User profiles for Alessandro Grossi
![]() | Alessandro GrossiSenior Staff Product Engineer eNVM, Infineon Technologies Verified email at infineon.com Cited by 1123 |
Fundamental variability limits of filament-based RRAM
While Resistive RAM (RRAM) are seen as an alternative to NAND Flash, their variability
and cycling understanding remain a major roadblock. Extensive characterizations of multi-kbits …
and cycling understanding remain a major roadblock. Extensive characterizations of multi-kbits …
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications
Limited endurance of resistive RAM (RRAM) is a major challenge for future computing
systems. Using thorough endurance tests that incorporate fine-grained read operations at the …
systems. Using thorough endurance tests that incorporate fine-grained read operations at the …
Experimental investigation of 4-kb RRAM arrays programming conditions suitable for TCAM
Resistive random access memories (RRAMs) feature high-speed operations, low-power
consumption, and nonvolatile retention, thus serving as a promising candidate for future …
consumption, and nonvolatile retention, thus serving as a promising candidate for future …
Resistive RAM with multiple bits per cell: Array-level demonstration of 3 bits per cell
We demonstrate, for the first time, resistive RAM (RRAM) arrays where each cell can store 3
bits. Such full array-level demonstration is possible through special techniques (eg, that …
bits. Such full array-level demonstration is possible through special techniques (eg, that …
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms
In this letter, we propose an effective route to reduce the cell-to-cell variability in 1T-1R-based
random access memories (RRAM) arrays by combining the excellent switching …
random access memories (RRAM) arrays by combining the excellent switching …
Impact of intercell and intracell variability on forming and switching parameters in RRAM arrays
A Grossi, D Walczyk, C Zambelli… - … on Electron Devices, 2015 - ieeexplore.ieee.org
The intercell variability of the initial state and the impact of dc and pulse forming on intercell
variability as well as on intracell variability in TiN/HfO 2 /Ti/TiN 1 transistor - 1 resistor (1T-1R) …
variability as well as on intracell variability in TiN/HfO 2 /Ti/TiN 1 transistor - 1 resistor (1T-1R) …
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays
The forming process, which corresponds to the activation of the switching filament in Resistive
Random Access Memory (RRAM) arrays, has a strong impact on the cells’ performances. …
Random Access Memory (RRAM) arrays, has a strong impact on the cells’ performances. …
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices
The Resistive RAM (RRAM) technology is currently in a level of maturity that calls for its
integration into CMOS compatible memory arrays. This CMOS integration requires a perfect …
integration into CMOS compatible memory arrays. This CMOS integration requires a perfect …
28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers
We present features adding extra reliability margin for emerging Non-Volatile Memories
adoption in automotive microcontrollers, and discuss experimental data of embedded 28nm …
adoption in automotive microcontrollers, and discuss experimental data of embedded 28nm …
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays
In this paper, the set operation of HfO 2 based 1T-1R arrays is studied by applying incremental
step pulse with verify algorithm. To evaluate the impact of the voltage step increment on …
step pulse with verify algorithm. To evaluate the impact of the voltage step increment on …