User profiles for Alessandro Grossi

Alessandro Grossi

Senior Staff Product Engineer eNVM, Infineon Technologies
Verified email at infineon.com
Cited by 1123

Fundamental variability limits of filament-based RRAM

A Grossi, E Nowak, C Zambelli… - 2016 IEEE …, 2016 - ieeexplore.ieee.org
While Resistive RAM (RRAM) are seen as an alternative to NAND Flash, their variability
and cycling understanding remain a major roadblock. Extensive characterizations of multi-kbits …

Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications

A Grossi, E Vianello, MM Sabry… - … on Electron Devices, 2019 - ieeexplore.ieee.org
Limited endurance of resistive RAM (RRAM) is a major challenge for future computing
systems. Using thorough endurance tests that incorporate fine-grained read operations at the …

Experimental investigation of 4-kb RRAM arrays programming conditions suitable for TCAM

A Grossi, E Vianello, C Zambelli… - … Transactions on Very …, 2018 - ieeexplore.ieee.org
Resistive random access memories (RRAMs) feature high-speed operations, low-power
consumption, and nonvolatile retention, thus serving as a promising candidate for future …

Resistive RAM with multiple bits per cell: Array-level demonstration of 3 bits per cell

BQ Le, A Grossi, E Vianello, T Wu… - … on Electron Devices, 2018 - ieeexplore.ieee.org
We demonstrate, for the first time, resistive RAM (RRAM) arrays where each cell can store 3
bits. Such full array-level demonstration is possible through special techniques (eg, that …

Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms

E Pérez, A Grossi, C Zambelli, P Olivo… - IEEE Electron …, 2016 - ieeexplore.ieee.org
In this letter, we propose an effective route to reduce the cell-to-cell variability in 1T-1R-based
random access memories (RRAM) arrays by combining the excellent switching …

Impact of intercell and intracell variability on forming and switching parameters in RRAM arrays

A Grossi, D Walczyk, C Zambelli… - … on Electron Devices, 2015 - ieeexplore.ieee.org
The intercell variability of the initial state and the impact of dc and pulse forming on intercell
variability as well as on intracell variability in TiN/HfO 2 /Ti/TiN 1 transistor - 1 resistor (1T-1R) …

Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays

A Grossi, C Zambelli, P Olivo, E Miranda… - Solid-State …, 2016 - Elsevier
The forming process, which corresponds to the activation of the switching filament in Resistive
Random Access Memory (RRAM) arrays, has a strong impact on the cells’ performances. …

Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices

A Grossi, E Perez, C Zambelli, P Olivo, E Miranda… - Scientific reports, 2018 - nature.com
The Resistive RAM (RRAM) technology is currently in a level of maturity that calls for its
integration into CMOS compatible memory arrays. This CMOS integration requires a perfect …

28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers

A Grossi, M Coppetta, S Aresu, A Kux… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
We present features adding extra reliability margin for emerging Non-Volatile Memories
adoption in automotive microcontrollers, and discuss experimental data of embedded 28nm …

Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays

E Perez, A Grossi, C Zambelli, P Olivo… - IEEE Journal of the …, 2016 - ieeexplore.ieee.org
In this paper, the set operation of HfO 2 based 1T-1R arrays is studied by applying incremental
step pulse with verify algorithm. To evaluate the impact of the voltage step increment on …