Test generation for global delay faults

GM Luong, DMH Walker - Proceedings International Test …, 1996 - ieeexplore.ieee.org
GM Luong, DMH Walker
Proceedings International Test Conference 1996. Test and Design …, 1996ieeexplore.ieee.org
This paper describes test generation for delay faults caused by global process disturbances.
The correlations between path delays is used to reduce the number of paths that must be
tested. We build macro models of path delays as a function of process parameters to reduce
test generation time. The test generation problem is formulated as a nonlinear optimization
using a set of candidate paths supplied by a path generator. Results are given for the
ISCAS85 benchmarks.
This paper describes test generation for delay faults caused by global process disturbances. The correlations between path delays is used to reduce the number of paths that must be tested. We build macro models of path delays as a function of process parameters to reduce test generation time. The test generation problem is formulated as a nonlinear optimization using a set of candidate paths supplied by a path generator. Results are given for the ISCAS85 benchmarks.
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