BibTeX record journals/tcasII/ShiXJZZ24

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@article{DBLP:journals/tcasII/ShiXJZZ24,
  author       = {Zhanhui Shi and
                  Jie Xiao and
                  Jianhui Jiang and
                  Ying Zhang and
                  Yuhao Zhou},
  title        = {Identifying Reliability High-Correlated Gates of Logic Circuits With
                  Pearson Correlation Coefficient},
  journal      = {{IEEE} Trans. Circuits Syst. {II} Express Briefs},
  volume       = {71},
  number       = {4},
  pages        = {2319--2323},
  year         = {2024},
  url          = {https://doi.org/10.1109/TCSII.2023.3334390},
  doi          = {10.1109/TCSII.2023.3334390},
  timestamp    = {Mon, 15 Apr 2024 08:26:05 +0200},
  biburl       = {https://dblp.org/rec/journals/tcasII/ShiXJZZ24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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