spins has 2 holes drilled through it, and depending on the location during startup the motor, might start slower or faster. Therefore, the coefficients of the resulting transfer function change slightly every time you run the final Express Workbench Project Script. After you identify a model, you must save the transfer function for further analysis. Select System Identification Import-Export ModelSave System Identification Model, shown in Figure 10, to save this model.
Figure 11a: Converting the System ID Model to a Control Design Model Type (Transfer Function)
To display the step shown in Figure 11a, select System IdentificationImport-Export ModelConvert to Control Design Model. To display the step shown in Figure 11b, select Control DesignModel TransformationDiscretize Model. On the Configuration page of this step, select Make Continuous from the Operation pull-down list.
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Figure 11b. Making the discrete model continuous Figure 13. Displaying the transfer function of the open-loop system plant in the s-domain.
Next, create a new display for the continuous transfer function. To create this display, right-click the DAQmx Acquire Result display in the data viewer window and select Add DisplayBelow from the shortcut menu. Figure 12 shows this creation.
Figure 12. Adding a window to display the transfer function for the open-loop system.
Then, drag the output of the Discretize Model step to the new display, shown in Figure 13. The system has now been identified as a first order transfer function. Every time the Express Workbench project script is run, the coefficients of the transfer function will change slightly. This is due to the spinning wheel and other mechanics of the motor itself (and the tachometer, and the fact that AI and AO is not 100% synchronized etc.), as explained above during the Estimation of the Parametric Model.
98 As you adjust the values of the P and I gains, the step response graph changes to show the resulting rise time, overshoot, ringing, settling time, and so on. Adjust the P and I gains so the step response looks similar to the step response shown in Figure 14. This step response has a rise time of approximately 25 ms and overshoot of less than 50% of the steady state value. Optionally, you can check these time domain specifications by adding a Time Domain Analysis step after the PID Synthesis step WARNING: Too much overshoot can causes the output of the controller to command a voltage much higher than the Analog Output board and the motor can handle. However, later on in this example, you will use the Simulation Module to enforce a limit on the valid range of the output. After you have properly adjusted the P and I gains, save the model by using the Save Control Design Model step, located at Control DesignImport-Export Model. Figure 15 shows this step.
Figure 16. Using the Simulation Module to simulate the behavior of the identified plant and the PI controller in a closed-loop configuration.
Figure 17 shows the response of the closed-loop system to a square wave input. Refer to Figure 14 to verify that this is the expected behavior.
[+] Enlarge Image Figure 17. Stimulating the closed-loop system with a square wave input and showing the response.
Notice the knobs on the front panel of Figure 17. You use these knobs to change the type, amplitude, and frequency of the stimulus signal while immediately viewing the response of the closed-loop system.
Electricity Testing and Measurement Handbook Vol. 7 Figure 18 shows the LabVIEW block diagram for driving the DC motor in an open-loop configuration.
99 By closing the loop and adding the PI controller to the open-loop system, the response of the motor becomes faster and more accurate with respect to the RPM you specify. The controller compares the actual speed of the motor with the speed you specified and adjusts the motor speed accordingly. Figure 20 shows this increase in response time and accuracy.
Figure 18. Driving the plant (DC Motor) in an open loop configuration.
The integration term in the PI controller minimizes the steady-state error by taking the history of the error into account. Figure 21 shows the LabVIEW block diagram that corresponds to the front panel shown in Figure 20.
[+] Enlarge Image Figure 19. Driving the plant (DC Motor) in an open loop configuration. The response from the motor is slow.
Figure 19 shows how you specify the motor speed in rotations per minute (RPM). This example converts this value to the corresponding analog voltage as directed by the manufacturer of the DC motor. In this situation, the multiplier is 0.0015 volts/RPM. The Analog Output Channel 0 (AO0) of the DAQ device then sends this value to the DC motor. This example then uses Analog Input Channel 0 (AI0) of the DAQ device to acquire the data from the tachometer of the DC motor. This example then converts the tachometer value to RPM by using the manufacturer-supplied multiplier of 666.6 RPM/volts. After you press the Stop button, this example stops the motor by sending a value of 0 volts to AI0. Notice in Figure 19 that the motor is slow to respond to any change in specified RPM. This example also demonstrates steady-state error, which is a permanent difference between the specified and actual motor speeds. This error is due to the calibration uncertainty in the multiplication constants Figure 18 shows. The steady-state error is particularly noticeable at high speeds, because high speeds increase the relative error that results from not multiplying with the exact conversion factor.
Figure 21. Driving the plant (DC Motor) in a closed loop configuration.
The block diagram in Figure 21 converts the speed it is converted to and from corresponding Analog Voltage using the same multipliers described in Figure 18. The actual speed of the motor is compared with the speed you specify, or the Set Point. The controller is loaded from file as shown in Figure 15. Figure 21 shows how Saturation function limits the output voltage of the motor. This figure also shows how you can use the SIM Set Diagram Params VI to programmatically change the ODE solver and other parameters of the simulation. NOTE: In the real world, the Saturation function is not necessary, because the DAQ Analog Output Assistant Express VI has a control that sets a limit on the output voltage. However, this example demonstrates the capabilities of the Simulation Module and how you would place Saturation function in a closed
100 loop. Also, if you place a LabVIEW data probe before and after the Saturation function, changing the Set Point suddenly can cause the motor to overshoot.
6. CONCLUSIONS
This example described how you can use LabVIEW and related software to identify, control, and simulate a real-world dynamic system. Although this example did not use any realtime (RT) hardware, you can use the LabVIEW Real-Time Module in conjunction with the Simulation Module to deploy a controller to any National Instruments RT Series hardware. Refer to Using CompactRIO, located at http://sine.ni.com /csol/cds/item/vw/p/id/538/nid/124200, for an example that demonstrates how to build a full-authority FPGA-based engine control system for a high-performance motorcycle engine. NOTE: You also can describe the simulation itself in the Express Workbench Project Script by adding a User-Defined Step. You also can translate an Express Workbench project script into LabVIEW code by launching LabVIEW and selecting ToolsExpress WorkbenchConvert Express Workbench Project from the pull-down menu. More complex systems, such as the high performance motorcycle engine described above, may have multiple inputs and multiple outputs. In these situations, you can use state-space model identification and control design methods to operate in the multiple-input multiple-output (MIMO) environment. The Control Design Toolkit, System Identification Toolkit and Simulation Module support these design methods.
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TECHNICAL STRATEGY
Our project has a long history of unique measurement service in the specialized area of electromechanical metrology. Significant emphasis is placed on an integrated approach. We provide industry with first measurements of new materials, specializing in cost-effective testing at currents less than 1000 amperes. Consultation is also provided to industry on developing its own measurements for routine testing. We also provide consultation on metrology to the magnet industry to predict and test the performance of very large cables with capacities on the order of 10 000 amperes, based on our tests at smaller scale. In short, our strategy has consistently been to sustain a small, well connected team approach with industry. Electromechanical Measurements of Superconductors We have developed an array of specialized measurement systems to test the effects of mechanical stresses on the electrical performance of superconducting materials. The objective is to simulate the operating conditions to which a superconductor will be subjected in magnet applications. In particular, since most technologically important superconductors are brittle, we need to know the value of strain at which fractures occur in the superconductor. This value is referred to as the irreversible strain limit, since the damage caused by the formation of cracks is permanent. The effect of cracks is extrinsic. In contrast, below the irreversible strain, there exists an elastic strain regime where the effect of strain is intrinsic to the superconductor. In this elastic regime, the variation in the critical-current density (Jc) with strain, if any, is reversible and is primarily associated with changes in the superconductors fundamental properties, such as the critical temperature (Tc) and the upper critical field (Hc2), as well as changes in the superconductors microstructure due to the application of strain. Measurement Facilities Extensive, advanced measurement facilities are available, including high-field (18.5 teslas) and split-pair magnets, servohydraulic mechanical testing systems, and state-of-the-art measurement probes. These probes are used for research on the effects of axial tensile strain and transverse compressive strain on critical current; measurement of cryogenic stress-strain characteristics; composite magnetic coil testing; and variable-temperature magnetoresistance measurements. Our electromechanical test capability for superconductors is one of the few of its kind in the world, and the only one providing specialized measurements for U.S. superconductor manufacturers. Collaboration with Other Government Agencies These measurements are an important element of our ongoing work with the U.S. Department of Energy (DOE). The DOE Office of High Energy Physics sponsors our research on electro-
CUSTOMER NEEDS
The project serves industry primarily in two areas. First is the need to develop a reliable measurement capability in the severe environment of superconductor applications: low temperature, high magnetic field, and high stress. The data are being used, for example, in the design of superconducting magnets for the magnetic-resonance-imaging (MRI) industry, which provides invaluable medical data for health care, and contributes 2 billion dollars per year to the U.S. economy. The second area is to provide data and feedback to industry for the development of high-performance superconductors. This is especially exciting because of the recent deregulation of the electric power utilities and the attendant large effort being devoted to develop superconductors for power conditioning and enhanced power-transmission capability. We receive numerous requests, from both industry and government agencies, for reliable electromechanical data to help guide their efforts in research and development in this critical growth period. The recent success of the second generation of high-temperature superconductors has brought with it new measurement problems in handling these brittle conductors. We have the expertise and equipment to address these problems. Stress and strain management is one of the key parameters needed to move the second-generation high-temperature coated conductors to the market place. The project utilizes the expertise and unique electromechanical measurement facilities at NIST to provide performance feedback and engineering data to companies and
102 mechanical properties of candidate superconductors for particleaccelerator magnets. These materials include low-temperature superconductors (Nb3Sn, Nb3Al, and MgB2), and high-temperature superconductors Bi-Sr-Ca-Cu-O (BSCCO) and Y-BaCu-O (YBCO) including conductors made on rolling-assisted, biaxially textured substrates (RABiTS) and conductors made by ion-beam-assisted deposition (IBAD). The purpose of the database produced from these measurements is to allow the magnet industry to design reliable superconducting magnet systems. Our research is also sponsored by the DOE Office of Electric Transmission and Distribution. Here, we focus on high-temperature superconductors for power applications, including power-conditioning systems, motors and generators, transformers, magnetic energy storage, and transmission lines. In all these applications, the electromechanical properties of these inherently brittle materials play an important role in determining their successful utilization. Scaling Laws for Magnet Design In the area of lowtemperature superconductors, we have embarked on a fundamental program to generalize the Strain Scaling Law (SSL), a magnet design relationship we discovered two decades ago. Since then, the SSL has been used in the structural design of most large magnets based on superconductors with the A-15 crystal structure. However, this relationship is a one-dimensional law, whereas magnet design is three-dimensional. Current practice is to generalize the SSL by assuming that distortional strain, rather than hydrostatic strain, dominates the effect. Recent measurements in our laboratory suggest however that this assumption is invalid. We are now developing a measurement system to carefully determine the three-dimensional strain effects in A-15 superconductors. The importance of these measurements for very large accelerator magnets is considerable. The Strain Scaling Law is now also being developed for high-temperature superconductors since we recently discovered that practical high-temperature superconductors exhibit an intrinsic axialstrain effect.
Electricity Testing and Measurement Handbook Vol. 7 The technique consists of measuring critical-current density (the maximum lossless current density that a superconductor can carry) versus axial strain for a number of copper-plated specimens of the same wire with different amounts of copper. We then deduced the strain properties of the virgin (noncopper-plated) wire by an extrapolation technique. Copper plating made the niobium-tin wires electrically stable enough to characterize, but the extra copper also influenced the value of the pre-compressive strain (max); hence the need for extrapolation. We confirmed that max indeed decreased linearly with increasing niobium fraction. However, we found that other parameters such as the matrix material and wire diameter also influence max. The pre-compressive strain for high-niobium-fraction wires can be reduced to about 0.1 percent, a very small strain window for magnet design. Fortunately, we also found that the use of copper alloys, instead of pure copper along with small wire diameters substantially mitigates the problem and provides reasonable strain operating margins in these high performance conductors. The data were used by Oxford Superconductor Technology to make immediate decisions regarding the conductor design for a new NMR system. Copper Stabilizer Improves Coated Superconductors Strain Tolerance High-temperature superconductor (HTS) wires are now being fabricated in kilometer lengths, providing the basis for a new generation of electric power devices, including high power-density motors and generators, transmission lines, and power conditioners. The development of HTS technology is expected to play a crucial role in maintaining the reliability of the power grid and upgrading power delivery to core urban areas. The most promising superconductor candidate for replacing ageing utility equipment is the highly textured Y-Ba-Cu-O (YBCO) compound deposited on buffered flexible metallic substrates. These coated conductors have a much higher current-carrying capacity compared to the Bi-Sr-Ca-Cu-O (BSCCO) tapes now commercially available. Whereas BSCCO tapes experience permanent damage when subjected to axial strains less than 0.2 percent, we demonstrated last year that the formation of cracks in the new YBCO system does not commence until subjected to strains higher than 0.38 percent, almost a two-fold increase in strain tolerance. This resilience of YBCO to strain is providing a strong motivation to produce commercial lengths of this second generation conductor, especially for the design of electric generators for which strain tolerance requirements have been raised to 0.4 percent. This year, we found that adding a Cu layer to the YBCO coated-conductor architecture extends the irreversible strain limit (irr) of this composite even further, from 0.38 percent to more than 0.5 percent. This markedly widens the strain window for coated-conductor applications and takes it beyond even the most demanding benchmark for large-scale superconducting generators. These measurements were undertaken in close collaboration with conductor manufacturers American Superconductor (Westborough, MA) and SuperPower (Schenectady, NY), who are incorporating the stabilizer layers either by Cu-lamination or Cu-plating. The original motivation for adding the Cu layers was to improve the electric and thermal stability of the conductor; the strain-tolerance dividend was unexpected. We can relate this remarkable result to the mismatch of thermal contraction between Cu and the other components of the composite. During sample cooling from processing temperatures to the cryogenic operating temperatures, the Cu layer exerts an additional pre-compressive strain on the YBCO film, and hence extends the irreversible
ACCOMPLISHMENTS
New Measurement Method for Marginally Stable Superconductor Wires The next generation of particle accelerators for high-energy physics, and magnet systems for nuclear magnetic resonance (NMR) spectroscopy, will require the development of a new type of superconducting niobium-tin wire able to carry extremely high currents at high magnetic fields. One way to achieve high currents is to push the density of superconductor filaments in composite wires to new limits. Oxford Superconductor Technology (Carteret, NJ) has successfully demonstrated the feasibility of this concept. However, this could significantly reduce the beneficial pre-compressive strain in these conductors upon cooling, an important parameter for magnet design. Our superconductor electromechanical testing system is the only one in the U.S. that utilizes stress-free cooling, which is essential for a direct measurement of pre-compressive strain. Unfortunately, the new niobium-tin wires, owing to their relatively small amount of copper stabilizer, are only marginally stable, which makes electrical characterization extremely challenging. Hence, a new measurement technique was required that did not compromise the stress-free cooling advantage.
Pre-compressive strain max versus Nb fraction for several niobium-tin wires with high niobium density. Data were obtained using a new measurement method developed by EEEL researchers for marginally stable superconductor wires.
Electricity Testing and Measurement Handbook Vol. 7 strain irr where permanent damage occurs. The Cu may also be acting as a crack arrester, which further improves the strain tolerance.
Normalized critical current density as a function of mechanical tensile strain for unlaminated and Culaminated YBCO coated conductor. The Cu stabilization layer extends the irreversible strain limit irr of the composite from 0.38 percent to more than 0.5 percent. Photograph of a new magnetoresistance probe designed to investigate carbon nanostructures. At the right end of the probe, the photo shows the steppermotor-controlled worm-gear system and sample stage, which allow precise angledependent, high-field measurements.
103 Textbook on Cryogenic Measurement Apparatus and Methods A new textbook has been written on experimental techniques for cryogenic measurements to be published by Oxford University Press. It covers the design of cryogenic measurement probes and provides cryogenic materials data for their construction. Topics include thermal techniques for designing a cryogenic apparatus, selecting materials appropriate for such apparatus, how to make high-quality electrical contacts to a superconductor, and how to make reliable criticalcurrent measurements. The textbook is written for beginning graduate students, industry measurement engineers, and materials scientists interested in learning how to design successful low-temperature measurement systems. The appendices are written for experts in the field of cryogenic measurements and include electrical, thermal, magnetic, and mechanical properties of technical materials for cryostat construction; properties of cryogenic liquids; and temperature measurement tables and thermometer properties. These appendices aim to collect in one place many of the data essential for designing new cryogenic measurement apparatus.
New Magnetoresistance Apparatus to Probe Carbon Nanostructures Electronic properties of materials change markedly as their dimensions approach those of a few atomic layers. Carbon nanostructures (including graphite sheets, singlewalled carbon nanotubes, and multi-walled carbon nanotubes) are prime examples of such potentially useful materials, although some of their very fundamental properties remain controversial. Characterization of these structures at high magnetic fields is one of the principal methods for determining the existence of ballistic conduction, for example, which could be the foundation for a new generation of nanoelectronic devices. We have designed and recently commissioned an apparatus to measure magnetoresistance of these highly directional structures in fields up to 18.5 teslas. (For comparison, the Earths magnetic field is only about 0.05 millitesla.) The apparatus automatically acquires data as a function of magneticfield magnitude, angle, and temperature. It was designed to also be compatible with the very-highfield magnet facilities at the National High Magnetic Field Laboratory at Florida State University, permitting the extension of EEELs measurements to fields up to 30 teslas. Magnetic field mapping has commenced for nanotubes fabricated at NIST and Rice University as well as for graphitic sheet structures manufactured by a nanotechnology research team at Georgia Institute of Technology. Magnetic-field angle can be varied with a resolution of better than 0.1 degree over a range of 130 degrees, and sample temperature can be varied over an extended range of 4.1 to 120 kelvins, with a stability of better than 3 millikelvins at 4.2 kelvins.
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THERMOGRAPHY
Thermography is a method of inspecting electrical and mechanical equipment by obtaining heat distribution pictures. This inspection method is based on the fact that most components in a system show an increase in temperature when malfunctioning. The increase in temperature in an electrical circuit could be due to loose connections or a worn bearing in the case of mechanical equipment. By observing the heat patterns in operational system components, faults can be located and their seriousness evaluated. The inspection tool Figure 1. The Thermal Image of electrical used by Thermographers is connector the Thermal Imager. These are sophisticated devices which measure the natural emissions of infrared radiation from a heated object and produce a thermal picture. Modern Thermal Imagers are portable with easily operated controls. As physical contact with the system is not required, inspections can be made under full operational conditions resulting in no loss of production or downtime. The Land Cyclops Thermal Imager is a device designed for plant condition Figure 2. The inspection of electrical equipment monitoring, preventative using a Thermal Imager maintenance and process monitoring applications. Potential applications include: Inspection of electrical equipment Inspection of mechanical equipment Inspection of refractory lined structures
ELECTROMAGNETIC SPECTRUM
The energy from a heated object is radiated at different levels across the electromagnetic spectrum. In most industrial applications, it is the energy radiated at infrared wavelengths which is used to determine the objects temperature. Figure 3 shows various forms of radiated energy in the electromagnetic spectrum including X-rays, Ultra Violet, Infrared and Radio. They are all emitted in the form of a wave and travel at the speed of light. The only difference between them is their wavelength which is related to frequency.
The human eye responds to visible light in the range 0.4 to 0.75 microns. The vast majority of infrared temperature measurement is made in the range 0.2 to 20 microns. Although emissions are mostly unable to be detected by a standard camera the Thermal Imager can focus this energy via an optical system on to a detector in a similar way to visible light. The detector converts infrared energy into an electrical voltage which after amplification and complex signal processing is used to build the thermal picture in the operators viewfinder on board the Thermal Imager.
ENERGY DISTRIBUTION
Figure 4 shows the energy emitted by a target at different temperatures. As can be seen, the higher the target temperature the higher the peak energy level. The wavelength at which peak energy occurs becomes progressively shorter as temperature increases. At low temperatures the bulk of the energy is at long wavelengths. Figure 4. Infrared energy and distribution across
the Electromagnetic spectrum
BASICS PHYSICS
An object when heated radiates electromagnetic energy. The amount of energy is related to the objects temperature. The Thermal Imager can determine the temperature of the object without physical contact by measuring the emitted energy.
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Electricity Testing and Measurement Handbook Vol. 7 It can be shown that there is a relationship between emissivity and reflectivity.
For an opaque object this is Emissivity + Reflectivity = 1.0
EMISSIVITY
The amount of energy radiated from an object is dependant on its temperature and its emissivity. An object which has the ability to radiate the maximum possible energy for its temperature is known as a Black Body. In practice, there are no perfect emitters and surfaces tend to radiate somewhat less energy than a Black Body. Figure 5 shows why objects are not perfect emitters of infrared energy. As energy moves towards the surface a certain amount is reflected back inside and never escapes by radiative means. From this example, it can be seen that only 60% of the available energy is actually emitted. The emissivity of an object is the ratio of the energy radiated to that which the object would emit if it were a Black Body.
Hence, a highly reflective material is a poor emitter of infrared energy and will therefore have a low emissivity value.
EFFECTS OF EMISSIVITY
If a material of high emissivity and one of low emissivity were placed side by side inside a furnace and heated to exactly the same temperature, the material with low emissivity would appear to the eye much duller. This is due to the different emissivities of the materials causing them to radiate at different levels, making the low emissivity material appear cooler than the high emissivity material, even though they are at exactly the same temperature. The Thermal Imager would see this in the same way as the eye and produce an error in making the temperature measurement. The temperature of an object cannot be determined by simply measuring its emitted infrared energy, a knowledge of the objects emissivity must also be known. The emissivity of an object can be determined as follows: 1) Consult manufacturers literature (always ensure these have been evaluated at the operating wavelength of your Thermal Imager as emissivity can vary with wavelength). 2) Have the objects emissivity evaluated by a laboratory method. There are two main ways to overcome the problem of emissivity. a) Mathematically correct the temperature measurement value. This is usually carried out within the signal processor of the Thermal Imager. Most modern Thermal Imagers have a compensation setting which can quickly and easily be set by the operator. b) It may be possible to paint the surface of a low emissivity target with a high and constant emissivity coating. This tends to elevate the target to a much higher emissivity level, but this may not be possible on all process plants. When carrying out Thermographic inspections, faults are often identified by comparing heat patterns in similar components operating under similar loads. This is an alternative to very precisely predicting the emissivity of each individual component and obtaining absolute temperature values.
EMISSIVITY VALUES
The value of emissivity tends to vary from one material to another. With metals, a rough or oxidised surface usually has a higher emissivity than a polished surface. Here are some examples:
Thermal Imager being used to inspect electrical equipment. With equal load and emissivities the temperature of the three measurement points should be the same.
107 d) Parameter changes: parameters saved with the stored image may be changed within the software. These include emissivity, and background temperature. e) Image enhancements: filtering, and zoom facility. Figures 7 to 12 show some of the available temperature measurement modes.
THERMAL IMAGERS
Thermal Imagers are sophisticated devices which measure the natural emissions of infrared radiation from a heated object and produce a thermal picture. Modern Thermal imagers such as the Land TI814 are usually very flexible containing many standard and optional features. Here are some of those of the TI814.
OPTICAL:
A motorised focus is used to obtain a clear image at different distances from the thermal imager. The focus distance is from 380mm/15 inches to infinity. An electronic zoom function enables 2X and 4X magnification of the image.
IMAGE DISPLAY:
The real time thermal image is displayed in colour on a 102mm / 4 inch LCD screen. The image may be colourised by any one of the eight different palettes available. The real time thermal image is also displayed on the builtin high resolution colour viewfinder.
DIGITAL MEMORY:
A built in non volatile memory system enables the simple capture of a large number of thermal images. Thermal images are stored on a removable compact flash memory card. This on board facility enables stored image recall to the viewfinder and selective image deletion. Several seconds of digital voice clip may be stored with each image and replayed or re-recorded on board the imager. The sound file can be replayed in by the imager or with image processing software. A 256MB card is capable of storing up to 1000 thermal images and up to an eight second digital voice clip with each image. Image file size including voice annotation is 256 KB. Transfer to image processing software for further image processing and report generation is via a USB Compact Flash memory card reader.
Figure 8. Measuring the average temperature within several rectangles in the scene
TEMPERATURE MEASUREMENT:
Temperature measurement at single point in the scene is possible.
POST PROCESSING:
This facility enables the generation of further temperature analysis in the imager viewfinder on stored images. A single movable point enables spot measurement at any point in the scene and a movable cursor generates a temperature profile trace.
Figure 9. Measuring the average temperature within several polygons in the scene
Figure 10. Measuring the temperature along several profiles in the scene
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Figure 11. Measuring the temperature distribution within a defined area in the scene
The software system is menu driven, making it extremely easy to use. Report Writer: The image processing system provides a report writing facility. This may be used to provide a hard copy record of the thermal image accompanied by an imported photograph and any other information for reference purposes.
Faults in an electrical installation often appear as hotspots which can be detected by the Thermal Imager. Hot spots are often the result of increased resistance in a circuit, overloading, or insulation failure. Figure 14 shows a hot-spot created by a bad connection in a power distribution system.
Some of the components commonly inspected are as follows: Connectors: When looking at similar current carrying connectors, a poor connection shows a higher temperature due to its increased resistance. Hot-spots can be generated as a result of loose, oxidised, or corroded connectors.
Figure 13. Typical items page in a report generated by the report writer facility
Electricity Testing and Measurement Handbook Vol. 7 Figure 15. Shows the fuses in the control panel of a machine. A faulty connection on the top of a fuse has created the hot-spot which can easily be seen by the imager. Three phase motors: Require balanced phases and correct operating temperatures. It has been shown that if correct operating temperatures are exceeded, the insulation life can be considerably shortened. Other commonly inspected components are: Relays Insulators Capacitors Switches
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Figure 17 shows an abnormal heat pattern on the wall of a cement kiln, which has been caused by erosion of the refractory brick liner. Equipment commonly inspected using Thermal Imagers is as follows: Electric Arc Furnaces Ladles, Heat Treatment Furnaces Glass Furnaces Rotary Kilns and Dryers
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BUYERS GUIDE
struction and engineering, street and parking lot lighting installation and maintenance. Now available - Power Quality field survey, monitoring and solutionsn to power quality problems. 3M Canada PO Box 5757 London, Ontario N6A 4T1 Tel: (800) 3M Helps Fax: (519) 452-6286 E-mail: [email protected] Web: www.mmm.com Description of products/services: Terminations and splices, using Cold Shrink Technology, moulded rubber, resin and heat shrink Motor lead connection systems Scotch vinyl insulation tapes, splicing and terminating tapes, corrosion protection sealing and general use tapes Scotchloc terminal, wire connectors and insulation displacement connectors, lugs, copper and aluminum connectors Scotchtrak infrared heat tracers and circuit tracers Fastening products, coatings and lubricants Duct- , packaging, filament-, and masking tapes Abrasive products Personal safety products, sorbents.
CD Nova Ltd. 5330 Imperial St. Burnaby, BC V5J 1E6 Tel: (604) 430-5612 Fax: (604) 437-1036 Contat: Don Bealle E-mail: [email protected] Web: www.cdnova.com CD NOVA companies distribute and service, in Canada, Energy and power Systems and devices, Transducer, Test and Measurement Instruments, Batteries, Chargers, UPS, Wireline and Wireless Comm. systems, SCADA systems, Power Quality Analysers and systems. Teleprotection, Transformers, Breakers Protective Relays, Gas and chemical Analysers, Stack sampline systems.
B.G. High Voltage Systems Ltd. 1 Select Avenue, Units 15 & 16 Scarborough, ON M1V 5J3 Tel: (416) 754-2666 ext. 202 Fax: (416) 754-4607 E-mail: [email protected] www.bg-high-voltage.ca Contact: B. J. (Bert) Berneche, C.E.T., President Description of products/services: B.G. High Voltage Systems offers a comprehensive approach to electrical project management, providing design, construction and engineering services to meet all your requirements. We team up with our clients to ensure that all their needs are defined and met at each stage of the project. Our experts will coordinate with your engineering personnel to ensure minimal disruption to facility operations. As well as complete electrical project management we offer: material procurement, maintenance and training services, emergency repair, overhead and underground distribution con-
Duncan Instruments Canada Ltd. 121 Milvan Drive Toronto, Ontario M9L 1Z8 Tel: 416 742-4448 Fax:416 749-5053 Email: [email protected] www.duncaninstr.com Description of products/services: Duncan Instruments Canada is a leading manufacturers representative and master distributor for a wide range of utility and electrical instrumentation. We can offer you data loggers, power line analyzers power/energy/harmonics analyzers, power disturbance monitors and fused test leads/accessories. In addition to sales, Duncan Instruments Canada can also provide: calibration traceable to NRC, technical product support and application training, instrument repair/modifications, and rental of selected electrical instruments. Registered to ISO 9001:2000
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Electricity Testing and Measurement Handbook Vol. 7 L4Z 1X9 Toll Free : 1-800-36-FLUKE Tel : (905) 890-7600 Fax : (905) 890-6866 Contact : Robin Bricker E-Mail : [email protected] www.flukecanada.ca Fluke Electronics Canada (www.flukecanada.ca) offers complete families of professional test tools, including power quality, thermography, digital multimeters, clamp meters, insulation resistance testers, portable oscilloscopes, thermometers, process testing equipment and accessories, as well as educational and training resources. A subsidiary of Fluke Corporation, Everett, Washington, Fluke Electronics Canada is headquartered in Ontario with offices across Canada. The Fluke brand has a reputation for quality, portability, ruggedness, safety and ease of use and Fluke test tools are used by technical professionals in a variety of industries throughout the world.
Flir Systems 5230 South Service Road #125 Burlington, ON Tel: (905) 637-5696 Fax: (905) 639-5488 Web: www.flirthermography.com FLIR Systems Ltd. (Agema Inframetrics) designs, manufactures, calibrates, services, rents and sells many models of infrared imaging cameras and accessories. Complete predictive maintenance solutions include the ThermaCam PM 695 radiometric camera with thermaland visual images, autofocus, voice and text messaging and of course Reporter analysis software with "drag-n-drop" image transfer software. Level's 1, 2 and 3 Thermography training conducted on site or at ITC facility. Camera accessories, such as close-up and telescopic optics, batteries, etc. can be sourced directly from Canadian service/sales depot in Burlington, ON. Ask about trade in allowances.
FLUKE ELECTRONICS Canada LP 400 Britannia Rd. East Unit 1 Mississauga, ON, Canada
G.T. WOOD CO. LTD. 3354 Mavis Road Mississauga, ON L5C 1T8 Tel: (905) 272-1696
Fax: (905) 272-1425 E-Mail: [email protected] Website: www.gtwood.com/flash/splash.html Specializing in High-Voltage Electrical Testing, inspections, maintenance and repairs. Refurbishing and repair of New and Reconditioned Transformers, Structures, Switchgear and Associated Equipment. Infrared Thermography, Engineering Studies and PCB Management.
Tel: 214-331-7360 (Direct) Fax: 214-331-7379 Email: [email protected] www.megger.com Megger is a leading provider of electrical test and measuring equipment for power, industrial, building wiring and communication applications. Its wide range of products extends from equipment to test protective relays and other substation electrical apparatus, to insulation resistance and ground testers. With three manufacturing facilities and sales offices located around the world, Megger is strategically positioned to provide customers with innovative products, hands-on technical assistance and superior service. For additional information, visit our web site www.megger.com.
High Voltage, Inc. 31 Rt. 7A, P.O. Box 408 Copake, NY 12516 USA Tel : (518) 329-3275 Fax : (518) 329-3271 Contact : Bob Tighe, E-Mail : [email protected] Manufacturers of High Voltage Test Equipment. Products include portable AC-VLF, .1Hz, .05 and 0.2Hz Very Low Frequency hipots with sine wave output, switchgear and bottle testers up to 100 kVac. Portable DC hipots up to 300 kV DC. Aerial lift and bucket truck AC test sets up to 300 kVac according to ANSI standards. Controlled energy cable fault locators, oil test sets and burners also offered.
LIZCO SALES R.R. #3 Tillsonburg, ON N4G 4G8 Toll Free: 1-877-842-9021 Fax: (519) 842-3775 Contact: Robin Carroll Website: www.lizcosales.com We have the energy with Canadas largest on-site directory: New and Rebuilt Power/Padmount/Dry Transformers New Oil-Filled TLO Unit Substation Transformers New HV S&C fuses/loadbreaks/towers High and low voltage: - Air Circuit Breakers Molded Case Breakers - QMQB/fusible switches Combination Starters Emergency Service and Replacement Systems Design/Build custom Application Systems
OPTIMUM ENERGY PRODUCTS LTD. #333, 11979 - 40 St SE Calgary, AB T2Z 4M3 Toll Free (877) 766-5412 Main (403) 256-3636 Fax (403) 256-3431 E-mail: [email protected] Optimum Energy Products Ltd are specialists in Power Quality and Power Metering products. We represent Fluke, AEMC Instruments, Electro Industries, and many other manufacturers. We sell portable PQ instruments for engineers and troubleshooters in many industries. From Plug based voltage disturbance meters to three phase Class A Power Quality instruments. We also supply permanent power and power quality meters for use in residential, commercial and industrial applications. For complete product range and information, please visit our specialty websites: www.PQMeterStore.com www.PowerMeterStore.com www.ElectricityMetering.com www.MyMeterStore.com
Megger 4271 Bronze Way Dallas, TX 75237-1088 USA Tel: 1-800-723-2861 Ext. 7360 (Toll Free)
Raytech USA 90 C Randall Avenue Woodlyn, PA 19094 Tel: 610-833-3017 Fax: 610-833-3018 email: [email protected] Web: www.raytechusa.com RAYTECH is an employee owned company that specializes in the design and manufacture of precision test equipment for the Electrical Industry. With extensive experience in the design and application of test equipment, RAYTECH offers products that truly meet the needs of the testing industry. Our durable products are used by Manufacturers, Rebuild Shops,
Field Test Crews, Utilities, Rural Electrical CO-OP's, Universities and Research Engineers.
SKM Systems Analysis, Inc. is a California-based corporation founded in 1972 with a desire to automate electrical design calculations. SKM has been a leader in the electrical engineering software industry for more than 30 years, providing quality software, training and support to thousands of satisfied customers throughout the world. SKM Systems Analysis, Inc. is also chosen by 39 of the top 40 Electrical Engineering firms in the world.
RHCtest.com 610 Ford Drive Suite 248 Oakville Ontario L6J 7W4 Canada Tel : (905) 828-6221 Fax : (905) 828 -6408 Contact : John Riddell E-Mail : [email protected] RHCtest.com Inc. is a Canadian owned and operated Distributor of Electrical Test and Measurement Equipment. We carry various products lines such as Kyoritsu, Thurlby Thandar, Dataq Instruments, Topward Instruments, Nidec Shimpo, High Voltage and Midtronics. We distribute products such as; Multimeters, Voltage Testers, Clamp Meters, Clamp Adapters, Voltage and Current Loggers, Power Loggers, Power Analyzers, Insulation Testers, Earth Resistance Testers, Test leads, DC/AC Hipots, VLF Hipots, TAN Delta Cable Diagnostics, Thumpers, Cable and Fault locating products, Power Supplies, Spectrum Analyzers, RF Generators, DDS Generators, Arbitrary Waveform Generators, Function Generators, LCR Meters, Micro Ohm Meters, Frequency Counters, DMMs DC Loads, Strobescopes, Hand Held Tachometers, Panel Mount Tachometers, Data Acquisition Starter Kits, Stand Alone Data Loggers, Thermocouple Data Acquisition Systems, DC Connected Data Acquisition Systems and Battery Testers.
techniCAL Systems 2002 Inc. 436 Jacqueline Blvd. Hamilton, Ontario L9B 2R3 Canada: 1-86-MEASURE-1 (1-866-327-8731) Tel: 905-575-1941 Fax: 905-575-0386 E-mail: [email protected] Web-site: www.technical-sys.com techniCAL provides electrical contractors and utilities with Test, Measurement, Calibration, Control & Recording Instrumentation. Representing Best-of-Breed Manufacturers; techniCAL provides such products as; Power Quality Analyzers, Micro-Ohmmeters, Megohmmeters, Insulation Testers, Leakage Current Meters, Ground Resistance Testers, Data Loggers, High Voltage Ammeters, Power Transducers, Panel Meters, CTs, PTs, Shunts, etc
SKM Systems Analysis Inc. 1040 Manhattan Beach Blvd. Manhattan Beach, CA 90266 USA Toll Free : 1-800-232-6789 Fax : 1-310-698-4708 E-Mail : [email protected] SKM Power*Tools software helps you design and analyze electrical power systems. Interactive graphics, rigorous calculations and a powerful database efficiently organize, process and display information. Associate projects with multiple one-line diagrams and TCC drawings with customized data fields. Generate better design with 'what if' scenarios by comparing study results in a single table. Also includes thousands of validated equipment libraries and the ability to export project data into AutoCAD DXF and XREF format. Multiple one-line diagrams can be associated with each project for better systems organization and presentation. Powerful drawing tools quickly create a structured, interactive one- line diagram system model.