"Testing 90 nm microcontroller SRAM PUF quality."

Mario Barbareschi et al. (2015)

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DOI: 10.1109/DTIS.2015.7127360

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Mario Barbareschi, Ermanno Battista, Antonino Mazzeo, Nicola Mazzocca:
Testing 90 nm microcontroller SRAM PUF quality. DTIS 2015: 1-6

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