Rack-aware regenerating codes for data centers

H Hou, PPC Lee, KW Shum… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
IEEE Transactions on Information Theory, 2019ieeexplore.ieee.org
Erasure coding is widely used for massive storage in data centers to achieve high fault
tolerance and low storage redundancy. Since the cross-rack communication cost is often
high, it is critical to design erasure codes that minimize the cross-rack repair bandwidth
during failure repair. In this paper, we analyze the optimal trade-off between storage
redundancy and cross-rack repair bandwidth specifically for data centers, subject to the
condition that the original data can be reconstructed from a sufficient number of any non …
Erasure coding is widely used for massive storage in data centers to achieve high fault tolerance and low storage redundancy. Since the cross-rack communication cost is often high, it is critical to design erasure codes that minimize the cross-rack repair bandwidth during failure repair. In this paper, we analyze the optimal trade-off between storage redundancy and cross-rack repair bandwidth specifically for data centers, subject to the condition that the original data can be reconstructed from a sufficient number of any non-failed nodes. We characterize the optimal trade-off curve under functional repair, and propose a general family of erasure codes called rack-aware regenerating codes (RRC), which achieve the optimal trade-off. We further propose exact repair constructions of RRC that have minimum storage redundancy and minimum cross-rack repair bandwidth, respectively. We show that (i) the minimum storage redundancy constructions support a wide range of parameters and have cross-rack repair bandwidth that is strictly less than that of the classical minimum storage regenerating codes in most cases, and (ii) the minimum cross-rack repair bandwidth constructions support all the parameters and have less cross-rack repair bandwidth than that of the minimum bandwidth regenerating codes for almost all of the parameters.
ieeexplore.ieee.org
Showing the best result for this search. See all results