"Investigation on the Worst Read Scenario of a ReRAM Crossbar Array."

Yelim Youn et al. (2017)

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DOI: 10.1109/TVLSI.2017.2710140

access: closed

type: Journal Article

metadata version: 2020-03-11

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Yelim Youn, Kwangmin Kim, Jae-Yoon Sim, Hong-June Park, Byungsub Kim:
Investigation on the Worst Read Scenario of a ReRAM Crossbar Array. IEEE Trans. Very Large Scale Integr. Syst. 25(9): 2402-2410 (2017)

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