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Electrical characterization of thin edgeless N-on-p planar pixel sensors for ATLAS upgrades

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Published 14 May 2014 © CERN 2014
, , Citation M Bomben et al 2014 JINST 9 C05020 DOI 10.1088/1748-0221/9/05/C05020

1748-0221/9/05/C05020

Abstract

In view of the LHC upgrade phases towards the High Luminosity LHC (HL-LHC), the ATLAS experiment plans to upgrade the Inner Detector with an all-silicon system. Because of its radiation hardness and cost effectiveness, the n-on-p silicon technology is a promising candidate for a large area pixel detector. The paper reports on the joint development, by LPNHE and FBK of novel n-on-p edgeless planar pixel sensors, making use of the active trench concept for the reduction of the dead area at the periphery of the device. After discussing the sensor technology, and presenting some sensors' simulation results, a complete overview of the electrical characterization of the produced devices will be given.

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10.1088/1748-0221/9/05/C05020