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Ting An
2020 – today
- 2021
- [j4]Chunwang Dong
, Chongshan Yang, Zhongyuan Liu, Rentian Zhang, Peng Yan, Ting An, Yan Zhao, Yang Li
:
Nondestructive Testing and Visualization of Catechin Content in Black Tea Fermentation Using Hyperspectral Imaging. Sensors 21(23): 8051 (2021) - 2020
- [j3]Sai Zhu
, Chunhui Han, Yafeng Meng, Jiawen Xu, Ting An:
Embryonics Based Phased Array Antenna Structure With Self-Repair Ability. IEEE Access 8: 209660-209673 (2020)
2010 – 2019
- 2019
- [j2]Gen Li
, Jun Liang
, Tibin Joseph
, Ting An, Jingjing Lu, Marcio Szechtman, Bjarne R. Andersen, Qikai Zhuang:
Feasibility and Reliability Analysis of LCC DC Grids and LCC/VSC Hybrid DC Grids. IEEE Access 7: 22445-22456 (2019) - 2017
- [c11]Ting An:
Application of Genetic Algorithm Based on F-Ratio Rule in Signal Feature Selection. ISCID (2) 2017: 492-495 - 2015
- [j1]Ting An, Kaikai Liu, Hao Cai, Lirida A. B. Naviner:
Accurate reliability analysis of concurrent checking circuits employing an efficient analytical method. Microelectron. Reliab. 55(3-4): 696-703 (2015) - 2014
- [b1]Ting An:
Architectures of self-controllable digital operators. (Architectures d'opérateurs numérique auto-contrôlables). Télécom ParisTech, France, 2014 - [c10]Ting An, Hao Cai, Lirida Alves de Barros Naviner
:
Simulation study of aging in CMOS binary adders. MIPRO 2014: 51-55 - [c9]Ting An, Kaikai Liu, Lirida Alves de Barros Naviner
:
Analytical method for reliability assessment of concurrent checking circuits under multiple faults. MIPRO 2014: 56-59 - [c8]Ting An, Kaikai Liu, Hao Cai, Lirida Alves de Barros Naviner
:
Efficient implementation for accurate analysis of CED circuits against multiple faults. MIXDES 2014: 436-440 - 2013
- [c7]Ting An, Lirida Alves de Barros Naviner
, Philippe Matherat:
A low cost reliable architecture for S-Boxes in AES processors. DFTS 2013: 155-160 - [c6]Kaikai Liu, Hao Cai, Ting An, Lirida A. B. Naviner
, Jean-François Naviner
, Hervé Petit:
Reliability analysis of combinational circuits with the influences of noise and single-event transients. DFTS 2013: 218-223 - [c5]Kaikai Liu, Ting An, Hao Cai, Lirida A. B. Naviner
, Jean-François Naviner
, Hervé Petit:
A general cost-effective design structure for probabilistic-based noise-tolerant logic functions in nanometer CMOS technology. EUROCON 2013: 1829-1836 - [c4]Tian Ban, Jianxin Wang, Ting An, Lirida A. B. Naviner
:
Modeling of transient faults and fault-tolerant design in nanoelectronics. MWSCAS 2013: 545-548 - [c3]Ting An, Lirida Alves de Barros Naviner
, Philippe Matherat:
Evaluation of fault-tolerant composite field AES S-boxes under multiple transient faults. NEWCAS 2013: 1-4 - 2012
- [c2]Matteo Causo, Ting An, Lirida Alves de Barros Naviner
:
Parallel scaling-free and area-time efficient CORDIC algorithm. ICECS 2012: 149-152 - [c1]Ting An, Matteo Causo, Lirida Alves de Barros Naviner
, Philippe Matherat:
Transient fault analysis of CORDIC processor. ICECS 2012: 757-760
Coauthor Index
aka: Lirida Alves de Barros Naviner

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