"Built-In Sensor for Signal Integrity Faults in Digital Interconnect Signals."

Víctor H. Champac, Victor Avendaño, Joan Figueras (2010)

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DOI: 10.1109/TVLSI.2008.2010398

access: closed

type: Journal Article

metadata version: 2020-03-11

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Víctor H. Champac, Victor Avendaño, Joan Figueras:
Built-In Sensor for Signal Integrity Faults in Digital Interconnect Signals. IEEE Trans. Very Large Scale Integr. Syst. 18(2): 256-269 (2010)

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