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Yoshiyuki Nakamura, Thomas Clouqueur, Kewal Saluja, Hideo Fujiwara
Search publications for: doi:10.1109/ATS.2006.260963 1 result
Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester
Yoshiyuki Nakamura, Thomas Clouqueur, Kewal Saluja, Hideo Fujiwara