Opens in a new windowOpens an external websiteOpens an external website in a new window
This website utilizes technologies such as cookies to enable essential site functionality, as well as for analytics, personalization, and targeted advertising. To learn more, view the following link: Privacy Policy
Loading [a11y]/accessibility-menu.js
A non-destructive technique using 3D X-ray Computed Tomography to reveal semiconductor internal physical defects | IEEE Conference Publication | IEEE Xplore