Paper
13 March 2015 A 12-bit 500KSPS cyclic ADC for CMOS image sensor
Author Affiliations +
Proceedings Volume 9403, Image Sensors and Imaging Systems 2015; 94030K (2015) https://doi.org/10.1117/12.2083269
Event: SPIE/IS&T Electronic Imaging, 2015, San Francisco, California, United States
Abstract
At present, single-slope analog-to-digital convertor (ADC) is widely used in the readout circuits of CMOS image sensor (CIS) while its main drawback is the high demand for the system clock frequency. The more pixels and higher ADC resolution the image sensor system needs, the higher system clock frequency is required. To overcome this problem in high dynamic range CIS system, this paper presents a 12-bit 500-KS/s cyclic ADC, in which the system clock frequency is 5MHz. Therefore, comparing with the system frequency of 2N×fS for the single-slope ADC, where fS, N is the sampling frequency and resolution, respectively, the higher ADC resolution doesn’t need the higher system clock frequency. With 0.18μm CMOS process, the circuit layout is realized and occupies an area of 8μm×374μm. Post simulation results show that Signal-to-Noise-and-Distortion-Ratio (SNDR) and Efficient Number of Bit (ENOB) reaches 63.7dB and 10.3bit, respectively.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhaohan Li, Gengyun Wang, Leli Peng, Cheng Ma, and Yuchun Chang "A 12-bit 500KSPS cyclic ADC for CMOS image sensor", Proc. SPIE 9403, Image Sensors and Imaging Systems 2015, 94030K (13 March 2015); https://doi.org/10.1117/12.2083269
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KEYWORDS
Clocks

Amplifiers

CMOS sensors

Image sensors

Capacitors

Device simulation

Switches

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