"Cost-Effective Test Screening Method on 40-nm Embedded SRAMs for Low-Power ..."

Yoshisato Yokoyama et al. (2021)

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DOI: 10.1109/TVLSI.2021.3082760

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type: Journal Article

metadata version: 2021-07-13

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Yoshisato Yokoyama, Yuichiro Ishii, Koji Nii, Kazutoshi Kobayashi:
Cost-Effective Test Screening Method on 40-nm Embedded SRAMs for Low-Power MCUs. IEEE Trans. Very Large Scale Integr. Syst. 29(7): 1495-1499 (2021)

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