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Xiao Shi 0001
Person information
- affiliation: Nanjing University, National Center of Technology Innovation for EDA, China
- affiliation (former): University of California Los Angeles, Electrical and Computer Engineering Department, CA, USA
- affiliation (former): Fudan University, Microelectronics Department, Shanghai, China
- affiliation (former): Southeast University, School of Electronic Science and Engineering, Nanjing, China
Other persons with the same name
- Xiao Shi — disambiguation page
- Xiao Shi 0002
— Shandong University of Finance and Economics, School of Finance, Jinan, China (and 1 more)
- Xiao Shi 0003
— Chinese Academy of Sciences, Nanjing Institute of InforSuperBahn, China (and 1 more)
- Xiao Shi 0004
— Chinese Academy of Agricultural Sciences, Agricultural Information Institute, Beijing, China (and 1 more)
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2020 – today
- 2025
- [j7]Hao Yan
, Yaning Jia, Chuangyuan Zeng, Xiaoping Liao, Xiao Shi:
Robust optimization algorithm of RF MEMS switches considering uncertainties. Integr. 104: 102470 (2025) - 2024
- [j6]Ziqi Wang
, Liang Pang
, Xiao Shi
, Longxing Shi
:
Efficient Memory Circuits Yield Analysis and Optimization Framework via Meta-Learning. IEEE Trans. Circuits Syst. II Express Briefs 71(9): 4196-4200 (2024) - [j5]Dongjia Zhao
, Lei Qi
, Xiao Shi
, Yinghuan Shi
, Xin Geng
:
A Novel Cross-Perturbation for Single Domain Generalization. IEEE Trans. Circuits Syst. Video Technol. 34(11): 10903-10916 (2024) - [c13]Junzhuo Zhou
, Li Huang
, Haoxuan Xia
, Yihui Cai
, Leilei Jin
, Xiao Shi
, Wei W. Xing
, Ting-Jung Lin
, Lei He
:
LVF2: A Statistical Timing Model based on Gaussian Mixture for Yield Estimation and Speed Binning. DAC 2024: 46:1-46:6 - [c12]Ziqi Wang
, Weihan Sun
, Zhongxi Guo
, Xiao Shi
, Longxing Shi
:
High-Dimensional Yield Analysis Using Sparse Representation for Long-Tailed Distribution. MLCAD 2024: 16:1-16:7 - 2023
- [j4]Liang Pang
, Ziqi Wang, Rui Shi, Mengyun Yao, Xiao Shi, Hao Yan, Longxin Shi:
An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated. Integr. 89: 155-167 (2023) - [j3]Liang Pang, Mengyun Yao, Xiao Shi, Hao Yan, Longxin Shi:
CharTM: The dynamic stability characterization for memory based on tail distribution modeling. Microelectron. J. 133: 105697 (2023) - [c11]Leilei Jin, Jiajie Xu, Wenjie Fu, Hao Yan, Xiao Shi, Ming Ling, Longxing Shi:
A Novel Delay Calibration Method Considering Interaction between Cells and Wires. DATE 2023: 1-6 - [c10]Tiandong Zhao, Siyuan Miao, Shaoqiang Lu
, Jialin Cao, Jun Qiu, Xiao Shi, Kun Wang, Lei He:
Token Packing for Transformers with Variable-Length Inputs. FPL 2023: 49-56 - [i1]Dongjia Zhao, Lei Qi, Xiao Shi, Yinghuan Shi, Xin Geng:
A Novel Cross-Perturbation for Single Domain Generalization. CoRR abs/2308.00918 (2023) - 2022
- [j2]Xiao Shi, Hao Yan, Qiancun Huang, Chengzhen Xuan, Lei He, Longxing Shi:
A Compact High-Dimensional Yield Analysis Method using Low-Rank Tensor Approximation. ACM Trans. Design Autom. Electr. Syst. 27(2): 19:1-19:23 (2022) - 2021
- [c9]Hao Yan, Xiao Shi, Chengzhen Xuan, Peng Cao, Longxing Shi:
An Adaptive Delay Model for Timing Yield Estimation under Wide-Voltage Range. ASP-DAC 2021: 272-277 - 2020
- [j1]Xiao Shi
, Hao Yan
, Jinxin Wang, Jiajia Zhang, Longxing Shi, Lei He
:
An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 4999-5010 (2020) - [c8]Shan Shen, Liang Pang, Tianxiang Shao, Ming Ling, Xiao Shi, Longxing Shi:
TYMER: A Yield-based Performance Model for Timing-speculation SRAM. DAC 2020: 1-6 - [c7]Xiao Shi, Hao Yan, Chuwen Li, Jianli Chen, Longxing Shi, Lei He:
A Non-Gaussian Adaptive Importance Sampling Method for High-Dimensional and Multi-Failure-Region Yield Analysis. ICCAD 2020: 7:1-7:8
2010 – 2019
- 2019
- [c6]Xiao Shi, Jinlong Yan, Hao Yan, Jiajia Zhang, Jinxin Wang, Longxing Shi, Lei He:
Adaptive Low-Rank Tensor Approximation for SRAM Yield Analysis using Bootstrap Resampling. ASICON 2019: 1-4 - [c5]Xiao Shi, Hao Yan, Qiancun Huang, Jiajia Zhang, Longxing Shi, Lei He:
Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation. DAC 2019: 150 - [c4]Xiao Shi, Hao Yan, Jiajia Zhang, Qiancun Huang, Longxing Shi, Lei He:
Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method. ICCAD 2019: 1-8 - [c3]Xiao Shi, Hao Yan, Jinxin Wang, Xiaofen Xu, Fengyuan Liu, Longxing Shi, Lei He:
Adaptive Clustering and Sampling for High-Dimensional and Multi-Failure-Region SRAM Yield Analysis. ISPD 2019: 139-146 - 2018
- [c2]Xiao Shi, Fengyuan Liu, Jun Yang, Lei He:
A fast and robust failure analysis of memory circuits using adaptive importance sampling method. DAC 2018: 134:1-134:6 - 2012
- [c1]Meng Zhang, Chenhao Wang, Xiao Shi, Hao Liu, Huacheng Zhu:
MAC controller for Wireless Sensor Network on IEEE 802.15.4 standard. ICSPCS 2012: 1-4
Coauthor Index
aka: Longxin Shi

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last updated on 2025-08-28 02:04 CEST by the dblp team
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