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ORCIDIEEE Transactions on Reliability, Volume 52
Volume 52, Number 1, March 2003
- Ralph A. Evans:
Editorial reasonable engineering guess. 1 - Ralph A. Evans:
Editorial genuine imitation Bayesian. 2 - Ralph A. Evans:
Editorial confidence intervals for discrete variables. 3 - Haiyan Xu
, Yincai Tang:
Commentary: the Khamis/Higgins model. 4-6 - Rebecca A. Betensky, Emily C. Martin:
Commentary: failure-rate functions for doubly-truncated random variables. 7-8 - Alessandro Birolini:
Commentary: author reply to a book review. 9 - John A. Connor:
Commentary: getting real about reliability, through wit and humor. 10-13 - Shaomin Wu, Ling-Yau Chan:
Performance utility-analysis of multi-state systems. 14-21 - Li Sheng, Jie Wu:
Maximum-shortest-path (MSP) is not optimal for a general N×N torus. 22-25 - Sofiane Gasmi, C. Ernie Love, Waltraud Kahle:
A general repair, proportional-hazards, framework to model complex repairable systems. 26-32 - C. D. Lai, Min Xie, D. N. P. Murthy:
A modified Weibull distribution. 33-37 - Jie Mi:
A unified way of comparing the reliability of coherent systems. 38-43 - Mark Lanus, Liang Yin, Kishor S. Trivedi:
Hierarchical composition and aggregation of state-based availability and performability models. 44-52 - Cristian Constantinescu:
Experimental evaluation of error-detection mechanisms. 53-57 - Michael G. H. Bell:
The use of game theory to measure the vulnerability of stochastic networks. 63-68 - Olivier Gaudoin, Bo Yang, Min Xie:
A simple goodness-of-fit test for the power-law process, based on the Duane plot. 69-74 - Nong Ye, Sean Vilbert, Qiang Chen:
Computer intrusion detection through EWMA for autocorrelated and uncorrelated data. 75-82 - Yeh Lam, Yuan Lin Zhang:
A geometric-process maintenance model for a deteriorating system under a random environment. 83-89 - N. Balakrishnan, N. Kannan, Chien-Tai Lin, H. K. T. Ng:
Point and interval estimation for Gaussian distribution, based on progressively Type-II censored samples. 90-95 - Antoine Rauzy:
A new methodology to handle Boolean models with loops. 96-105 - A. O. C. Elegbede, Chengbin Chu, Kondo H. Adjallah, Farouk Yalaoui:
Reliability allocation through cost minimization. 106-111 - Alenka Brezavscek, Alenka Hudoklin:
Joint optimization of block-replacement and periodic-review spare-provisioning policy. 112-117 - Thomas R. Bennett, Jane M. Booker, Sallie Keller-McNulty, Nozer D. Singpurwalla:
Testing the untestable: reliability in the 21st century. 118-124 - Georgia-Ann Klutke, Peter C. Kiessler, Martin A. Wortman:
A critical look at the bathtub curve. 125-129 - Thomas E. Sälzer:
Tubulation techniques for locating fine-leak sites in hermetic electronic packages. 130-132 - Nader B. Ebrahimi:
Indirect assessment of system reliability. 58-62
Volume 52, Number 2, June 2003
- Hoang Pham:
Commentary: steady-state series-system availability. 146-147 - James A. McLinn:
Commentary: material review board in 2003. 148 - Wayne Tustin:
Commentary: real education. 149 - Abdul-Rahman M. Abouammoh, Isa S. Qamber:
New better than renewal-used classes of life distributions. 150-153 - Michael L. Ulrey:
Formulas for the distribution of sums of independent exponential random variables. 154-161 - Andrew J. Fry:
Integrity-based self-validation test scheduling. 162-167 - Philip J. Boland, Harshinder Singh:
A birth-process approach to Moranda's geometric software-reliability model. 168-174 - Antoine Rauzy:
Toward an efficient implementation of the MOCUS algorithm. 175-180 - Ruiqing Zhao, Baoding Liu:
Stochastic programming models for general redundancy-optimization problems. 181-191 - Gregory Levitin:
Optimal allocation of multistate elements in a linear consecutively-connected system. 192-199 - A. M. Mathai:
Order statistics from a logistic distribution and applications to survival and reliability analysis. 200-206 - Héctor Cancela, Mohamed El Khadiri:
The recursive variance-reduction simulation algorithm for network reliability evaluation. 207-212 - J. D. Andrews, Sally Beeson:
Birnbaum's measure of component importance for noncoherent systems. 213-219 - Yong Ou, Joanne Bechta Dugan:
Approximate sensitivity analysis for acyclic Markov reliability models. 220-230 - Gregory Levitin:
Reliability evaluation for acyclic transmission networks of multi-state elements with delays. 231-237 - Hairong Sun, James J. Han, Haim Levendel:
Availability requirement for a fault-management server in high-availability communication systems. 238-244 - Dong Xiang, Ai Chen, Jie Wu:
Reliable broadcasting in wormhole-routed hypercube-connected networks using local safety information. 245-256 - John Quigley, Lesley Walls:
Confidence intervals for reliability-growth models with small sample-sizes. 257-262 - Gregory Levitin:
Linear multi-state sliding-window systems. 263-269
Volume 52, Number 3, September 2003
- Ralph A. Evans:
Editorials-from 1978. 273-276 - Ralph A. Evans:
Editorials-from 1979. 277-280 - Ralph A. Evans:
Editorials-from 1980. 281-284 - Ralph A. Evans:
Editorials-from 1981. 285-288 - Alexandru O. Balan, Lorenzo Traldi:
Preprocessing minpaths for sum of disjoint products. 289-295 - Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
Extending integrated-circuit yield-models to estimate early-life reliability. 296-300 - Sally Beeson, J. D. Andrews:
Importance measures for noncoherent-system analysis. 301-310 - Atanu Biswas, Jyotirmoy Sarkar, Sahadeb Sarkar:
Availability of a periodically inspected system, maintained under an imperfect-repair policy. 311-318 - Juan A. Carrasco:
Solving dependability/performability irreducible Markov models using regenerative randomization. 319-329 - Joohan Lee, Steve J. Chapin, Stephen Taylor:
Reliable heterogeneous applications. 330-339 - Gregory Levitin:
Reliability of multi-state systems with two failure-modes. 340-348 - Anna Richelli, Luigi Colalongo, Zsolt Miklós Kovács-Vajna:
Increasing the immunity to electromagnetic interferences of CMOS OpAmps. 349-353 - Shiuh-Pyng Shieh, Yea-Ching Tsai, Yu-Lun Huang:
Optimal information-dispersal for fault-tolerant communication over a burst-error channel. 354-366 - Galit Shmueli:
Computing consecutive-type reliabilities nonrecursively. 367-372 - S. K. Yang:
A condition-based failure-prediction and processing-scheme for preventive maintenance. 373-383
Volume 52, Number 4, December 2003
- Chih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu:
Built-in redundancy analysis for memory yield improvement. 386-399 - Fabrizio Ferrandi, Franco Fummi, Graziano Pravadelli, Donatella Sciuto:
Identification of design errors through functional testing. 400-412 - Karl Thaller, Andreas Steininger:
A transparent online memory test for simultaneous detection of functional faults and soft errors in memories. 413-422 - Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park:
Maximal diagnosis of interconnects of random access memories. 423-434 - J. H. Jiang, Wen-Ben Jone, Shih-Chieh Chang, Swaroop Ghosh:
Embedded core test generation using broadcast test architecture and netlist scrambling. 435-443 - W. P. M. Allen, Donald G. Bailey, Serge N. Demidenko, Vincenzo Piuri:
Analysis and application of digital spectral warping in analog and mixed-signal testing. 444-457 - Cristiana Bolchini:
A software methodology for detecting hardware faults in VLIW data paths. 458-468 - Cecilia Metra, Luca Schiano, Michele Favalli:
Concurrent detection of power supply noise. 469-475 - Gian Carlo Cardarilli, A. Leandri, P. Marinucci, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano:
Design of a fault tolerant solid state mass memory. 476-491 - Stanislaw J. Piestrak, Abbas Dandache, Fabrice Monteiro:
Designing fault-secure parallel encoders for systematic linear error correcting codes. 492-500 - Kaijie Wu, Ramesh Karri:
Selectively breaking data dependences to improve the utilization of idle cycles in algorithm level re-computing data paths. 501-511 - Christoph Scherrer, Andreas Steininger:
Dealing with dormant faults in an embedded fault-tolerant computer system. 512-522 - Anne Barros, Christophe Bérenguer, Antoine Grall:
Optimization of replacement times using imperfect monitoring information. 523-533
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