"Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor Gates."

Walid Ibrahim, Valeriu Beiu, Azam Beg (2012)

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DOI: 10.1109/TR.2012.2206249

access: closed

type: Journal Article

metadata version: 2021-04-09

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Walid Ibrahim, Valeriu Beiu, Azam Beg:
Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor Gates. IEEE Trans. Reliab. 61(3): 675-686 (2012)

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