default search action
"A Built-in Self-Diagnosis and Repair Design With Fail Pattern ..."
Chin-Lung Su et al. (2011)
- Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Kun-Lun Luo, Wen Ching Wu:
A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2184-2194 (2011)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.