Volume 227 -
The 23rd International Workshop on Vertex Detectors (Vertex2014) -
Electronics and Integration, TRG
65 nm Technology for HEP: Status and Perspective
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Published on:
May 21, 2015
DOI: https://doi.org/10.22323/1.227.0043
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Copyright owned by the author(s) under the term of the Creative Commons Attribution-NonCommercial-ShareAlike.