BibTeX record journals/tvlsi/BaoRTMVTW17

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@article{DBLP:journals/tvlsi/BaoRTMVTW17,
  author       = {Trong Huynh Bao and
                  Julien Ryckaert and
                  Zsolt Tokei and
                  Abdelkarim Mercha and
                  Diederik Verkest and
                  Aaron Voon{-}Yew Thean and
                  Piet Wambacq},
  title        = {Statistical Timing Analysis Considering Device and Interconnect Variability
                  for {BEOL} Requirements in the 5-nm Node and Beyond},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {25},
  number       = {5},
  pages        = {1669--1680},
  year         = {2017},
  url          = {https://doi.org/10.1109/TVLSI.2017.2647853},
  doi          = {10.1109/TVLSI.2017.2647853},
  timestamp    = {Sun, 04 Aug 2024 19:49:51 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/BaoRTMVTW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}