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ORCIDYves Danto
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2000 – 2009
- 2007
[j22]Kirsten Weide-Zaage, David Dalleau, Yves Danto, Hélène Frémont:
Dynamic void formation in a DD-copper-structure with different metallization geometry. Microelectron. Reliab. 47(2-3): 319-325 (2007)- [j21]W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto:
Torsion test applied for reballing and solder paste volume evaluation. Microelectron. Reliab. 47(9-11): 1663-1667 (2007) - 2006
- [j20]W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto:
Improved physical understanding of intermittent failure in continuous monitoring method. Microelectron. Reliab. 46(9-11): 1886-1891 (2006) - [c4]Corinne Bestory, François Marc, Hervé Levi, Yves Danto:
Multi-level Modeling of Hot Carrier Injection for Reliability. FDL 2006: 61-68 - 2005
- [j19]S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto:
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectron. Reliab. 45(9-11): 1593-1599 (2005) - [j18]A. Dehbi, Yves Ousten, Yves Danto, Wolfgang Wondrak:
Vibration lifetime modelling of PCB assemblies using steinberg model. Microelectron. Reliab. 45(9-11): 1658-1661 (2005) - 2004
- [j17]Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto:
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. Microelectron. Reliab. 44(9-11): 1299-1304 (2004) - [j16]Hélène Frémont, Jean-Yves Delétage, Kirsten Weide-Zaage, Yves Danto:
How to study delamination in plastic encapsulated devices. Microelectron. Reliab. 44(9-11): 1311-1316 (2004) - [j15]Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé:
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. Microelectron. Reliab. 44(9-11): 1337-1342 (2004) - 2003
- [j14]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto:
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43(1): 173-177 (2003) - [j13]Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard:
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectron. Reliab. 43(7): 1125-1136 (2003) - [j12]Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto:
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectron. Reliab. 43(7): 1137-1144 (2003) - [j11]B. Mongellaz, François Marc, Yves Danto:
Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. Microelectron. Reliab. 43(9-11): 1513-1518 (2003) - [j10]Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard:
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectron. Reliab. 43(9-11): 1743-1749 (2003) - [j9]G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby
, Wilfrid Claeys:
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43(9-11): 1803-1807 (2003) - [j8]David Dalleau, Kirsten Weide-Zaage, Yves Danto:
Simulation of time depending void formation in copper, aluminum and tungsten plugged via structures. Microelectron. Reliab. 43(9-11): 1821-1826 (2003) - [j7]Angie Tetelin, Claude Pellet, Jean-Yves Delétage, B. Carbonne, Yves Danto:
Moisture diffusion in BCB resins used for MEMS packaging. Microelectron. Reliab. 43(9-11): 1939-1944 (2003) - [j6]Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano:
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE Trans. Instrum. Meas. 52(1): 135-142 (2003) - [c3]François Marc, B. Mongellaz, Yves Danto:
Reliability simulation of electronic circuits with VHDL-AMS. FDL 2003: 175-184 - 2002
- [j5]A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto:
High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectron. Reliab. 42(6): 835-840 (2002) - [j4]B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, Bernard Parmentier:
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectron. Reliab. 42(7): 1113-1120 (2002) - [j3]B. Mongellaz, François Marc, Noëlle Milet-Lewis, Yves Danto:
Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language. Microelectron. Reliab. 42(9-11): 1353-1358 (2002) - [j2]Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto:
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectron. Reliab. 42(9-11): 1517-1522 (2002) - [j1]Geneviève Duchamp, Yves Ousten, Yves Danto:
Evaluation of a micropackaging analysis technique by highfrequency microwaves. Microelectron. Reliab. 42(9-11): 1551-1554 (2002) - [c2]Ahmed Fakhfakh, Hervé Levi, Noëlle Milet-Lewis, Yves Danto:
Behavioral Modeling of Analogue and Mixed Integrated Systems with VHDL-AMS for RF Applications. SBCCI 2002: 308-316
1990 – 1999
- 1997
- [c1]Thomas Zimmer, Patrice Kadionik, Yves Danto:
A World-Wide-Web based instrumentation pool real testing in a virtual world. MSE 1997: 114-115
Coauthor Index
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