"An Interconnect Reliability-Driven Routing Technique for Electromigration ..."

Xiaodao Chen et al. (2012)

> Home

Details and statistics

DOI: 10.1109/TDSC.2010.57

access: closed

type: Journal Article

metadata version: 2020-04-09

- view
  authority control:
- export record
  dblp key:
  - journals/tdsc/ChenLWH12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tdsc/ChenLWH12
Xiaodao Chen, Chen Liao, Tongquan Wei, Shiyan Hu:
An Interconnect Reliability-Driven Routing Technique for Electromigration Failure Avoidance. IEEE Trans. Dependable Secur. Comput. 9(5): 770-776 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.