"Development of a spatial dimension-based taxonomy for classifying the ..."

Seung-Hyun Choi et al. (2024)

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DOI: 10.1016/J.AEI.2024.102540

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type: Journal Article

metadata version: 2024-08-04

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Seung-Hyun Choi, Dong-Hee Lee, Eun-Su Kim, Young-Mok Bae, Young-Chan Oh, Kwang-Jae Kim:
Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map. Adv. Eng. Informatics 60: 102540 (2024)

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