A highly reliable butterfly PUF in SRAM-based FPGAs

Xiumin Xu; Huaguo Liang; Zhengfeng Huang; Cuiyun Jiang; Yiming Ouyang; Xiangsheng Fang; Tianming Ni; Maoxiang Yi

doi:10.1587/elex.14.20170551

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A highly reliable butterfly PUF in SRAM-based FPGAs

Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xiangsheng Fang, Tianming Ni, Maoxiang Yi

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Keywords: physically unclonable function (PUF), SRAM-based FPGAs, delay difference test, selective mapping, highly reliable

JOURNAL FREE ACCESS

2017 Volume 14 Issue 14 Pages 20170551

DOI https://doi.org/10.1587/elex.14.20170551

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Abstract

This paper presents a butterfly physically unclonable function (PUF) implementation in SRAM-based field programmable gate arrays (FPGAs). To avoid output instability, we propose a delay difference test to identify reliable slices (mapped to which butterfly PUF cells are highly reliable) and then PUF reliability is significantly improved by selective mapping PUF cells to reliable slices, which is validated in experimental results.

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