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"Fractal Anti-Counterfeit Label Comparison Using Combined Image Features ..."
Wen Wang, Guoyong Han, Guanglei Sun (2020)
- Wen Wang, Guoyong Han, Guanglei Sun:
Fractal Anti-Counterfeit Label Comparison Using Combined Image Features and Clustering. IEEE Access 8: 134303-134310 (2020)
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