Paper
24 February 2014 Evaluation of the shape of the specular peak for high glossy surfaces
Gaël Obein, Shiraz Ouarets, Guillaume Ged
Author Affiliations +
Proceedings Volume 9018, Measuring, Modeling, and Reproducing Material Appearance; 901805 (2014) https://doi.org/10.1117/12.2040350
Event: IS&T/SPIE Electronic Imaging, 2014, San Francisco, California, United States
Abstract
Gloss is the second most relevant visual attribute of a surface beside its colour. While the colour originates from the wavelength repartition of the reflected light, gloss originates from its angular distribution. When an observer is asked to evaluate the gloss of a surface, he always first orientate his eyes along the specular direction before lightly tilting the examined sample. This means that gloss is located in and around the specular direction, in a peak that is called the specular peak. On the one hand, this peak is flat and broad on matte surfaces on the other hand, it is narrow and sharp on high gloss surfaces. For the late ones, the FWHM of the specular peak is less than 2° which can be quite difficult to measure. We developed a dedicated facility capable of measuring specular peak with a FWHM up to 0,1 °. We measured the evolution of the peak according to the angle of illumination and the specular gloss of the sample in the restricted field of very glossy surface. The facility and peaks measured are presented in the paper. The next step will be to identify the correlations between the peak and the roughness of the sample.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gaël Obein, Shiraz Ouarets, and Guillaume Ged "Evaluation of the shape of the specular peak for high glossy surfaces", Proc. SPIE 9018, Measuring, Modeling, and Reproducing Material Appearance, 901805 (24 February 2014); https://doi.org/10.1117/12.2040350
Lens.org Logo
CITATIONS
Cited by 5 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Visualization

Charge-coupled devices

Metrology

Spatial resolution

Bidirectional reflectance transmission function

CCD cameras

Ions

RELATED CONTENT

DESI commissioning instrument metrology
Proceedings of SPIE (July 10 2018)
Incoherent x-ray mirror surface metrology
Proceedings of SPIE (November 01 1997)
eROSITA in orbit calibration strategy and plan from the...
Proceedings of SPIE (September 13 2012)

Back to Top