Title |
Progress on Transverse Beam Profile Measurement Using the Heterodyne Near Field Speckles Method at ALBA |
Authors |
- S. Mazzoni, F. Roncarolo, G. Trad
CERN, Geneva, Switzerland
- U. Iriso, C. Kamma-Lorger, A.A. Nosych
ALBA-CELLS Synchrotron, Cerdanyola del Vallès, Spain
- M.A.C. Potenza
Universita’ degli Studi di Milano & INFN, Milano, Italy
- M. Siano
Università degli Studi di Milano, Milano, Italy
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Abstract |
We present the recent developments of a study aiming at measuring the transverse beam profile using the Heterodyne Near Field Speckles (HNFS) method. The HNFS technique consists of a suspension of nanoparticles suspended in a liquid and illuminated by synchrotron radiation (either in the visible or in X-ray wavelength range). The transverse coherence of the source, and therefore, under the conditions of validity of the Van Cittert and Zernike theorem, the transverse electron beam size is retrieved from the interference between the transmitted beam and the spherical waves scattered by each nanoparticle. We here describe the fundamentals of this technique, as well as the recent experimental results obtained with 12 keV radiation at the NCD beamline at ALBA. The applicability of such technique for future accelerators (e.g. CLIC or FCC) is also discussed.
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Paper |
download THOA03.PDF [0.637 MB / 4 pages] |
Slides |
download THOA03_TALK.PDF [2.414 MB] |
Export |
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Conference |
IBIC2018 |
Series |
International Beam Instrumentation Conference (7th) |
Location |
Shanghai, China |
Date |
09-13 September 2018 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Volker RW Schaa (GSI, Darmstadt, Germany) |
Online ISBN |
978-3-95450-201-1 |
Received |
05 September 2018 |
Accepted |
13 September 2018 |
Issue Date |
29 January 2019 |
DOI |
doi:10.18429/JACoW-IBIC2018-THOA03 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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