Temperature-variation-aware test pattern optimization
T Yoneda, M Nakao, M Inoue, Y Sato… - 2011 Sixteenth IEEE …, 2011 - ieeexplore.ieee.org
T Yoneda, M Nakao, M Inoue, Y Sato, H Fujiwara
2011 Sixteenth IEEE European Test Symposium, 2011•ieeexplore.ieee.orgFor accurate failure prediction, it is important to eliminate the environmental delay variations
from the measure delays for capturing the actual delay shift caused by aging. This paper
presents a novel test pattern optimization method to reduces spatial and temporal
temperature variations during delay test.
from the measure delays for capturing the actual delay shift caused by aging. This paper
presents a novel test pattern optimization method to reduces spatial and temporal
temperature variations during delay test.
For accurate failure prediction, it is important to eliminate the environmental delay variations from the measure delays for capturing the actual delay shift caused by aging. This paper presents a novel test pattern optimization method to reduces spatial and temporal temperature variations during delay test.
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