Title |
Characterisation of SPS Slow Extraction Spill Quality Degradation |
Authors |
- F.M. Velotti, H. Bartosik, M.C.L. Buzio, K. Cornelis, V. Di Capua, M.A. Fraser, B. Goddardpresenter, V. Kain
CERN, Meyrin, Switzerland
|
Abstract |
The main physics users of the Super Proton Synchrotron (SPS) are the experiments installed in the North Area (NA). They are supplied with slowly extracted protons or heavy ions, exploiting a third integer slow extraction to provide a 4.8 s spill. High duty cycle and constant particle flux are the main requirements. Frequent super cycle changes induce variation of the spill macro structure which directly deteriorate the final spill quality. In this paper, the source of such an effect are investigated. Results of both beam based measurements and direct magnetic measurements on the SPS reference magnets are presented. Finally, a possible strategy to counteract this effect is discussed, in order to try to remove the super cycle changes variation as cause for spill quality deterioration.
|
Paper |
download WEPMP034.PDF [1.187 MB / 3 pages] |
Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
※ RIS
※ EndNote |
Conference |
IPAC2019 |
Series |
International Particle Accelerator Conference (10th) |
Location |
Melbourne, Australia |
Date |
19-24 May 2019 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Mark Boland (UoM, Saskatoon, SK, Canada); Hitoshi Tanaka (KEK, Tsukuba, Japan); David Button (ANSTO, Kirrawee, NSW, Australia); Rohan Dowd (ANSTO, Kirrawee, NSW, Australia); Volker RW Schaa (GSI, Darmstadt, Germany); Eugene Tan (ANSTO, Kirrawee, NSW, Australia) |
Online ISBN |
978-3-95450-208-0 |
Received |
15 May 2019 |
Accepted |
21 May 2019 |
Issue Date |
21 June 2019 |
DOI |
doi:10.18429/JACoW-IPAC2019-WEPMP034 |
Pages |
2403-2405 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
|