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Proceedings
VTS
VTS 1998

Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)

12.3 A Novel Routing Algorithm for MCM Substrate Verification Using Single-Ended Probe

Year: 1998, Pages: 266

DOI Bookmark: 10.1109/VTEST.1998.670879

Authors

R. Yan
B.C. Kim

Abstract

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