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Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker
Search publications for: doi:10.1109/VTS.2015.7116296 1 result
Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects
Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker